IT8867358A0 - Apparecchiatura di prova per schede di circuiti stampati e relativa sonda - Google Patents

Apparecchiatura di prova per schede di circuiti stampati e relativa sonda

Info

Publication number
IT8867358A0
IT8867358A0 IT8867358A IT6735888A IT8867358A0 IT 8867358 A0 IT8867358 A0 IT 8867358A0 IT 8867358 A IT8867358 A IT 8867358A IT 6735888 A IT6735888 A IT 6735888A IT 8867358 A0 IT8867358 A0 IT 8867358A0
Authority
IT
Italy
Prior art keywords
probe
circuit board
printed circuit
test equipment
board test
Prior art date
Application number
IT8867358A
Other languages
English (en)
Other versions
IT1224333B (it
Inventor
Paul Mario Di Perna
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of IT8867358A0 publication Critical patent/IT8867358A0/it
Application granted granted Critical
Publication of IT1224333B publication Critical patent/IT1224333B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
IT67358/88A 1987-04-16 1988-04-18 Apparecchiatura di prova per schede di circuiti stampati e relativa sonda IT1224333B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/038,909 US4884024A (en) 1985-11-19 1987-04-16 Test pin assembly for circuit board tester

Publications (2)

Publication Number Publication Date
IT8867358A0 true IT8867358A0 (it) 1988-04-18
IT1224333B IT1224333B (it) 1990-10-04

Family

ID=21902588

Family Applications (1)

Application Number Title Priority Date Filing Date
IT67358/88A IT1224333B (it) 1987-04-16 1988-04-18 Apparecchiatura di prova per schede di circuiti stampati e relativa sonda

Country Status (7)

Country Link
US (1) US4884024A (it)
JP (1) JP2529998B2 (it)
CA (2) CA1290461C (it)
DE (1) DE3812654A1 (it)
FR (1) FR2614105B1 (it)
GB (3) GB2203906B (it)
IT (1) IT1224333B (it)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4967147A (en) * 1988-05-26 1990-10-30 Zehntel, Inc. Circuit tester having mechanical fingers and pogo probes for causing electrical contact with test fixture assemblies
IT1243302B (it) * 1990-06-19 1994-05-26 St Microelectronics Srl Connessione universale multicontatto tra scheda portasonde ews e scheda di prova per una stazione di collaudo su fetta di dispositivi a semiconduttore.
US5420519A (en) * 1992-03-10 1995-05-30 Virginia Panel Corporation Double-headed spring contact probe assembly
US5576631A (en) * 1992-03-10 1996-11-19 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly
US5254939A (en) * 1992-03-20 1993-10-19 Xandex, Inc. Probe card system
DE4226069C2 (de) * 1992-08-06 1994-08-04 Test Plus Electronic Gmbh Adaptereinrichtung für eine Prüfeinrichtung für Schaltungsplatinen
US5510722A (en) * 1992-12-18 1996-04-23 Tti Testron, Inc. Test fixture for printed circuit boards
US5311120A (en) * 1993-01-06 1994-05-10 Bartholomew Mark R Test fixture with test function feature
GB2276281B (en) * 1993-03-03 1995-04-12 Centalic Tech Dev Ltd Testing apparatus for printed circuit boards and the like
US5489854A (en) * 1993-04-01 1996-02-06 Analog Devices, Inc. IC chip test socket with double-ended spring biased contacts
US5528158A (en) * 1994-04-11 1996-06-18 Xandex, Inc. Probe card changer system and method
US5942906A (en) * 1994-11-18 1999-08-24 Virginia Panel Corporation Interface system utilizing engagement mechanism
US5764069A (en) * 1995-10-30 1998-06-09 International Faster Corporation High density grid for testing circuit boards
US5945836A (en) 1996-10-29 1999-08-31 Hewlett-Packard Company Loaded-board, guided-probe test fixture
US6407565B1 (en) 1996-10-29 2002-06-18 Agilent Technologies, Inc. Loaded-board, guided-probe test fixture
US5781023A (en) * 1997-01-31 1998-07-14 Delware Capital Formation, Inc. Hollow plunger test probe
US6054869A (en) * 1998-03-19 2000-04-25 H+W Test Products, Inc. Bi-level test fixture for testing printed circuit boards
US6259261B1 (en) * 1999-04-16 2001-07-10 Sony Corporation Method and apparatus for electrically testing semiconductor devices fabricated on a wafer
DE10016453A1 (de) * 2000-04-01 2001-11-15 Grant Boctor -Doppelhülse mit zwei Pressringen -InCircuit-Prüfadapter mit direkter Prüffederkontaktierung der bestückten Leiterplatte (über Doppelhülse und Leiterplatte) zum InCircuit-Testsystem
US6784675B2 (en) * 2002-06-25 2004-08-31 Agilent Technologies, Inc. Wireless test fixture adapter for printed circuit assembly tester
CN2682638Y (zh) * 2003-11-20 2005-03-02 上海莫仕连接器有限公司 压接式导电端子
DE102004027886A1 (de) * 2004-05-28 2005-12-22 Feinmetall Gmbh Prüfeinrichtung zur elektrischen Prüfung eines Prüflings sowie Verfahren zur Herstellung einer Prüfeinrichtung
US7046027B2 (en) * 2004-10-15 2006-05-16 Teradyne, Inc. Interface apparatus for semiconductor device tester
US7616019B2 (en) * 2006-05-08 2009-11-10 Aspen Test Engineering, Inc. Low profile electronic assembly test fixtures
TW200922009A (en) * 2007-12-07 2009-05-16 Jye Chuang Electronic Co Ltd Contact terminal
DE102009016181A1 (de) * 2009-04-03 2010-10-14 Atg Luther & Maelzer Gmbh Kontaktierungseinheit für eine Testvorrichtung zum Testen von Leiterplatten
DE102011102791A1 (de) * 2011-05-27 2012-11-29 Feinmetall Gmbh Federkontaktstiftanordnung
US9739826B2 (en) 2012-11-21 2017-08-22 Konrad Gmbh Method and device for testing a workpiece
CN103760391A (zh) * 2014-01-29 2014-04-30 上海华力微电子有限公司 内置多探针模块及其具有该模块的探针台
CN105938160B (zh) * 2016-06-23 2019-02-12 南京协辰电子科技有限公司 阻抗测试装置
CN112305032B (zh) * 2020-10-27 2022-09-30 湖南有色金属职业技术学院 一种电化学改进型电极的球形纳米传感器原位测量装置

