JP2000066133A5 - - Google Patents

Download PDF

Info

Publication number
JP2000066133A5
JP2000066133A5 JP1999135991A JP13599199A JP2000066133A5 JP 2000066133 A5 JP2000066133 A5 JP 2000066133A5 JP 1999135991 A JP1999135991 A JP 1999135991A JP 13599199 A JP13599199 A JP 13599199A JP 2000066133 A5 JP2000066133 A5 JP 2000066133A5
Authority
JP
Japan
Prior art keywords
laser beam
axis direction
adjusting
lenses
pair
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1999135991A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000066133A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP11135991A priority Critical patent/JP2000066133A/ja
Priority claimed from JP11135991A external-priority patent/JP2000066133A/ja
Priority to US09/326,173 priority patent/US6172820B1/en
Publication of JP2000066133A publication Critical patent/JP2000066133A/ja
Publication of JP2000066133A5 publication Critical patent/JP2000066133A5/ja
Pending legal-status Critical Current

Links

JP11135991A 1998-06-08 1999-05-17 レ―ザ―光照射装置 Pending JP2000066133A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP11135991A JP2000066133A (ja) 1998-06-08 1999-05-17 レ―ザ―光照射装置
US09/326,173 US6172820B1 (en) 1998-06-08 1999-06-04 Laser irradiation device

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP15913398 1998-06-08
JP10-159133 1998-06-08
JP11135991A JP2000066133A (ja) 1998-06-08 1999-05-17 レ―ザ―光照射装置

Publications (2)

Publication Number Publication Date
JP2000066133A JP2000066133A (ja) 2000-03-03
JP2000066133A5 true JP2000066133A5 (enExample) 2006-06-29

Family

ID=26469693

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11135991A Pending JP2000066133A (ja) 1998-06-08 1999-05-17 レ―ザ―光照射装置

Country Status (2)

Country Link
US (1) US6172820B1 (enExample)
JP (1) JP2000066133A (enExample)

