FR2751461B1 - Dispositif de controle de finalite de test - Google Patents

Dispositif de controle de finalite de test

Info

Publication number
FR2751461B1
FR2751461B1 FR9609487A FR9609487A FR2751461B1 FR 2751461 B1 FR2751461 B1 FR 2751461B1 FR 9609487 A FR9609487 A FR 9609487A FR 9609487 A FR9609487 A FR 9609487A FR 2751461 B1 FR2751461 B1 FR 2751461B1
Authority
FR
France
Prior art keywords
integrated circuit
dysfunction
lock
test mode
control device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9609487A
Other languages
English (en)
Other versions
FR2751461A1 (fr
Inventor
Francois Pierre Tailliet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Priority to FR9609487A priority Critical patent/FR2751461B1/fr
Priority to US08/897,869 priority patent/US6055198A/en
Publication of FR2751461A1 publication Critical patent/FR2751461A1/fr
Application granted granted Critical
Publication of FR2751461B1 publication Critical patent/FR2751461B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31719—Security aspects, e.g. preventing unauthorised access during test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/006—Identification
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
FR9609487A 1996-07-22 1996-07-22 Dispositif de controle de finalite de test Expired - Fee Related FR2751461B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR9609487A FR2751461B1 (fr) 1996-07-22 1996-07-22 Dispositif de controle de finalite de test
US08/897,869 US6055198A (en) 1996-07-22 1997-07-21 Device to check the end of a test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9609487A FR2751461B1 (fr) 1996-07-22 1996-07-22 Dispositif de controle de finalite de test

Publications (2)

Publication Number Publication Date
FR2751461A1 FR2751461A1 (fr) 1998-01-23
FR2751461B1 true FR2751461B1 (fr) 1998-11-06

Family

ID=9494564

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9609487A Expired - Fee Related FR2751461B1 (fr) 1996-07-22 1996-07-22 Dispositif de controle de finalite de test

Country Status (2)

Country Link
US (1) US6055198A (fr)
FR (1) FR2751461B1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1817595B1 (fr) * 2004-11-22 2009-03-04 Freescale Semiconductor Inc. Circuit integre et procede permettant de mettre en oeuvre un test securise
KR102648785B1 (ko) * 2017-01-11 2024-03-19 에스케이하이닉스 주식회사 반도체 메모리 장치 및 그 동작 방법

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1047437B (it) * 1975-10-08 1980-09-10 Cselt Centro Studi Lab Telecom Procedimento e dispositivo per il controllo in linea di memorie logiche sequenziali operanti a divisione di tempo
JPS61292755A (ja) * 1985-06-20 1986-12-23 Fujitsu Ltd 半導体集積回路
JPS6447972A (en) * 1987-08-19 1989-02-22 Nec Corp Memory ic testing circuit
JPH081760B2 (ja) * 1987-11-17 1996-01-10 三菱電機株式会社 半導体記憶装置
EP0475588B1 (fr) * 1990-08-17 1996-06-26 STMicroelectronics, Inc. Mémoire à semi-conducteur avec entrée de mode test empêchée pendant couple de démarrage
JPH0612878A (ja) * 1992-06-25 1994-01-21 Mitsubishi Electric Corp 半導体メモリ装置
JPH0676598A (ja) * 1992-08-28 1994-03-18 Mitsubishi Electric Corp 半導体記憶装置
JPH07235200A (ja) * 1994-02-24 1995-09-05 Toshiba Corp 半導体記憶装置
US5594694A (en) * 1995-07-28 1997-01-14 Micron Quantum Devices, Inc. Memory circuit with switch for selectively connecting an input/output pad directly to a nonvolatile memory cell
US5642318A (en) * 1995-12-05 1997-06-24 Cypress Semicondcutor Corporation Testing method for FIFOS

Also Published As

Publication number Publication date
FR2751461A1 (fr) 1998-01-23
US6055198A (en) 2000-04-25

Similar Documents

Publication Publication Date Title
NO331257B1 (no) Programmerbar sylinderlas
TR28890A (tr) Kilitleme cihazi ile ve daha belirli olarak islenmemis anahtarlar, anahtarlar ve bunlar vasitasiyla calistirilan kilitler.
MY118314A (en) Semiconductor integrated circuit
ATE146317T1 (de) Mikroprozessorgesteuertes elektronisches gerät
DE3775639D1 (de) Halbleiteranordnung mit einer schmelzsicherungsschaltung und einer erkennungsschaltung, um schmelzsicherungszustaende in der schmelzsicherungsschaltung zu erkennen.
JPH05158800A (ja) 秘密にされるべき回路の解析を阻止する装置と方法
NL194854B (nl) Klokgenererende schakeling voor klokgestuurde logische schakelingen.
HUP9904346A2 (hu) Cilinderzár kulcscsapdával
ATE221402T1 (de) Biderektionale sperreinrichtung für absturzsicherung
DE69903868T2 (de) Schaltung mit gemischten Signalen und Geräte von integrierten Schaltungen
DE69712660D1 (de) Halbleiterspeicheranordnung mit einer Adressübergangsdetektionsschaltung zur Steuerung von Lese- und Verriegelungsbetrieb
FR2751461B1 (fr) Dispositif de controle de finalite de test
KR910007276A (ko) 직접회로소자용 테스트 회로와 집적회로의 테스트중 구성 비트를 프로그래밍하는 방법
KR880000973A (ko) 오기입 동작방지 기능을 갖는 반도체 메모리장치
ES2078237T3 (es) Sistemas de tratamiento de datos con escritura en memoria transitoria retardada.
US4703163A (en) Security system
ATE177862T1 (de) Verfahren zum scharfschalten einer einbruchmeldeanlage mittels eines einsteckschlosses mit integrierter blockschlossfunktion
DE69009302T2 (de) Vorrichtung zum Schutz gegen Überspannungen von integrierten elektronischen Schaltungen, insbesondere für Anwendungen in der Kraftfahrzeugtechnik.
CA2252989A1 (fr) Micro-ordinateur et methode de controle de la vitesse d'acces
DE50013708D1 (de) Elektronisches Zündstartschlosssystem für ein Kraftfahrzeug
KR920001516A (ko) 데이터 기억장치
DE69424010D1 (de) Integrierte Halbleiterschaltung mit Selbsttestfunktion
ID16264A (id) Pemasangan rangkaian yang memiliki suatu pengaturan
KR100226291B1 (ko) 이모빌라이저 시스템에서의 통신 충돌 방지 회로
SU1241475A1 (ru) Устройство автоматического переключени диапазонов

Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20080331