JP2002189632A - サイズ及び速度に関して構成可能なｓｄｒａｍメモリセットを有するメモリテスタ用エラー捕捉ｒａｍ - Google Patents

サイズ及び速度に関して構成可能なｓｄｒａｍメモリセットを有するメモリテスタ用エラー捕捉ｒａｍ

Info

Publication number
JP2002189632A
JP2002189632A JP2001287568A JP2001287568A JP2002189632A JP 2002189632 A JP2002189632 A JP 2002189632A JP 2001287568 A JP2001287568 A JP 2001287568A JP 2001287568 A JP2001287568 A JP 2001287568A JP 2002189632 A JP2002189632 A JP 2002189632A
Authority
JP
Japan
Prior art keywords
memory
address
test
banks
group
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2001287568A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002189632A5 (enExample
Inventor
John H Cook Iii
ジョン・エイチ・クック・ザ・サード
Preet P Singh
プリート・ピー・サイ
La Puente Edmundo De
エドモンド・デ・ラ・プエンタ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2002189632A publication Critical patent/JP2002189632A/ja
Publication of JP2002189632A5 publication Critical patent/JP2002189632A5/ja
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Memory System (AREA)
  • Debugging And Monitoring (AREA)
JP2001287568A 2000-09-20 2001-09-20 サイズ及び速度に関して構成可能なｓｄｒａｍメモリセットを有するメモリテスタ用エラー捕捉ｒａｍ Ceased JP2002189632A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/665,892 US6320812B1 (en) 2000-09-20 2000-09-20 Error catch RAM for memory tester has SDRAM memory sets configurable for size and speed
US09/665892 2000-09-20

Publications (2)

Publication Number Publication Date
JP2002189632A true JP2002189632A (ja) 2002-07-05
JP2002189632A5 JP2002189632A5 (enExample) 2008-11-06

Family

ID=24671977

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001287568A Ceased JP2002189632A (ja) 2000-09-20 2001-09-20 サイズ及び速度に関して構成可能なｓｄｒａｍメモリセットを有するメモリテスタ用エラー捕捉ｒａｍ

Country Status (6)

Country Link
US (1) US6320812B1 (enExample)
EP (1) EP1193716B1 (enExample)
JP (1) JP2002189632A (enExample)
KR (1) KR100786418B1 (enExample)
DE (1) DE60111324T2 (enExample)
TW (1) TW559821B (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008300948A (ja) * 2007-05-29 2008-12-11 Sharp Corp データ処理装置
WO2009122700A1 (ja) * 2008-03-30 2009-10-08 株式会社アドバンテスト 試験装置および試験方法
WO2009122699A1 (ja) * 2008-03-30 2009-10-08 株式会社アドバンテスト 試験モジュール、試験装置および試験方法
WO2009122701A1 (ja) * 2008-03-31 2009-10-08 株式会社アドバンテスト 試験モジュール、試験装置および試験方法

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US6651204B1 (en) * 2000-06-01 2003-11-18 Advantest Corp. Modular architecture for memory testing on event based test system
US20020082884A1 (en) * 2000-12-22 2002-06-27 Moroney Brady J. Manufacturing and testing communications system
JP2002216495A (ja) * 2001-01-18 2002-08-02 Mitsubishi Electric Corp メモリデバイス冗長救済解析方法、記録媒体および装置
US6574764B2 (en) * 2001-04-25 2003-06-03 Agilent Technologies, Inc. Algorithmically programmable memory tester with history FIFO's that aid in error analysis and recovery
US7158900B2 (en) * 2002-01-07 2007-01-02 Siemens Energy & Automation, Inc. Pulse output function for programmable logic controller
EP1546870A2 (en) 2002-06-03 2005-06-29 Siemens Energy & Automation, Inc. A wizard for programming an intelligent module
US7082075B2 (en) * 2004-03-18 2006-07-25 Micron Technology, Inc. Memory device and method having banks of different sizes
JP2006266835A (ja) * 2005-03-23 2006-10-05 Advantest Corp 試験装置、試験方法、及び試験制御プログラム
KR100708183B1 (ko) * 2005-09-26 2007-04-17 삼성전자주식회사 움직임 추정을 위한 영상 데이터 저장 장치 및 그 데이터저장 방법
DE102006016499B4 (de) * 2006-04-07 2014-11-13 Qimonda Ag Speichermodulsteuerung, Speichersteuerung und entsprechende Speicheranordnung sowie Verfahren zur Fehlerkorrektur
US20080189479A1 (en) * 2007-02-02 2008-08-07 Sigmatel, Inc. Device, system and method for controlling memory operations
US7606067B2 (en) * 2007-07-06 2009-10-20 International Business Machines Corporation Method to create a uniformly distributed multi-level cell (MLC) bitstream from a non-uniform MLC bitstream
US7623365B2 (en) * 2007-08-29 2009-11-24 Micron Technology, Inc. Memory device interface methods, apparatus, and systems
KR20100100395A (ko) * 2009-03-06 2010-09-15 삼성전자주식회사 복수의 프로세서를 포함하는 메모리 시스템
TWI426519B (zh) * 2009-12-29 2014-02-11 Winbond Electronics Corp 記憶體晶片以及其控制方法
US8839057B2 (en) * 2011-02-03 2014-09-16 Arm Limited Integrated circuit and method for testing memory on the integrated circuit
US9508437B2 (en) 2014-01-30 2016-11-29 Sandisk Technologies Llc Pattern breaking in multi-die write management
US9281080B2 (en) * 2014-03-11 2016-03-08 Advantest Corporation Staged buffer caching in a system for testing a device under test
US9690482B2 (en) * 2014-11-03 2017-06-27 Arm Limited Data storage organisation technique
US10810525B1 (en) 2015-05-07 2020-10-20 CSC Holdings, LLC System and method for task-specific GPS-enabled network fault annunciator
US9960951B1 (en) 2016-03-15 2018-05-01 CSC Holdings, LLC System, method, and medium for determining a failure of a network element
CN110161977B (zh) * 2018-02-13 2022-04-12 京元电子股份有限公司 测量系统及其测量方法
CN114566205B (zh) * 2022-03-02 2024-06-21 长鑫存储技术有限公司 存储芯片的测试方法、装置、存储介质与电子设备
US12099424B2 (en) * 2022-11-10 2024-09-24 Intelligent Memory Limited Apparatus, systems, and methods for dynamically reconfigured semiconductor tester for volatile and non-volatile memories
US12321249B2 (en) * 2022-11-10 2025-06-03 Intelligent Memory Limited Systems and methods for reducing error log required space in semiconductor testing
US12374417B2 (en) 2022-11-10 2025-07-29 Intelligent Memory Limited Apparatus, systems, and methods for dynamically reconfigured semiconductor tester for volatile and non-volatile memories

