JP2001166704A - Display device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a display device having plural bus lines formed in its display area, in which defects, such as the disconnection and the interlayer short circuit generated in the manufacturing process of the display device can be easily repaired and which becomes a nondefective product. SOLUTION: This display device is constituted so that plural drain bus lines 220 which are divided into groups 5-1 to 5-m are formed in a display area (a) and is constituted so as to have repair wirings 6R whose (n) lines are formed for every group and which cross with the bus lines 220 through insulating films at the outside of the display area (a), second repair wiliness 7R whose (n) lines are formed for every group at a side opposite to the first repair wirings 6R as to the display area (a) and which cross with the bus lines 220 through insulating films at the outside of the display area (a) and third repair wirings 8R being 2×n lines which cross with entire (m×n) lines of the second repair wirings 7R through insulating films.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a display device having a plurality of bus lines formed in a display area, and more particularly, to repairing (repairing) defects such as disconnection and interlayer short-circuit occurring in a manufacturing process of the display device. Display device.

[0002]

2. Description of the Related Art FIG. 4 shows an example of the configuration of an active matrix type liquid crystal display device. The liquid crystal panel is a TFT
TFT substrate 200 on which (thin film transistor) etc. are formed
Substrate 20 on which color filters (CF) and the like are formed
2 with two glass substrates facing each other and a liquid crystal 204 between them.
Are sealed and bonded.

FIG. 5 shows an equivalent circuit of an element formed on a TFT substrate 200. On the TFT substrate 200,
A plurality of gate bus lines 218 extending left and right in the figure are formed in parallel, and a plurality of drain bus lines 220 extending vertically in the figure crossing the gate bus lines 218 are formed in parallel. Each region surrounded by the plurality of gate bus lines 218 and the drain bus lines 220 is a pixel region. T in the pixel area
An FT 222 and a display electrode 224 made of a transparent electrode material are formed. The drain electrode of each TFT 222 is connected to the adjacent drain bus line 220, the gate electrode is connected to the adjacent gate bus line 218, and the source electrode is connected to the display electrode 224. Below the display electrode 224 with respect to the substrate surface, a storage capacitor bus line 226 is formed in parallel with the gate bus line 218. These TFT 222 and each bus line 218, 220, 226
Is formed by a photolithography process, and is formed by repeating a series of semiconductor processes of “film formation → resist coating → exposure → development → etching → resist stripping”.

[0004] Returning to FIG. 4, the TFT substrate 200, which seals the liquid crystal 204 and faces the CF substrate 202, has a gate driving circuit 206 on which a driver IC for driving a plurality of gate bus lines 218 is mounted. A drain drive circuit 208 on which a driver IC for driving the plurality of drain bus lines 220 is mounted is provided. These drive circuits 206 and 208 send a scanning signal or a data signal to a predetermined gate bus line 218 or a drain bus line 2 based on a predetermined signal output from the control circuit 216.
20 is output. A polarizing plate 212 is arranged on the substrate surface of the TFT substrate 200 opposite to the element forming surface, and a backlight unit 214 is mounted on the surface of the polarizing plate 212 opposite to the TFT substrate 200. On the other hand, on the surface of the CF substrate 202 opposite to the CF forming surface, a polarizing plate 210 arranged in crossed Nicols with the polarizing plate 212 is attached.

The structure of the TFT 222 includes an inverted stagger type in which a source / drain electrode is formed above a gate electrode with respect to a substrate surface, a staggered type or a planar type in which a gate electrode is formed above a source / drain electrode, and the like. is there. FIG.
1 shows a schematic configuration of a pixel region having a typical inverted staggered TFT. FIG. 6A illustrates a pixel region viewed toward the substrate surface, and FIG. 6B illustrates a pixel region AA of FIG.
The cross section of the TFT cut by a line is shown. FIG.
(C) shows a cross section of an intersection region of the gate bus line 218 (or the storage capacitor bus line 226) and the drain bus line cut along the line BB in FIG. 6 (a).

As shown in FIG. 6, the TFT 222 is formed near the intersection of the gate bus line 218 and the drain bus line 220. The drain electrode 230 of the TFT 222 is drawn out from the drain bus line 220, and its end is formed on the gate bus line 218 with an operating semiconductor layer 232 made of amorphous silicon (a-Si) or polysilicon, and formed thereon. The channel protection film 242 is formed so as to be located on one end side.

On the other hand, the source electrode 228 is
32 and the other side of the channel protective film 242. In such a configuration, the region of the gate bus line 218 immediately below the channel protective film 242 functions as the gate electrode of the TFT 222.

Further, as shown in FIG. 6B, a gate insulating film 240 is formed on the gate bus line 218,
The operating semiconductor layer 232 constituting the channel is formed on the gate insulating film 240 immediately above the gate bus line 218. Further, an auxiliary capacitance bus line 226 is formed which extends right and left substantially in the center of the pixel region. On the upper layer of the auxiliary capacitance bus line 226, a storage capacitance electrode 236 is formed for each pixel via an insulating film 240. A pixel electrode 224 made of a transparent electrode is formed on the source electrode 228 and the storage capacitor electrode 236. The pixel electrode 224 is electrically connected to the source electrode 228 via a contact hole 234 provided in a protective film 244 formed thereunder. In addition, the pixel electrode 224 is
It is electrically connected to the storage capacitor electrode 236 via.

The TFT structure described above is an inverted staggered type. For example, in a staggered type or a planar type, the drain electrode is provided in the lowermost layer, and the gate electrode is provided in an upper portion thereof. Regardless of the structure, it should be noted here that each metal layer is stacked with an insulating film intersecting.

