Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
  • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
  • G01M11/02—Testing optical properties
  • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
  • G01M11/025—Testing optical properties by measuring geometrical properties or aberrations by determining the shape of the object to be tested
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
  • G01B11/00—Measuring arrangements characterised by the use of optical techniques
  • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
  • G01B11/00—Measuring arrangements characterised by the use of optical techniques
  • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
  • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
  • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
  • G01M11/02—Testing optical properties
  • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
  • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
  • G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
  • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
  • G01M11/02—Testing optical properties
  • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
  • G01M11/0271—Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods

Definitions

• the present invention relates to a method and a system for measuring the geometric or optical structure of an optical component.
• the method according to the invention makes it possible to measure absolutely the two faces of an optical component.
• Absolute measurement is understood to mean a measurement that does not require any prior knowledge of the component apart from its refractive index. Face measurement is susceptible to many industrial applications. It is particularly useful in the ophthalmic field for the control or measurement of ophthalmic lenses; in this case, the realization of complex faces requires the simultaneous determination of hundreds of coefficients.
• EP-A-0 644 41 1 in the name of the applicant describes a deflectometry apparatus in reflection or in transmission.
• This apparatus allows measurement by reflection or transmission of the geometric structure of an optical component.
• the principle of such a measuring device is to illuminate the optical component to be measured by known wavefront radiation - in the simplest case a plane wave - and to measure the wavefront after reflection or transmission. on the optical component to be measured.
• the measurement of the wavefront after reflection or transmission makes it possible to go back to the geometrical characteristics of the component to be measured.
• DE102004047531 is also known, in which two interferometric measurements are carried out, one in reflection and the other in transmission, to determine a superficial topography and an internal refractive index distribution of a living organism (cell or group of cells). cells). But implicitly, to reach an absolute result, which makes it possible to translate the measurement of phase variation of a reflected or transmitted optical wave into a map of heights or refractive index variations, the measurement described in this document requires an a priori knowledge of the topography or the distribution of refractive index of the organism.
• the present invention aims to solve the aforementioned drawbacks and proposes to determine the geometric structure of an optical component from two non-destructive measurements. At least one of these measurements operates in zonal or multipoint mode (as opposed to the "point-to-point" mode introduced above) and at least one of these measurements is performed on a signal of an MS1 resulting from a transformation of a signal probe by only one of the faces, and where each of these faces is unknown a priori. This determination is further based on a digital reconstruction of each of the component faces from said measurements.
• the invention achieves this goal by virtue of the features of claim 1, according to a first aspect and the features of claim 14, according to a second aspect.
• the invention relates to a method for measuring the geometric structure of a component delimited by a first face 10 and a second face 20; said method comprising the steps of:
• At least one of the measurements of the first signal MS1 and the measurement of the second signal MS2 is a zonal measurement
• the invention relates to a system for measuring the geometric structure of a component delimited by a first face 10 and a second face 20; said system comprising:
• At least one of said measuring means MM1, MM2 performs a zonal measurement
• a first calculation means CM1 configured to estimate said first face from the first signal MS1, said first simulation, a first virtual face 1 1 and a first cost function V1 quantifying a difference between the first estimate ES1 and the first signal MS1;
• a second calculation means CM2 configured to estimate said second face 20 from the second signal MS2, said second simulation, a second virtual face 21, said third transformation and a second function cost V2 quantifying a difference between the second estimate ES2 and the second signal MS2.
• the method according to the invention has the advantage of making a determination of the structure of a component which is very fast compared to existing direct mechanical or optical measurement techniques (point-to-point probing with mechanical or optical probe, for example). .).
• the at least one zonal measurement or "multipoint" can, itself, result from a collection of a small number of elementary zonal measurements.
• These elementary zonal measurements each measure a first elementary signal resulting from a first transformation of the first probe signal PS1 by a zone of the first face 10.
• the set of zones covering the first face In this case, a step of splicing zonal elementary measurements is necessary. This makes it possible, with the same measurement means MM1, to obtain an estimate of the first more accurate dace than when the zonal measurement is made in a single take, the zonal measurement made by the collection of a limited number of elementary zonal measurements remaining more quick and easy to implement as a point-to-point measure.
• the first measurement is for example a measurement in reflection
• the second measurement is carried out for example in transmission.
• the first measurement is a measurement of fringe reflection deflectometry
• the second measurement is a Hartmann type measurement, but alternatively the first measurement may be a measurement of deformation of an optical signal reflected by the first face and the second measurement is a measurement of magnification, or magnification, of an optical signal transmitted by the first and the second face.
