IN2014CN03711A - - Google Patents

Info

Publication number
IN2014CN03711A
IN2014CN03711A IN3711CHN2014A IN2014CN03711A IN 2014CN03711 A IN2014CN03711 A IN 2014CN03711A IN 3711CHN2014 A IN3711CHN2014 A IN 3711CHN2014A IN 2014CN03711 A IN2014CN03711 A IN 2014CN03711A
Authority
IN
India
Prior art keywords
micro
layer
receiving substrate
utilized
micro devices
Prior art date
Application number
Other languages
English (en)
Inventor
Hsin Hua Hu
Andreas Bibl
John A Higginson
Hung Fai Stephen Law
Original Assignee
Luxvue Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US13/372,422 external-priority patent/US8349116B1/en
Priority claimed from US13/436,260 external-priority patent/US8573469B2/en
Priority claimed from US13/436,314 external-priority patent/US8518204B2/en
Application filed by Luxvue Technology Corp filed Critical Luxvue Technology Corp
Publication of IN2014CN03711A publication Critical patent/IN2014CN03711A/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/20—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
    • F21V7/00—Reflectors for light sources
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/75—Apparatus for connecting with bump connectors or layer connectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/93—Batch processes
    • H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/075—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
    • H01L25/0753—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00 the devices being arranged next to each other
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/15—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0684—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape, relative sizes or dispositions of the semiconductor regions or junctions between the regions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005—Processes
    • H01L33/0093—Wafer bonding; Removal of the growth substrate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005—Processes
    • H01L33/0095—Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/04—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/04—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
    • H01L33/06—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction within the light emitting region, e.g. quantum confinement structure or tunnel barrier
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/26—Materials of the light emitting region
    • H01L33/28—Materials of the light emitting region containing only elements of Group II and Group VI of the Periodic Table
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/26—Materials of the light emitting region
    • H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
    • H01L2224/7598—Apparatus for connecting with bump connectors or layer connectors specially adapted for batch processes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8319—Arrangement of the layer connectors prior to mounting
    • H01L2224/83191—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on the semiconductor or solid-state body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/93—Batch processes
    • H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/15—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission
    • H01L27/153—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission in a repetitive configuration, e.g. LED bars
    • H01L27/156—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission in a repetitive configuration, e.g. LED bars two-dimensional arrays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/12—Passive devices, e.g. 2 terminal devices
    • H01L2924/1204—Optical Diode
    • H01L2924/12041—LED
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/12—Passive devices, e.g. 2 terminal devices
    • H01L2924/1204—Optical Diode
    • H01L2924/12042—LASER
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
    • H01L33/40—Materials therefor
    • H01L33/405—Reflective materials

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Ceramic Engineering (AREA)
  • Led Devices (AREA)
  • Led Device Packages (AREA)
  • Light Receiving Elements (AREA)
IN3711CHN2014 2011-11-18 2012-11-08 IN2014CN03711A (ja)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
US201161561706P 2011-11-18 2011-11-18
US201261594919P 2012-02-03 2012-02-03
US201261597109P 2012-02-09 2012-02-09
US201261597658P 2012-02-10 2012-02-10
US13/372,422 US8349116B1 (en) 2011-11-18 2012-02-13 Micro device transfer head heater assembly and method of transferring a micro device
US13/436,260 US8573469B2 (en) 2011-11-18 2012-03-30 Method of forming a micro LED structure and array of micro LED structures with an electrically insulating layer
US13/436,314 US8518204B2 (en) 2011-11-18 2012-03-30 Method of fabricating and transferring a micro device and an array of micro devices utilizing an intermediate electrically conductive bonding layer
PCT/US2012/064215 WO2013074370A1 (en) 2011-11-18 2012-11-08 Method of forming a micro led structure and array of micro led structures with an electrically insulating layer

Publications (1)

Publication Number Publication Date
IN2014CN03711A true IN2014CN03711A (ja) 2015-10-09

Family

ID=48430052

Family Applications (1)

Application Number Title Priority Date Filing Date
IN3711CHN2014 IN2014CN03711A (ja) 2011-11-18 2012-11-08

Country Status (9)

Country Link
EP (1) EP2780954B1 (ja)
JP (1) JP6100275B2 (ja)
KR (1) KR101596386B1 (ja)
AU (1) AU2012339938B2 (ja)
BR (1) BR112014011807A2 (ja)
IN (1) IN2014CN03711A (ja)
MX (1) MX336453B (ja)
TW (2) TWI559572B (ja)
WO (2) WO2013074370A1 (ja)

