FR2260186A1 - Semiconductor device mfr. with two or more zones - of different characteristics using successive masking and ion implantation technique - Google Patents
Semiconductor device mfr. with two or more zones - of different characteristics using successive masking and ion implantation techniqueInfo
- Publication number
- FR2260186A1 FR2260186A1 FR7403569A FR7403569A FR2260186A1 FR 2260186 A1 FR2260186 A1 FR 2260186A1 FR 7403569 A FR7403569 A FR 7403569A FR 7403569 A FR7403569 A FR 7403569A FR 2260186 A1 FR2260186 A1 FR 2260186A1
- Authority
- FR
- France
- Prior art keywords
- windows
- zones
- zone
- different characteristics
- ion implantation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005468 ion implantation Methods 0.000 title abstract 2
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 230000000873 masking effect Effects 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 239000011248 coating agent Substances 0.000 abstract 2
- 238000000576 coating method Methods 0.000 abstract 2
- 150000002500 ions Chemical class 0.000 abstract 2
- 230000001186 cumulative effect Effects 0.000 abstract 1
- 238000005286 illumination Methods 0.000 abstract 1
- 238000002513 implantation Methods 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
- H01L21/266—Bombardment with radiation with high-energy radiation producing ion implantation using masks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0112—Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/60—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
- H10D84/611—Combinations of BJTs and one or more of diodes, resistors or capacitors
- H10D84/613—Combinations of vertical BJTs and one or more of diodes, resistors or capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Bipolar Transistors (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7403569A FR2260186A1 (en) | 1974-02-04 | 1974-02-04 | Semiconductor device mfr. with two or more zones - of different characteristics using successive masking and ion implantation technique |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7403569A FR2260186A1 (en) | 1974-02-04 | 1974-02-04 | Semiconductor device mfr. with two or more zones - of different characteristics using successive masking and ion implantation technique |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2260186A1 true FR2260186A1 (en) | 1975-08-29 |
| FR2260186B1 FR2260186B1 (enrdf_load_stackoverflow) | 1978-11-10 |
Family
ID=9134404
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7403569A Granted FR2260186A1 (en) | 1974-02-04 | 1974-02-04 | Semiconductor device mfr. with two or more zones - of different characteristics using successive masking and ion implantation technique |
Country Status (1)
| Country | Link |
|---|---|
| FR (1) | FR2260186A1 (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0028786A1 (de) * | 1979-11-13 | 1981-05-20 | Deutsche ITT Industries GmbH | Ionenimplantationsverfahren |
| EP0437834A1 (en) * | 1989-12-28 | 1991-07-24 | Sanyo Electric Co., Ltd. | Method for manufacturing a semiconductor integrated circuit |
-
1974
- 1974-02-04 FR FR7403569A patent/FR2260186A1/fr active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0028786A1 (de) * | 1979-11-13 | 1981-05-20 | Deutsche ITT Industries GmbH | Ionenimplantationsverfahren |
| EP0437834A1 (en) * | 1989-12-28 | 1991-07-24 | Sanyo Electric Co., Ltd. | Method for manufacturing a semiconductor integrated circuit |
Also Published As
| Publication number | Publication date |
|---|---|
| FR2260186B1 (enrdf_load_stackoverflow) | 1978-11-10 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| CA | Change of address | ||
| CD | Change of name or company name | ||
| ST | Notification of lapse |