JPS5235684A - Method and apparatus for total reflection absorption measurement at lo w temperatures - Google Patents

Method and apparatus for total reflection absorption measurement at lo w temperatures

Info

Publication number
JPS5235684A
JPS5235684A JP11132175A JP11132175A JPS5235684A JP S5235684 A JPS5235684 A JP S5235684A JP 11132175 A JP11132175 A JP 11132175A JP 11132175 A JP11132175 A JP 11132175A JP S5235684 A JPS5235684 A JP S5235684A
Authority
JP
Japan
Prior art keywords
total reflection
temperatures
reflection absorption
absorption measurement
cool
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11132175A
Other languages
Japanese (ja)
Inventor
Seiga Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP11132175A priority Critical patent/JPS5235684A/en
Publication of JPS5235684A publication Critical patent/JPS5235684A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To cool an element for supporting sample in a vacuum thereby easily and highly accurately measuring total reflection absorption spectra of liquid, etc. at low temperatures.
JP11132175A 1975-09-12 1975-09-12 Method and apparatus for total reflection absorption measurement at lo w temperatures Pending JPS5235684A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11132175A JPS5235684A (en) 1975-09-12 1975-09-12 Method and apparatus for total reflection absorption measurement at lo w temperatures

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11132175A JPS5235684A (en) 1975-09-12 1975-09-12 Method and apparatus for total reflection absorption measurement at lo w temperatures

Publications (1)

Publication Number Publication Date
JPS5235684A true JPS5235684A (en) 1977-03-18

Family

ID=14558242

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11132175A Pending JPS5235684A (en) 1975-09-12 1975-09-12 Method and apparatus for total reflection absorption measurement at lo w temperatures

Country Status (1)

Country Link
JP (1) JPS5235684A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6246357U (en) * 1985-09-07 1987-03-20
JPH04348254A (en) * 1990-07-26 1992-12-03 Jasco Corp Method fr measuring total reflection and objective mirror for microscope for measuring total reflection
JPH06129979A (en) * 1991-08-27 1994-05-13 Donald W Sting Spectroscope device for radioactive energy

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6246357U (en) * 1985-09-07 1987-03-20
JPH04348254A (en) * 1990-07-26 1992-12-03 Jasco Corp Method fr measuring total reflection and objective mirror for microscope for measuring total reflection
JPH06129979A (en) * 1991-08-27 1994-05-13 Donald W Sting Spectroscope device for radioactive energy

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