FR2614105B1 - Appareil et sonde pour le test de cartes de circuit imprime - Google Patents

Appareil et sonde pour le test de cartes de circuit imprime

Info

Publication number
FR2614105B1
FR2614105B1 FR888805017A FR8805017A FR2614105B1 FR 2614105 B1 FR2614105 B1 FR 2614105B1 FR 888805017 A FR888805017 A FR 888805017A FR 8805017 A FR8805017 A FR 8805017A FR 2614105 B1 FR2614105 B1 FR 2614105B1
Authority
FR
France
Prior art keywords
probe
printed circuit
circuit boards
testing printed
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR888805017A
Other languages
English (en)
Other versions
FR2614105A1 (fr
Inventor
Paul Mario Diperna
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of FR2614105A1 publication Critical patent/FR2614105A1/fr
Application granted granted Critical
Publication of FR2614105B1 publication Critical patent/FR2614105B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
FR888805017A 1987-04-16 1988-04-15 Appareil et sonde pour le test de cartes de circuit imprime Expired - Lifetime FR2614105B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/038,909 US4884024A (en) 1985-11-19 1987-04-16 Test pin assembly for circuit board tester

Publications (2)

Publication Number Publication Date
FR2614105A1 FR2614105A1 (fr) 1988-10-21
FR2614105B1 true FR2614105B1 (fr) 1990-09-07

Family

ID=21902588

Family Applications (1)

Application Number Title Priority Date Filing Date
FR888805017A Expired - Lifetime FR2614105B1 (fr) 1987-04-16 1988-04-15 Appareil et sonde pour le test de cartes de circuit imprime

Country Status (7)