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4132948A (en) * 1977-03-17 1979-01-02 Teradyne, Inc. Test fixture using stock printed circuit board having test pins mounted thereon
JPS5428259A (en) * 1977-08-05 1979-03-02 Nippon Steel Corp Strip edge reformer for welded pipe
US4230985A (en) * 1978-01-12 1980-10-28 Fairchild Camera And Instrument Corporation Fixturing system
US4321532A (en) * 1978-03-16 1982-03-23 Luna L Jack Repairable spring probe assembly
US4322682A (en) * 1979-05-21 1982-03-30 Everett/Charles Inc. Vacuum actuated test head having programming plate
US4352061A (en) * 1979-05-24 1982-09-28 Fairchild Camera & Instrument Corp. Universal test fixture employing interchangeable wired personalizers
JPS5666768A (en) * 1979-11-02 1981-06-05 Hitachi Ltd Tool for in-circuit tester
US4357062A (en) * 1979-12-10 1982-11-02 John Fluke Mfg. Co., Inc. Universal circuit board test fixture
CA1162243A (en) * 1979-12-26 1984-02-14 Jonathon H. Katz Test pin
DE3038665C2 (de) * 1980-10-13 1990-03-29 Riba-Prüftechnik GmbH, 7801 Schallstadt Prüfeinrichtung zum Überprüfen von mit Leiterbahnen versehenen Leiterplatten
JPS57101769A (en) * 1980-10-30 1982-06-24 Everett Charles Inc Translation apparatus and test mount apparatus and manufacture of translation apparatus
US4528500A (en) * 1980-11-25 1985-07-09 Lightbody James D Apparatus and method for testing circuit boards
DE3115787A1 (de) * 1981-03-06 1982-11-04 Feinmetall Gmbh, 7033 Herrenberg Kontaktvorrichtung
JPS581174U (ja) * 1981-06-26 1983-01-06 株式会社日立製作所 プロ−ビング装置
DE3143768A1 (de) * 1981-11-04 1983-05-11 Siemens AG, 1000 Berlin und 8000 München Adapter zur verbindung von in einer ebene angeordneten kontaktpunkten eines prueflings mit den anschluessen einer pruefeinrichtung
CH645730A5 (fr) * 1982-01-08 1984-10-15 Technobal Sa Contact d'essai pour le test de circuits imprimes, et tete de contact amovible pour un tel contact d'essai.
FR2521305A1 (fr) * 1982-02-10 1983-08-12 Crouzet Sa Dispositif de controle de l'isolement des circuits imprimes
JPS5956176A (ja) * 1982-09-24 1984-03-31 Toshiba Corp インサ−キツトテスト装置
DE3240916C2 (de) * 1982-11-05 1985-10-31 Luther, Erich, Ing.(Grad.), 3003 Ronnenberg Vorrichtung zum Prüfen von elektrischen Leiterplatten
EP0115135A1 (en) * 1982-12-27 1984-08-08 Genrad, Inc. Electrical test fixture for printed circuit boards and the like
DE3248694A1 (de) * 1982-12-30 1984-07-05 Siemens AG, 1000 Berlin und 8000 München Pruefadapter fuer flache elektrische baugruppen
FR2557701B1 (fr) * 1983-12-28 1986-04-11 Crouzet Sa Dispositif de controle de continuite des circuits imprimes
DK291184D0 (da) * 1984-06-13 1984-06-13 Boeegh Petersen Allan Fremgangsmaade og indretning til test af kredsloebsplader
DE3441578A1 (de) * 1984-11-14 1986-05-22 Riba-Prüftechnik GmbH, 7801 Schallstadt Leiterplatten-pruefeinrichtung
AT395485B (de) * 1985-01-22 1993-01-25 Feinmetall Gmbh Pruefadapter
US4724383A (en) * 1985-05-03 1988-02-09 Testsystems, Inc. PC board test fixture
US4799007A (en) * 1985-11-01 1989-01-17 Hewlett-Packard Company Bendable pin board test fixture
GB2183938A (en) * 1985-11-19 1987-06-10 Teradyne Inc Testing circuit boards
US4740923A (en) * 1985-11-19 1988-04-26 Hitachi, Ltd Memory circuit and method of controlling the same
AT391762B (de) * 1985-11-26 1990-11-26 Alcatel Austria Ag Vorrichtung zum pruefen von leiterplatten

