HK25787A - Apparatus for measuring the thickness of thin layers - Google Patents

Apparatus for measuring the thickness of thin layers Download PDF

Info

Publication number
HK25787A
HK25787A HK257/87A HK25787A HK25787A HK 25787 A HK25787 A HK 25787A HK 257/87 A HK257/87 A HK 257/87A HK 25787 A HK25787 A HK 25787A HK 25787 A HK25787 A HK 25787A
Authority
HK
Hong Kong
Prior art keywords
layer
mirror
ray beam
region
thickness
Prior art date
Application number
HK257/87A
Other languages
English (en)
Inventor
Fischer Helmut
Original Assignee
Helmut Fischer Gmbh & Co., Institut Fur Elektronik Und Messtechnik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Helmut Fischer Gmbh & Co., Institut Fur Elektronik Und Messtechnik filed Critical Helmut Fischer Gmbh & Co., Institut Fur Elektronik Und Messtechnik
Publication of HK25787A publication Critical patent/HK25787A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
HK257/87A 1982-10-23 1987-03-26 Apparatus for measuring the thickness of thin layers HK25787A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19823239379 DE3239379A1 (de) 1982-10-23 1982-10-23 Vorrichtung zum messen der dicke duenner schichten

Publications (1)

Publication Number Publication Date
HK25787A true HK25787A (en) 1987-04-03

Family

ID=6176500

Family Applications (1)

Application Number Title Priority Date Filing Date
HK257/87A HK25787A (en) 1982-10-23 1987-03-26 Apparatus for measuring the thickness of thin layers

Country Status (6)

Country Link
US (2) US4597093A (enrdf_load_stackoverflow)
JP (2) JPS5975109A (enrdf_load_stackoverflow)
DE (1) DE3239379A1 (enrdf_load_stackoverflow)
GB (1) GB2129127B (enrdf_load_stackoverflow)
HK (1) HK25787A (enrdf_load_stackoverflow)
SG (1) SG10386G (enrdf_load_stackoverflow)

