JPS5622938A - Analyzing method for surface of transparent substance - Google Patents

Analyzing method for surface of transparent substance

Info

Publication number
JPS5622938A
JPS5622938A JP9837579A JP9837579A JPS5622938A JP S5622938 A JPS5622938 A JP S5622938A JP 9837579 A JP9837579 A JP 9837579A JP 9837579 A JP9837579 A JP 9837579A JP S5622938 A JPS5622938 A JP S5622938A
Authority
JP
Japan
Prior art keywords
transparent substance
reflective element
element plate
substance
internal reflective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9837579A
Other languages
Japanese (ja)
Other versions
JPS6058820B2 (en
Inventor
Reikichi Iwamoto
Koji Oota
Masaru Miya
Seiichi Mima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP9837579A priority Critical patent/JPS6058820B2/en
Publication of JPS5622938A publication Critical patent/JPS5622938A/en
Publication of JPS6058820B2 publication Critical patent/JPS6058820B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

PURPOSE:To know the state of a substance to be analyzed by accurately measuring the Raman spectrum of a part very close to the surface of the substance by using sapphire as an internal reflective element plate. CONSTITUTION:Sapphire-made internal reflective element plate 2 is brought into close contact with transparent substance 1 and laser light 3 is caused to strike internal reflective element plate 2. At this time, laser light 3 is caused to strike at an incident angle at which total reflection is caused by the interface between internal reflective element plate 2 and transparent substance 1. Incident laser light 3 is reflected to reach contact interface 4 between internal reflective element plate 2 and the transparent substance the a greater angle, causing the total reflection at point C. Since it actually intrudes into transparent substance 1 up to a certain depth from the interface at point C, transparent substance 1 generates scattered light 5 with laser light 3 passed through transparent substance 1. This scattered light 5 is passed through condenser 6 and then separated by spectrometer 7, thereby recording Raman spectrum.
JP9837579A 1979-07-31 1979-07-31 Surface analysis method for transparent materials Expired JPS6058820B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9837579A JPS6058820B2 (en) 1979-07-31 1979-07-31 Surface analysis method for transparent materials

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9837579A JPS6058820B2 (en) 1979-07-31 1979-07-31 Surface analysis method for transparent materials

Publications (2)

Publication Number Publication Date
JPS5622938A true JPS5622938A (en) 1981-03-04
JPS6058820B2 JPS6058820B2 (en) 1985-12-21

Family

ID=14218123

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9837579A Expired JPS6058820B2 (en) 1979-07-31 1979-07-31 Surface analysis method for transparent materials

Country Status (1)

Country Link
JP (1) JPS6058820B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6137396A (en) * 1984-07-31 1986-02-22 Isuzu Motors Ltd Copper alloy welding rod
WO1995032417A1 (en) * 1994-05-25 1995-11-30 Daikin Industries, Ltd. Optical measuring method and apparatus therefor
US7652763B2 (en) 2004-12-09 2010-01-26 The Science And Technology Facilities Council Apparatus for depth-selective Raman spectroscopy
US7911604B2 (en) 2005-11-25 2011-03-22 The Science And Technology Facilities Council Security screening using raman analysis
JP2015049241A (en) * 2013-08-30 2015-03-16 株式会社東芝 Component analysis device, component analysis method and program

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6137396A (en) * 1984-07-31 1986-02-22 Isuzu Motors Ltd Copper alloy welding rod
JPH0450109B2 (en) * 1984-07-31 1992-08-13 Isuzu Jidosha Kk
WO1995032417A1 (en) * 1994-05-25 1995-11-30 Daikin Industries, Ltd. Optical measuring method and apparatus therefor
US5858800A (en) * 1994-05-25 1999-01-12 Shigemori; Kazuhisa Optical measurement method and apparatus thereof
US7652763B2 (en) 2004-12-09 2010-01-26 The Science And Technology Facilities Council Apparatus for depth-selective Raman spectroscopy
US8159664B2 (en) 2004-12-09 2012-04-17 The Science And Technology Facilities Council Apparatus for depth-selective Raman spectroscopy
US8243269B2 (en) 2004-12-09 2012-08-14 The Science And Technology Facilities Council Raman spectral analysis of sub-surface tissues and fluids
US7911604B2 (en) 2005-11-25 2011-03-22 The Science And Technology Facilities Council Security screening using raman analysis
US8085396B2 (en) 2006-04-05 2011-12-27 The Science And Technology Facilities Council Raman analysis
US8259902B2 (en) 2006-04-05 2012-09-04 The Science And Technology Facilities Council Raman analysis of tissue and/or calcifications
JP2015049241A (en) * 2013-08-30 2015-03-16 株式会社東芝 Component analysis device, component analysis method and program

Also Published As

Publication number Publication date
JPS6058820B2 (en) 1985-12-21

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