JP2000117636A - 研磨方法及び研磨システム - Google Patents
研磨方法及び研磨システムInfo
- Publication number
- JP2000117636A JP2000117636A JP29342798A JP29342798A JP2000117636A JP 2000117636 A JP2000117636 A JP 2000117636A JP 29342798 A JP29342798 A JP 29342798A JP 29342798 A JP29342798 A JP 29342798A JP 2000117636 A JP2000117636 A JP 2000117636A
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- slurry
- polishing slurry
- concentration
- supplied
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29342798A JP2000117636A (ja) | 1998-10-15 | 1998-10-15 | 研磨方法及び研磨システム |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29342798A JP2000117636A (ja) | 1998-10-15 | 1998-10-15 | 研磨方法及び研磨システム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2000117636A true JP2000117636A (ja) | 2000-04-25 |
| JP2000117636A5 JP2000117636A5 (enExample) | 2005-09-15 |
Family
ID=17794628
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP29342798A Pending JP2000117636A (ja) | 1998-10-15 | 1998-10-15 | 研磨方法及び研磨システム |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2000117636A (enExample) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003170034A (ja) * | 2001-12-05 | 2003-06-17 | Fujitsu Ltd | 薬液供給装置及びスラリーの調合方法 |
| US7258598B2 (en) | 2000-11-29 | 2007-08-21 | Renesas Technology Corp. | Polishing solution supply system, method of supplying polishing solution, apparatus for and method of polishing semiconductor substrate and method of manufacturing semiconductor device |
| JP2009528162A (ja) * | 2006-03-03 | 2009-08-06 | エアー・リキッド・エレクトロニクス・ユー.エス.・エルピー | 液体ディスペンスシステム |
| JP2011502054A (ja) * | 2007-10-30 | 2011-01-20 | ポール・コーポレーション | 使用済み研磨スラリーを処理するための方法 |
| US8297830B2 (en) | 2009-03-04 | 2012-10-30 | Taiwan Semiconductor Manufacturing Co., Ltd. | Slurry system for semiconductor fabrication |
-
1998
- 1998-10-15 JP JP29342798A patent/JP2000117636A/ja active Pending
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7258598B2 (en) | 2000-11-29 | 2007-08-21 | Renesas Technology Corp. | Polishing solution supply system, method of supplying polishing solution, apparatus for and method of polishing semiconductor substrate and method of manufacturing semiconductor device |
| US7465216B2 (en) | 2000-11-29 | 2008-12-16 | Renesas Technology Corp. | Polishing apparatus |
| US7465221B2 (en) | 2000-11-29 | 2008-12-16 | Renesas Technology Corp. | Polishing apparatus |
| JP2003170034A (ja) * | 2001-12-05 | 2003-06-17 | Fujitsu Ltd | 薬液供給装置及びスラリーの調合方法 |
| JP2009528162A (ja) * | 2006-03-03 | 2009-08-06 | エアー・リキッド・エレクトロニクス・ユー.エス.・エルピー | 液体ディスペンスシステム |
| JP2011502054A (ja) * | 2007-10-30 | 2011-01-20 | ポール・コーポレーション | 使用済み研磨スラリーを処理するための方法 |
| US8940174B2 (en) | 2007-10-30 | 2015-01-27 | Pall Corporation | Method for treating spent abrasive slurry |
| US8297830B2 (en) | 2009-03-04 | 2012-10-30 | Taiwan Semiconductor Manufacturing Co., Ltd. | Slurry system for semiconductor fabrication |
| TWI382465B (zh) * | 2009-03-04 | 2013-01-11 | 台灣積體電路製造股份有限公司 | 研磨液供給系統、使用者可調量測槽及將研磨液混合物供給至化學機械研磨站之方法 |
| US8517802B2 (en) | 2009-03-04 | 2013-08-27 | Taiwan Semiconductor Manufacturing Co., Ltd. | Slurry system for semiconductor fabrication |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050329 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050329 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080424 |
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| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20080916 |