FIG. 7 shows a conventional repair method when a short circuit occurs between metal layers for some reason. FIG. 7 (a)
Represents a pixel area viewed toward the substrate surface, and FIG.
Shows a cross section taken along the line AA in FIG. FIG. 8 shows the repair wiring formed on the TFT substrate 200. Here, components having the same functions and operations as those described with reference to FIGS. 4 to 6 are denoted by the same reference numerals, and description thereof will be omitted.

FIGS. 7A and 7B show a state in which the storage capacitor bus line 226 and the drain bus line 220 penetrate the gate insulating film 240 to cause an interlayer short circuit 290. When the interlayer short circuit 290 is present, a predetermined voltage is not applied to the drain bus line 220, so that a linear display defect occurs. Repair using a laser is performed to repair the display defect.

This repair method firstly involves a cutting position 3 between the drain electrode 230 of the defective pixel and the interlayer short circuit 290.
The 00 drain bus line 220 is cut by laser light irradiation. Second, the drain bus line 220 at the cutting position 301 between the interlayer short circuit 290 and the drain electrode 230 of the next pixel is cut by laser light irradiation. Thereby, the short-circuit portion of the interlayer short-circuit 290 is isolated.

Third, as shown in FIG. 8, a drain drive circuit is connected to the cut drain bus line 220 by using spare wirings (repair wirings) 302 and 303 provided in advance on the TFT substrate 200 for repair. A predetermined voltage from 208 is applied.

A plurality of drain bus lines 220 formed in parallel and at equal intervals in the display area (a) shown in FIG.
AB (Tape Automated Bondin)
g) The mounting of the driver IC by FPC (Flexible)
e Printed Circuit)
It is connected to a CP (Tape Carrier Package).

The repair wiring 302 is formed so as to intersect with a plurality of drain bus lines 220 via an insulating film at the end of the display area (a) on the side of the drain drive circuit 208, and to lead out with the plurality of drain bus lines 220. Through the portion (b), the terminal portion (c) is connected to the TCP. The repair wiring 302 is formed using a metal for forming the gate bus line 218, and is normally insulated from the drain bus line 220 by the insulating film 240.

When a defect occurs due to an interlayer short circuit 290 in a certain drain bus line 220, a laser beam is applied to an intersection region 304 between the drain bus line 220 and the repair wiring 302 to melt and connect both wiring metals to establish conduction. Take.

The repair wiring 302 is connected from the gate drive circuit 206 side to the repair wiring 303 on the non-mounting side of the drive circuit through the printed circuit board 250. The repair wiring 303 on the non-mounting side of the drive circuit is also formed using the metal for forming the gate bus line 218, and is formed to intersect the plurality of drain bus lines 220 via the insulating film 240. At the time of repair, the intersection region 3 between the drain bus line 220 causing the interlayer short circuit 290 and the repair wiring 302
By irradiating the laser beam to the laser beam 04 and also irradiating the laser beam to the intersection region 305 between the drain bus line 220 and the repair wiring 303, the two are fused and connected to establish electrical continuity. In this manner, a predetermined voltage is applied to the drain bus line 220 from which the short-circuit portion of the interlayer short-circuit 290 has been cut from the opposite side of the drain drive circuit 208 to perform repair to prevent the occurrence of linear display defects. Will be

FIG. 9 shows n repair wirings R for the entire panel.
FIG. 11 is a schematic diagram showing an example of an arrangement relationship of repair wirings R1 to Rn in a conventional liquid crystal display device having 1 to Rn. T
A plurality of gate bus lines (not shown) are arranged on the FT substrate 200 in parallel with each other, and a drain bus line 220 is arranged orthogonal to the gate bus lines via an insulating film. The drain bus line 220 is connected to TA
M groups 5 bundled for each group connected to B
-1 to 5-m.

In the lead-out wiring portion (b) outside the display area (a), n (= 2 × m) first repair wirings 6R
1 to 6Rn are connected to the drain bus line 220 via the insulating film.
Are arranged so as to be orthogonal to. For example, group 5
In FIG. 1, the extraction wiring portion (b) outside the display area (a)
, Two first repair wirings 6R1, 6
R2 is arranged so as to be orthogonal to the drain bus line 220 via the insulating film. Similarly, each group 5
In each of -1 to 5-m, two first repair wirings 6R (2i-1) and 6R2i (i is an integer and 1 ≦ i ≦
m) is arranged so as to be orthogonal to the drain bus line 220 via the insulating film.

On the other hand, in the display area (a), n (= 2 × 2 ×)
m) The second repair wirings 7R1 to 7Rn are arranged so as to be orthogonal to the drain bus lines 220 via an insulating film. The second repair wirings 7R1 to 7Rn are disposed so as to be orthogonal to any one of the drain bus lines 220 of the groups 5-1 to 5-m every two lines.

FIG. 10 shows another arrangement relationship of the repair lines R1 to Rn in the conventional liquid crystal display device having n repair lines R1 to Rn in the entire panel. The first difference from the conventional example shown in FIG.
The first repair wiring 6R (for example, the group 5-1) formed two in each of the extraction wiring portions (b) 1 to 5-m.
6R1 and 6R2) are arranged on a straight line orthogonal to the drain bus line 220, and each of the groups 5-1 to 5-m
Are cut and separated at the center of each of the groups 5-1 to 5-m such that the ends of the two first repair wirings 6R face each other substantially at the center.

Further, two second repair wirings 7 are formed in each of the repair portions (d) of the groups 5-1 to 5-m.
R1 to 7Rn (n = 2 × m) are also connected to the drain bus line 2
Each group 5-1 is arranged on a straight line orthogonal to 20.
Each of the groups 5-1 to 5-m is cut and separated so that the ends of the two second repair wirings face each other at substantially the center of the groups 5-1 to 5-m.

