IT1298182B1 - Metodo e circuito per rilevare la temperatura di giunzione tj di dispositivi a semiconduttori di potenza a gate mos - Google Patents
Metodo e circuito per rilevare la temperatura di giunzione tj di dispositivi a semiconduttori di potenza a gate mosInfo
- Publication number
- IT1298182B1 IT1298182B1 ITMI980111A IT1298182B1 IT 1298182 B1 IT1298182 B1 IT 1298182B1 IT MI980111 A ITMI980111 A IT MI980111A IT 1298182 B1 IT1298182 B1 IT 1298182B1
- Authority
- IT
- Italy
- Prior art keywords
- detecting
- circuit
- power devices
- junction temperature
- semiconductor power
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
- G01K7/20—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit
- G01K7/21—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit for modifying the output characteristic, e.g. linearising
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
- G01K7/015—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions using microstructures, e.g. made of silicon
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
- H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
- H01L29/7803—Vertical DMOS transistors, i.e. VDMOS transistors structurally associated with at least one other device
- H01L29/7804—Vertical DMOS transistors, i.e. VDMOS transistors structurally associated with at least one other device the other device being a pn-junction diode
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
- H03K17/0822—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in field-effect transistor switches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K2217/00—Temperature measurement using electric or magnetic components already present in the system to be measured
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/0601—Structure
- H01L2224/0603—Bonding areas having different sizes, e.g. different heights or widths
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/4901—Structure
- H01L2224/4903—Connectors having different sizes, e.g. different diameters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
- H01L23/49562—Geometry of the lead-frame for devices being provided for in H01L29/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Nonlinear Science (AREA)
- Ceramic Engineering (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US79883597A | 1997-02-12 | 1997-02-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
ITMI980111A1 ITMI980111A1 (it) | 1999-07-23 |
IT1298182B1 true IT1298182B1 (it) | 1999-12-20 |
Family
ID=25174399
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT98MI000111 IT1298182B1 (it) | 1997-02-12 | 1998-01-23 | Metodo e circuito per rilevare la temperatura di giunzione tj di dispositivi a semiconduttori di potenza a gate mos |
Country Status (8)
Country | Link |
---|---|
JP (1) | JP2846309B2 (de) |
KR (1) | KR19980070752A (de) |
DE (1) | DE19805734A1 (de) |
FR (1) | FR2759456B1 (de) |
GB (1) | GB2322709B (de) |
IT (1) | IT1298182B1 (de) |
SG (1) | SG55452A1 (de) |
TW (1) | TW385548B (de) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10023950A1 (de) * | 2000-05-16 | 2001-11-22 | Bosch Gmbh Robert | Halbleiter-Bauelement |
JP3721119B2 (ja) * | 2001-11-08 | 2005-11-30 | 株式会社東芝 | 温度センサ |
DE10220587B4 (de) | 2002-05-08 | 2007-07-19 | Infineon Technologies Ag | Temperatursensor für MOS-Schaltungsanordnung |
JP4681911B2 (ja) * | 2005-02-25 | 2011-05-11 | 三菱電機株式会社 | 電力用半導体装置 |
CN100374872C (zh) * | 2005-10-14 | 2008-03-12 | 北京工业大学 | 半导体pn结二极管器件的温升和热阻测量方法及装置 |
JP2009240024A (ja) * | 2008-03-26 | 2009-10-15 | Denso Corp | 温度検出装置 |
DE102008023217A1 (de) | 2008-05-19 | 2009-11-26 | Friedrich-Alexander-Universität Erlangen-Nürnberg | Elektrisches Verfahren zur ortsbezogenen Betriebstemperatureinstellung eines MOS-gesteuerten Halbleiterleistungsbauelementes und Bauelement zur Ausführung des Verfahrens |
US20110182324A1 (en) * | 2008-05-19 | 2011-07-28 | X-Fab Semiconductor Foundries Ag | Operating temperature measurement for an mos power component, and mos component for carrying out the method |