Family Cites Families (9)

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JPH04119600A (ja) * 1990-09-10 1992-04-21 Mitsubishi Electric Corp テストモード機能内蔵ダイナミックランダムアクセスメモリ装置
US5896551A (en) * 1994-04-15 1999-04-20 Micron Technology, Inc. Initializing and reprogramming circuitry for state independent memory array burst operations control
KR100284987B1 (ko) 1994-12-23 2001-03-15 로데릭 더블류 루이스 버스트 edo 메모리 장치 어드레스 카운터
JP3654608B2 (ja) * 1995-04-27 2005-06-02 株式会社日立製作所 同期式ｄｒａｍからなるメモリに適したアドレス割り付けとアドレスロック機能を有するプロセッサシステム
JP3547059B2 (ja) * 1995-06-30 2004-07-28 株式会社アドバンテスト 半導体メモリ試験方法およびこの方法を実施する装置
TW338106B (en) * 1996-03-29 1998-08-11 Adoban Test Kk Semiconductor memory testing apparatus
JP3700797B2 (ja) * 1996-08-09 2005-09-28 株式会社アドバンテスト メモリ試験装置
JPH10269799A (ja) 1997-03-19 1998-10-09 Advantest Corp 半導体メモリ試験装置
KR100308621B1 (ko) * 1998-11-19 2001-12-17 윤종용 반도체 메모리 장치를 위한 프로그램 가능한 내장 자기 테스트 시스템

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008300948A (ja) * 2007-05-29 2008-12-11 Sharp Corp データ処理装置
WO2009122700A1 (ja) * 2008-03-30 2009-10-08 株式会社アドバンテスト 試験装置および試験方法
WO2009122699A1 (ja) * 2008-03-30 2009-10-08 株式会社アドバンテスト 試験モジュール、試験装置および試験方法
US7779313B2 (en) 2008-03-30 2010-08-17 Advantest Corporation Testing apparatus and testing method
US8117004B2 (en) 2008-03-30 2012-02-14 Advantest Corporation Testing module, testing apparatus and testing method
JP5279816B2 (ja) * 2008-03-30 2013-09-04 株式会社アドバンテスト 試験モジュール、試験装置および試験方法
JP5279817B2 (ja) * 2008-03-30 2013-09-04 株式会社アドバンテスト 試験装置および試験方法
WO2009122701A1 (ja) * 2008-03-31 2009-10-08 株式会社アドバンテスト 試験モジュール、試験装置および試験方法
US8010851B2 (en) 2008-03-31 2011-08-30 Advantest Corporation Testing module, testing apparatus and testing method
JP5279818B2 (ja) * 2008-03-31 2013-09-04 株式会社アドバンテスト 試験モジュール、試験装置および試験方法
TWI410977B (zh) * 2008-03-31 2013-10-01 Advantest Corp 測試模組、測試裝置與測試方法

Also Published As

Publication number Publication date
EP1193716B1 (en) 2005-06-08
DE60111324D1 (de) 2005-07-14
TW559821B (en) 2003-11-01
EP1193716A1 (en) 2002-04-03
DE60111324T2 (de) 2006-05-18
KR100786418B1 (ko) 2007-12-17
US6320812B1 (en) 2001-11-20
KR20020022618A (ko) 2002-03-27

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