Second, the second repair wirings 7R1 to 7Rn
Does not reach the terminal portion at the end of the TFT substrate 200 as in the conventional example shown in FIG.
Repair wirings 8R1 to 8Rm (m = n
/ 2) in that they are arranged orthogonally. The third repair wires 8R1 to 8Rm are group 5
Any one of the two second repair lines 7R
They are arranged so as to be orthogonal to 1 to 7Rn.

Next, FIG. 11 is a schematic diagram showing still another arrangement relationship of the repair wirings R1 to Rn in the conventional liquid crystal display device having n repair wirings R1 to Rn throughout the panel. The first repair wirings 6R1 to 6Rn are the same as the conventional example shown in FIG. 9, and the second repair wirings 7R1 to 7Rn and the third repair wirings 8R1 to 8Rn have the same structure as the conventional example shown in FIG. I have. However, the second repair wirings 7R1 to 7Rn are not separated at the center, and like the first repair wirings 6R1 to 6Rn, the groups 5-1 to 5Rn are not separated.
-M penetrates from one end to the other.

[0025]

According to the conventional repair structure shown in FIG. 9, two repairs are possible for each of the groups 5-1 to 5-m. For example, if m = 8 as the number of groups that are often used at present, the second repair wirings 7R1 to 7R
The number of n is n = 2 × m = 16. However, in order to form such a large number of repair wirings, an increase in the pattern area of the repair portion (d) is inevitable, which is not preferable in the present situation where the greening of the panel is required.

On the other hand, the second repair wirings 7R1 to 7R7
If all of Rn is penetrated to the end of the repair part (d), the second
It is possible to reduce the area of the repair portion (d) by reducing the total number of the repair wirings 7R1 to 7Rn, but this increases the number of intersections between the second repair wirings 7R1 to 7Rn and the drain bus line 220. This is difficult to realize because the load on the drain drive circuit 208 increases due to an increase in the additional capacitance and the display quality deteriorates.

The conventional example shown in FIG. 10 is used in order to suppress an increase in additional capacity, which is a drawback of the conventional example shown in FIG.
In the second repair wiring 7R1 to 7Rn.
Repair wirings 7R1-Rn and third repair wirings 8R1-Rn.
Although it is divided into 8Rm, if one of the groups 5-1 to 5-m is to be repaired,
The number of the third repair wirings 8 is required for the number of groups m,
Again, the pattern area of the repair part (d) increases.

The conventional example shown in FIG. 11 is an improvement of the number of repairs, which is a drawback of the conventional example shown in FIG. 10, and two adjacent groups out of groups 5-1 to 5-m have a maximum of two. Repair is possible. Assuming that the number m of groups is m = 8, the total number of repairable units is eight, which is the same as that of the display device shown in FIG. 10. However, although there are some restrictions, up to two units can be repaired in one group.

However, in any of the repair wiring structures described above, if disconnection defects are concentrated in the same group, it is impossible to repair them. In addition,
The disconnection here involves not only the disconnection of the bus line but also the drain bus disconnection process by repairing the interlayer short-circuit such as the short-circuit between the drain bus line and the gate bus line and the short-circuit between the drain bus line and the storage capacitor bus line. The accompanying ones are also included.

An object of the present invention is to provide a display device capable of easily repairing defects such as disconnection or interlayer short-circuit occurring in a manufacturing process of the display device and improving the quality of the display device.

[0031]

SUMMARY OF THE INVENTION It is an object of the present invention to provide a display device in which a plurality of bus lines divided into m groups are formed in a display area. A first repair wiring that intersects via an insulating film outside the display area, and n pieces of each of the groups formed on the display area on the opposite side of the first repair wiring, and the bus line and the display area outside the display area. A second repair wire crossing via the insulating film, and 2 × n third repair wires crossing via the insulating film with all (m × n) second repair wires. This is achieved by a display device characterized by having a display device.

In the display device of the present invention, each group includes 2 × 2 × n fourth repair wirings intersecting with the first repair wirings via the insulating film. .

[0033]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A display device according to an embodiment of the present invention will be described with reference to FIGS. First, a schematic configuration of the display device according to the present embodiment will be described with reference to FIG. In the present embodiment, components having the same functions and functions as those shown in FIGS. 4 to 11 described in the related art are denoted by the same reference numerals, and description thereof will be omitted.

FIG. 1 is a schematic diagram showing an arrangement relationship of repair wirings of the liquid crystal display device according to the present embodiment. TFT
A plurality of gate bus lines (not shown) are arranged on the substrate 200 in parallel with each other, and a drain bus line 220 is arranged orthogonal to the gate bus lines via an insulating film. Drain bus line 220 is TAB
M groups 5 bundled for each connected group
It is divided into 1 to 5-m.

In the lead wiring portion (b) outside the display area (a), n groups are arranged for each of the groups 5-1 to 5-m, and x groups are arranged in the entire groups 5-1 to 5-m. First repair wirings 6R1 to 6Rx (x = n × m) are arranged. In FIG. 1, the first repair wiring 6R is a group 5-1.
The case where three (n = 3) are arranged for every .about.5-m is illustrated. For example, in the group 5-1 the display area (a)
The first repair wirings 6R1, 6R2, and 6R3 arranged substantially in parallel in the lead-out wiring portion (b) outside are arranged so as to be orthogonal to the drain bus lines 220 of the group 5-1 via an insulating film. ing. Similarly, group 5
In each of −2 to 5-m, three first repair wires 6R (3i-2), 6R (3i-1), and 6R3i
(I is an integer and 1 ≦ i ≦ m) are arranged so as to be orthogonal to the drain bus lines 220 in the group via the insulating film.

