JPS5474488A - Method and device for making structural topogram of surface layer of polycrystalline piece - Google Patents

Method and device for making structural topogram of surface layer of polycrystalline piece

Info

Publication number
JPS5474488A
JPS5474488A JP13108478A JP13108478A JPS5474488A JP S5474488 A JPS5474488 A JP S5474488A JP 13108478 A JP13108478 A JP 13108478A JP 13108478 A JP13108478 A JP 13108478A JP S5474488 A JPS5474488 A JP S5474488A
Authority
JP
Japan
Prior art keywords
topogram
surface layer
making structural
polycrystalline piece
polycrystalline
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13108478A
Other languages
English (en)
Inventor
Eberhard Born
Gerald Paul
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of JPS5474488A publication Critical patent/JPS5474488A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
JP13108478A 1977-10-28 1978-10-26 Method and device for making structural topogram of surface layer of polycrystalline piece Pending JPS5474488A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2748501A DE2748501C3 (de) 1977-10-28 1977-10-28 Verfahren und Vorrichtung zur Erstellung von Texturtopogrammen

Publications (1)

Publication Number Publication Date
JPS5474488A true JPS5474488A (en) 1979-06-14

Family

ID=6022563

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13108478A Pending JPS5474488A (en) 1977-10-28 1978-10-26 Method and device for making structural topogram of surface layer of polycrystalline piece

Country Status (5)

Country Link
US (1) US4223219A (ja)
JP (1) JPS5474488A (ja)
DE (1) DE2748501C3 (ja)
FR (1) FR2407467A1 (ja)
GB (1) GB2007479B (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59182349A (ja) * 1983-03-31 1984-10-17 Shimadzu Corp 結晶のミスオリエンテ−シヨン検出方法
US6262520B1 (en) * 1999-09-15 2001-07-17 Bei Technologies, Inc. Inertial rate sensor tuning fork

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4561062A (en) * 1983-02-18 1985-12-24 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources Stress measurement by X-ray diffractometry
GB2169480B (en) * 1985-01-03 1988-12-07 Erno Raumfahrttechnik Gmbh A method of non-destructive testing of structural members
US5016267A (en) * 1986-08-15 1991-05-14 Commonwealth Scientific And Industrial Research Instrumentation for conditioning X-ray or neutron beams
DD268059B5 (de) * 1987-12-14 1993-08-05 Ifw Inst Fuer Festkoerper Und Vorrichtung zur roentgenografischen abbildung und messung lokaler spannungsverteilungen
US4856043A (en) * 1988-07-18 1989-08-08 North American Philips Corporation Two piece ceramic Soller slit collimator for X-ray collimation
US5231732A (en) * 1991-02-04 1993-08-03 Custom Metalcraft Inc. Side door hinge
US5418828A (en) * 1993-09-08 1995-05-23 The United States Of America As Represented By The Department Of Energy Nondestructive method and apparatus for imaging grains in curved surfaces of polycrystalline articles
JPH0862400A (ja) * 1994-08-24 1996-03-08 Nec Corp Ｘ線回折顕微装置
US6038285A (en) * 1998-02-02 2000-03-14 Zhong; Zhong Method and apparatus for producing monochromatic radiography with a bent laue crystal
US7076025B2 (en) 2004-05-19 2006-07-11 Illinois Institute Of Technology Method for detecting a mass density image of an object
US7330530B2 (en) * 2004-10-04 2008-02-12 Illinois Institute Of Technology Diffraction enhanced imaging method using a line x-ray source
US7469037B2 (en) * 2007-04-03 2008-12-23 Illinois Institute Of Technology Method for detecting a mass density image of an object

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2500948A (en) * 1946-07-29 1950-03-21 Herman F Kaiser X-ray diffraction apparatus
BE488126A (ja) * 1948-03-27
US3073952A (en) * 1956-09-11 1963-01-15 Gen Electric X-ray diffraction apparatus
US3070693A (en) * 1959-06-10 1962-12-25 Picker X Ray Corp Diffraction apparatus and method of using same
US3394255A (en) * 1965-06-28 1968-07-23 Picker Corp Diffraction mechanism in which a monochromator diffracts the X-ray beam in planes transverse to an axis of specimen rotation
FR1564558A (ja) * 1968-01-19 1969-04-25
US3852594A (en) * 1973-07-25 1974-12-03 Pepi Inc X-ray diffraction apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59182349A (ja) * 1983-03-31 1984-10-17 Shimadzu Corp 結晶のミスオリエンテ−シヨン検出方法
JPH0457973B2 (ja) * 1983-03-31 1992-09-16 Shimadzu Corp
US6262520B1 (en) * 1999-09-15 2001-07-17 Bei Technologies, Inc. Inertial rate sensor tuning fork

Also Published As

Publication number Publication date
DE2748501A1 (de) 1979-05-03
DE2748501C3 (de) 1985-05-30
GB2007479B (en) 1982-02-24
FR2407467A1 (fr) 1979-05-25
FR2407467B1 (ja) 1984-06-01
GB2007479A (en) 1979-05-16
DE2748501B2 (de) 1979-08-30
US4223219A (en) 1980-09-16

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