FR2452789A1 - FIELD EFFECT TRANSISTOR - Google Patents
FIELD EFFECT TRANSISTORInfo
- Publication number
- FR2452789A1 FR2452789A1 FR8007109A FR8007109A FR2452789A1 FR 2452789 A1 FR2452789 A1 FR 2452789A1 FR 8007109 A FR8007109 A FR 8007109A FR 8007109 A FR8007109 A FR 8007109A FR 2452789 A1 FR2452789 A1 FR 2452789A1
- Authority
- FR
- France
- Prior art keywords
- effect transistor
- source
- drain regions
- field effect
- connection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000005669 field effect Effects 0.000 title abstract 2
- 239000004065 semiconductor Substances 0.000 abstract 2
- 238000010276 construction Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/402—Field plates
- H01L29/404—Multiple field plate structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/765—Making of isolation regions between components by field effect
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
- H01L29/42312—Gate electrodes for field effect devices
- H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
- H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
- H01L29/42364—Gate electrodes for field effect devices for field-effect transistors with insulated gate characterised by the insulating layer, e.g. thickness or uniformity
- H01L29/42368—Gate electrodes for field effect devices for field-effect transistors with insulated gate characterised by the insulating layer, e.g. thickness or uniformity the thickness being non-uniform
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7831—Field effect transistors with field effect produced by an insulated gate with multiple gate structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7833—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's
- H01L29/7836—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's with a significant overlap between the lightly doped extension and the gate electrode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Junction Field-Effect Transistors (AREA)
- Local Oxidation Of Silicon (AREA)
- Element Separation (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Bipolar Integrated Circuits (AREA)
Abstract
TRANSISTOR A EFFET DE CHAMP ET SON PROCEDE DE CONSTRUCTION POUR AUGMENTER LES TENSIONS DE PERCAGE ET DE RUPTURE POUR DES POLARISATIONS INVERSES. LE TRANSISTOR COMPREND DES ELECTRODES DE GRILLE 16 ET DE PROTECTION 28, 29, DES REGIONS DE SOURCE ET DE DRAIN 10, 13 DANS UN CORPS SEMI-CONDUCTEUR 21 ET UNE COUCHE ISOLANTE 19 DEPOSEE SUR LA SURFACE DU SEMI-CONDUCTEUR ET COMPORTANT DES TROUS DE CONNEXIONS 11, 14 AUX REGIONS DE SOURCE ET DE DRAIN, L'ELECTRODE DE PROTECTION ENTOURANT LA CONNEXION A LA REGION CORRESPONDANTE ET ETANT PLUS PRES DE CETTE CONNEXION ET PLUS LOIN DE LA SURFACE DU CORPS SEMI-CONDUCTEUR QUE L'ELECTRODE DE GRILLE. APPLICATION AUX CIRCUITS INTEGRES MONOLITHIQUES.FIELD-EFFECT TRANSISTOR AND ITS CONSTRUCTION PROCESS TO INCREASE PIERCING AND BREAKING TENSIONS FOR REVERSE POLARIZATIONS. THE TRANSISTOR CONSISTS OF GRID 16 AND PROTECTION ELECTRODES 28, 29, SOURCE AND DRAIN REGIONS 10, 13 IN A SEMICONDUCTOR BODY 21 AND AN INSULATING LAYER 19 DEPOSITED ON THE SURFACE OF THE SEMICONDUCTOR AND INCLUDING HOLES OF CONNECTIONS 11, 14 AT SOURCE AND DRAIN REGIONS, THE PROTECTION ELECTRODE SURROUNDING THE CONNECTION TO THE CORRESPONDING REGION AND BEING CLOSER TO THIS CONNECTION AND FURTHER FROM THE SURFACE OF THE SEMI-CONDUCTIVE BODY THAN THE GATE ELECTRODE. APPLICATION TO MONOLITHIC INTEGRATED CIRCUITS.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US2484079A | 1979-03-28 | 1979-03-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
FR2452789A1 true FR2452789A1 (en) | 1980-10-24 |
Family
ID=21822678
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR8007109A Withdrawn FR2452789A1 (en) | 1979-03-28 | 1980-03-28 | FIELD EFFECT TRANSISTOR |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS55132054A (en) |
CA (1) | CA1142271A (en) |
DE (1) | DE3011778A1 (en) |
FR (1) | FR2452789A1 (en) |
GB (1) | GB2045525A (en) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4429237A (en) * | 1981-03-20 | 1984-01-31 | International Business Machines Corp. | High voltage on chip FET driver |
JPS57204172A (en) * | 1981-06-08 | 1982-12-14 | Ibm | Field effect transistor |
EP0087155B1 (en) * | 1982-02-22 | 1991-05-29 | Kabushiki Kaisha Toshiba | Means for preventing the breakdown of an insulation layer in semiconductor devices |
JPS5984572A (en) * | 1982-11-08 | 1984-05-16 | Nec Corp | Semiconductor device |
US5087591A (en) * | 1985-01-22 | 1992-02-11 | Texas Instruments Incorporated | Contact etch process |
US4734752A (en) * | 1985-09-27 | 1988-03-29 | Advanced Micro Devices, Inc. | Electrostatic discharge protection device for CMOS integrated circuit outputs |
EP0242540A1 (en) * | 1986-04-21 | 1987-10-28 | International Business Machines Corporation | Method and structure for reducing resistance in integrated circuits |
JPS63104466A (en) * | 1986-10-22 | 1988-05-09 | Mitsubishi Electric Corp | Mos type dynamic random access memory (ram) |
US5047820A (en) * | 1988-09-14 | 1991-09-10 | Micrel, Inc. | Semi self-aligned high voltage P channel FET |
US4885627A (en) * | 1988-10-18 | 1989-12-05 | International Business Machines Corporation | Method and structure for reducing resistance in integrated circuits |
JP2720624B2 (en) * | 1991-04-26 | 1998-03-04 | 日本電気株式会社 | MOS integrated circuit |
JP2690244B2 (en) * | 1992-08-20 | 1997-12-10 | 松下電子工業株式会社 | MIS type high voltage transistor and method of manufacturing the same |
US6552389B2 (en) | 2000-12-14 | 2003-04-22 | Kabushiki Kaisha Toshiba | Offset-gate-type semiconductor device |
JP2007214398A (en) * | 2006-02-10 | 2007-08-23 | Nec Corp | Semiconductor integrated circuit |
JP2009212110A (en) * | 2008-02-29 | 2009-09-17 | Renesas Technology Corp | Transistor and its manufacturing method |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5435757B2 (en) * | 1974-02-15 | 1979-11-05 |
-
1980
- 1980-03-07 CA CA000347291A patent/CA1142271A/en not_active Expired
- 1980-03-26 GB GB8010180A patent/GB2045525A/en not_active Withdrawn
- 1980-03-27 DE DE19803011778 patent/DE3011778A1/en not_active Withdrawn
- 1980-03-28 FR FR8007109A patent/FR2452789A1/en not_active Withdrawn
- 1980-03-28 JP JP4112580A patent/JPS55132054A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0332234B2 (en) | 1991-05-10 |
JPS55132054A (en) | 1980-10-14 |
CA1142271A (en) | 1983-03-01 |
DE3011778A1 (en) | 1980-10-09 |
GB2045525A (en) | 1980-10-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse | ||
RE | Withdrawal of published application |