The three first repair wirings 6R arranged in each group are formed in a “U-shape”, respectively.
The connection wirings 6Rxa and 6Rxb are drawn out from both ends of the “U-shape” through the drawing wiring part (b) to the terminal part (c), and are formed so as to be TAB-connected with the drain bus lines 220 in the group. Have been.

In the TAB connection, groups 5-1 to 5
The -m connection wires 6R (3i-2) a of the m first repair wires 6R (3i-2) are commonly connected to each other and connected to a third repair wire 8R1 described later, and the connection wires 6R ( 3
i-2) b are commonly connected to each other to form a third repair wiring 8R
6 is connected. Similarly, groups 5-1 to 5
The -m connection wires 6R (3i-1) a of the m first repair wires 6R (3i-1) are commonly connected to each other and connected to the third repair wire 8R2, and the connection wires 6R (3i-
1) b is commonly connected and connected to a third repair wiring 8R5. Further, similarly, groups 5-1 to 5-1
The 5-m connection wires 6R3ia of the m first repair wires 6R3i are commonly connected to each other to form a third repair wire 8R.
3 and the connection wirings 6R3ib are commonly connected to each other and connected to a third repair wiring 8R4.

On the other hand, in the display area (a), the repair part (d) on the opposite side to the lead-out wiring part (b) has a group 5
N groups are arranged every −1 to 5-m, and groups 5-1 to 5-m are arranged.
m, x second repair wirings 7R1 to 7Rx (x = 2
nxm). FIG. 1 illustrates a case where three (n = 3) are arranged for each of the groups 5-1 to 5-m in correspondence with the first repair wiring 6R. The three second repair wirings 7R1, 7R2, 7R3 arranged substantially in parallel in the repair part (d) are connected to the drain bus line 22 of the group 5-1 via an insulating film.
It is arranged to be orthogonal to 0.

Similarly, in each of groups 5-2 to 5-m, three second repair wirings 7R (3i-
2), 7R (3i-1), 7R3i (i is an integer, 1 ≦ i
≦ m) are arranged so as to be orthogonal to the drain bus lines 220 in each group via an insulating film. Each of the three second repair wirings 7R arranged in each group is formed in a “U-shape” in the opposite direction to the first repair wiring 6R.

On the "U-shaped" arms 7a and 7b of each second repair wiring 7R, 2.times.n third repair wirings 8R1 to 8R2n are arranged via an insulating film. FIG. 1 shows six third repair wirings 8R1 to 8R6 corresponding to the number n = 3 of the first and second repair wirings 6R and 7R. The six third repair wirings 8R1 to 8R6 are arranged so as to intersect all the arm portions 7a and 7b of the second repair wirings 7R1 to 7Rx via the insulating film without intersecting with any of the drain bus lines 220. Have been.

Next, a repair operation in the display device according to the present embodiment having the above-described repair wiring structure will be described with reference to FIG. To simplify the explanation,
FIG. 2 illustrates the case where n = 2. That is,
In the lead-out wiring part (b) outside the display area (a), two lines are arranged for each of the groups 5-1 to 5-m.
2m first repair wirings 6R1 to 6R1 to 6m
R2m is arranged. In the case of the group 5-1 as an example, two first repair wirings 6R1 and 6R2 arranged substantially in parallel in the lead-out wiring part (b) outside the display area (a).
Are arranged so as to be orthogonal to the drain bus lines 220 of the group 5-1 via the insulating film.

The first repair wires 6R1 arranged in the group 5-1 are formed in a “U-shape” shape, and are drawn from both ends of the “U-shape” shape through the lead-out wiring portion (b) and the terminal portion ( The connection wirings 6R1a and 6R1b are drawn out to c),
It is formed so as to be TAB connected with the drain bus line 220 in the group. First repair wiring 6R
Reference numeral 2 denotes a connection wiring 6R2a formed in a “U-shape” inside the first repair wiring 6R1 and extending from both ends of the “U-shape” through the lead-out wiring part (b) to the terminal part (c). , 6R
2b is drawn out to be TAB-connected with the drain bus line 220 in the group.

First repair wiring 6R1 of group 5-1
The connection wiring 6R1a is connected to the third repair wiring 8R1, and the connection wiring 6R1b is connected to the third repair wiring 8R4. Similarly, the connection wiring 6R2a of the first repair wiring 6R2 is connected to the third repair wiring 8R2.
And the connection wiring 6R2b is connected to the third repair wiring 8R
3 is connected.

On the other hand, in the repair section (d), the group 5-
Two groups are arranged for every 1 to 5-m, and groups 5-1 to 5-m
A total of 2 m second repair wirings 7R1 to 7R2m are arranged. In the group 5-1, the two second repair wirings 7R1, 7R arranged substantially in parallel in the repair part (d)
2 are arranged so as to be orthogonal to the drain bus lines 220 of the group 5-1 via an insulating film. Each of the two second repair wirings 7R1 and 7R2 arranged in each group is formed in a “U-shape” shape opposite to the first repair wiring 6R.

On the "U" -shaped arms 7a and 7b of each second repair wiring 7R, 2.times.n third repair wirings 8R1 to 8R2n are arranged via an insulating film. FIG. 2 shows four third repair wirings 8R1 to 8R4 corresponding to the number n = 2 of the first and second repair wirings 6R and 7R. The four third repair wires 8R1 to 8R4 are arranged so as to intersect all the arm portions 7a and 7b of the second repair wires 7R1 to 7Rx via the insulating film without intersecting with any of the drain bus lines 220. Have been.