Country Link
US (1) US4884024A (fr)
JP (1) JP2529998B2 (fr)
CA (2) CA1290461C (fr)
DE (1) DE3812654A1 (fr)
FR (1) FR2614105B1 (fr)
GB (3) GB2203906B (fr)
IT (1) IT1224333B (fr)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
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US4967147A (en) * 1988-05-26 1990-10-30 Zehntel, Inc. Circuit tester having mechanical fingers and pogo probes for causing electrical contact with test fixture assemblies
IT1243302B (it) * 1990-06-19 1994-05-26 St Microelectronics Srl Connessione universale multicontatto tra scheda portasonde ews e scheda di prova per una stazione di collaudo su fetta di dispositivi a semiconduttore.
US5576631A (en) * 1992-03-10 1996-11-19 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly
US5420519A (en) * 1992-03-10 1995-05-30 Virginia Panel Corporation Double-headed spring contact probe assembly
US5254939A (en) * 1992-03-20 1993-10-19 Xandex, Inc. Probe card system
DE4226069C2 (de) * 1992-08-06 1994-08-04 Test Plus Electronic Gmbh Adaptereinrichtung für eine Prüfeinrichtung für Schaltungsplatinen
US5510722A (en) * 1992-12-18 1996-04-23 Tti Testron, Inc. Test fixture for printed circuit boards
US5311120A (en) * 1993-01-06 1994-05-10 Bartholomew Mark R Test fixture with test function feature
GB2276281B (en) * 1993-03-03 1995-04-12 Centalic Tech Dev Ltd Testing apparatus for printed circuit boards and the like
US5489854A (en) * 1993-04-01 1996-02-06 Analog Devices, Inc. IC chip test socket with double-ended spring biased contacts
US5528158A (en) * 1994-04-11 1996-06-18 Xandex, Inc. Probe card changer system and method
US5942906A (en) * 1994-11-18 1999-08-24 Virginia Panel Corporation Interface system utilizing engagement mechanism
US5764069A (en) * 1995-10-30 1998-06-09 International Faster Corporation High density grid for testing circuit boards
US5945836A (en) 1996-10-29 1999-08-31 Hewlett-Packard Company Loaded-board, guided-probe test fixture
US6407565B1 (en) 1996-10-29 2002-06-18 Agilent Technologies, Inc. Loaded-board, guided-probe test fixture
US5781023A (en) * 1997-01-31 1998-07-14 Delware Capital Formation, Inc. Hollow plunger test probe
US6054869A (en) * 1998-03-19 2000-04-25 H+W Test Products, Inc. Bi-level test fixture for testing printed circuit boards
US6259261B1 (en) * 1999-04-16 2001-07-10 Sony Corporation Method and apparatus for electrically testing semiconductor devices fabricated on a wafer
DE10016453A1 (de) * 2000-04-01 2001-11-15 Grant Boctor -Doppelhülse mit zwei Pressringen -InCircuit-Prüfadapter mit direkter Prüffederkontaktierung der bestückten Leiterplatte (über Doppelhülse und Leiterplatte) zum InCircuit-Testsystem
US6784675B2 (en) * 2002-06-25 2004-08-31 Agilent Technologies, Inc. Wireless test fixture adapter for printed circuit assembly tester
CN2682638Y (zh) * 2003-11-20 2005-03-02 上海莫仕连接器有限公司 压接式导电端子
DE102004027886A1 (de) * 2004-05-28 2005-12-22 Feinmetall Gmbh Prüfeinrichtung zur elektrischen Prüfung eines Prüflings sowie Verfahren zur Herstellung einer Prüfeinrichtung
US7046027B2 (en) * 2004-10-15 2006-05-16 Teradyne, Inc. Interface apparatus for semiconductor device tester
US7616019B2 (en) * 2006-05-08 2009-11-10 Aspen Test Engineering, Inc. Low profile electronic assembly test fixtures
TW200922009A (en) * 2007-12-07 2009-05-16 Jye Chuang Electronic Co Ltd Contact terminal
DE102009016181A1 (de) * 2009-04-03 2010-10-14 Atg Luther & Maelzer Gmbh Kontaktierungseinheit für eine Testvorrichtung zum Testen von Leiterplatten
DE102011102791A1 (de) * 2011-05-27 2012-11-29 Feinmetall Gmbh Federkontaktstiftanordnung
US9739826B2 (en) 2012-11-21 2017-08-22 Konrad Gmbh Method and device for testing a workpiece
CN103760391A (zh) * 2014-01-29 2014-04-30 上海华力微电子有限公司 内置多探针模块及其具有该模块的探针台
CN105938160B (zh) * 2016-06-23 2019-02-12 南京协辰电子科技有限公司 阻抗测试装置
CN112305032B (zh) * 2020-10-27 2022-09-30 湖南有色金属职业技术学院 一种电化学改进型电极的球形纳米传感器原位测量装置
EP4375677A1 (fr) * 2022-11-23 2024-05-29 Mikrodust AB Dispositif de test compact

