FR2886746B1 - Regulation du niveau de tension de sortie - Google Patents

Regulation du niveau de tension de sortie

Info

Publication number
FR2886746B1
FR2886746B1 FR0505712A FR0505712A FR2886746B1 FR 2886746 B1 FR2886746 B1 FR 2886746B1 FR 0505712 A FR0505712 A FR 0505712A FR 0505712 A FR0505712 A FR 0505712A FR 2886746 B1 FR2886746 B1 FR 2886746B1
Authority
FR
France
Prior art keywords
regulation
output voltage
voltage level
level
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0505712A
Other languages
English (en)
Other versions
FR2886746A1 (fr
Inventor
Gaetan Bracmard
Henri Bottaro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Atmel Corp
Original Assignee
Atmel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atmel Corp filed Critical Atmel Corp
Priority to FR0505712A priority Critical patent/FR2886746B1/fr
Priority to US11/221,008 priority patent/US7907002B2/en
Priority to CN2006800200904A priority patent/CN101194216B/zh
Priority to JP2008515744A priority patent/JP5058158B2/ja
Priority to PCT/US2006/020428 priority patent/WO2006132821A2/fr
Priority to KR1020087000247A priority patent/KR20080017444A/ko
Priority to EP06771283A priority patent/EP1889134A2/fr
Priority to TW095119820A priority patent/TW200705810A/zh
Publication of FR2886746A1 publication Critical patent/FR2886746A1/fr
Application granted granted Critical
Publication of FR2886746B1 publication Critical patent/FR2886746B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is dc
    • G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
FR0505712A 2005-06-06 2005-06-06 Regulation du niveau de tension de sortie Expired - Fee Related FR2886746B1 (fr)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FR0505712A FR2886746B1 (fr) 2005-06-06 2005-06-06 Regulation du niveau de tension de sortie
US11/221,008 US7907002B2 (en) 2005-06-06 2005-09-07 Output level voltage regulation
JP2008515744A JP5058158B2 (ja) 2005-06-06 2006-05-25 出力レベル電圧調整
PCT/US2006/020428 WO2006132821A2 (fr) 2005-06-06 2006-05-25 Regulation du niveau de tension de sortie
CN2006800200904A CN101194216B (zh) 2005-06-06 2006-05-25 输出电平电压调节电路
KR1020087000247A KR20080017444A (ko) 2005-06-06 2006-05-25 출력 레벨 전압 조정
EP06771283A EP1889134A2 (fr) 2005-06-06 2006-05-25 Regulation du niveau de tension de sortie
TW095119820A TW200705810A (en) 2005-06-06 2006-06-05 Voltage regulation circuit and method for regulating voltage at an output pin of a circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0505712A FR2886746B1 (fr) 2005-06-06 2005-06-06 Regulation du niveau de tension de sortie

Publications (2)

Publication Number Publication Date
FR2886746A1 FR2886746A1 (fr) 2006-12-08
FR2886746B1 true FR2886746B1 (fr) 2007-08-10

Family

ID=36373078

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0505712A Expired - Fee Related FR2886746B1 (fr) 2005-06-06 2005-06-06 Regulation du niveau de tension de sortie

Country Status (5)

Country Link
US (1) US7907002B2 (fr)
JP (1) JP5058158B2 (fr)
CN (1) CN101194216B (fr)
FR (1) FR2886746B1 (fr)
TW (1) TW200705810A (fr)

