FI3594952T3 - Flash-muistin virkistyksen hallinta - Google Patents

Flash-muistin virkistyksen hallinta

Info

Publication number
FI3594952T3
FI3594952T3 FIEP19188896.5T FI19188896T FI3594952T3 FI 3594952 T3 FI3594952 T3 FI 3594952T3 FI 19188896 T FI19188896 T FI 19188896T FI 3594952 T3 FI3594952 T3 FI 3594952T3
Authority
FI
Finland
Prior art keywords
register
refresh
flash memory
host device
operations
Prior art date
Application number
FIEP19188896.5T
Other languages
English (en)
Finnish (fi)
Inventor
Hyunsuk Shin
Robert Hardacker
Hung Vuong
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Application granted granted Critical
Publication of FI3594952T3 publication Critical patent/FI3594952T3/fi

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02Addressing or allocation; Relocation
    • G06F12/0223User address space allocation, e.g. contiguous or non contiguous base addressing
    • G06F12/023Free address space management
    • G06F12/0238Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
    • G06F12/0246Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G11C16/3431Circuits or methods to detect disturbed nonvolatile memory cells, e.g. which still read as programmed but with threshold less than the program verify threshold or read as erased but with threshold greater than the erase verify threshold, and to reverse the disturbance via a refreshing programming or erasing step

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Read Only Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Memory System (AREA)
  • Dram (AREA)
FIEP19188896.5T 2016-06-20 2017-06-07 Flash-muistin virkistyksen hallinta FI3594952T3 (fi)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201662352393P 2016-06-20 2016-06-20
US15/615,827 US10199115B2 (en) 2016-06-20 2017-06-06 Managing refresh for flash memory

Publications (1)

Publication Number Publication Date
FI3594952T3 true FI3594952T3 (fi) 2026-04-17

Family

ID=60659776

Family Applications (1)

Application Number Title Priority Date Filing Date
FIEP19188896.5T FI3594952T3 (fi) 2016-06-20 2017-06-07 Flash-muistin virkistyksen hallinta

Country Status (11)

Country Link
US (2) US10199115B2 (https=)
EP (3) EP3472840B1 (https=)
JP (2) JP7213690B2 (https=)
KR (1) KR102508868B1 (https=)
CN (2) CN114758711A (https=)
BR (1) BR112018075661A2 (https=)
CA (1) CA3026804C (https=)
DK (1) DK3594952T3 (https=)
ES (1) ES2874279T3 (https=)
FI (1) FI3594952T3 (https=)
WO (1) WO2017222818A1 (https=)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10199115B2 (en) * 2016-06-20 2019-02-05 Qualcomm Incorporated Managing refresh for flash memory
US10885991B2 (en) * 2017-04-04 2021-01-05 Sandisk Technologies Llc Data rewrite during refresh window
KR102658230B1 (ko) 2018-06-01 2024-04-17 삼성전자주식회사 반도체 메모리 장치, 이를 포함하는 메모리 시스템 및 반도체 메모리 장치의 동작 방법
KR102611382B1 (ko) 2018-09-19 2023-12-07 삼성디스플레이 주식회사 터치 감지 유닛과 그를 포함하는 표시 장치
US10761727B2 (en) * 2018-11-19 2020-09-01 Micron Technology, Inc. Scan frequency modulation based on memory density or block usage
US10725706B1 (en) * 2019-01-23 2020-07-28 Qualcomm Incorporated Apparatus and method of scheduling universal flash storage refresh operations according to a refresh handover mechanism
US10811076B1 (en) * 2019-06-29 2020-10-20 Intel Corporation Battery life based on inhibited memory refreshes
US11404131B2 (en) * 2019-07-12 2022-08-02 Micron Technology, Inc. Decision for executing full-memory refresh during memory sub-system power-on stage
US11037641B1 (en) * 2019-12-05 2021-06-15 Sandisk Technologies Llc Temperature and cycling dependent refresh operation for memory cells
US11500567B2 (en) 2019-12-06 2022-11-15 Micron Technology, Inc. Configuring partitions of a memory sub-system for different data
US11475929B2 (en) 2020-02-27 2022-10-18 Taiwan Semiconductor Manufacturing Company, Ltd. Memory refresh
DE102020133713A1 (de) * 2020-02-27 2021-09-02 Taiwan Semiconductor Manufacturing Co., Ltd. Speicheraktualisierung
CN111798906A (zh) * 2020-06-29 2020-10-20 深圳市芯天下技术有限公司 提高非型闪存数据保持能力方法、系统、存储介质和终端
US12327046B2 (en) 2021-06-25 2025-06-10 SanDisk Technologies, Inc. Data retention-specific refresh read
JP2023141335A (ja) 2022-03-23 2023-10-05 キオクシア株式会社 メモリシステムおよびリフレッシュ方法
US12237031B2 (en) * 2022-06-01 2025-02-25 Micron Technology, Inc. Refresh rate selection for a memory built-in self-test
US12282687B2 (en) * 2022-06-09 2025-04-22 Micron Technology, Inc. Prioritization of background media management operations in memory systems
CN116312673B (zh) * 2023-03-16 2024-08-06 海光集成电路设计(北京)有限公司 一种数据自刷新电路、芯片及电子设备

