JP2001195900A5 - - Google Patents

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Publication number
JP2001195900A5
JP2001195900A5 JP2000007764A JP2000007764A JP2001195900A5 JP 2001195900 A5 JP2001195900 A5 JP 2001195900A5 JP 2000007764 A JP2000007764 A JP 2000007764A JP 2000007764 A JP2000007764 A JP 2000007764A JP 2001195900 A5 JP2001195900 A5 JP 2001195900A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000007764A
Other versions
JP2001195900A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2000007764A priority Critical patent/JP2001195900A/ja
Priority claimed from JP2000007764A external-priority patent/JP2001195900A/ja
Priority to TW089122231A priority patent/TW480484B/zh
Priority to US09/694,485 priority patent/US6259640B1/en
Priority to KR10-2000-0063179A priority patent/KR100383007B1/ko
Publication of JP2001195900A publication Critical patent/JP2001195900A/ja
Publication of JP2001195900A5 publication Critical patent/JP2001195900A5/ja
Pending legal-status Critical Current

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JP2000007764A 2000-01-17 2000-01-17 半導体記憶装置 Pending JP2001195900A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2000007764A JP2001195900A (ja) 2000-01-17 2000-01-17 半導体記憶装置
TW089122231A TW480484B (en) 2000-01-17 2000-10-23 Semiconductor storage device
US09/694,485 US6259640B1 (en) 2000-01-17 2000-10-24 Semiconductor storage device having a delayed sense amplifier activating signal during a test mode
KR10-2000-0063179A KR100383007B1 (ko) 2000-01-17 2000-10-26 반도체 기억 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000007764A JP2001195900A (ja) 2000-01-17 2000-01-17 半導体記憶装置

Publications (2)

Publication Number Publication Date
JP2001195900A JP2001195900A (ja) 2001-07-19
JP2001195900A5 true JP2001195900A5 (ja) 2007-02-01

Family

ID=18536126

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000007764A Pending JP2001195900A (ja) 2000-01-17 2000-01-17 半導体記憶装置

Country Status (4)

Country Link
US (1) US6259640B1 (ja)
JP (1) JP2001195900A (ja)
KR (1) KR100383007B1 (ja)
TW (1) TW480484B (ja)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4400999B2 (ja) 2000-06-29 2010-01-20 株式会社ルネサステクノロジ 半導体記憶装置
JP2002230998A (ja) * 2001-02-01 2002-08-16 Mitsubishi Electric Corp 半導体記憶装置
KR100543911B1 (ko) * 2003-04-29 2006-01-23 주식회사 하이닉스반도체 반도체 테스트 회로
US6992939B2 (en) * 2004-01-26 2006-01-31 Micron Technology, Inc. Method and apparatus for identifying short circuits in an integrated circuit device
JP2005339588A (ja) * 2004-05-24 2005-12-08 Matsushita Electric Ind Co Ltd 半導体記憶装置の検査方法と半導体記憶装置
DE102006007321A1 (de) * 2006-02-16 2007-08-30 Infineon Technologies Ag Integrierte Schaltkreis-Anordnung und Verfahren zum Ermitteln des parasitären ohmschen Widerstands zumindest der Zuleitung zumindest einer Speicherzelle einer integrierten Schaltkreis-Anordnung
JP4899751B2 (ja) 2006-09-27 2012-03-21 富士通セミコンダクター株式会社 半導体メモリおよび半導体メモリの試験方法
JP5490359B2 (ja) * 2007-07-11 2014-05-14 ピーエスフォー ルクスコ エスエイアールエル 半導体記憶装置
KR100965773B1 (ko) * 2008-04-24 2010-06-24 주식회사 하이닉스반도체 메모리소자의 센스앰프제어회로 및 그 제어방법
US7852692B2 (en) * 2008-06-30 2010-12-14 Freescale Semiconductor, Inc. Memory operation testing

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0428084A (ja) 1990-05-23 1992-01-30 Mitsubishi Electric Corp 半導体記憶装置
JPH04356789A (ja) * 1990-07-17 1992-12-10 Nec Corp 半導体メモリ装置
KR0138208B1 (ko) * 1994-12-08 1998-04-28 문정환 반도체 메모리 소자
KR19980034731A (ko) * 1996-11-08 1998-08-05 김영환 반도체 메모리 소자의 스트레스 테스트 장치 및 그 방법
JP3803463B2 (ja) * 1997-07-23 2006-08-02 エルピーダメモリ株式会社 半導体記憶装置
US6163862A (en) * 1997-12-01 2000-12-19 International Business Machines Corporation On-chip test circuit for evaluating an on-chip signal using an external test signal
JPH11328972A (ja) * 1998-05-18 1999-11-30 Mitsubishi Electric Corp 半導体装置、その設計方法およびその検査方法

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