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JP2011053957A (ja) * 2009-09-02 2011-03-17 Toshiba Corp 参照電流生成回路
US8971387B2 (en) * 2009-10-09 2015-03-03 Intersil Americas LLC System and method for providing a full fail-safe capability in signal transmission networks
CN102496381B (zh) * 2011-11-18 2015-04-01 深圳芯邦科技股份有限公司 调整上电电压的方法及装置、上电复位单元、芯片
TWI503644B (zh) 2012-10-05 2015-10-11 Faraday Tech Corp 電壓調節器校正電路
US9461539B2 (en) * 2013-03-15 2016-10-04 Taiwan Semiconductor Manufacturing Company, Ltd. Self-calibrated voltage regulator
JP6122720B2 (ja) * 2013-07-17 2017-04-26 ルネサスエレクトロニクス株式会社 電源電圧遷移照合回路、電源電圧遷移照合方法、及び半導体集積回路
US9704581B2 (en) * 2014-12-27 2017-07-11 Intel Corporation Voltage ramping detection
US9665298B2 (en) * 2015-04-21 2017-05-30 Sandisk Technologies Llc Method and system to reduce power usage on an I/O interface
TWI580984B (zh) * 2015-10-27 2017-05-01 力晶科技股份有限公司 電壓校正電路及電壓校正系統
KR102324194B1 (ko) * 2017-05-22 2021-11-10 삼성전자주식회사 안티퓨즈들을 포함하는 전압 트리밍 회로, 그것의 동작 방법, 그리고 그 전압 트리밍 회로를 포함하는 집적 회로
US10559558B2 (en) * 2017-09-29 2020-02-11 Taiwan Semiconductor Manufacturing Co., Ltd. Pin modification for standard cells
US20200136505A1 (en) * 2018-10-26 2020-04-30 Nxp B.V. Switched resistor dc-dc converter
CN114815943B (zh) * 2022-03-31 2023-03-24 深圳市迪浦电子有限公司 校正修调电路及集成电路
US11908539B2 (en) * 2022-05-31 2024-02-20 Nanya Technology Corporation Voltage regulator for providing word line voltage

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US4638188A (en) * 1984-08-27 1987-01-20 Cray Research, Inc. Phase modulated pulse logic for gallium arsenide
US5652902A (en) * 1993-06-08 1997-07-29 Theseus Research, Inc. Asynchronous register for null convention logic systems
JPH0816260A (ja) * 1994-07-05 1996-01-19 Hitachi Ltd 電源電圧調整方法および装置
US6046896A (en) * 1995-08-11 2000-04-04 Fijitsu Limited DC-to-DC converter capable of preventing overvoltage
JP3363002B2 (ja) * 1995-09-29 2003-01-07 株式会社日立エンジニアリングサービス 機器の試験方法および試験装置
US5675231A (en) * 1996-05-15 1997-10-07 General Electric Company Systems and methods for protecting a single phase motor from circulating currents
JP3003577B2 (ja) * 1996-07-19 2000-01-31 日本電気株式会社 半導体集積回路
JP3442942B2 (ja) * 1996-10-08 2003-09-02 シャープ株式会社 直流安定化電源回路の出力ドライブ回路
US5815355A (en) * 1997-10-06 1998-09-29 Atmel Corporation Modulation compensated clamp circuit
US5945920A (en) * 1997-12-10 1999-08-31 Atmel Corporation Minimum voltage radio frequency indentification
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US6157206A (en) * 1998-12-31 2000-12-05 Intel Corporation On-chip termination
US6512411B2 (en) * 1999-08-05 2003-01-28 Maxim Integrated Products, Inc. Charge pump mode transition control
JP3765703B2 (ja) * 2000-02-01 2006-04-12 本田技研工業株式会社 電源装置
US6229443B1 (en) * 2000-06-23 2001-05-08 Single Chip Systems Apparatus and method for detuning of RFID tag to regulate voltage
JP3597760B2 (ja) * 2000-07-13 2004-12-08 Ｎｅｃエレクトロニクス株式会社 スルーレート調整回路
US6525514B1 (en) * 2000-08-08 2003-02-25 Power Integrations, Inc. Method and apparatus for reducing audio noise in a switching regulator
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KR100403633B1 (ko) * 2001-08-10 2003-10-30 삼성전자주식회사 임피던스 제어회로
JP4212309B2 (ja) * 2002-07-01 2009-01-21 株式会社ルネサステクノロジ 半導体集積回路
TW200412725A (en) * 2002-10-11 2004-07-16 Fairchild Semiconductor Current integrating sense amplifier for memory modules in RFID
US7023672B2 (en) * 2003-02-03 2006-04-04 Primarion, Inc. Digitally controlled voltage regulator
US6861895B1 (en) * 2003-06-17 2005-03-01 Xilinx Inc High voltage regulation circuit to minimize voltage overshoot
WO2006132821A2 (fr) 2005-06-06 2006-12-14 Atmel Corporation Regulation du niveau de tension de sortie

Also Published As

Publication number Publication date
TW200705810A (en) 2007-02-01
FR2886746A1 (fr) 2006-12-08
JP2009510802A (ja) 2009-03-12
JP5058158B2 (ja) 2012-10-24
US20060273847A1 (en) 2006-12-07
US7907002B2 (en) 2011-03-15
CN101194216A (zh) 2008-06-04
CN101194216B (zh) 2012-12-19

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Legal Events

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ST Notification of lapse

Effective date: 20140228