As described above, in the repair wiring structure shown in FIG. 2, there are two first repair wires 6R and two second repair wires 7R in each group 5 and four third repair wires 8R. In the entire display area (a), four disconnection repair processes can be performed.

In FIG. 2, four drain bus lines 2 are continuously arranged on the left side in the display area (a) of the group 5-1.
20a to 200d are disconnection points 10, 11, 1 respectively.
2 and 13 show the state of disconnection. The procedure of the repair process in such a situation will be described below. In FIG. 2, white circles on the repair wiring indicate cut portions, and black circles indicate connection portions.

A. In the first repair wiring 6R, (1) the intersection (short-circuit part) 15 between the leftmost drain bus line 220a and the first repair wiring 6R1 is irradiated with laser light to break the insulating film and The drain bus line 220a separated in the lower layer and the first repair wiring 6R1 are short-circuited and electrically connected. (2) The intersection 16 between the second drain bus line 220b from the left and the first repair wiring 6R1 is irradiated with a laser beam to break the insulating film and separate the upper and lower drain bus lines 220b. The first repair wiring 6R1 is short-circuited and electrically connected. (3) The intersection 17 between the third drain bus line 220c from the left and the first repair wiring 6R2 is irradiated with a laser beam to break the insulating film and separate the upper and lower drain bus lines 220c. The one repair wiring 6R2 is short-circuited and electrically connected. (4) The intersection 18 between the fourth drain bus line 220d from the left and the first repair wiring 6R2 is irradiated with a laser beam to break the insulating film and separate the upper and lower drain bus lines 220d and 220d. The one repair wiring 6R2 is short-circuited and electrically connected. (5) The cutting portion 20 between the intersections 15 and 16 of the first repair wiring 6R1 is irradiated with a laser beam, and the first repair wiring 6
The connection wiring 6R1a side and 6R1b side of R1 are cut and electrically separated. (6) The cutting portion 21 between the intersections 17 and 18 of the first repair wiring 6R2 is irradiated with laser light, and the first repair wiring 6R2 is irradiated with laser light.
The connection wiring 6R2a side and 6R2b side of R2 are cut and electrically separated.

B. In the second repair wiring 7R, (1) the intersection (short-circuit part) 22 between the leftmost drain bus line 220a and the second repair wiring 7R1 is irradiated with laser light to break the insulating film and The drain bus line 220a separated into the lower layer and the second repair wiring 7R1 are short-circuited and electrically connected. (2) The intersection 23 between the second drain bus line 220b from the left and the second repair wiring 7R1 is irradiated with a laser beam to break the insulating film and separate the drain bus line 220a into upper and lower layers. The two repair wirings 7R1 are short-circuited and electrically connected. (3) The intersection 24 between the third drain bus line 220c from the left and the second repair wiring 7R2 is irradiated with a laser beam to break the insulating film and separate the upper and lower drain bus lines 220c. The two repair wirings 7R2 are short-circuited and electrically connected. (4) The intersection 25 between the fourth drain bus line 220d from the left and the second repair wiring 7R2 is irradiated with laser light to break the insulating film and separate the upper and lower drain bus lines 220d and 220d. The two repair wirings 7R2 are short-circuited and electrically connected. (5) The cutting portion 26 between the intersections 22 and 23 of the second repair wiring 7R1 is irradiated with a laser beam, and the second repair wiring 7R1 is irradiated with laser light.
The arm 7a side and 7b side of R1 are cut and electrically separated. (6) The cutting portion 27 between the intersections 24 and 25 of the second repair wiring 7R2 is irradiated with laser light, and the second repair wiring 7R2 is irradiated with laser light.
The arm 7a side and 7b side of R2 are cut and electrically separated.

C. In the third repair wiring 8R, (1) the third repair wiring 8R1 and the second repair wiring 7R
The third repair wiring 8 which has been divided into upper and lower layers by irradiating a laser beam to an intersection (short-circuit part) 28 with
R1 and the arm 7a side of the second repair wiring 7R1 are short-circuited and electrically connected. (2) Third repair wiring 8R2 and second repair wiring 7R
The second repair wiring 8R2, which has been divided into upper and lower layers by irradiating a laser beam to the intersection 29 with
And short-circuit with the arm 7a side of the repair wiring 7R2. (3) Third repair wiring 8R3 and second repair wiring 7R
The third repair wiring 8R3, which has been divided into upper and lower layers by irradiating a laser beam to the intersection 30 with
Of the repair wiring 7R1 on the side of the arm 7b is electrically connected. (4) Third repair wiring 8R4 and second repair wiring 7R
The second repair wiring 8R4, which has been divided into upper and lower layers by irradiating a laser beam to the intersection 31 with
To the arm 7b side of the repair wiring 7R2.

D. Final connection Although not shown, TAB mounting and printed circuit board 25
0 is completed, the connection wirings 6R1a, 6R1b,... Of the first repair wiring 6R in FIG. . . Are electrically connected to the corresponding third repair wirings 8R1 to 8R4. In this manner, repair can be performed even if the four drain bus lines 220 are disconnected in the entire panel.

As described above, according to the repair wiring structure of the display device according to the present embodiment, one first and second repair wiring 6R and 7R are arranged in each of the groups 5, and two The third repair wiring 8R is arranged, so that a maximum of two drain bus lines can be repaired. Accordingly, each group 5 includes the first and second repair wirings 6R,
By arranging n pieces of 7Rs and arranging 2 × n third repair wirings 8R, it becomes possible to repair 2 × n drain bus lines in the entire panel display area.
By adopting this configuration, 2 × n can be achieved in all the display areas (a) without increasing the additional capacity.
The book can be repaired.

