JP2002110081A5 - - Google Patents

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Publication number
JP2002110081A5
JP2002110081A5 JP2001175747A JP2001175747A JP2002110081A5 JP 2002110081 A5 JP2002110081 A5 JP 2002110081A5 JP 2001175747 A JP2001175747 A JP 2001175747A JP 2001175747 A JP2001175747 A JP 2001175747A JP 2002110081 A5 JP2002110081 A5 JP 2002110081A5
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JP
Japan
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JP2001175747A
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Japanese (ja)
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JP4588925B2 (ja
JP2002110081A (ja
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Priority claimed from GB0014062A external-priority patent/GB0014062D0/en
Priority claimed from GB0101048A external-priority patent/GB0101048D0/en
Priority claimed from GB0105227A external-priority patent/GB2364168B/en
Application filed filed Critical
Publication of JP2002110081A publication Critical patent/JP2002110081A/ja
Publication of JP2002110081A5 publication Critical patent/JP2002110081A5/ja
Application granted granted Critical
Publication of JP4588925B2 publication Critical patent/JP4588925B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2001175747A 2000-06-09 2001-06-11 質量分析方法および装置 Expired - Lifetime JP4588925B2 (ja)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
GB0014062A GB0014062D0 (en) 2000-06-09 2000-06-09 Methods and apparatus for tandem mass spectrometry
GB0101048A GB0101048D0 (en) 2001-01-15 2001-01-15 Methods and apparatus for tandem mass spectrometry
GB0101048.7 2001-03-02
GB0105227.3 2001-03-02
GB0105227A GB2364168B (en) 2000-06-09 2001-03-02 Methods and apparatus for mass spectrometry
GB0014062.4 2001-03-02

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2009141208A Division JP5154511B2 (ja) 2000-06-09 2009-06-12 質量分析のための方法および装置

Publications (3)

Publication Number Publication Date
JP2002110081A JP2002110081A (ja) 2002-04-12
JP2002110081A5 true JP2002110081A5 (OSRAM) 2008-07-24
JP4588925B2 JP4588925B2 (ja) 2010-12-01

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Family Applications (2)

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JP2001175716A Pending JP2002100318A (ja) 2000-06-09 2001-06-11 質量分析方法および装置
JP2001175747A Expired - Lifetime JP4588925B2 (ja) 2000-06-09 2001-06-11 質量分析方法および装置

Family Applications Before (1)

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JP2001175716A Pending JP2002100318A (ja) 2000-06-09 2001-06-11 質量分析方法および装置

Country Status (7)

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US (1) US6717130B2 (OSRAM)
EP (4) EP1220290B1 (OSRAM)
JP (2) JP2002100318A (OSRAM)
AT (2) ATE329369T1 (OSRAM)
CA (2) CA2340150C (OSRAM)
DE (2) DE60120337T2 (OSRAM)
GB (1) GB2363249B (OSRAM)

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