IL156150A - מזין לבדיקת פאון והתקן לבדיקת פאון - Google Patents

מזין לבדיקת פאון והתקן לבדיקת פאון

Info

Publication number
IL156150A
IL156150A IL156150A IL15615003A IL156150A IL 156150 A IL156150 A IL 156150A IL 156150 A IL156150 A IL 156150A IL 15615003 A IL15615003 A IL 15615003A IL 156150 A IL156150 A IL 156150A
Authority
IL
Israel
Prior art keywords
inspection
polyhedron
inspection object
chip
forming member
Prior art date
Application number
IL156150A
Other languages
English (en)
Other versions
IL156150A0 (en
Original Assignee
Lintec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lintec Corp filed Critical Lintec Corp
Publication of IL156150A0 publication Critical patent/IL156150A0/xx
Publication of IL156150A publication Critical patent/IL156150A/he

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Sorting Of Articles (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Feeding Of Articles To Conveyors (AREA)
  • Attitude Control For Articles On Conveyors (AREA)
  • Specific Conveyance Elements (AREA)
IL156150A 2002-06-27 2003-05-27 מזין לבדיקת פאון והתקן לבדיקת פאון IL156150A (he)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002187661A JP4121319B2 (ja) 2002-06-27 2002-06-27 多面体検査用フィーダー

Publications (2)

Publication Number Publication Date
IL156150A0 IL156150A0 (en) 2003-12-23
IL156150A true IL156150A (he) 2009-11-18

Family

ID=30437039

Family Applications (1)

Application Number Title Priority Date Filing Date
IL156150A IL156150A (he) 2002-06-27 2003-05-27 מזין לבדיקת פאון והתקן לבדיקת פאון

Country Status (6)

Country Link
JP (1) JP4121319B2 (he)
KR (1) KR100955624B1 (he)
CN (1) CN100419369C (he)
IL (1) IL156150A (he)
SG (1) SG115544A1 (he)
TW (1) TWI276592B (he)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1987395B (zh) * 2005-12-23 2012-05-16 鸿富锦精密工业（深圳）有限公司 量测装置
NO327576B1 (no) * 2006-06-01 2009-08-17 Ana Tec As Framgangsmate og apparat for analyse av objekter
CN101412025B (zh) * 2007-10-16 2013-06-05 鸿富锦精密工业（深圳）有限公司 射出成型工件自动检验方法及检验系统
JP2009216698A (ja) * 2008-02-07 2009-09-24 Camtek Ltd 対象物の複数の側面を画像化するための装置および方法
JP6088855B2 (ja) * 2013-02-28 2017-03-01 モレックス エルエルシー 外観検査装置及び外観検査方法
JP6477686B2 (ja) * 2014-03-27 2019-03-06 株式会社村田製作所 姿勢変換装置・整列装置及び姿勢変換方法・整列方法
CN104990931B (zh) * 2015-07-14 2018-01-09 苏州佳祺仕信息科技有限公司 电容拨动装置
CN107402219A (zh) * 2017-08-21 2017-11-28 苏州巨智能装备有限公司 电芯外观视觉检测设备及其检测方法
CN107934436B (zh) * 2017-11-28 2019-06-25 广州智能装备研究院有限公司 一种理料输送系统
CN108160530A (zh) * 2017-12-29 2018-06-15 苏州德创测控科技有限公司 一种上料平台及工件上料方法
CN108355980A (zh) * 2017-12-30 2018-08-03 芜湖慧盈自动化设备有限公司 一种不良品分拣的电容外壳用输送装置
CN109499916B (zh) * 2018-11-21 2021-01-05 浙江硕和机器人科技有限公司 管接头视觉检测方法
CN110631508A (zh) * 2019-09-25 2019-12-31 武汉虹之彩包装印刷有限公司 一种高精度定位的纸张卷曲度检测装置
CN111701891B (zh) * 2020-07-17 2021-05-18 山东广鹏信息科技有限公司 一种基于弱电工程智能化检测设备
CN114713519B (zh) * 2022-03-30 2023-07-25 浙江五洲新春集团股份有限公司 一种叶片外观缺陷自动检测系统

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10194431A (ja) * 1996-12-30 1998-07-28 Taiyo Yuden Co Ltd チップ状部品供給装置
JP3393056B2 (ja) * 1998-01-30 2003-04-07 東京製綱株式会社 スローアウェイチップ類の検査装置
JP3515435B2 (ja) * 1999-07-30 2004-04-05 リンテック株式会社 ワーク検査装置及び検査方法
JP4887523B2 (ja) * 2000-12-28 2012-02-29 リンテック株式会社 多面体検査用フィーダー及び多面体検査装置

Also Published As

Publication number Publication date
CN1470846A (zh) 2004-01-28
TWI276592B (en) 2007-03-21
CN100419369C (zh) 2008-09-17
KR100955624B1 (ko) 2010-05-03
JP4121319B2 (ja) 2008-07-23
IL156150A0 (en) 2003-12-23
SG115544A1 (en) 2005-10-28
TW200400148A (en) 2004-01-01
KR20040002544A (ko) 2004-01-07
JP2004026453A (ja) 2004-01-29

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