Next, the manufacturing yield of the display device according to the present embodiment shown in FIG. 2 will be described in comparison with the conventional display device shown in FIGS. 9 and 10. The yield Yp of the display device based on the defect density Dp of the pattern causing the disconnection of the bus line can be expressed by the following equation.

[0054]

(Equation 1)

Here, A represents the area of the display area (a), and F (i) represents a coefficient depending on the position of the defect. Table 1 shows the value of the coefficient F (i) depending on the position of the defect when repairing of up to four lines is possible in the entire display area (a). If it is assumed that up to four lines can be repaired in the entire display area (a), the conventional display device shown in FIG. 9 can repair two groups in total with two lines per group at maximum, as shown in Table 1. Thus, until i = 2, F
The value of (i) is 1, and becomes smaller than 1 when i = 3 or more.

In the conventional display device shown in FIG. 10, a maximum of one line can be repaired per group, and repair of four groups in total is possible. As shown in Table 1, the value of F (i) is 1 until i = 1. And becomes a value smaller than 1 when i = 2 or more.

On the other hand, in the display device according to the present embodiment shown in FIG. 2, one group can be repaired with four lines per group, and as shown in Table 1, i = 4
Up to this point, the value of F (i) is 1.

The "reference" in Table 1 indicates the position of a defect in the case where repair is possible up to a maximum of eight in the entire display area (a), two in one group, and repair is possible in four groups in total. Is dependent on the coefficient F (i). Even in the “reference” having a large maximum number of repairs, the value of F (i) is 1 up to i = 2 as shown in Table 1. As described above, according to the repair wiring structure shown in FIG. 2 according to the present embodiment, even if the value of i increases in the expression for obtaining yield Yp shown in Expression 1, the coefficient F is higher than that of the other repair wiring structures. It can be seen that since the value of (i) maintains 1 for a long time, a high yield Yp can be obtained.

[0059]

[Table 1]

As is clear from the above description, according to the present embodiment, repairing can be performed for the number of repair wirings with a smaller number of repair wirings irrespective of the location where a disconnection defect occurs, and at the same time, the number of repair wirings can be reduced. An increase in additional capacity due to the arrangement can also be suppressed.

Next, a modification of the display device according to the present embodiment will be described with reference to FIG. The example shown in FIG.
The case where n = 2 will be described in the same manner as described above. In the lead-out wiring section (b) outside the display area (a), two groups 5-1 to 5-m are arranged, and the group 5-1
2 to m first repair wirings 6R1 to 6R1 to 6-m
R2m is arranged. In the case of the group 5-1 as an example, two first repair wirings 6R1 and 6R2 arranged substantially in parallel in the lead-out wiring part (b) outside the display area (a).
Are arranged so as to be orthogonal to the drain bus lines 220 of the group 5-1 via the insulating film. The first repair wiring 6R1 is formed in a “U-shape” shape, and the first repair wiring 6R2 is formed in a “U-shape” inside the first repair wiring 6R1.

[0062] First repair wiring 6 R having a “U” shape
The fourth arm that intersects both arms of the first and sixth R2 via an insulating film.
Repair wiring 9R is formed. In the drawing, 2 × n = 4 fourth repair wires 9R1a to 9R4a intersect the left arm of the first repair wires 6R1 and 6R2 via an insulating film. The fourth repair wirings 9R1a to 9R4a are connected to connection wirings 6R1a to 6R4a formed in the terminal portion (c), respectively. Connection wiring 6R1a to 6R4a
Is TAB together with the drain bus line 220 in the group.
It is formed to be connected.

Similarly, the first repair wirings 6R1, 6R2
In the right arm portion, 2 × n = 4 fourth repair wirings 9R1
b to 9R4b are arranged. Fourth repair wiring 9R
1b to 9R4b are connection wires 6 formed in the terminal portion (c).
R1b to R6b. The connection wirings 6R1b to 6R4b are formed so as to be TAB connected together with the drain bus lines 220 in the group.
In the example of the group 5-1, the connection wires 6R1a to 6R
4a are connected to the third repair wires 8R1 to 8R4, respectively, and are connected to the connection wires 6R1b to 6R4b.
Are also connected to the third repair wirings 8R1 to 8R4, respectively.

The second repair wirings 7R1 to 7R2m and the third repair wiring 8R formed in the repair section (d)
1 to 8R4 are the same as the arrangement configuration shown in FIG.

As described above, in the repair wiring structure shown in FIG. 3, there are two first repair wirings 6R and two second repair wirings 7R in each group 5 and four third repair wirings 8R. In the entire display area (a), four disconnection repair processes can be performed. Further, the first repair wiring 6R does not extend to the TAB terminal portion, but intersects the fourth repair wiring 9R via an insulating film. The number of the first repair wires 6R is 2 / group, whereas the number of the fourth repair wires 9R is 4 × 2 / group.

With such a repair wiring structure, the additional capacitance at the intersection of the wiring can be further reduced. For example, in FIG. 3, two drain bus lines 2 are continuously arranged on the left side in the display area (a) of the group 5-1.
20a and 200b are disconnected at disconnection locations 10 and 11, respectively, and two drain bus lines 220c and 200d are continuously disconnected at disconnection locations 12 and 13 on the left side in the display area (a) of the group 5-2. It shows the state where it is. The procedure of the repair process in such a situation will be described below. Note that, in FIG. 3, white circles on the repair wiring indicate cut portions, and black circles indicate connection portions.

