IL156150A0 - Polyhedron inspection feeder and polyhedron inspection apparatus - Google Patents

Polyhedron inspection feeder and polyhedron inspection apparatus

Info

Publication number
IL156150A0
IL156150A0 IL15615003A IL15615003A IL156150A0 IL 156150 A0 IL156150 A0 IL 156150A0 IL 15615003 A IL15615003 A IL 15615003A IL 15615003 A IL15615003 A IL 15615003A IL 156150 A0 IL156150 A0 IL 156150A0
Authority
IL
Israel
Prior art keywords
polyhedron inspection
feeder
polyhedron
inspection apparatus
inspection
Prior art date
Application number
IL15615003A
Other versions
IL156150A (en
Original Assignee
Lintec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lintec Corp filed Critical Lintec Corp
Publication of IL156150A0 publication Critical patent/IL156150A0/en
Publication of IL156150A publication Critical patent/IL156150A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Sorting Of Articles (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Attitude Control For Articles On Conveyors (AREA)
  • Specific Conveyance Elements (AREA)
  • Feeding Of Articles To Conveyors (AREA)
IL156150A 2002-06-27 2003-05-27 Polyhedron inspection feeder and polyhedron inspection apparatus IL156150A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002187661A JP4121319B2 (en) 2002-06-27 2002-06-27 Polyhedral inspection feeder

Publications (2)

Publication Number Publication Date
IL156150A0 true IL156150A0 (en) 2003-12-23
IL156150A IL156150A (en) 2009-11-18

Family

ID=30437039

Family Applications (1)

Application Number Title Priority Date Filing Date
IL156150A IL156150A (en) 2002-06-27 2003-05-27 Polyhedron inspection feeder and polyhedron inspection apparatus

Country Status (6)

Country Link
JP (1) JP4121319B2 (en)
KR (1) KR100955624B1 (en)
CN (1) CN100419369C (en)
IL (1) IL156150A (en)
SG (1) SG115544A1 (en)
TW (1) TWI276592B (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1987395B (en) * 2005-12-23 2012-05-16 鸿富锦精密工业（深圳）有限公司 Measuring device
NO327576B1 (en) * 2006-06-01 2009-08-17 Ana Tec As Method and apparatus for analyzing objects
CN101412025B (en) * 2007-10-16 2013-06-05 鸿富锦精密工业（深圳）有限公司 Automatic testing method of injection molding workpiece and inspection system thereof
JP2009216698A (en) * 2008-02-07 2009-09-24 Camtek Ltd Apparatus and method for imaging multiple sides of object
JP6088855B2 (en) * 2013-02-28 2017-03-01 モレックス エルエルシー Appearance inspection apparatus and appearance inspection method
KR101981512B1 (en) * 2014-03-27 2019-05-23 가부시키가이샤 무라타 세이사쿠쇼 Posture changing device, alignment apparatus, posture changing method, and alignment method
CN104990931B (en) * 2015-07-14 2018-01-09 苏州佳祺仕信息科技有限公司 Electric capacity striking gear
CN107402219A (en) * 2017-08-21 2017-11-28 苏州巨智能装备有限公司 Battery core apparent visual detection device and its detection method
CN107934436B (en) * 2017-11-28 2019-06-25 广州智能装备研究院有限公司 A kind of reason material transportation system
CN108160530A (en) * 2017-12-29 2018-06-15 苏州德创测控科技有限公司 A kind of material loading platform and workpiece feeding method
CN108355980A (en) * 2017-12-30 2018-08-03 芜湖慧盈自动化设备有限公司 A kind of capacitance shell conveying device of defective products sorting
CN109499916B (en) * 2018-11-21 2021-01-05 浙江硕和机器人科技有限公司 Pipe joint visual detection method
CN110631508A (en) * 2019-09-25 2019-12-31 武汉虹之彩包装印刷有限公司 High-precision positioning paper curling degree detection device
CN111701891B (en) * 2020-07-17 2021-05-18 山东广鹏信息科技有限公司 Based on intelligent check out test set of light current engineering
CN114713519B (en) * 2022-03-30 2023-07-25 浙江五洲新春集团股份有限公司 Automatic detection system for appearance defects of blades

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10194431A (en) * 1996-12-30 1998-07-28 Taiyo Yuden Co Ltd Tip-shaped part feeder
JP3393056B2 (en) * 1998-01-30 2003-04-07 東京製綱株式会社 Inspection device for indexable chips
JP3515435B2 (en) * 1999-07-30 2004-04-05 リンテック株式会社 Work inspection device and inspection method
JP4887523B2 (en) * 2000-12-28 2012-02-29 リンテック株式会社 Polyhedron inspection feeder and polyhedron inspection device

Also Published As

Publication number Publication date
IL156150A (en) 2009-11-18
TWI276592B (en) 2007-03-21
TW200400148A (en) 2004-01-01
JP4121319B2 (en) 2008-07-23
CN100419369C (en) 2008-09-17
CN1470846A (en) 2004-01-28
SG115544A1 (en) 2005-10-28
KR20040002544A (en) 2004-01-07
JP2004026453A (en) 2004-01-29
KR100955624B1 (en) 2010-05-03

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Legal Events

Date Code Title Description
FF Patent granted
KB Patent renewed
MM9K Patent not in force due to non-payment of renewal fees