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JP6959697B2 (ja) 2016-01-15 2021-11-05 ロヒンニ リミテッド ライアビリティ カンパニー 装置上のカバーを介してバックライトで照らす装置及び方法
US10032827B2 (en) * 2016-06-29 2018-07-24 Applied Materials, Inc. Systems and methods for transfer of micro-devices
DE102016112584B4 (de) 2016-07-08 2024-10-24 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Halbleiterchip, Verfahren zur Herstellung eines Halbleiterchips und Vorrichtung mit einer Mehrzahl von Halbleiterchips
US10854779B2 (en) 2016-11-07 2020-12-01 Goertek. Inc Micro-LED transfer method and manufacturing method
JP6850112B2 (ja) * 2016-11-28 2021-03-31 株式会社ディスコ Ｌｅｄ組み立て方法
JP6918537B2 (ja) * 2017-03-24 2021-08-11 東レエンジニアリング株式会社 ピックアップ方法、ピックアップ装置、及び実装装置
TWI633646B (zh) 2017-04-06 2018-08-21 優顯科技股份有限公司 用於批量移轉微半導體結構之方法
CN106990519B (zh) * 2017-05-12 2024-09-24 中国科学院苏州生物医学工程技术研究所 结构光照明显微成像系统
TWI661533B (zh) 2017-06-07 2019-06-01 台灣愛司帝科技股份有限公司 晶片安裝系統以及晶片安裝方法
TWI636587B (zh) * 2017-07-28 2018-09-21 泰谷光電科技股份有限公司 Light-emitting diode structure for avoiding light leakage on side and back sides and manufacturing method thereof
TWI647810B (zh) * 2017-10-13 2019-01-11 行家光電股份有限公司 微元件之巨量排列方法及系統
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CN107887331B (zh) * 2017-11-11 2020-04-10 福州大学 一种Micro-LED发光显示器件的制备方法
TWI706554B (zh) 2017-12-13 2020-10-01 友達光電股份有限公司 畫素陣列基板及其製造方法
KR102428029B1 (ko) 2017-12-20 2022-08-02 (주)포인트엔지니어링 마이크로 led 전사헤드
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WO2019176409A1 (ja) 2018-03-13 2019-09-19 富士フイルム株式会社 硬化膜の製造方法、固体撮像素子の製造方法
KR20190114330A (ko) 2018-03-29 2019-10-10 (주)포인트엔지니어링 마이크로 led 전사헤드
KR102481434B1 (ko) 2018-03-30 2022-12-26 (주)포인트엔지니어링 전사헤드 및 이를 이용한 마이크로 led 흡착방법
KR20190114372A (ko) 2018-03-30 2019-10-10 (주)포인트엔지니어링 마이크로 led 전사 시스템
KR102424246B1 (ko) 2018-03-30 2022-07-25 (주)포인트엔지니어링 전사헤드를 구비한 마이크로 led 전사 시스템
KR20190117180A (ko) 2018-04-06 2019-10-16 (주)포인트엔지니어링 마이크로 led 흡착체 및 이를 이용한 마이크로 led 검사시스템
KR102498037B1 (ko) 2018-04-20 2023-02-10 (주)포인트엔지니어링 마이크로 led 흡착체
TW201944086A (zh) 2018-04-06 2019-11-16 南韓商普因特工程有限公司 微發光二極體吸附體
KR102471585B1 (ko) 2018-04-06 2022-11-28 (주)포인트엔지니어링 마이크로 led 흡착체 및 이를 이용한 마이크로 led 검사시스템
TWI672466B (zh) * 2018-04-11 2019-09-21 台灣愛司帝科技股份有限公司 微型發光二極體顯示器及其製作方法
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KR20190120598A (ko) 2018-04-16 2019-10-24 (주)포인트엔지니어링 마이크로 led 흡착체를 포함하는 마이크로 led 전사 시스템
KR102498109B1 (ko) 2018-04-20 2023-02-09 (주)포인트엔지니어링 마이크로 led 전사 시스템
KR20190124920A (ko) 2018-04-27 2019-11-06 (주)포인트엔지니어링 소자 전사 헤드
KR102498112B1 (ko) 2018-04-27 2023-02-09 (주)포인트엔지니어링 마이크로 led 전사 헤드
TWI658612B (zh) * 2018-05-02 2019-05-01 態金材料科技股份有限公司 Light-emitting diode structure capable of gaining light output performance
KR20190131311A (ko) 2018-05-16 2019-11-26 (주)포인트엔지니어링 마이크로 led 흡착체
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KR102527138B1 (ko) 2018-05-16 2023-04-28 (주)포인트엔지니어링 마이크로 led 전사 시스템
KR102457191B1 (ko) 2018-05-16 2022-10-20 (주)포인트엔지니어링 마이크로 led 전사 시스템
KR102540860B1 (ko) 2018-05-29 2023-06-07 (주)포인트엔지니어링 마이크로 led 전사헤드 및 이를 이용한 마이크로 led 전사 시스템
CN110544661A (zh) 2018-05-29 2019-12-06 普因特工程有限公司 微led转印头及利用其的微led转印系统
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KR20190135862A (ko) 2018-05-29 2019-12-09 (주)포인트엔지니어링 마이크로 led 전사 시스템
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