A. In the first repair wiring 6R, (1) the intersection 15 (short-circuit portion) between the drain bus line 220a and the first repair wiring 6R1 is irradiated with a laser beam, so that the drain bus line 220a and the first repair wiring 6
R1 is short-circuited and electrically connected. (2) The intersection 16 between the drain bus line 220b and the first repair wiring 6R2 is irradiated with a laser beam, and the drain bus line 220b and the first repair wiring 6R1 are short-circuited and electrically connected. (3) The intersection 33 between the drain bus line 220c and the first repair wiring 6R1 of the group 5-2 is irradiated with a laser beam to short-circuit the drain bus line 220c and the first repair wiring 6R1, thereby electrically connecting the first repair wiring 6R1. Connect to (4) The intersection 34 between the drain bus line 220d and the first repair wiring 6R2 of the group 5-2 is irradiated with laser light, and the drain bus line 220d and the first repair wiring 6R2 are short-circuited and electrically connected. Connect to (5) The intersection 35 between the first repair wiring 6R1 of the group 5-1 and the fourth repair wiring 9R1a is irradiated with laser light, and the first repair wiring 6R1 and the fourth repair wiring 9 are radiated.
R1a is short-circuited and electrically connected. (6) The intersection 36 between the first repair wire 6R2 of the group 5-1 and the fourth repair wire 9R2a is irradiated with a laser beam, and the first repair wire 6R12 and the fourth repair wire 9 are radiated.
R2a is short-circuited and electrically connected. (7) The intersection 37 between the first repair wiring 6R1 and the fourth repair wiring 9R3a of the group 5-2 is irradiated with laser light, and the first repair wiring 6R1 and the fourth repair wiring 9 are radiated.
R3a is short-circuited and electrically connected. (8) The intersection 38 between the first repair wiring 6R2 of the group 5-2 and the fourth repair wiring 9R4a is irradiated with laser light, and the first repair wiring 6R2 and the fourth repair wiring 9 are radiated.
R4a is short-circuited and electrically connected. (9) A laser beam is applied to the cut portion 20 on the right side near the intersection 15 of the first repair wires 6R1 of the group 5-1 to cut the first repair wires 6R1 into two and electrically separate them. . (10) A laser beam is irradiated to the cut portion 21 on the right side near the intersection 16 of the first repair wiring 6R2 of the group 5-1.
The first repair wiring 6R2 is cut into two and electrically separated. (11) A laser beam is irradiated on the cut portion 39 on the right side near the intersection 33 of the first repair wiring 6R1 of the group 5-2,
The first repair wiring 6R1 is cut into two and electrically separated. (12) By irradiating the laser beam to the cut portion 40 on the right side near the intersection 34 of the first repair wiring 6R2 of the group 5-2,
The first repair wiring 6R2 is cut into two and electrically separated.

B. In the second repair wiring 7R, (1) the intersection (short-circuited part) 22 between the drain bus line 220a and the second repair wiring 7R1 is irradiated with laser light, so that the drain bus line 220a and the second repair wiring 7
R1 is short-circuited and electrically connected. (2) The intersection 41 between the drain bus line 220b and the second repair wiring 7R2 is irradiated with laser light, and the drain bus line 220b and the second repair wiring 7R2 are short-circuited and electrically connected. (3) The intersection (short-circuit portion) 42 between the drain bus line 220c and the second repair wiring 7R1 is irradiated with a laser beam, so that the drain bus line 220c and the second repair wiring 7R1 are irradiated.
R1 is short-circuited and electrically connected. (4) The intersection 43 between the drain bus line 220d and the second repair wiring 7R2 is irradiated with laser light, and the drain bus line 220d and the second repair wiring 7R2 are short-circuited and electrically connected. (5) The cutting portion 26 on the right side near the intersection 22 of the second repair wiring 7R1 of the group 5-1 is irradiated with laser light to cut the second repair wiring 7R1 into two and electrically separate them. . (6) A laser beam is applied to the cut portion 44 on the right side near the intersection 41 of the second repair wiring 7R2 of the group 5-1 to cut the second repair wiring 7R2 into two and electrically separate them. . (7) The cutting portion 45 on the right side in the vicinity of the intersection 42 of the second repair wiring 7R1 of the group 5-2 is irradiated with laser light to cut the second repair wiring 7R1 into two and electrically separate them. . (8) The cutting portion 46 on the right side near the intersection 43 of the second repair wires 7R2 of the group 5-2 is irradiated with laser light to cut the second repair wires 7R2 into two and electrically separate them. .

C. In the third repair wiring 8R, (1) the third repair wiring 8R1 and the second of the group 5-1
A laser beam is applied to the intersection (short-circuited portion) 28 with the repair wiring 7R1 to short-circuit the third repair wiring 8R1 and the arm 7a side of the second repair wiring 7R1 to be electrically connected. (2) The third repair wiring 8R2 and the second of the group 5-1
A laser beam is applied to the intersection 29 between the third repair wiring 7R2 and the third repair wiring 7R2.
Is short-circuited and electrically connected. (3) The third repair wiring 8R3 and the second of the group 5-2
A laser beam is applied to the intersection 30 between the third repair wiring 7R1 and the third repair wiring 7R1.
Is short-circuited and electrically connected. (4) The third repair wiring 8R4 and the second of the group 5-2
A laser beam is applied to an intersection 31 between the third repair wiring 7R2 and the third repair wiring 7R2.
Is short-circuited and electrically connected.

D. Final connection Although not shown, TAB mounting and printed circuit board 25
0 is completed, the connection wirings 6R1a, 6R1b,... Of the first repair wiring 6R in FIG. . . Are electrically connected to the corresponding third repair wirings 8R1 to 8R4. In this manner, repair can be performed even if the four drain bus lines 220 are disconnected in the entire panel.