• the method according to the invention also has the advantage of being able to be implemented from existing equipment configured to perform face measurements but which does not include calculation means for reconstructing these faces in a reference frame which is not related to themselves.
• a third advantage of the method according to the invention is related to the form in which the determination of the structure is produced: the steps of reconstruction of the faces presented below use a representation of the faces in an analytical form.
• the structure of the component as it is delivered by the method according to the invention has an analytical form: this is particularly suitable for the subsequent use of the estimated structure in numerical simulation means.
• a fourth advantage of the method according to the invention lies in the excellent accuracy it achieves on the evaluation of heights of the faces of the optical component while the amplitude of the variation in height is important and that no knowledge of any of these faces is required.
• FIG. 1 shows the flow chart of a measurement method according to one embodiment of the invention
• FIG. 2 shows an exemplary measurement of a first signal MS1 implemented in said method according to one embodiment of the invention
• FIG. 3 shows an exemplary step of measuring a second signal MS2 implemented in said method according to one embodiment of the invention
• FIG. 4 shows an exemplary step of determining a third transformation implemented in said method according to one embodiment of the invention
• FIG. 5 schematically presents an embodiment of a system for measuring the structure of a component according to one embodiment of the invention.
• FIG. 1 represents a flowchart comprising 5 steps of a method for measuring the geometrical structure of a component according to one embodiment of the invention. In what follows, these five steps are explained and detailed for measuring the geometric structure of an ophthalmic lens having a first face 10, for example convex, and a second face 20, for example concave.
• the optical component is an ophthalmic lens.
• the optical component is a progressive ophthalmic lens. Step S1: Measuring the first face 10 by a fringe reflection method;
• a periodic grating PS1 is projected onto the first face 10 of the component, constituted for example by light strips of width L uniformly illuminated by white light and separated by strips of width L which are not illuminated. .
• the fringe network is reflected by the face 10 and forms a distorted image of the network.
• This image is captured by an image capture device, for example a digital camera sensitive to light in the visible spectrum.
• This image (or set of several images) is used to calculate a map MS1 of the normal directions to the face 10 in a chosen number of its points.
• the transformation T1 makes it possible to pass from the signal PS1 to a card MS1 of "measured" normals of the face 10.
• a simulation makes it possible to obtain a first absolute estimation ES1 of the normals for an initial face. known.
• absolute it is meant that the estimate gives access to an unambiguous result. This is not the case, for example an interferometric measurement in reflection geometry on the first face, performed at a wavelength ⁇ . Since this type of measurement is based on a phase variation measurement, its simulation allows access only to a map of the heights of the first face which is ambiguous, modulo ⁇ : the estimate in this case is not absolute.
• the MS1 map of the measured normals is the target of a reconstruction problem that is solved by optimization at the subsequent step S10 from the knowledge of the simulation to obtain the first absolute estimate.
• the present invention is not limited to the embodiment described by way of example; thus, it is possible to use other methods for measuring the first signal MS1 than the deflectometry of fringe in reflection, for example a deflectometry method using projection fringes or using an Ronchi grating.
• the measurement of the first signal MS1 is a zonal or multipoint measurement. More precisely, here it is described as “zonal” or “multipoint” a measurement of a signal MS1 resulting from a first transformation of a probe signal by, simultaneously, a plurality of points of the first face of the optical component.
• the first face 10 is illuminated by a network of fringes and the extent of this network is greater than the size of the first face 10.
• the zonal measurement can be obtained by a collection of elementary zonal measurements made for example with a network of fringes as described above, illuminating only a fraction of the first surface that will be called "elementary zone".
• the elementary zonal measurement measures the signal resulting from the reflection of the fringe network by the elementary zone.
• the elementary zonal measurements are repeated until the elementary zones cover the whole of the first face.
• the zonal measurement is obtained by splicing the various elementary zonal measurements.
• this second embodiment for a zonal measurement made from two elementary zonal measurements can be described as follows: the first face 10 is illuminated by a network of fringes whose extent is smaller than the total area of the first For example, consider that the fringe network covers 60% of the surface of the first face 10. A first elementary zonal measurement is performed as indicated above on a first elementary zone Z1 corresponding to the 60% of the first covered face. by the network for a first position of the first face with respect to the network.