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4132948A (en) * 1977-03-17 1979-01-02 Teradyne, Inc. Test fixture using stock printed circuit board having test pins mounted thereon
JPS5428259A (en) * 1977-08-05 1979-03-02 Nippon Steel Corp Strip edge reformer for welded pipe
US4230985A (en) * 1978-01-12 1980-10-28 Fairchild Camera And Instrument Corporation Fixturing system
US4321532A (en) * 1978-03-16 1982-03-23 Luna L Jack Repairable spring probe assembly
US4322682A (en) * 1979-05-21 1982-03-30 Everett/Charles Inc. Vacuum actuated test head having programming plate
US4352061A (en) * 1979-05-24 1982-09-28 Fairchild Camera & Instrument Corp. Universal test fixture employing interchangeable wired personalizers
JPS5666768A (en) * 1979-11-02 1981-06-05 Hitachi Ltd Tool for in-circuit tester
US4357062A (en) * 1979-12-10 1982-11-02 John Fluke Mfg. Co., Inc. Universal circuit board test fixture
CA1162243A (fr) * 1979-12-26 1984-02-14 Jonathon H. Katz Broche pour branchement d'essai
DE3038665C2 (de) * 1980-10-13 1990-03-29 Riba-Prüftechnik GmbH, 7801 Schallstadt Prüfeinrichtung zum Überprüfen von mit Leiterbahnen versehenen Leiterplatten
JPS57101769A (en) * 1980-10-30 1982-06-24 Everett Charles Inc Translation apparatus and test mount apparatus and manufacture of translation apparatus
US4528500A (en) * 1980-11-25 1985-07-09 Lightbody James D Apparatus and method for testing circuit boards
DE3115787A1 (de) * 1981-03-06 1982-11-04 Feinmetall Gmbh, 7033 Herrenberg Kontaktvorrichtung
JPS581174U (ja) * 1981-06-26 1983-01-06 株式会社日立製作所 プロ−ビング装置
DE3143768C2 (de) * 1981-11-04 1987-04-16 Siemens AG, 1000 Berlin und 8000 München Adapter zur Verbindung von in einer Ebene angeordneten Kontaktpunkten eines Prüflings mit den Anschlüssen einer Prüfeinrichtung
CH645730A5 (fr) * 1982-01-08 1984-10-15 Technobal Sa Contact d'essai pour le test de circuits imprimes, et tete de contact amovible pour un tel contact d'essai.
FR2521305A1 (fr) * 1982-02-10 1983-08-12 Crouzet Sa Dispositif de controle de l'isolement des circuits imprimes
JPS5956176A (ja) * 1982-09-24 1984-03-31 Toshiba Corp インサ−キツトテスト装置
DE3240916C2 (de) * 1982-11-05 1985-10-31 Luther, Erich, Ing.(Grad.), 3003 Ronnenberg Vorrichtung zum Prüfen von elektrischen Leiterplatten
EP0115135A1 (fr) * 1982-12-27 1984-08-08 Genrad, Inc. Fixation électrique pour tester des circuits imprimés et similaires
DE3248694A1 (de) * 1982-12-30 1984-07-05 Siemens AG, 1000 Berlin und 8000 München Pruefadapter fuer flache elektrische baugruppen
FR2557701B1 (fr) * 1983-12-28 1986-04-11 Crouzet Sa Dispositif de controle de continuite des circuits imprimes
DK291184D0 (da) * 1984-06-13 1984-06-13 Boeegh Petersen Allan Fremgangsmaade og indretning til test af kredsloebsplader
DE3441578A1 (de) * 1984-11-14 1986-05-22 Riba-Prüftechnik GmbH, 7801 Schallstadt Leiterplatten-pruefeinrichtung
AT395485B (de) * 1985-01-22 1993-01-25 Feinmetall Gmbh Pruefadapter
US4724383A (en) * 1985-05-03 1988-02-09 Testsystems, Inc. PC board test fixture
US4799007A (en) * 1985-11-01 1989-01-17 Hewlett-Packard Company Bendable pin board test fixture
US4740923A (en) * 1985-11-19 1988-04-26 Hitachi, Ltd Memory circuit and method of controlling the same
FR2590439A1 (fr) * 1985-11-19 1987-05-22 Teradyne Inc Ensemble de broches d'essais perfectionne pour controleur de cartes ou plaquettes de circuits imprimes
AT391762B (de) * 1985-11-26 1990-11-26 Alcatel Austria Ag Vorrichtung zum pruefen von leiterplatten

Also Published As

Publication number Publication date
JPS63304180A (ja) 1988-12-12
DE3812654A1 (de) 1988-11-03
CA1290461C (fr) 1991-10-08
JP2529998B2 (ja) 1996-09-04
CA1317385C (fr) 1993-05-04
GB2242081A (en) 1991-09-18
GB9104232D0 (en) 1991-04-17
GB2245111A (en) 1991-12-18
GB2245111B (en) 1992-03-18
DE3812654C2 (fr) 1993-06-17
FR2614105A1 (fr) 1988-10-21
GB8809132D0 (en) 1988-05-18
IT8867358A0 (it) 1988-04-18
GB2203906A (en) 1988-10-26
IT1224333B (it) 1990-10-04
GB2203906B (en) 1992-03-25
GB9118032D0 (en) 1991-10-09
US4884024A (en) 1989-11-28
GB2242081B (en) 1992-03-11

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Legal Events

Date Code Title Description
ST Notification of lapse