Families Citing this family (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3239379A1 (de) * 1982-10-23 1984-04-26 Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen Vorrichtung zum messen der dicke duenner schichten
DE3522779A1 (de) * 1984-07-03 1986-01-09 Twin City International, Inc., Amherst, N.Y. Dickenmessinstrument mit stationaerem probenbeobachtungsspiegel
DE3444270A1 (de) * 1984-12-05 1986-06-05 Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen Vorrichtung zum messen der dicke duenner schichten
JPH0539449Y2 (enrdf_load_stackoverflow) * 1985-09-30 1993-10-06
US4860329A (en) * 1986-02-24 1989-08-22 Upa Technology, Inc. X-ray fluorescence thickness measuring device
DE3710437A1 (de) * 1987-04-01 1988-10-20 Helmut Fischer Elektronik & Me Vorrichtung zum messen der dicke duenner schichten
DE3731973A1 (de) * 1987-09-23 1989-04-13 Helmut Fischer Gmbh & Co Vorrichtung zur stabilisierung fuer roentgenfluoreszenzschichtdicken-messgeraete und verfahren hierzu
US4962518A (en) * 1987-12-07 1990-10-09 Twin City International, Inc. Apparatus for measuring the thickness of a coating
US4979203A (en) * 1989-06-19 1990-12-18 Princeton X-Ray Laser X-ray laser microscope apparatus
DE4021388A1 (de) * 1990-07-05 1992-01-16 Twin City Int Inc Vorrichtung zum messen der staerke eines ueberzuges
DE4203887C2 (de) * 1992-02-11 1998-07-23 Helmut Fischer Gmbh & Co Positioniervorrichtung für ein Meßgerät
US5309495A (en) * 1992-03-18 1994-05-03 Helmut Fischer Positioning device for an x-ray thickness measuring system
DE19710420C2 (de) * 1997-03-13 2001-07-12 Helmut Fischer Gmbh & Co Verfahren und Vorrichtung zum Messen der Dicken dünner Schichten mittels Röntgenfluoreszenz
DE19739321C2 (de) * 1997-09-09 2001-09-27 Helmut Fischer Gmbh & Co Verfahren und Einrichtung zum Bestimmen der Meßunsicherheit bei Röntgenfluoreszenz-Schichtdickenmessungen
RU2168166C2 (ru) * 1998-03-30 2001-05-27 Войсковая часть 75360 Рентгенооптический эндоскоп
GB9906011D0 (en) 1999-03-16 1999-05-12 Whiley Foils Ltd Fluorescent materials
US6345086B1 (en) 1999-09-14 2002-02-05 Veeco Instruments Inc. X-ray fluorescence system and method
JP3811089B2 (ja) * 2002-04-15 2006-08-16 株式会社東芝 摩耗量測定方法
DE10259696B4 (de) * 2002-12-18 2018-07-05 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Vorrichtung zum Messen der Dicke dünner Schichten
US7023954B2 (en) * 2003-09-29 2006-04-04 Jordan Valley Applied Radiation Ltd. Optical alignment of X-ray microanalyzers
DE102004020370B4 (de) * 2004-04-23 2006-11-16 Sirona Dental Systems Gmbh Röntgenstrahler und Verfahren zur Erzeugung und Darstellung von Röntgenbildern
US20080302461A1 (en) * 2007-06-08 2008-12-11 E. I. Du Pont De Nemours And Company Transparent Colored High Modulus Interlayers and Laminates Therefrom
US20080318063A1 (en) * 2007-06-22 2008-12-25 Anderson Jerrel C Glass laminates with improved weatherability
US20090155576A1 (en) * 2007-12-18 2009-06-18 E. I. Du Pont De Nemours And Company Glass-less glazing laminates
US7985188B2 (en) * 2009-05-13 2011-07-26 Cv Holdings Llc Vessel, coating, inspection and processing apparatus
PT2251454E (pt) 2009-05-13 2014-10-01 Sio2 Medical Products Inc Revestimento e inspeção de vaso
WO2013170052A1 (en) 2012-05-09 2013-11-14 Sio2 Medical Products, Inc. Saccharide protective coating for pharmaceutical package
US9458536B2 (en) 2009-07-02 2016-10-04 Sio2 Medical Products, Inc. PECVD coating methods for capped syringes, cartridges and other articles
US11624115B2 (en) 2010-05-12 2023-04-11 Sio2 Medical Products, Inc. Syringe with PECVD lubrication
US9878101B2 (en) 2010-11-12 2018-01-30 Sio2 Medical Products, Inc. Cyclic olefin polymer vessels and vessel coating methods
US9272095B2 (en) 2011-04-01 2016-03-01 Sio2 Medical Products, Inc. Vessels, contact surfaces, and coating and inspection apparatus and methods
US11116695B2 (en) 2011-11-11 2021-09-14 Sio2 Medical Products, Inc. Blood sample collection tube
JP6095678B2 (ja) 2011-11-11 2017-03-15 エスアイオーツー・メディカル・プロダクツ・インコーポレイテッド 薬剤パッケージ用の不動態化、ｐＨ保護又は滑性皮膜、被覆プロセス及び装置
US20150297800A1 (en) 2012-07-03 2015-10-22 Sio2 Medical Products, Inc. SiOx BARRIER FOR PHARMACEUTICAL PACKAGE AND COATING PROCESS
CN104854257B (zh) 2012-11-01 2018-04-13 Sio2医药产品公司 涂层检查方法
EP2920567B1 (en) 2012-11-16 2020-08-19 SiO2 Medical Products, Inc. Method and apparatus for detecting rapid barrier coating integrity characteristics
WO2014085348A2 (en) 2012-11-30 2014-06-05 Sio2 Medical Products, Inc. Controlling the uniformity of pecvd deposition on medical syringes, cartridges, and the like
US9764093B2 (en) 2012-11-30 2017-09-19 Sio2 Medical Products, Inc. Controlling the uniformity of PECVD deposition
WO2014134577A1 (en) 2013-03-01 2014-09-04 Sio2 Medical Products, Inc. Plasma or cvd pre-treatment for lubricated pharmaceutical package, coating process and apparatus
DE102013102270A1 (de) * 2013-03-07 2014-09-11 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Optischer Spiegel, Röntgenfluoreszenzanalysegerät und Verfahren zur Röntgenfluoreszenzanalyse
CN105392916B (zh) 2013-03-11 2019-03-08 Sio2医药产品公司 涂布包装材料
US9937099B2 (en) 2013-03-11 2018-04-10 Sio2 Medical Products, Inc. Trilayer coated pharmaceutical packaging with low oxygen transmission rate
EP2971227B1 (en) 2013-03-15 2017-11-15 Si02 Medical Products, Inc. Coating method.
EP3122917B1 (en) 2014-03-28 2020-05-06 SiO2 Medical Products, Inc. Antistatic coatings for plastic vessels
KR102786617B1 (ko) 2015-08-18 2025-03-26 에스아이오2 메디컬 프로덕츠, 엘엘씨 산소 전달률이 낮은, 의약품 및 다른 제품의 포장용기
CN109323653B (zh) * 2018-11-14 2024-03-08 江苏一六仪器有限公司 一种x光光斑定位仪及其定位方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1976179A (en) * 1930-04-28 1934-10-09 Mannl Rudolf Adjusting device for x-ray tubes
DE1084044B (de) * 1958-04-01 1960-06-23 Berthold W Schumacher Dipl Phy Satz dynamischer Druckstufen
US3717768A (en) * 1970-02-09 1973-02-20 Medinova Ab X-ray filter device in combination with a positioning light converging means
JPS51121388A (en) * 1975-04-16 1976-10-23 Nec Corp Apparatus for adjusting a specimen for x-ray diffration camera
AT354160B (de) * 1977-12-21 1979-12-27 Oesterr Studien Atomenergie Einrichtung zur bestimmung des spezifischen gewichtes von ausgewaehlten bereichen von mikroskopisch kleinen, planprallelen probe- teilen
JPS5489596A (en) * 1977-12-27 1979-07-16 Nec Corp Swing and iris set for x-rays
JPS5758300U (enrdf_load_stackoverflow) * 1980-09-22 1982-04-06
JPS57129156U (enrdf_load_stackoverflow) * 1981-02-04 1982-08-12
JPS57197454A (en) * 1981-05-29 1982-12-03 Rigaku Denki Kogyo Kk X-ray analysing apparatus
JPS58133239A (ja) * 1982-02-02 1983-08-08 株式会社堀場製作所 照射ｘ線領域モニタ−装置
DE3239379A1 (de) * 1982-10-23 1984-04-26 Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen Vorrichtung zum messen der dicke duenner schichten

Also Published As

Publication number Publication date
GB2129127B (en) 1985-11-13
SG10386G (en) 1987-09-18
US4799246A (en) 1989-01-17
JPS5975109A (ja) 1984-04-27
GB2129127A (en) 1984-05-10
JPH02236106A (ja) 1990-09-19
DE3239379A1 (de) 1984-04-26
US4597093A (en) 1986-06-24
JPH0526122B2 (enrdf_load_stackoverflow) 1993-04-15
DE3239379C2 (enrdf_load_stackoverflow) 1989-04-20
JPH0244363B2 (enrdf_load_stackoverflow) 1990-10-03
GB8310802D0 (en) 1983-05-25

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PE Patent expired