DE102008023215A1 (de) * | 2008-05-19 | 2009-12-03 | Friedrich-Alexander-Universität Erlangen-Nürnberg | Verfahren zur Betriebstemperatursteuerung eines MOS-gesteuerten Halbleiterleistungsbauelementes und Bauelement zur Ausführung des Verfahrens |
AU2010206053B2 (en) | 2009-07-31 | 2014-08-07 | ResMed Pty Ltd | Wire Heated Tube with Temperature Control System, Tube Type Detection, and Active Over Temperature Protection for Humidifier for Respiratory Apparatus |
DE102012006009B4 (de) | 2012-03-24 | 2024-06-13 | Volkswagen Aktiengesellschaft | Verfahren und Vorrichtung zur Bestimmung einer Sperrschichttemperatur eines Halbleiterbauelements |
CN102928109A (zh) * | 2012-10-25 | 2013-02-13 | 重庆长安汽车股份有限公司 | 一种信号采集电路 |
DE102012222481A1 (de) * | 2012-12-06 | 2014-06-12 | Robert Bosch Gmbh | Verfahren zum Ermitteln einer Sperrschichttemperatur eines Leistungshalbleiters unter Berücksichtigung der Degradation und Mittel zu dessen Implementierung |
NZ743034A (en) | 2013-02-01 | 2019-12-20 | ResMed Pty Ltd | Wire heated tube with temperature control system for humidifier for respiratory apparatus |
CN103323135B (zh) * | 2013-06-09 | 2014-12-03 | 广东明阳龙源电力电子有限公司 | 一种igbt温度检测电路 |
DE102015104990B4 (de) * | 2015-03-31 | 2020-06-04 | Infineon Technologies Austria Ag | Verbindungshalbleitervorrichtung mit einem Abtastlead |
CN105929316A (zh) * | 2016-07-10 | 2016-09-07 | 北京工业大学 | 多路igbt结温及热疲劳实时监控系统 |
CN106501699B (zh) * | 2016-10-20 | 2019-02-19 | 北京工业大学 | 一种饱和状态下双极晶体管结温的实时测量方法 |
EP3598505B1 (de) * | 2018-07-19 | 2023-02-15 | Mitsubishi Electric R&D Centre Europe B.V. | Temperaturschätzung eines leistungshalbleiterbauelements |
EP3690412B1 (de) * | 2019-02-04 | 2022-06-15 | EM Microelectronic-Marin SA | Funkelrauschenreduzierung in einer temperatursensoranordnung |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5728228A (en) * | 1980-07-28 | 1982-02-15 | Seiko Epson Corp | Semiconductor integrated circuit |
DE3150013A1 (de) * | 1981-12-17 | 1983-06-23 | Datron-Electronic Pichl & Schulte KG, 6109 Mühltal | "verfahren und vorrichtung zur automatisierten justierung (eichung) von messgeraeten und wandlern pysikalischer eingangsgroessen" |
JPS59225324A (ja) * | 1983-06-06 | 1984-12-18 | Terumo Corp | 電子温度計の製造方法 |
JPS60127433A (ja) * | 1983-12-13 | 1985-07-08 | Toshiba Corp | 温度検出装置の校正方法 |
JPH0693485B2 (ja) * | 1985-11-29 | 1994-11-16 | 日本電装株式会社 | 半導体装置 |
GB2191292B (en) * | 1986-06-07 | 1990-02-21 | Thomas James Allen | Measuring equipment |
GB2291742B (en) * | 1993-09-14 | 1996-08-28 | Int Rectifier Corp | Power MOS-gated device with over-temperature protection |
US5497285A (en) * | 1993-09-14 | 1996-03-05 | International Rectifier Corporation | Power MOSFET with overcurrent and over-temperature protection |
-
1998
- 1998-01-19 SG SG1998000139A patent/SG55452A1/en unknown
- 1998-01-22 GB GB9801403A patent/GB2322709B/en not_active Expired - Fee Related
- 1998-01-23 KR KR1019980002017A patent/KR19980070752A/ko not_active Application Discontinuation
- 1998-01-23 IT IT98MI000111 patent/IT1298182B1/it active IP Right Grant
- 1998-02-04 TW TW87101360A patent/TW385548B/zh active
- 1998-02-04 JP JP2293998A patent/JP2846309B2/ja not_active Expired - Lifetime
- 1998-02-11 FR FR9801599A patent/FR2759456B1/fr not_active Expired - Fee Related
- 1998-02-12 DE DE1998105734 patent/DE19805734A1/de not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
JP2846309B2 (ja) | 1999-01-13 |
FR2759456B1 (fr) | 1999-07-02 |
TW385548B (en) | 2000-03-21 |
KR19980070752A (ko) | 1998-10-26 |
ITMI980111A1 (it) | 1999-07-23 |
GB2322709B (en) | 2000-11-01 |
DE19805734A1 (de) | 1998-08-20 |
FR2759456A1 (fr) | 1998-08-14 |
SG55452A1 (en) | 1998-12-21 |
GB9801403D0 (en) | 1998-03-18 |
JPH10246676A (ja) | 1998-09-14 |
GB2322709A (en) | 1998-09-02 |
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Legal Events
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0001 | Granted |