FI114841B - Kuvauslaitteita, -järjestelmiä ja -menetelmiä - Google Patents
Kuvauslaitteita, -järjestelmiä ja -menetelmiä Download PDFInfo
- Publication number
- FI114841B FI114841B FI964728A FI964728A FI114841B FI 114841 B FI114841 B FI 114841B FI 964728 A FI964728 A FI 964728A FI 964728 A FI964728 A FI 964728A FI 114841 B FI114841 B FI 114841B
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- Finland
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- pixel
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- imaging device
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2964—Scanners
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14665—Imagers using a photoconductor layer
- H01L27/14676—X-ray, gamma-ray or corpuscular radiation imagers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14831—Area CCD imagers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/48—Increasing resolution by shifting the sensor relative to the scene
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/74—Circuitry for scanning or addressing the pixel array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
- H04N5/321—Transforming X-rays with video transmission of fluoroscopic images
- H04N5/325—Image enhancement, e.g. by subtraction techniques using polyenergetic X-rays
Applications Claiming Priority (10)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9410973 | 1994-06-01 | ||
GB9410973A GB2289979A (en) | 1994-06-01 | 1994-06-01 | Imaging devices systems and methods |
GB9421289A GB2289980A (en) | 1994-06-01 | 1994-10-21 | Imaging devices systems and methods |
GB9421289 | 1994-10-21 | ||
GB9502419 | 1995-02-08 | ||
GB9502419A GB2289981A (en) | 1994-06-01 | 1995-02-08 | Imaging devices systems and methods |
GB9508294A GB2289983B (en) | 1994-06-01 | 1995-04-24 | Imaging devices,systems and methods |
GB9508294 | 1995-04-24 | ||
PCT/EP1995/002056 WO1995033332A2 (fr) | 1994-06-01 | 1995-05-29 | Dispositifs, systemes et procedes de generation d'images |
EP9502056 | 1995-05-29 |
Publications (3)
Publication Number | Publication Date |
---|---|
FI964728A0 FI964728A0 (fi) | 1996-11-27 |
FI964728A FI964728A (fi) | 1996-12-02 |
FI114841B true FI114841B (fi) | 2004-12-31 |
Family
ID=27451167
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI964728A FI114841B (fi) | 1994-06-01 | 1996-11-27 | Kuvauslaitteita, -järjestelmiä ja -menetelmiä |
Country Status (17)
Country | Link |
---|---|
US (5) | US5812191A (fr) |
EP (1) | EP0763302B1 (fr) |
JP (1) | JP3897357B2 (fr) |
CN (1) | CN1132408C (fr) |
AT (2) | ATE288170T1 (fr) |
AU (1) | AU691926B2 (fr) |
CA (1) | CA2191100C (fr) |
DE (2) | DE69533967T2 (fr) |
DK (1) | DK0763302T3 (fr) |
ES (1) | ES2123991T3 (fr) |
FI (1) | FI114841B (fr) |
GB (1) | GB2289983B (fr) |
HK (1) | HK1014819A1 (fr) |
IL (1) | IL113921A (fr) |
NO (1) | NO320777B1 (fr) |
NZ (1) | NZ287868A (fr) |
WO (1) | WO1995033332A2 (fr) |
Families Citing this family (187)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6035013A (en) * | 1994-06-01 | 2000-03-07 | Simage O.Y. | Radiographic imaging devices, systems and methods |
GB2289983B (en) | 1994-06-01 | 1996-10-16 | Simage Oy | Imaging devices,systems and methods |
GB2371196A (en) * | 2000-12-22 | 2002-07-17 | Simage Oy | High energy radiation scan imaging system |
US7136452B2 (en) | 1995-05-31 | 2006-11-14 | Goldpower Limited | Radiation imaging system, device and method for scan imaging |
