FR2688904B1 - Circuit de generation de tension de reference. - Google Patents

Circuit de generation de tension de reference.

Info

Publication number
FR2688904B1
FR2688904B1 FR9205286A FR9205286A FR2688904B1 FR 2688904 B1 FR2688904 B1 FR 2688904B1 FR 9205286 A FR9205286 A FR 9205286A FR 9205286 A FR9205286 A FR 9205286A FR 2688904 B1 FR2688904 B1 FR 2688904B1
Authority
FR
France
Prior art keywords
reference voltage
generation circuit
voltage generation
circuit
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9205286A
Other languages
English (en)
Other versions
FR2688904A1 (fr
Inventor
Jae-Hyeong Lee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of FR2688904A1 publication Critical patent/FR2688904A1/fr
Application granted granted Critical
Publication of FR2688904B1 publication Critical patent/FR2688904B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is dc
    • G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
    • G05F3/242—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
    • G05F3/247—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage producing a voltage or current as a predetermined function of the supply voltage
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is dc
    • G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
    • G05F3/242—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
    • G05F3/245—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage producing a voltage or current as a predetermined function of the temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Electromagnetism (AREA)
  • Nonlinear Science (AREA)
  • Automation & Control Theory (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Control Of Electrical Variables (AREA)
  • Dram (AREA)
FR9205286A 1992-03-18 1992-04-29 Circuit de generation de tension de reference. Expired - Fee Related FR2688904B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019920004474A KR950010284B1 (ko) 1992-03-18 1992-03-18 기준전압 발생회로

Publications (2)

Publication Number Publication Date
FR2688904A1 FR2688904A1 (fr) 1993-09-24
FR2688904B1 true FR2688904B1 (fr) 1994-06-03

Family

ID=19330566

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9205286A Expired - Fee Related FR2688904B1 (fr) 1992-03-18 1992-04-29 Circuit de generation de tension de reference.

Country Status (7)

Country Link
JP (1) JPH0643953A (fr)
KR (1) KR950010284B1 (fr)
DE (1) DE4214106A1 (fr)
FR (1) FR2688904B1 (fr)
GB (1) GB2265478B (fr)
IT (1) IT1254948B (fr)
TW (1) TW250603B (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9423034D0 (en) * 1994-11-15 1995-01-04 Sgs Thomson Microelectronics A reference circuit
DE69521287T2 (de) * 1995-03-24 2002-05-02 Sgs Thomson Microelectronics Schaltungsanordnung zur Erzeugung einer Referenzspannung und Detektion eines Versorgungsspannungsabfalls und zugehöriges Verfahren
KR100496792B1 (ko) * 1997-09-04 2005-09-08 삼성전자주식회사 기준전압발생회로
US6242972B1 (en) * 1999-10-27 2001-06-05 Silicon Storage Technology, Inc. Clamp circuit using PMOS-transistors with a weak temperature dependency
KR101133758B1 (ko) * 2005-01-19 2012-04-09 삼성전자주식회사 센서 및 이를 구비한 박막 트랜지스터 표시판
JP5482126B2 (ja) * 2009-11-13 2014-04-23 ミツミ電機株式会社 参照電圧発生回路および受信回路
CN107015594A (zh) * 2017-05-30 2017-08-04 长沙方星腾电子科技有限公司 一种偏置电流产生电路

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56121114A (en) * 1980-02-28 1981-09-22 Seiko Instr & Electronics Ltd Constant-current circuit
US4464588A (en) * 1982-04-01 1984-08-07 National Semiconductor Corporation Temperature stable CMOS voltage reference
US4446383A (en) * 1982-10-29 1984-05-01 International Business Machines Reference voltage generating circuit
US4847518A (en) * 1987-11-13 1989-07-11 Harris Semiconductor Patents, Inc. CMOS voltage divider circuits
GB2214333B (en) * 1988-01-13 1992-01-29 Motorola Inc Voltage sources
JP2674669B2 (ja) * 1989-08-23 1997-11-12 株式会社東芝 半導体集積回路
KR920004587B1 (ko) * 1989-10-24 1992-06-11 삼성전자 주식회사 메모리장치의 기준전압 안정화회로

Also Published As

Publication number Publication date
GB2265478B (en) 1996-01-03
GB2265478A (en) 1993-09-29
ITMI921017A0 (it) 1992-04-29
DE4214106A1 (de) 1993-09-23
JPH0643953A (ja) 1994-02-18
KR930020658A (ko) 1993-10-20
IT1254948B (it) 1995-10-11
KR950010284B1 (ko) 1995-09-12
ITMI921017A1 (it) 1993-10-29
FR2688904A1 (fr) 1993-09-24
TW250603B (fr) 1995-07-01
GB9209196D0 (en) 1992-06-17

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Legal Events

Date Code Title Description
ST Notification of lapse