• first face 10 To measure the entirety of the first face 10, we then move said first face 10 relative to the network so that the latter is projected on another part of the face 10 and covers a second elementary zone Z2, for example an area still covering 60% of the surface of the first face, but where the zones Z1 and Z2 elementary overlap on a surface corresponding to 20% of the total surface of the first face.
• a measurement head projecting the probe signal on the second elementary zone after having projected it on the first zone Z1.
• a splicing of the two elementary zonal measurements is performed to constitute the measurement of the first signal SM1 from the probe signal constituted by the fringe network.
• the splicing is done numerically by seeking to maximize the autocorrelation function of the signal SM1 on the overlap zone between the two elementary zones Z1 and Z2. In this case, only one constraint is necessary: it is necessary for the overlap zone between the elementary zones to contain enough information to obtain a good autocorrelation function.
• This overlap between the elementary zones is not essential in the case where the first face 10 is provided with a marker, optical or mechanical, making it possible to easily position one of the elementary zonal measurements relative to the other, for example for a unifocal lens. .
• the number of elementary zonal measurements for performing a zonal measurement of one of the faces of the component does not exceed 10.
• This second embodiment which is not limited to the type of measurement in reflection of a network of fringes, has the advantage of making it possible to perform a zonal measurement in several sockets, for certain applications to allow a measurement of one face large area with the same probe signal or to obtain even greater accuracy on the zonal measurement.
• Step S2 Transmission Measurement, Through the First and Second Faces Using a Hartmann Method:
• a parallel ray optical beam PS2 is sent through faces 10 and 20 of the component to be measured.
• the beams constituting the beam undergo a refraction-related deviation at the two interfaces 10, 20 of the component.
• Part of the deviated rays then pass through a matrix of openings to form secondary beams which are finally intercepted by a screen.
• An image of the screen is captured by an image capture device, for example a digital camera sensitive to light in the visible spectrum, the offsets of the secondary beams translated into deviations of the incident light rays characteristic of the effect are acquired.
• optics measured component By a known treatment carried out on the captured image, these offsets are translated into a map MS2 of the normals at the wavefront transmitted by the component.
• the transformation T2 makes it possible to pass from the signal PS2 to a card MS2 of "measured" deviations.
• the knowledge of the ray deviation is associated with a modeling of the behavior of the Hartmann type measuring system. Based on this modeling, a simulation of the deviation of the light rays by a component having two known faces makes it possible to obtain an absolute estimate of the deviations obtained for this component.
• the second measure implemented is singular in that a simulation of its operation provides access to an estimate of the faces of the component removed.
• the MS2 map of the measured deviations is the target of a reconstruction problem which is solved by optimization at the subsequent step S20.
• the present invention is not limited to the embodiment described by way of example; thus, other methods can be used to measure the second signal MS2 than Hartmann's deflectometry in transmission, such as for example a Shack-Hartmann deflectometry method, transmission fringes or Schlieren.
• the first signal MS1 results from the first transformation of the first probe signal PS1 by said first face 10; and the second signal MS2 results from the second transformation of the second probe signal PS2 by said first face 10 and said second face 20.
• the first signal MS1 results from the first transformation of the first probe signal PS1 by said first face 10; and the second signal MS2 results from the second transformation of the second probe signal PS2 by said second face 20.
• the first and / or the second probe signal PS1, PS2 is an optical signal.
• the first signal MS1 is a normal map to the first face 10 obtained by deflectometry measurement of an optical signal constituted by a periodic grating reflected by the first face 10 and the measurement step S2 of the second signal MS2 is a measurement deflectometry of an optical signal transmitted by the first and the second face 10, 20.
• the step S1 for measuring the first signal MS1 is a measurement of deformation of an optical signal reflected by the first face 10 and the step S2 of measuring the second signal MS2 is a measurement of magnification, or magnification, of an optical signal transmitted by the first and second faces 10, 20.
• the measurement of the second signal MS2 is a zonal measurement.
• the measurement of the first signal MS1 and the measurement of the second signal MS2 are zonal measurements.
• said zonal measurement is performed by means of a collection of elementary zonal measurements, in which said elementary zonal measurements each measure an elementary signal resulting from a transformation of a probe signal by an elementary zone of the face (s) (s) ), so that said elementary areas cover all of said (or said) face (s).
• the measurement steps S1, S2 are implemented by a single device.
• Step S3 Determination of a third transformation to go from the first marker R1 to the second marker R2
• the measurement MS2 of the second face is carried out in a reference R2. It is necessary to know a transformation to go from the R1 mark to the R2 mark.
