GB8627614D0 - Testing circuit boards - Google Patents

Testing circuit boards

Info

Publication number
GB8627614D0
GB8627614D0 GB868627614A GB8627614A GB8627614D0 GB 8627614 D0 GB8627614 D0 GB 8627614D0 GB 868627614 A GB868627614 A GB 868627614A GB 8627614 A GB8627614 A GB 8627614A GB 8627614 D0 GB8627614 D0 GB 8627614D0
Authority
GB
United Kingdom
Prior art keywords
circuit boards
testing circuit
testing
boards
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB868627614A
Other versions
GB2183938A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US79946085A priority Critical
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of GB8627614D0 publication Critical patent/GB8627614D0/en
Publication of GB2183938A publication Critical patent/GB2183938A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
GB08627614A 1985-11-19 1986-11-19 Testing circuit boards Withdrawn GB2183938A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US79946085A true 1985-11-19 1985-11-19

Publications (2)

Publication Number Publication Date
GB8627614D0 true GB8627614D0 (en) 1986-12-17
GB2183938A GB2183938A (en) 1987-06-10

Family

ID=25175970

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08627614A Withdrawn GB2183938A (en) 1985-11-19 1986-11-19 Testing circuit boards

Country Status (2)

Country Link
FR (1) FR2590439A1 (en)
GB (1) GB2183938A (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4884024A (en) * 1985-11-19 1989-11-28 Teradyne, Inc. Test pin assembly for circuit board tester
US4803424A (en) * 1987-08-31 1989-02-07 Augat Inc. Short-wire bed-of-nails test fixture
FR2629669B1 (en) * 1988-03-30 1991-05-17 Morille Robert METHOD AND DEVICE FOR VERIFICATION AND CONTROL IN THE MANUFACTURE OF A PRINTED CIRCUIT
GB2223631B (en) * 1988-10-06 1993-01-13 British Aerospace Universal test fixture
EP0544957B1 (en) * 1991-12-06 1995-05-17 Sigmatech Co. Ltd. Apparatus for inspecting internal circuit of semiconductor device
GB2276281B (en) * 1993-03-03 1995-04-12 Centalic Tech Dev Ltd Testing apparatus for printed circuit boards and the like
FR2725030B1 (en) * 1994-09-26 1997-02-07
US6667628B2 (en) * 2002-04-02 2003-12-23 Agilent Technologies, Inc. Method and apparatus for the management of forces in a wireless fixture

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4357062A (en) * 1979-12-10 1982-11-02 John Fluke Mfg. Co., Inc. Universal circuit board test fixture
EP0115135A1 (en) * 1982-12-27 1984-08-08 Genrad, Inc. Electrical test fixture for printed circuit boards and the like

Also Published As

Publication number Publication date
FR2590439A1 (en) 1987-05-22
GB2183938A (en) 1987-06-10

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)