IL203250A - Methods for extracting, desecrating, imagining and controlling the semiconductor device feature - Google Patents

Methods for extracting, desecrating, imagining and controlling the semiconductor device feature

Info

Publication number
IL203250A
IL203250A IL203250A IL20325010A IL203250A IL 203250 A IL203250 A IL 203250A IL 203250 A IL203250 A IL 203250A IL 20325010 A IL20325010 A IL 20325010A IL 203250 A IL203250 A IL 203250A
Authority
IL
Israel
Prior art keywords
visualization
generation
semiconductor device
monitoring methods
device property
Prior art date
Application number
IL203250A
Other languages
English (en)
Hebrew (he)
Original Assignee
Kla Tencor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kla Tencor Corp filed Critical Kla Tencor Corp
Publication of IL203250A publication Critical patent/IL203250A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
IL203250A 2007-07-30 2010-01-11 Methods for extracting, desecrating, imagining and controlling the semiconductor device feature IL203250A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/830,485 US8611639B2 (en) 2007-07-30 2007-07-30 Semiconductor device property extraction, generation, visualization, and monitoring methods
PCT/US2008/071587 WO2009018337A1 (en) 2007-07-30 2008-07-30 Semiconductor device property extraction, generation, visualization, and monitoring methods

Publications (1)

Publication Number Publication Date
IL203250A true IL203250A (en) 2015-03-31

Family

ID=40042596

Family Applications (1)

Application Number Title Priority Date Filing Date
IL203250A IL203250A (en) 2007-07-30 2010-01-11 Methods for extracting, desecrating, imagining and controlling the semiconductor device feature

Country Status (5)

Country Link
US (1) US8611639B2 (enExample)
JP (1) JP5662146B2 (enExample)
KR (1) KR101381300B1 (enExample)
IL (1) IL203250A (enExample)
WO (1) WO2009018337A1 (enExample)

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KR101381300B1 (ko) 2014-04-04
WO2009018337A1 (en) 2009-02-05
KR20100046240A (ko) 2010-05-06
US8611639B2 (en) 2013-12-17
US20090037134A1 (en) 2009-02-05
JP5662146B2 (ja) 2015-01-28
JP2010535430A (ja) 2010-11-18

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