Families Citing this family (68)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6555449B1 (en) * 1996-05-28 2003-04-29 Trustees Of Columbia University In The City Of New York Methods for producing uniform large-grained and grain boundary location manipulated polycrystalline thin film semiconductors using sequential lateral solidfication
JP4663047B2 (ja) * 1998-07-13 2011-03-30 株式会社半導体エネルギー研究所 レーザー照射装置及び半導体装置の作製方法
US6393042B1 (en) * 1999-03-08 2002-05-21 Semiconductor Energy Laboratory Co., Ltd. Beam homogenizer and laser irradiation apparatus
US6368945B1 (en) * 2000-03-16 2002-04-09 The Trustees Of Columbia University In The City Of New York Method and system for providing a continuous motion sequential lateral solidification
US6830993B1 (en) * 2000-03-21 2004-12-14 The Trustees Of Columbia University In The City Of New York Surface planarization of thin silicon films during and after processing by the sequential lateral solidification method
USD444800S1 (en) 2000-09-19 2001-07-10 Richard T. Miller Laser wire stripping apparatus case
KR100854834B1 (ko) * 2000-10-10 2008-08-27 더 트러스티스 오브 컬럼비아 유니버시티 인 더 시티 오브 뉴욕 얇은 금속층을 가공하는 방법 및 장치
JP4583709B2 (ja) * 2000-11-27 2010-11-17 ザ・トラスティーズ・オブ・コロンビア・ユニバーシティ・イン・ザ・シティ・オブ・ニューヨーク 基板上の半導体膜領域のレーザー結晶化処理のための方法及びマスク投影装置
MY127193A (en) * 2000-12-26 2006-11-30 Semiconductor Energy Lab Laser irradiation apparatus and method of laser irradiation
US6955956B2 (en) * 2000-12-26 2005-10-18 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing a semiconductor device
JP4837170B2 (ja) * 2001-01-12 2011-12-14 株式会社Ihi レーザアニール方法及び装置
US6770546B2 (en) * 2001-07-30 2004-08-03 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing semiconductor device
CN1330797C (zh) * 2001-08-27 2007-08-08 纽约市哥伦比亚大学托管会 通过对相对于沟道区域的微结构的自觉偏移提高多晶薄膜晶体管器件之间均匀性的方法
SG143981A1 (en) * 2001-08-31 2008-07-29 Semiconductor Energy Lab Laser irradiation method, laser irradiation apparatus, and method of manufacturing a semiconductor device
US7105048B2 (en) * 2001-11-30 2006-09-12 Semiconductor Energy Laboratory Co., Ltd. Laser irradiation apparatus
AU2003220611A1 (en) * 2002-04-01 2003-10-20 The Trustees Of Columbia University In The City Of New York Method and system for providing a thin film
WO2004017382A2 (en) * 2002-08-19 2004-02-26 The Trustees Of Columbia University In The City Of New York Process and system for laser crystallization processing of film regions on a substrate to provide substantial uniformity within areas in such regions and edge areas thereof, and a structure of such film regions
KR101118974B1 (ko) * 2002-08-19 2012-03-15 더 트러스티스 오브 콜롬비아 유니버시티 인 더 시티 오브 뉴욕 균일성을 제공하도록 기판 상의 박막 영역을 레이저 결정화처리하는 방법 및 시스템, 그리고 그러한 박막 영역의 구조
US7718517B2 (en) * 2002-08-19 2010-05-18 Im James S Single-shot semiconductor processing system and method having various irradiation patterns
KR101131040B1 (ko) * 2002-08-19 2012-03-30 더 트러스티스 오브 콜롬비아 유니버시티 인 더 시티 오브 뉴욕 에지 영역을 최소화하도록 기판 상의 박막 영역을 레이저결정화 처리하는 방법 및 시스템, 그리고 그러한 박막 영역의 구조
KR20040043251A (ko) * 2002-11-18 2004-05-24 차연선 선형레이져 조사장치
JP4515088B2 (ja) * 2002-12-25 2010-07-28 株式会社半導体エネルギー研究所 半導体装置の作製方法
US7387922B2 (en) * 2003-01-21 2008-06-17 Semiconductor Energy Laboratory Co., Ltd. Laser irradiation method, method for manufacturing semiconductor device, and laser irradiation system
JP5164378B2 (ja) * 2003-02-19 2013-03-21 ザ トラスティーズ オブ コロンビア ユニヴァーシティ イン ザ シティ オブ ニューヨーク 逐次的横方向結晶化技術を用いて結晶化させた複数の半導体薄膜フィルムを処理するシステム及びプロセス
US7164152B2 (en) * 2003-09-16 2007-01-16 The Trustees Of Columbia University In The City Of New York Laser-irradiated thin films having variable thickness
TWI351713B (en) * 2003-09-16 2011-11-01 Univ Columbia Method and system for providing a single-scan, con
US7364952B2 (en) * 2003-09-16 2008-04-29 The Trustees Of Columbia University In The City Of New York Systems and methods for processing thin films
WO2005029551A2 (en) 2003-09-16 2005-03-31 The Trustees Of Columbia University In The City Of New York Processes and systems for laser crystallization processing of film regions on a substrate utilizing a line-type beam, and structures of such film regions
WO2005029548A2 (en) * 2003-09-16 2005-03-31 The Trustees Of Columbia University In The City Of New York System and process for providing multiple beam sequential lateral solidification
WO2005029550A2 (en) * 2003-09-16 2005-03-31 The Trustees Of Columbia University In The City Of New York Method and system for producing crystalline thin films with a uniform crystalline orientation
US7318866B2 (en) 2003-09-16 2008-01-15 The Trustees Of Columbia University In The City Of New York Systems and methods for inducing crystallization of thin films using multiple optical paths