• the step of reconstructing the second face 20 from a second measurement MS2 carried out in transmission generally does not in itself make it possible to position and orient the second estimated face (or reconstructed) with respect to the first estimated face .
• the knowledge of a third transformation for passing from a first reference R1 linked to the measurement of the first signal MS1 to a second reference R2 related to the measurement of the second signal MS2 is necessary to achieve this.
• R1 here means reference of an affine space, defined by an origin and 3 independent directions.
• the third transformation is therefore an affine transformation which can be defined by means of a vector which separates the origin of R1 and the origin of R2 and a rotation matrix of order 3 to express the rotations necessary to pass.
• axes of the reference R1 to the axes of the R2 mark.
• the knowledge of the third transformation passes through an independent determination of the measurement of the first and the second signal MS2.
• the third transformation can be determined at a reference point: the thickness at the center of the component is measured for example using a mechanical or optical probing system. This makes it possible to know the distance between the faces 10 and 20 of the component at this reference point.
• Step S3 depends on the type of measurement performed in steps S1 and S2.
• steps S1 and S2 relate to altitudes (for example in a mechanical probe), the available information is sufficient to fully reconstruct the face.
• the measurement concerns data of order one (for example normals, or optical deviations), there is an indeterminacy and the reconstruction can not take place without giving the altitude of a point of the face (the problem of reconstruction has an infinity of solutions).
• a measurement of the thickness at the center of the component makes it possible to position the face to be reconstructed in space.
• the prism measurement can be directly translated into a transformation between the first face and the second face. If the prism measurement is performed by an incident ray that is not normal to the first face, then the prism depends on the second face. It is therefore necessary to reconstruct simultaneously the second face and the orientation of the second face in space (the altitude being given by the measurement of the center thickness). In the latter situation, the step S20 described below leads to a simultaneous determination of the third transformation and the second face 20.
• the present invention is not limited to the embodiment described by way of example;
• methods for determining the third transformation other than the transmission optical methods mentioned, for example an optical method in reflection, by mechanical probing or by optical probing.
• the measurement steps S1, S2 are performed on different measurement equipment. This makes a common measurement repository necessary to absolutely position the component in the space.
• the first and second measurements can be made, each using a micro-circle pointing system carried on one of the faces of the component or alternatively through a common mechanical reference between measuring systems which guarantees a positioning in an equivalent reference in each of them.
• a self-centered mechanical clamp located in space is used.
• the step (S3) for determining the third transformation comprises a thickness measurement of the component.
• the step (S3) for determining the third transformation further includes a measurement of the prism of the component.
• Step S10 Estimation of the first face 10 made in particular from the first signal MS1.
• a first reconstruction aims to estimate the first face 10 of the component. Considering a first virtual face 1 1 positioned in space under the same conditions (position and orientation) as the first face 10 of the physical component during the deformation measurement of the fringe network.
• the reference in which the measurement MS1 is carried out is called R1 and in which the position of the first face 10 and the position of the first virtual face 11 are known.
• Starting values are defined for the first virtual face 11, for example a spherical shape.
• the simulation of the transformation of the signal PS1 by the virtual face 1 1 makes it possible to calculate an estimate ES1 of the normals of the virtual face 1 1.
• a cost function V1 is defined, which can be calculated for current values of the virtual face 1 1 of the component; this cost function V1 is designed to present a minimum or maximum value when the values of the estimate ES1 of the measurement made with the virtual face 1 1 are equal to the values of the measurement MS1.
• the value of the cost function quantifies the difference between the simulation of measurement ES1 and measurement MS1. For each measurement point, we can consider the norm of the vector equal to the difference between the normal indicating vector that comes from the measurement and the vector indicating the normal that comes from the simulation.
• a cost function can be the quadratic sum of the vector norms for all measurement points.
• an iterative optimization algorithm modifies the virtual face 1 1 in order to decrease the cost function V1.
• a least squares algorithm is used such as Gauss-Newton, or Levenberg-Marquardt described in Numerical Optimization, Bonnas et al., Springer 2003.
• the algorithm proposes a new virtual face 1 1; the simulation of the transformation T1 by this new virtual face 1 1 makes it possible to calculate a new value V1 of the cost function.
• the iterative process is interrupted for example when when a stop criterion is verified for example when the value taken by the cost function V1 can no longer be reduced, or when the value of the cost function V1 is less than a threshold given.
• a virtual face 1 1 which is a correct estimate of the measured face 10 since the difference between the measurement and the simulation of this measurement via the transformation T1 is reduced.