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3641066B2 (ja) * 1995-05-30 2005-04-20 株式会社東芝 フラッシュメモリを混載するマイクロコンピュータのデータ書換え方法
JP2000011670A (ja) 1998-06-25 2000-01-14 Canon Inc 不揮発性メモリを有する機器
US7089344B1 (en) * 2000-06-09 2006-08-08 Motorola, Inc. Integrated processor platform supporting wireless handheld multi-media devices
JP2005025363A (ja) * 2003-06-30 2005-01-27 Sony Corp バースト転送モード付データ転送装置、データ転送方法及びデータ転送プログラム
US7342841B2 (en) * 2004-12-21 2008-03-11 Intel Corporation Method, apparatus, and system for active refresh management
US7685371B1 (en) * 2006-04-19 2010-03-23 Nvidia Corporation Hierarchical flush barrier mechanism with deadlock avoidance
US7861113B2 (en) * 2007-03-16 2010-12-28 Dot Hill Systems Corporation Method and apparatus for operating storage controller system in elevated temperature environment
JP5216244B2 (ja) 2007-05-31 2013-06-19 株式会社東芝 データリフレッシュ装置、及びデータリフレッシュ方法
JP5478855B2 (ja) 2008-08-08 2014-04-23 ルネサスエレクトロニクス株式会社 不揮発性メモリ制御方法及び半導体装置
JP5422984B2 (ja) 2008-12-08 2014-02-19 富士通株式会社 不揮発性メモリ、メモリ制御装置、メモリ制御システムおよび不揮発性メモリの制御方法
JP5834303B2 (ja) * 2008-12-30 2015-12-16 ラウンド ロック リサーチ リミテッド ライアビリティー カンパニー 作動温度範囲を拡張した不揮発性メモリ
US8762656B2 (en) 2008-12-30 2014-06-24 Micron Technology, Inc. Temperature alert and low rate refresh for a non-volatile memory
DE112009005413B4 (de) * 2009-12-02 2018-11-29 Micron Technology, Inc. Verfahren zur Aktualisierung für nichtflüchtige Speicher und Nichtflüchtiger-Speicher-Vorrichtung
KR101798920B1 (ko) * 2010-11-30 2017-11-17 삼성전자주식회사 다중 주기 셀프 리프레쉬를 수행하는 반도체 메모리 장치 및이의 검증 방법
KR101962874B1 (ko) * 2012-04-24 2019-03-27 삼성전자주식회사 메모리 장치, 메모리 컨트롤러, 메모리 시스템 및 이의 동작 방법
US9236110B2 (en) * 2012-06-30 2016-01-12 Intel Corporation Row hammer refresh command
KR20140007989A (ko) 2012-07-09 2014-01-21 삼성전자주식회사 불휘발성 램을 포함하는 사용자 장치 및 그것의 설정 방법
KR20140076735A (ko) * 2012-12-13 2014-06-23 삼성전자주식회사 휘발성 메모리 장치 및 메모리 시스템
US9076499B2 (en) * 2012-12-28 2015-07-07 Intel Corporation Refresh rate performance based on in-system weak bit detection
JP2014178974A (ja) 2013-03-15 2014-09-25 Nec Casio Mobile Communications Ltd 電子機器、その制御方法及びプログラムに関する。
US9336855B2 (en) * 2013-05-14 2016-05-10 Qualcomm Incorporated Methods and systems for smart refresh of dynamic random access memory
JP6011512B2 (ja) 2013-10-29 2016-10-19 株式会社デンソー データリフレッシュ装置
KR101601643B1 (ko) * 2013-11-08 2016-03-09 주식회사 피델릭스 효율적으로 리프레쉬 동작을 수행하는 플래시 메모리 장치
US9817749B2 (en) 2013-12-04 2017-11-14 Sandisk Technologies Llc Apparatus and method of offloading processing from a data storage device to a host device
KR102289001B1 (ko) * 2014-06-09 2021-08-13 삼성전자주식회사 솔리드 스테이드 드라이브 및 그것의 동작 방법
US10199115B2 (en) * 2016-06-20 2019-02-05 Qualcomm Incorporated Managing refresh for flash memory

Also Published As

Publication number Publication date
EP3472840A1 (en) 2019-04-24
CN114758711A (zh) 2022-07-15
EP3594952A1 (en) 2020-01-15
CA3026804C (en) 2023-09-05
US10360987B2 (en) 2019-07-23
WO2017222818A1 (en) 2017-12-28
EP3594952B1 (en) 2026-01-21
CN109328386B (zh) 2022-04-29
ES2874279T3 (es) 2021-11-04
JP2022070884A (ja) 2022-05-13
US20190066811A1 (en) 2019-02-28
DK3594952T3 (da) 2026-04-20
KR20190016968A (ko) 2019-02-19
JP2019522284A (ja) 2019-08-08
CN109328386A (zh) 2019-02-12
EP4682887A2 (en) 2026-01-21
CA3026804A1 (en) 2017-12-28
KR102508868B1 (ko) 2023-03-09
JP7213690B2 (ja) 2023-01-27
US10199115B2 (en) 2019-02-05
EP4682887A3 (en) 2026-04-22
EP3472840B1 (en) 2021-02-24
BR112018075661A2 (pt) 2019-04-09
JP7348325B2 (ja) 2023-09-20
US20170365352A1 (en) 2017-12-21

Similar Documents

Publication Publication Date Title
FI3594952T3 (fi) Flash-muistin virkistyksen hallinta
JP2019522284A5 (https=)
EP4361828A3 (en) Method and apparatus for reducing read latency for a block erasable non-volatile memory
ES2547321T3 (es) Sistema y método para optimizar un sistema de seguimiento
BR112017027915A2 (pt) método e aparelho de processamento de dados e dispositivo flash
Wang et al. Determination of temporal information granules to improve forecasting in fuzzy time series
WO2015020900A3 (en) Method and device for error correcting code (ecc) error handling
JP2016505940A5 (https=)
EP2271987A4 (en) SAVING CHECKPOINT DATA IN NON-VOLATILE MEMORY
JP2014199583A5 (https=)
EP2360571A3 (en) Reduction of I/O latency for writable copy-on-write snapshot function
US10372349B2 (en) Method and apparatus for facilitating wear leveling of solid state disk
JP2014527254A5 (https=)
WO2011046639A3 (en) Burst-based cache dead block prediction
CL2016000555A1 (es) Terminación de comando de averiguación en memorias flash
GB2505844A (en) Moving blocks of data between main memory and storage class memory
MX2019002948A (es) Metodo y dispositivo para escribir datos almacenados en un medio de almacenamiento basado en memoria flash.
JP2014164794A5 (https=)
GB201204152D0 (en) Wear leveling
EP3564748A4 (en) CONTROL METHOD AND APPARATUS, TERMINAL, COMPUTER DEVICE, AND STORAGE MEDIUM
WO2016048837A3 (en) Host-managed non-volatile memory
WO2015081129A3 (en) Hard power fail architecture
RU2015110811A (ru) Система и способ оптимизации использования энергии в автономном транспортном средстве
FI3682331T3 (fi) Pysyvät kirjoitukset haihtumattomaan muistiin
GB2579329A (en) Cache management