JP2000322282A - マイクロコンピュータ - Google Patents

マイクロコンピュータ

Info

Publication number
JP2000322282A
JP2000322282A JP11132685A JP13268599A JP2000322282A JP 2000322282 A JP2000322282 A JP 2000322282A JP 11132685 A JP11132685 A JP 11132685A JP 13268599 A JP13268599 A JP 13268599A JP 2000322282 A JP2000322282 A JP 2000322282A
Authority
JP
Japan
Prior art keywords
reset
address
circuit
evaluation program
selection signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11132685A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000322282A5 (enExample
Inventor
Takashi Uchiumi
崇 内海
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP11132685A priority Critical patent/JP2000322282A/ja
Priority to US09/440,056 priority patent/US6493833B1/en
Publication of JP2000322282A publication Critical patent/JP2000322282A/ja
Publication of JP2000322282A5 publication Critical patent/JP2000322282A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Debugging And Monitoring (AREA)
JP11132685A 1999-05-13 1999-05-13 マイクロコンピュータ Pending JP2000322282A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP11132685A JP2000322282A (ja) 1999-05-13 1999-05-13 マイクロコンピュータ
US09/440,056 US6493833B1 (en) 1999-05-13 1999-11-15 Microcomputer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11132685A JP2000322282A (ja) 1999-05-13 1999-05-13 マイクロコンピュータ

Publications (2)

Publication Number Publication Date
JP2000322282A true JP2000322282A (ja) 2000-11-24
JP2000322282A5 JP2000322282A5 (enExample) 2006-06-15

Family

ID=15087140

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11132685A Pending JP2000322282A (ja) 1999-05-13 1999-05-13 マイクロコンピュータ

Country Status (2)

Country Link
US (1) US6493833B1 (enExample)
JP (1) JP2000322282A (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4437881B2 (ja) * 2001-06-22 2010-03-24 富士通マイクロエレクトロニクス株式会社 デバッグサポートユニットを有するマイクロコントローラ
US7073094B1 (en) * 2002-05-09 2006-07-04 Winbond Electronics Corporation Method and systems for programming and testing an embedded system
JP2004262491A (ja) * 2003-02-28 2004-09-24 Dainippon Printing Co Ltd 包装材料
JP2007310714A (ja) * 2006-05-19 2007-11-29 Seiko Epson Corp 集積回路装置、デバッグツール、デバッグシステム、マイクロコンピュータ及び電子機器
KR102396448B1 (ko) 2017-10-19 2022-05-11 삼성전자주식회사 불휘발성 메모리 장치 및 그것의 동작 방법
US11256605B2 (en) 2017-10-19 2022-02-22 Samsung Electronics Co., Ltd. Nonvolatile memory device

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01201762A (ja) 1988-02-05 1989-08-14 Nec Corp マイクロコンピュータ
US5463766A (en) * 1993-03-22 1995-10-31 Dell Usa, L.P. System and method for loading diagnostics routines from disk
KR100198382B1 (ko) * 1996-05-07 1999-06-15 윤종용 멀티-부팅 기능을 갖는 컴퓨터 장치
JPH10214201A (ja) * 1997-01-29 1998-08-11 Mitsubishi Electric Corp マイクロコンピュータ
JPH11219299A (ja) * 1998-02-02 1999-08-10 Mitsubishi Electric Corp マイクロコンピュータ

Also Published As

Publication number Publication date
US6493833B1 (en) 2002-12-10

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