IN2014DN07627A - - Google Patents

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Publication number
IN2014DN07627A
IN2014DN07627A IN7627DEN2014A IN2014DN07627A IN 2014DN07627 A IN2014DN07627 A IN 2014DN07627A IN 7627DEN2014 A IN7627DEN2014 A IN 7627DEN2014A IN 2014DN07627 A IN2014DN07627 A IN 2014DN07627A
Authority
IN
India
Prior art keywords
signal
msi
measuring
conversion
quantifying
Prior art date
Application number
Other languages
English (en)
Inventor
Stéphane Gueu
Nicolas Lavillonniere
Fabien Muradore
Asma Lakhoua
Original Assignee
Essilor Internat Cie Générale Doptique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Essilor Internat Cie Générale Doptique filed Critical Essilor Internat Cie Générale Doptique
Publication of IN2014DN07627A publication Critical patent/IN2014DN07627A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/025Testing optical properties by measuring geometrical properties or aberrations by determining the shape of the object to be tested
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0271Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods

Landscapes

  • Physics & Mathematics (AREA)
  • Geometry (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
IN7627DEN2014 2012-03-09 2013-03-08 IN2014DN07627A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP12290084.8A EP2637011A1 (fr) 2012-03-09 2012-03-09 Procédé et appareil de mesure de la structure géométrique d'un composant optique
PCT/EP2013/054751 WO2013132072A1 (fr) 2012-03-09 2013-03-08 Procede et appareil de mesure de la structure geometrique d'un composant optique

Publications (1)

Publication Number Publication Date
IN2014DN07627A true IN2014DN07627A (ja) 2015-05-15

Family

ID=47846012

Family Applications (1)

Application Number Title Priority Date Filing Date
IN7627DEN2014 IN2014DN07627A (ja) 2012-03-09 2013-03-08

Country Status (14)

Country Link
US (1) US9109976B2 (ja)
EP (2) EP2637011A1 (ja)
JP (1) JP6223368B2 (ja)
KR (1) KR102022888B1 (ja)
CN (1) CN104169704B (ja)
AU (1) AU2013229379B2 (ja)
BR (1) BR112014022264B1 (ja)
CA (1) CA2864866C (ja)
IN (1) IN2014DN07627A (ja)
MX (1) MX338853B (ja)
NZ (1) NZ628795A (ja)
RU (1) RU2618746C2 (ja)
WO (1) WO2013132072A1 (ja)
ZA (1) ZA201406182B (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10289895B2 (en) 2014-10-21 2019-05-14 Isra Surface Vision Gmbh Method and device for determining a three-dimensional distortion
DE102014115336A1 (de) * 2014-10-21 2016-04-21 Isra Surface Vision Gmbh Verfahren zur Bestimmung eines lokalen Brechwerts und Vorrichtung hierfür
RU2650857C1 (ru) * 2017-04-06 2018-04-17 Федеральное государственное бюджетное образовательное учреждение высшего образования "Кубанский государственный технологический университет" (ФГБОУ ВО "КубГТУ") Система определения геометрических параметров трехмерных объектов

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU642768B2 (en) * 1990-10-02 1993-10-28 Ciba-Geigy Ag A method of surface-cleaning and/or sterilising optical components, especially contact lenses
DE69402281T2 (de) * 1993-09-17 1997-09-04 Essilor Int Verfahren und Gerät zur absoluten Messung der geometrischen oder optischen Struktur eines optischen Bestandteiles
US6072570A (en) * 1997-07-24 2000-06-06 Innotech Image quality mapper for progressive eyeglasses
FR2783938B1 (fr) * 1998-09-28 2000-11-17 Essilor Int Lentilles ophtalmiques toriques
US6256098B1 (en) * 1998-11-23 2001-07-03 Inray Ltd. Method for determining and designing optical elements
JP2001227908A (ja) * 2000-02-18 2001-08-24 Canon Inc 光学測定装置
FR2813391B1 (fr) * 2000-08-22 2002-11-29 Essilor Int Procede et appareil de mesure en transmission de la structure geometrique d'un composant optique
US7034949B2 (en) * 2001-12-10 2006-04-25 Ophthonix, Inc. Systems and methods for wavefront measurement
JP2003269952A (ja) * 2002-03-13 2003-09-25 Canon Inc 3次元形状測定装置および方法
ATE524762T1 (de) * 2002-05-31 2011-09-15 Crossbows Optical Ltd Gleitsichtglas
DE10337894A1 (de) * 2003-08-18 2005-03-17 Robert Bosch Gmbh Optisches Messsystem zum Erfassen von Geometriedaten von Oberflächen
DE102004047531B4 (de) * 2004-09-30 2006-07-13 Kemper, Björn, Dr.rer.nat. Interferometrisches Verfahren und interferometrische Vorrichtung zum Ermitteln einer Topographie und einer Brechungsindexverteilung eines Objekts
EP2008058B1 (en) * 2006-04-07 2012-12-05 Abbott Medical Optics Inc. Geometric measurement system and method of measuring a geometric characteristic of an object
US7573643B2 (en) * 2006-08-16 2009-08-11 Technion Research & Development Foundation Ltd. Method and apparatus for designing transmissive optical surfaces
EP2136178A1 (en) * 2007-04-05 2009-12-23 Nikon Corporation Geometry measurement instrument and method for measuring geometry
JP2010085335A (ja) * 2008-10-01 2010-04-15 Fujinon Corp 光波干渉測定装置
FR2938934B1 (fr) * 2008-11-25 2017-07-07 Essilor Int - Cie Generale D'optique Verre de lunettes procurant une vision ophtalmique et une vision supplementaire
JP2010237189A (ja) * 2009-03-11 2010-10-21 Fujifilm Corp 3次元形状測定方法および装置
JP5591063B2 (ja) 2009-11-12 2014-09-17 キヤノン株式会社 測定方法及び測定装置
JP4968966B2 (ja) * 2009-12-07 2012-07-04 キヤノン株式会社 屈折率分布の計測方法および計測装置
CN103003662B (zh) * 2010-07-15 2015-06-24 佳能株式会社 用于测量被检表面的形状的测量方法、测量设备和光学元件的制造方法
JP5618727B2 (ja) 2010-09-21 2014-11-05 キヤノン株式会社 形状測定法及び形状計測装置

Also Published As

Publication number Publication date
RU2618746C2 (ru) 2017-05-11
WO2013132072A1 (fr) 2013-09-12
CN104169704B (zh) 2018-04-24
BR112014022264B1 (pt) 2020-11-10
US20150055126A1 (en) 2015-02-26
US9109976B2 (en) 2015-08-18
NZ628795A (en) 2016-11-25
CA2864866A1 (fr) 2013-09-12
RU2014140808A (ru) 2016-05-10
ZA201406182B (en) 2016-02-24
KR20140132725A (ko) 2014-11-18
JP2015509599A (ja) 2015-03-30
MX338853B (es) 2016-05-02
AU2013229379B2 (en) 2016-11-24
BR112014022264A8 (pt) 2018-08-14
EP2823279A1 (fr) 2015-01-14
EP2823279B1 (fr) 2019-12-25
KR102022888B1 (ko) 2019-11-25
CN104169704A (zh) 2014-11-26
MX2014010784A (es) 2015-04-17
JP6223368B2 (ja) 2017-11-01
BR112014022264A2 (ja) 2017-06-20
EP2637011A1 (fr) 2013-09-11
CA2864866C (fr) 2020-07-07
AU2013229379A1 (en) 2014-09-04

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