• Step S20 Estimation of the second face 20 made in particular from the first signal MS2.
• a virtual component is constituted, the first face of which is the result of the reconstruction of the first face 10 estimated from the measurement MS1, and the second face of which is a second virtual face 21.
• the third transformation determined at the step S3 is the law of passage of the reference frame R1 in which is expressed the first estimated face towards the reference R2 in which is the position of the second face 20 is identified during the measurement carried out in step 2. This third transformation makes it possible to constructing the virtual component in the space and placing it virtually under the same conditions as the component (the physical part) during the measurement carried out in step S2.
• the norm of the vector equal to the difference between the measured deviated vector and the simulated deviated vector can be considered.
• a cost function can be the quadratic sum of these norms.
• an iterative optimization algorithm modifies the virtual face 21 of the component in order to decrease the value of the cost function V2.
• a least squares algorithm such as Gauss-Newton, or Levenberg-Marquardt ("Numerical Optimization", Bonnas et al., Springer, 2003) can be used for this purpose.
• the algorithm proposes a new virtual face 21; the simulation of the transformation T2 by this new face 21 makes it possible to calculate a new value V2 of the cost function.
• the iterative process stops, for example, when the value of the cost function can no longer be reduced, or when the value of the cost function is lower than a given threshold.
• We then have a virtual face 21 which is an estimate E2 of the measured face 20 since the difference between the measurement and the simulation of this measurement via the transformation T2 is small.
• each estimation step S10, S20 is iterative, each iteration consisting of:
• step b Measure the difference between the estimate ES1, ES2 calculated in step a and the measured signal MS1; MS2 using the cost function V1, V2; c If a stopping criterion the difference measured in step b is not verified, modify the virtual face 1 1; 21 to reduce said gap and return to step a;
• the estimate 21 of said second face 20 is further obtained from the estimate 1 1 of said first face 10.
• the estimation steps S10, S20 comprise a step where the virtual face 11, 21 is expressed in an analytical form.
• the advantage of this step is to accelerate the calculations, and ultimately provide an estimate of the geometric structure of the component in a form easily manipulated in subsequent numerical calculations.
• FIG. 5 schematically represents a system for measuring the geometrical structure of a component delimited by a first face face 10f ace and a second face face20face; said system comprising
• a first calculation means CM1 configured to estimate said first face from the first signal MS1, said first simulation, a first virtual face 1 1 and a first cost function V1 quantifying a difference between the first estimate ES1 and the first signal MS1;
• a second calculation means CM2 configured to estimate said second face 20 from the second signal MS2, said second simulation, a second face 21 virtual signal, said third transformation and a second cost function V2 quantifying a difference between the second estimate ES2 and the second signal MS2.
• the estimate of the first surface 10 serves to estimate the second surface 20.
• the first calculation means CM1 makes a measurement of deformation of an optical signal reflected by the first face 10; and the second calculation means CM2 carries out a measurement of magnification or magnification of an optical signal transmitted by the first and second faces 10, 20.
• the first calculation means (CM1) makes a map of normals to the first face (10) obtained by deflectometry measurement of an optical signal constituted by a periodic grating reflected by the first face (10);
• CM2 performs a deflectometry measurement of an optical signal transmitted by the first and the second face (10, 20).
• a system according to one embodiment of the invention comprises measurement means MM1, MM2 of an optical measurement system configured to perform measurements of faces 10, 20 of an optical component expressed in a reference system specific to said system. .
• At least one of said measuring means MM1, MM2 performs a zonal measurement.
• said first and second measuring means MM1, MM2 perform a zonal measurement.
• One of the applications of this measurement of the geometric structure to an ophthalmic lens may be the comparative analysis of a lens after machining with a nominal part, for example to study the conformity of the piece produced.
• the measured ophthalmic lens and the nominal part are brought back into a common reference frame, for example linked to the part where the measurement is made.
• the position of the measured ophthalmic lens and of the nominal part is then determined in the measurement reference frame either by the association of a mechanical reference on the lens and the workpiece, such as a flat surface, or by the permanent marking score. on the lens and the piece, of the micro-circle type.
• the reference to "an embodiment” means that a particular feature, structure, or feature described in connection with the Embodiment may be included in at least one implementation of the invention.
• the appearances of the phrase "in one embodiment" at various places in the foregoing detailed description are not necessarily all referable to the same embodiment, Similarly, separate or alternative embodiments are not necessarily mutually exclusive. other embodiments.

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