Also Published As

Publication number Publication date
CA1290461C (en) 1991-10-08
GB2203906B (en) 1992-03-25
FR2614105A1 (fr) 1988-10-21
GB8809132D0 (en) 1988-05-18
GB2245111A (en) 1991-12-18
US4884024A (en) 1989-11-28
JPS63304180A (ja) 1988-12-12
GB2242081B (en) 1992-03-11
GB2203906A (en) 1988-10-26
GB2245111B (en) 1992-03-18
DE3812654A1 (de) 1988-11-03
CA1317385C (en) 1993-05-04
GB9104232D0 (en) 1991-04-17
DE3812654C2 (it) 1993-06-17
FR2614105B1 (fr) 1990-09-07
GB2242081A (en) 1991-09-18
JP2529998B2 (ja) 1996-09-04
GB9118032D0 (en) 1991-10-09
IT1224333B (it) 1990-10-04

Similar Documents

Publication Publication Date Title
IT8867358A0 (it) Apparecchiatura di prova per schede di circuiti stampati e relativa sonda
GB2085673B (en) Printed circuit board testing device
KR900012520A (ko) 인쇄회로기판의 천공장치와 그 방법
DE69033784D1 (de) Gedruckte Schaltungsplatte
DE69226937T2 (de) Prüfverfahren für Leiterplatten
DE3065137D1 (en) Electrical test probe for use in testing circuits on printed circuit boards and the like
KR880700275A (ko) 전자 장치 테스트 방법 및 테스트용 집적 회로 테스터
GB8430270D0 (en) Printed circuit board test fixture
JPS53133764A (en) Circuit board tester
GB8407690D0 (en) Testing printed circuit board
IT7852160A0 (it) Apparecchio e procedimento di saldatura in particolare per componenti elettronici su pannelli di circuiti stampati
FR2604260B1 (fr) Testeur de circuits electroniques
KR880700276A (ko) 인쇄회로기판의 수리 및 검사 시스템(System for Testing and Repairing Printed Circuit Boards)
IT1122235B (it) Supporto-guida per schede o circuiti stampati per elettronica e relativi connettori e procedimento per la sua fabbricazione
FR2633055B2 (fr) Perfectionnements aux testeurs de circuits
FR2617977B1 (fr) Appareil de test de circuit imprime
GB8627614D0 (en) Testing circuit boards
GB8408917D0 (en) Printed circuit board testers
HUT38731A (en) Testing probe for testing printed wiring and printed circuit panels
DE68928600T2 (de) Erweiterte Prüfschaltung
GB2215064B (en) Testing printed circuit boards
GB8612929D0 (en) Testing printed circuit board
KR910001198U (ko) 회로기판 테스터
JPS5340866A (en) Method of inspecting printed circuit board
KR920021906U (ko) 회로기판 회로 검사 지그

Legal Events

Date Code Title Description
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19970423