JPH0946600A (ja) * | 1995-08-02 | 1997-02-14 | Canon Inc | 撮像装置 |
GB2307785B (en) * | 1995-11-29 | 1998-04-29 | Simage Oy | Forming contacts on semiconductor substrates for radiation detectors and imaging devices |
US6236050B1 (en) * | 1996-02-02 | 2001-05-22 | TüMER TüMAY O. | Method and apparatus for radiation detection |
GB2311198B (en) | 1996-03-14 | 1998-05-06 | Simage Oy | Autoradiography imaging |
GB2318411B (en) * | 1996-10-15 | 1999-03-10 | Simage Oy | Imaging device for imaging radiation |
GB2318448B (en) | 1996-10-18 | 2002-01-16 | Simage Oy | Imaging detector and method of production |
US6242745B1 (en) | 1996-11-24 | 2001-06-05 | Ge Medical Systems Israel Ltd. | Solid state gamma camera |
US6693666B1 (en) | 1996-12-11 | 2004-02-17 | Interval Research Corporation | Moving imager camera for track and range capture |
US7199410B2 (en) * | 1999-12-14 | 2007-04-03 | Cypress Semiconductor Corporation (Belgium) Bvba | Pixel structure with improved charge transfer |
US6037577A (en) * | 1997-03-11 | 2000-03-14 | Kabushiki Kaisha Toshiba | Amplifying solid-state image pickup device and operating method of the same |
US6215898B1 (en) * | 1997-04-15 | 2001-04-10 | Interval Research Corporation | Data processing system and method |
US6515702B1 (en) * | 1997-07-14 | 2003-02-04 | California Institute Of Technology | Active pixel image sensor with a winner-take-all mode of operation |
US6157016A (en) * | 1997-09-30 | 2000-12-05 | Intel Corporation | Fast CMOS active-pixel sensor array readout circuit with predischarge circuit |
GB2332800B (en) * | 1997-12-18 | 2000-09-27 | Simage Oy | Device for imaging radiation |
GB2332585B (en) * | 1997-12-18 | 2000-09-27 | Simage Oy | Device for imaging radiation |
GB2332562B (en) | 1997-12-18 | 2000-01-12 | Simage Oy | Hybrid semiconductor imaging device |
GB2332608B (en) | 1997-12-18 | 2000-09-06 | Simage Oy | Modular imaging apparatus |
US6697108B1 (en) * | 1997-12-31 | 2004-02-24 | Texas Instruments Incorporated | Fast frame readout architecture for array sensors with integrated correlated double sampling system |
IL123006A (en) | 1998-01-20 | 2005-12-18 | Edge Medical Devices Ltd | X-ray imaging system |
JPH11220663A (ja) * | 1998-02-03 | 1999-08-10 | Matsushita Electron Corp | 固体撮像装置およびその駆動方法 |
US6323490B1 (en) * | 1998-03-20 | 2001-11-27 | Kabushiki Kaisha Toshiba | X-ray semiconductor detector |
KR100280488B1 (ko) * | 1998-06-09 | 2001-02-01 | 김영환 | 전자셔터 기능을 가지는 액티브 픽셀 센서 방식의 픽셀 구조 |
US6665010B1 (en) * | 1998-07-21 | 2003-12-16 | Intel Corporation | Controlling integration times of pixel sensors |
IL126018A0 (en) | 1998-09-01 | 1999-05-09 | Edge Medical Devices Ltd | X-ray imaging system |
US9029793B2 (en) * | 1998-11-05 | 2015-05-12 | Siemens Aktiengesellschaft | Imaging device |
US6236708B1 (en) * | 1998-11-25 | 2001-05-22 | Picker International, Inc. | 2D and 3D tomographic X-ray imaging using flat panel detectors |
JP3847494B2 (ja) * | 1998-12-14 | 2006-11-22 | シャープ株式会社 | 二次元画像検出器の製造方法 |
EP1018655B1 (fr) * | 1999-01-05 | 2003-12-10 | Direct Radiography Corp. | Séquence de lecture pour élimination d'image résiduelle dans un panneau de détection de rayonnement |
US6326625B1 (en) | 1999-01-20 | 2001-12-04 | Edge Medical Devices Ltd. | X-ray imaging system |
US6646245B2 (en) * | 1999-01-22 | 2003-11-11 | Intel Corporation | Focal plane averaging implementation for CMOS imaging arrays using a split photodiode architecture |
JP2000214577A (ja) * | 1999-01-25 | 2000-08-04 | Mitsubishi Electric Corp | パタ―ン歪検出方法、パタ―ン歪検出装置およびその記録媒体 |
JP2000267070A (ja) * | 1999-03-18 | 2000-09-29 | Alps Electric Co Ltd | 液晶表示装置およびその駆動方法 |
FR2791469B1 (fr) * | 1999-03-23 | 2001-04-13 | Commissariat Energie Atomique | Dispositif d'imagerie de rayonnement x et procede de realisation d'un tel dispositif |
IL145489A0 (en) | 1999-04-26 | 2002-06-30 | Simage Oy | Self-triggered imaging device for imaging radiation |
US6263566B1 (en) | 1999-05-03 | 2001-07-24 | Micron Technology, Inc. | Flexible semiconductor interconnect fabricated by backslide thinning |
US6178225B1 (en) | 1999-06-04 | 2001-01-23 | Edge Medical Devices Ltd. | System and method for management of X-ray imaging facilities |
US7061062B2 (en) * | 1999-07-01 | 2006-06-13 | Gateway Inc. | Integrated circuit with unified input device, microprocessor and display systems |
US6693670B1 (en) * | 1999-07-29 | 2004-02-17 | Vision - Sciences, Inc. | Multi-photodetector unit cell |
DE19947536A1 (de) * | 1999-10-02 | 2001-04-05 | Philips Corp Intellectual Pty | Verfahren zum Auslesen der Sensorelemente eines Sensors sowie Sensor |
CA2388256A1 (fr) | 1999-10-08 | 2001-04-19 | Dentsply International Inc. | Commande automatique de l'exposition pour un appareil de radiographie dentaire panoramique et de cephalographie |
JP4613406B2 (ja) * | 1999-11-05 | 2011-01-19 | 株式会社デンソー | 受光素子、距離測定装置及び距離・画像測定装置 |
US6930714B2 (en) * | 1999-12-08 | 2005-08-16 | Digital Cinema Systems Corporation | High speed film to digital conversion |
DE19962229B4 (de) * | 1999-12-22 | 2004-02-26 | Siemens Ag | Bildaufnahmesystem für ein medizinisches Diagnose- oder Behandlungsgerät |
AU782164B2 (en) * | 2000-02-02 | 2005-07-07 | Gendex Corporation | Automatic x-ray detection for intra-oral dental x-ray imaging apparatus |
US7084905B1 (en) * | 2000-02-23 | 2006-08-01 | The Trustees Of Columbia University In The City Of New York | Method and apparatus for obtaining high dynamic range images |
FI120561B (fi) | 2000-03-07 | 2009-11-30 | Planmeca Oy | Digitaalikamera, kuvantamislaite ja menetelmä digitaalisessa kuvantamisessa |
US6809769B1 (en) * | 2000-06-22 | 2004-10-26 | Pixim, Inc. | Designs of digital pixel sensors |
EP1303978A4 (fr) * | 2000-07-05 | 2006-08-09 | Vision Sciences Inc | Procede de compression de gamme dynamique |
US6717151B2 (en) | 2000-07-10 | 2004-04-06 | Canon Kabushiki Kaisha | Image pickup apparatus |
ATE266223T1 (de) * | 2000-07-10 | 2004-05-15 | Honeywell Int Inc | Aus blöcken zusammengesetzte flüssigkristallanzeige |
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1995
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- 1995-05-29 AT AT98200377T patent/ATE288170T1/de not_active IP Right Cessation
- 1995-05-29 WO PCT/EP1995/002056 patent/WO1995033332A2/fr active IP Right Grant
- 1995-05-29 CN CN95194375A patent/CN1132408C/zh not_active Expired - Lifetime
- 1995-05-29 DE DE69533967T patent/DE69533967T2/de not_active Expired - Lifetime
- 1995-05-29 AU AU26720/95A patent/AU691926B2/en not_active Ceased
- 1995-05-29 CA CA002191100A patent/CA2191100C/fr not_active Expired - Lifetime
- 1995-05-29 DK DK95921784T patent/DK0763302T3/da active
- 1995-05-29 JP JP50032296A patent/JP3897357B2/ja not_active Expired - Lifetime
- 1995-05-29 NZ NZ287868A patent/NZ287868A/en unknown
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1997
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