WO2005029546A2 (en) * 2003-09-16 2005-03-31 The Trustees Of Columbia University In The City Of New York Method and system for providing a continuous motion sequential lateral solidification for reducing or eliminating artifacts, and a mask for facilitating such artifact reduction/elimination
WO2005029547A2 (en) * 2003-09-16 2005-03-31 The Trustees Of Columbia University In The City Of New York Enhancing the width of polycrystalline grains with mask
US7311778B2 (en) * 2003-09-19 2007-12-25 The Trustees Of Columbia University In The City Of New York Single scan irradiation for crystallization of thin films
WO2005093801A1 (en) 2004-03-26 2005-10-06 Semiconductor Energy Laboratory Co., Ltd. Laser irradiation method and laser irradiation apparatus
US8525075B2 (en) 2004-05-06 2013-09-03 Semiconductor Energy Laboratory Co., Ltd. Laser irradiation apparatus
US8304313B2 (en) * 2004-08-23 2012-11-06 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and its manufacturing method
US7645337B2 (en) * 2004-11-18 2010-01-12 The Trustees Of Columbia University In The City Of New York Systems and methods for creating crystallographic-orientation controlled poly-silicon films
US8221544B2 (en) * 2005-04-06 2012-07-17 The Trustees Of Columbia University In The City Of New York Line scan sequential lateral solidification of thin films
JP5153086B2 (ja) * 2005-05-02 2013-02-27 株式会社半導体エネルギー研究所 レーザ照射装置
KR101284201B1 (ko) 2005-05-02 2013-07-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 레이저 조사 장치 및 레이저 조사 방법
US20090218577A1 (en) * 2005-08-16 2009-09-03 Im James S High throughput crystallization of thin films
US8598588B2 (en) * 2005-12-05 2013-12-03 The Trustees Of Columbia University In The City Of New York Systems and methods for processing a film, and thin films
WO2007072837A1 (en) * 2005-12-20 2007-06-28 Semiconductor Energy Laboratory Co., Ltd. Laser irradiation apparatus and method for manufacturing semiconductor device
US8614471B2 (en) * 2007-09-21 2013-12-24 The Trustees Of Columbia University In The City Of New York Collections of laterally crystallized semiconductor islands for use in thin film transistors
TWI418037B (zh) 2007-09-25 2013-12-01 Univ Columbia 藉由改變形狀、大小或雷射光束在製造於橫向結晶化薄膜上之薄膜電晶體元件中產生高一致性的方法
WO2009067688A1 (en) 2007-11-21 2009-05-28 The Trustees Of Columbia University In The City Of New York Systems and methods for preparing epitaxially textured polycrystalline films
US8012861B2 (en) 2007-11-21 2011-09-06 The Trustees Of Columbia University In The City Of New York Systems and methods for preparing epitaxially textured polycrystalline films
CN101919058B (zh) * 2007-11-21 2014-01-01 纽约市哥伦比亚大学理事会 用于制备外延纹理厚膜的系统和方法
CN102513701B (zh) 2008-01-07 2015-08-19 株式会社Ihi 激光退火方法以及装置
WO2009111340A2 (en) * 2008-02-29 2009-09-11 The Trustees Of Columbia University In The City Of New York Flash lamp annealing crystallization for large area thin films
JP2011515834A (ja) * 2008-02-29 2011-05-19 ザ トラスティーズ オブ コロンビア ユニヴァーシティ イン ザ シティ オブ ニューヨーク 均一な結晶シリコン薄膜を製造するリソグラフィ方法
JP2011515833A (ja) * 2008-02-29 2011-05-19 ザ トラスティーズ オブ コロンビア ユニヴァーシティ イン ザ シティ オブ ニューヨーク 薄膜のためのフラッシュ光アニーリング
JP5240764B2 (ja) * 2008-05-28 2013-07-17 株式会社日本製鋼所 レーザ光照射装置
WO2009150733A1 (ja) * 2008-06-12 2009-12-17 株式会社Ihi レーザアニール方法及びレーザアニール装置
DE102008029622B4 (de) * 2008-06-23 2018-05-09 Ihi Corporation Laserglühverfahren und Laserglühvorrichtung
WO2010056990A1 (en) 2008-11-14 2010-05-20 The Trustees Of Columbia University In The City Of New York Systems and methods for the crystallization of thin films
KR101116783B1 (ko) 2009-09-16 2012-03-05 주식회사 제이미크론 레이저를 이용한 부분 도금 장치 및 부분 도금 방법
KR101184430B1 (ko) 2009-09-16 2012-09-20 주식회사 제이미크론 도금방지막을 이용한 부분 도금 장치 및 부분 도금 방법
US8440581B2 (en) 2009-11-24 2013-05-14 The Trustees Of Columbia University In The City Of New York Systems and methods for non-periodic pulse sequential lateral solidification
US9646831B2 (en) 2009-11-03 2017-05-09 The Trustees Of Columbia University In The City Of New York Advanced excimer laser annealing for thin films
US9087696B2 (en) 2009-11-03 2015-07-21 The Trustees Of Columbia University In The City Of New York Systems and methods for non-periodic pulse partial melt film processing
KR101288993B1 (ko) * 2011-12-20 2013-08-16 삼성디스플레이 주식회사 레이저 어닐링 장치
JP5717146B2 (ja) * 2012-10-23 2015-05-13 株式会社日本製鋼所 レーザラインビーム改善装置およびレーザ処理装置
EP2966671B1 (en) * 2013-03-07 2022-08-31 Mitsubishi Electric Corporation Laser annealing device, and method of producing semiconductor device
KR102463885B1 (ko) * 2015-10-21 2022-11-07 삼성디스플레이 주식회사 레이저 어닐링 장치 및 이를 이용한 디스플레이 장치 제조방법
KR102446583B1 (ko) * 2016-11-03 2022-09-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 레이저 가공 장치, 적층체의 가공 장치, 및 레이저 가공 방법
EP4107826A4 (en) * 2020-02-19 2024-03-20 Elemental Scientific Lasers, LLC VARIABLE BEAM SIZE VIA A HOMQGENIZER MOVEMENT

