FR2361630A1 - Procede de mesure interferometrique, relative a la surface - Google Patents
Procede de mesure interferometrique, relative a la surfaceInfo
- Publication number
- FR2361630A1 FR2361630A1 FR7720043A FR7720043A FR2361630A1 FR 2361630 A1 FR2361630 A1 FR 2361630A1 FR 7720043 A FR7720043 A FR 7720043A FR 7720043 A FR7720043 A FR 7720043A FR 2361630 A1 FR2361630 A1 FR 2361630A1
- Authority
- FR
- France
- Prior art keywords
- grating
- interferometric measurement
- measurement process
- process relating
- diffraction order
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
Procédé de mesure interférométrique relatif à la surface. Un faisceau 5 de lumière cohérente collimatée est dirigée sur un réseau 9 en partie directement 7 et en partie par réflexion 8 sur la surface de l'objet à mesurer 10. Les angles d'incidence et l'angle entre le réseau et la surface de l'objet sont choisis tels que chacun des faisceaux incidents sur le réseau a un ordre de diffraction parallèle à l'ordre de diffraction de l'autre faisceau. Le dispositif utilise comme plan de référence les fronts des ondes lumineuses. La distance entre l'objet et le réseau peut être grande de 5 à 50 cm. Peut être utilisé pour mesurer des éléments de surface même substantiellement non réfléchissante.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19762636498 DE2636498C2 (de) | 1976-08-13 | 1976-08-13 | Verfahren zur interferometrischen Oberflächenmessiing |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2361630A1 true FR2361630A1 (fr) | 1978-03-10 |
FR2361630B1 FR2361630B1 (fr) | 1980-12-19 |
Family
ID=5985380
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7720043A Granted FR2361630A1 (fr) | 1976-08-13 | 1977-06-21 | Procede de mesure interferometrique, relative a la surface |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPS5322763A (fr) |
DE (1) | DE2636498C2 (fr) |
FR (1) | FR2361630A1 (fr) |
GB (1) | GB1538811A (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2413632A1 (fr) * | 1977-12-27 | 1979-07-27 | Ibm | Procede interferometrique a resolution 1/4 servant notamment pour la fabrication des circuits integres |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2946493A1 (de) | 1979-11-17 | 1981-05-21 | Wolfgang Prof. Dipl.-Phys. Dr. Dreybrodt | Verfahren und vorrichtung zur automatischen und beruehrungslosen qualitaetsbewertung optisch reflektierender oberflaechen |
EP0066030B1 (fr) * | 1981-05-29 | 1986-08-27 | Ibm Deutschland Gmbh | Dispositif et procédé pour la mesure interférométrique de planéité |
DE3173451D1 (en) * | 1981-09-17 | 1986-02-20 | Ibm Deutschland | Method for interferometric surface topography |
DE3174649D1 (en) * | 1981-11-25 | 1986-06-19 | Ibm Deutschland | Phase balancing of an optical wave front |
DE4318739C2 (de) * | 1993-06-05 | 1997-07-03 | Lamtech Lasermestechnik Gmbh | Interferometer und Verfahren zur Messung der Topographie von Prüflingsoberflächen |
DE10303364A1 (de) * | 2003-01-29 | 2004-08-05 | Hentze-Lissotschenko Patentverwaltungs Gmbh & Co.Kg | Vorrichtung zur Bestimmung des Höhenprofils eines Objekts |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4962160A (fr) * | 1972-10-16 | 1974-06-17 |
-
1976
- 1976-08-13 DE DE19762636498 patent/DE2636498C2/de not_active Expired
-
1977
- 1977-06-21 FR FR7720043A patent/FR2361630A1/fr active Granted
- 1977-07-19 JP JP8573977A patent/JPS5322763A/ja active Granted
- 1977-08-10 GB GB3355377A patent/GB1538811A/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2413632A1 (fr) * | 1977-12-27 | 1979-07-27 | Ibm | Procede interferometrique a resolution 1/4 servant notamment pour la fabrication des circuits integres |
Also Published As
Publication number | Publication date |
---|---|
JPS5322763A (en) | 1978-03-02 |
FR2361630B1 (fr) | 1980-12-19 |
GB1538811A (en) | 1979-01-24 |
JPS616921B2 (fr) | 1986-03-03 |
DE2636498B1 (de) | 1977-05-12 |
DE2636498C2 (de) | 1979-02-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |