FR2407467A1 - Procede et dispositif pour l'execution de topogrammes de texture - Google Patents
Procede et dispositif pour l'execution de topogrammes de textureInfo
- Publication number
- FR2407467A1 FR2407467A1 FR7831263A FR7831263A FR2407467A1 FR 2407467 A1 FR2407467 A1 FR 2407467A1 FR 7831263 A FR7831263 A FR 7831263A FR 7831263 A FR7831263 A FR 7831263A FR 2407467 A1 FR2407467 A1 FR 2407467A1
- Authority
- FR
- France
- Prior art keywords
- topograms
- radiation
- diffract
- diffract radiation
- executing texture
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
SUIVANT LE PROCEDE, APPUYE SUR LA TECHNIQUE DE GUINIER, SELON LEQUEL UN FAISCEAU DIVERGENT DE RAYONNEMENT MONOCHROMATIQUE EST DIFFRACTE SUR UN CORPS POLYCRISTALLIN, LE RAYONNEMENT DIFFRACTE ETANT REFERME EN FAISCEAU SUR UN CERCLE DE FOCALISATION EN UN POINT DE REFLEXION, LE FAISCEAU DE RAYONS NE DIVERGEANT QUE FAIBLEMENT PERPENDICULAIREMENT AU PLAN DE DIFFRACTION EST ISOLE POUR LA FORMATION DE L'IMAGE, DU CONE DE DIFFRACTION DU RAYONNEMENT DIFFRACTE ET LE RAYONNEMENT DIFFRACTE EST ENREGISTRE A DISTANCE DE LA REFLEXION FOCALISEE ET DU CORPS EXAMINE.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2748501A DE2748501C3 (de) | 1977-10-28 | 1977-10-28 | Verfahren und Vorrichtung zur Erstellung von Texturtopogrammen |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2407467A1 true FR2407467A1 (fr) | 1979-05-25 |
FR2407467B1 FR2407467B1 (fr) | 1984-06-01 |
Family
ID=6022563
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7831263A Granted FR2407467A1 (fr) | 1977-10-28 | 1978-10-27 | Procede et dispositif pour l'execution de topogrammes de texture |
Country Status (5)
Country | Link |
---|---|
US (1) | US4223219A (fr) |
JP (1) | JPS5474488A (fr) |
DE (1) | DE2748501C3 (fr) |
FR (1) | FR2407467A1 (fr) |
GB (1) | GB2007479B (fr) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4561062A (en) * | 1983-02-18 | 1985-12-24 | Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources | Stress measurement by X-ray diffractometry |
JPS59182349A (ja) * | 1983-03-31 | 1984-10-17 | Shimadzu Corp | 結晶のミスオリエンテ−シヨン検出方法 |
GB2169480B (en) * | 1985-01-03 | 1988-12-07 | Erno Raumfahrttechnik Gmbh | A method of non-destructive testing of structural members |
JPH02501338A (ja) * | 1986-08-15 | 1990-05-10 | コモンウェルス サイエンティフィック アンド インダストリアル リサーチ オーガナイゼイション | X線ビームもしくは中性子ビーム調節用計装装置 |
DD268059B5 (de) * | 1987-12-14 | 1993-08-05 | Ifw Inst Fuer Festkoerper Und | Vorrichtung zur roentgenografischen abbildung und messung lokaler spannungsverteilungen |
US4856043A (en) * | 1988-07-18 | 1989-08-08 | North American Philips Corporation | Two piece ceramic Soller slit collimator for X-ray collimation |
US5231732A (en) * | 1991-02-04 | 1993-08-03 | Custom Metalcraft Inc. | Side door hinge |
US5418828A (en) * | 1993-09-08 | 1995-05-23 | The United States Of America As Represented By The Department Of Energy | Nondestructive method and apparatus for imaging grains in curved surfaces of polycrystalline articles |
JPH0862400A (ja) * | 1994-08-24 | 1996-03-08 | Nec Corp | X線回折顕微装置 |
US6038285A (en) * | 1998-02-02 | 2000-03-14 | Zhong; Zhong | Method and apparatus for producing monochromatic radiography with a bent laue crystal |
US6262520B1 (en) * | 1999-09-15 | 2001-07-17 | Bei Technologies, Inc. | Inertial rate sensor tuning fork |
US7076025B2 (en) | 2004-05-19 | 2006-07-11 | Illinois Institute Of Technology | Method for detecting a mass density image of an object |
US7330530B2 (en) * | 2004-10-04 | 2008-02-12 | Illinois Institute Of Technology | Diffraction enhanced imaging method using a line x-ray source |
US7469037B2 (en) * | 2007-04-03 | 2008-12-23 | Illinois Institute Of Technology | Method for detecting a mass density image of an object |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2500948A (en) * | 1946-07-29 | 1950-03-21 | Herman F Kaiser | X-ray diffraction apparatus |
NL72976C (fr) * | 1948-03-27 | |||
US3073952A (en) * | 1956-09-11 | 1963-01-15 | Gen Electric | X-ray diffraction apparatus |
US3070693A (en) * | 1959-06-10 | 1962-12-25 | Picker X Ray Corp | Diffraction apparatus and method of using same |
US3394255A (en) * | 1965-06-28 | 1968-07-23 | Picker Corp | Diffraction mechanism in which a monochromator diffracts the X-ray beam in planes transverse to an axis of specimen rotation |
FR1564558A (fr) * | 1968-01-19 | 1969-04-25 | ||
US3852594A (en) * | 1973-07-25 | 1974-12-03 | Pepi Inc | X-ray diffraction apparatus |
-
1977
- 1977-10-28 DE DE2748501A patent/DE2748501C3/de not_active Expired
-
1978
- 1978-10-24 US US05/954,254 patent/US4223219A/en not_active Expired - Lifetime
- 1978-10-26 JP JP13108478A patent/JPS5474488A/ja active Pending
- 1978-10-27 FR FR7831263A patent/FR2407467A1/fr active Granted
- 1978-10-27 GB GB7842278A patent/GB2007479B/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
US4223219A (en) | 1980-09-16 |
FR2407467B1 (fr) | 1984-06-01 |
DE2748501B2 (de) | 1979-08-30 |
DE2748501A1 (de) | 1979-05-03 |
DE2748501C3 (de) | 1985-05-30 |
GB2007479A (en) | 1979-05-16 |
JPS5474488A (en) | 1979-06-14 |
GB2007479B (en) | 1982-02-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |