IT1139738B - Dispositivi a circuito integrato a semiconduttori e procedimento per la sua fabbricazione - Google Patents

Dispositivi a circuito integrato a semiconduttori e procedimento per la sua fabbricazione

Info

Publication number
IT1139738B
IT1139738B IT25073/81A IT2507381A IT1139738B IT 1139738 B IT1139738 B IT 1139738B IT 25073/81 A IT25073/81 A IT 25073/81A IT 2507381 A IT2507381 A IT 2507381A IT 1139738 B IT1139738 B IT 1139738B
Authority
IT
Italy
Prior art keywords
procedure
manufacture
integrated circuit
semiconductor integrated
circuit devices
Prior art date
Application number
IT25073/81A
Other languages
English (en)
Other versions
IT8125073A0 (it
Inventor
Muramatsu Akira
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of IT8125073A0 publication Critical patent/IT8125073A0/it
Application granted granted Critical
Publication of IT1139738B publication Critical patent/IT1139738B/it

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/762Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/76202Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO
    • H01L21/76205Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO in a region being recessed from the surface, e.g. in a recess, groove, tub or trench region
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0112Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs
    • H10D84/0119Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs the components including complementary BJTs
    • H10D84/0121Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs the components including complementary BJTs the complementary BJTs being vertical BJTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/02Manufacture or treatment characterised by using material-based technologies
    • H10D84/03Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
    • H10D84/038Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/60Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
    • H10D84/641Combinations of only vertical BJTs
    • H10D84/643Combinations of non-inverted vertical BJTs and inverted vertical BJTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/60Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
    • H10D84/65Integrated injection logic
    • H10D84/658Integrated injection logic integrated in combination with analog structures

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Element Separation (AREA)
  • Bipolar Transistors (AREA)
  • Bipolar Integrated Circuits (AREA)
IT25073/81A 1980-12-01 1981-11-13 Dispositivi a circuito integrato a semiconduttori e procedimento per la sua fabbricazione IT1139738B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55168044A JPS5792858A (en) 1980-12-01 1980-12-01 Semiconductor integrated circuit device and manufacture thereof

Publications (2)

Publication Number Publication Date
IT8125073A0 IT8125073A0 (it) 1981-11-13
IT1139738B true IT1139738B (it) 1986-09-24

Family

ID=15860776

Family Applications (1)

Application Number Title Priority Date Filing Date
IT25073/81A IT1139738B (it) 1980-12-01 1981-11-13 Dispositivi a circuito integrato a semiconduttori e procedimento per la sua fabbricazione

Country Status (8)

Country Link
US (1) US4502201A (it)
JP (1) JPS5792858A (it)
DE (1) DE3146779A1 (it)
FR (1) FR2495379A1 (it)
GB (1) GB2088627B (it)
HK (1) HK43586A (it)
IT (1) IT1139738B (it)
MY (1) MY8600603A (it)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58210283A (ja) * 1982-05-31 1983-12-07 トステム株式会社 連段窓改装における旧窓枠除去方法
JPS58210281A (ja) * 1982-05-31 1983-12-07 トステム株式会社 連段窓改装における旧窓枠除去方法
US4797372A (en) * 1985-11-01 1989-01-10 Texas Instruments Incorporated Method of making a merge bipolar and complementary metal oxide semiconductor transistor device
US5023690A (en) * 1986-10-24 1991-06-11 Texas Instruments Incorporated Merged bipolar and complementary metal oxide semiconductor transistor device
EP0309788A1 (de) * 1987-09-30 1989-04-05 Siemens Aktiengesellschaft Verfahren zur Erzeugung eines versenkten Oxids
JP2005116973A (ja) * 2003-10-10 2005-04-28 Seiko Epson Corp 半導体装置の製造方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3962717A (en) * 1974-10-29 1976-06-08 Fairchild Camera And Instrument Corporation Oxide isolated integrated injection logic with selective guard ring
DE2455347A1 (de) * 1974-11-22 1976-05-26 Itt Ind Gmbh Deutsche Monolithisch integrierte festkoerperschaltung und herstellungsverfahren
FR2352403A1 (fr) * 1976-05-20 1977-12-16 Comp Generale Electricite Circuit integre rapide
US4157268A (en) * 1977-06-16 1979-06-05 International Business Machines Corporation Localized oxidation enhancement for an integrated injection logic circuit
DE2835632A1 (de) * 1978-08-14 1980-02-28 Bosch Gmbh Robert Monolithisch integrierte schaltung und verfahren zu ihrer herstellung
DE3020609C2 (de) * 1979-05-31 1985-11-07 Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa Verfahren zum Herstellen einer integrierten Schaltung mit wenigstens einem I↑2↑L-Element
JPS5696852A (en) * 1979-12-29 1981-08-05 Fujitsu Ltd Semiconductor device
DE3029013A1 (de) * 1980-07-31 1982-02-25 Robert Bosch Gmbh, 7000 Stuttgart Hochintegrierte, monolithische halbleiterschaltung

Also Published As

Publication number Publication date
FR2495379A1 (fr) 1982-06-04
MY8600603A (en) 1986-12-31
GB2088627A (en) 1982-06-09
HK43586A (en) 1986-06-20
DE3146779A1 (de) 1982-09-09
US4502201A (en) 1985-03-05
IT8125073A0 (it) 1981-11-13
JPS5792858A (en) 1982-06-09
GB2088627B (en) 1985-01-03

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Legal Events

Date Code Title Description
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19931118