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05127077A (ja) 1991-10-31 1993-05-25 Minolta Camera Co Ltd シリンドリカルレンズ系
US5662822A (en) * 1994-10-13 1997-09-02 Hitachi Construction Machinery Co., Ltd. Dam bar cutting apparatus and dam bar cutting method
JPH10209028A (ja) * 1997-01-16 1998-08-07 Nikon Corp 照明光学装置及び半導体素子の製造方法

Similar Documents

Publication Publication Date Title
JP2000066133A5 (enExample)
JP4748836B2 (ja) レーザ照射装置
KR101037119B1 (ko) 빔 호모게나이저, 레이저 조사장치 및 반도체장치의제조방법
KR101115077B1 (ko) 레이저 박막 폴리실리콘 어닐링 시스템
KR20060126666A (ko) 레이저 박막 폴리실리콘 어닐링 광학 시스템
JPH09275081A5 (enExample)
JP2004119919A (ja) 半導体薄膜および半導体薄膜の製造方法
WO2005029138A2 (en) Systems and methods for inducing crystallization of thin films using multiple optical paths
US7471455B2 (en) Systems and methods for generating laser light shaped as a line beam
US20090016400A1 (en) Multi-beam laser apparatus
JP2004311906A (ja) レーザ処理装置及びレーザ処理方法
JP5165557B2 (ja) ラインビームとして成形されたレーザと基板上に堆積された膜との間の相互作用を実現するためのシステム
TWI546147B (zh) 用於照射半導體材料之裝置及其用途
KR100478623B1 (ko) 반도체 박막의 형성방법 및 반도체 박막의 형성장치
JP5613211B2 (ja) ラインビームとして成形されたレーザと基板上に堆積された膜との間の相互作用を実現するためのシステム及び方法
EP1952105B1 (en) Systems and methods to shape laser light as a homogeneous line beam for interaction with a film deposited on a substrate
CN1886872A (zh) 激光薄膜多晶硅退火系统
JP2002141302A (ja) レーザアニーリング用レーザ光学系とこれを用いたレーザアニーリング装置
JP2009130231A (ja) 結晶シリコンアレイ、および薄膜トランジスタの製造方法
JP3847172B2 (ja) 結晶成長方法及びレーザアニール装置
JPH0531354A (ja) レーザ照射装置
WO2006075568A1 (ja) 多結晶半導体薄膜の製造方法および製造装置
KR102836621B1 (ko) 광학계 및 이를 포함하는 레이저 조사 장치
US7679029B2 (en) Systems and methods to shape laser light as a line beam for interaction with a substrate having surface variations
KR20050064381A (ko) 레이저 빔 프로파일 변형 필터를 포함하는 레이저 광학계