In this repair process, as shown in FIG. 3, when the left two drain bus lines 220a to 220d of the groups 5-1 and 5-2 are disconnected,
In the repair wiring structure shown in FIG.
Wiring 6R1a for the repair wirings 6R1 and 6R2
If 6R2a are used, the connection wirings 6R1b and 6R2b must be used in the group 5-2. Since the first repair wires 6R1 and 6R2 connected to the connection wires 6R1b and 6R2b respectively extend from the rightmost side in the group in the figure, the plurality of drain bus lines 2
20 and the additional capacity increases.

On the other hand, in the case of the repair wiring structure shown in FIG. 3 of the present modified example, even in the group 5-2, the fourth repair wiring 6R1 and 6R2 close to the disconnection point are used by using the left side. It can be connected to the connection wirings 6R3a, 6R4a via the repair wirings 9R3a, 9R4a. Therefore, the intersection with the plurality of drain bus lines 220 can be reduced, and an increase in the additional capacitance can be suppressed.

As described above, according to the display device of the present embodiment, the first repair wiring and the second repair wiring are cut off during the repair processing, and as a result, the number of wirings is doubled. Therefore, more repair processing can be performed with a smaller number of wires, and the yield of the display device can be improved.

The present invention is not limited to the above embodiment, and various modifications are possible. For example, in the above embodiment, the TFT
Has been described as an example of an active matrix type liquid crystal display device using a switching element as a switching element. However, the present invention is not limited to this, and other display devices such as a diode element (MI
M) or other active matrix liquid crystal display device using a non-linear element, or a passive liquid crystal display device such as an STN method, or various display devices such as an EL (electroluminescence) display device or a PDP (plasma display device). It is possible to apply to.

[0075]

As described above, according to the present invention, it is possible to easily repair a defect such as a disconnection or an interlayer short-circuit occurring in a manufacturing process of a display device and to obtain a good product.

[Brief description of the drawings]

FIG. 1 is a schematic diagram showing an arrangement relationship of repair wirings R1 to Rn in a display device according to an embodiment of the present invention.

FIG. 2 is a diagram illustrating a repair method using repair lines R1 to Rn in the display device according to the embodiment of the present invention.

FIG. 3 is a schematic diagram showing another arrangement relationship and repair method of the repair wirings R1 to Rn in the display device according to the embodiment of the present invention.

FIG. 4 is a diagram showing a schematic configuration of a liquid crystal display device.

FIG. 5 is a diagram illustrating an equivalent circuit of an element unit of the liquid crystal display device.

FIG. 6 is a diagram illustrating a schematic configuration of an element unit of the liquid crystal display device.

FIG. 7 is a diagram showing a conventional repair method in a liquid crystal display device.

FIG. 8 is a diagram showing a conventional repair method in a liquid crystal display device.

FIG. 9 is a schematic diagram showing an arrangement relationship of repair wires R1 to Rn in a conventional liquid crystal display device having n repair wires R1 to Rn.

FIG. 10 is a schematic diagram showing another arrangement relationship of the repair wirings R1 to Rn in a conventional liquid crystal display device having n repair wirings R1 to Rn.

FIG. 11 is a schematic diagram showing still another arrangement relationship of the repair wirings R1 to Rn in a conventional liquid crystal display device having n repair wirings R1 to Rn.

[Explanation of symbols]

5-1 to 5-mm Group of drain bus lines 220 divided into m 6R 1st repair wiring 7R 2nd repair wiring 8R 3rd repair wiring 9R 4th repair wiring 10-13 Drain bus line 220 15 to 18 Intersection (short-circuit portion) between the drain bus line 220 and the first repair wiring 6R 20, 21 Cutting part of the first repair wiring 6R 22 to 25 Drain bus line 220 and the second repair wiring Intersection with 7R (short circuit) 26, 27 Cut section of second repair wiring 7R 28-31 Intersection (short circuit) of second repair wiring 7R and third repair wiring 8R 33, 34 Drain bus Line 220 and group 5-
Intersecting portions (short-circuit portions) of the second repair wiring 6R with the first repair wiring 6R.
200 TFT substrate 202 CF substrate 204 Liquid crystal 206 Gate drive circuit 208 Drain drive circuit 210, 212 Polarizing plate 214 Backlight unit 216 Control circuit 218 Gate bus line 220 Drain bus line 224 Pixel Electrode 226 Storage capacitor bus line 228 Source electrode 230 Drain electrode 232 Operating semiconductor layer 234, 238 Contact hole 236 Storage capacitor electrode 240 Gate insulating film 242 Channel protective film 244 Protective film 290 Interlayer short circuit 300, 301 Cutting position 302, 303 Repair wiring 304 , 305 intersection area

 ──────────────────────────────────────────────────続 き Continued on front page F-term (reference) 2H092 JA24 JA26 JA29 JA38 JB13 JB23 JB32 JB57 JB63 JB69 JB72 JB73 JB74 JB77 MA47 NA25 NA27 NA29 NA30 PA06 5C094 AA32 AA42 AA43 BA03 BA43 CA19 DA15 EA10 5G435 AA17 CC

Claims (2)

[Claims] 1. A display device in which a plurality of bus lines divided into m groups are formed in a display area, wherein n bus lines are formed for each group, and an insulating film is formed outside the bus lines and the display area. A first repair wire that intersects with each other, and n lines are formed for each of the groups on the opposite side of the first repair wire with respect to the display area, and intersect with the bus line outside the display area via the insulating film. A display device, comprising: a second repair wiring to be formed; and 2 × n third repair wirings intersecting all of the second repair wirings (m × n) via the insulating film. . 2. The display device according to claim 1, wherein each group includes 2 × 2 × n fourth repair wires intersecting with the first repair wires via the insulating film. Characteristic display device.