JP6243518B2 - イメージング検出器 - Google Patents
イメージング検出器 Download PDFInfo
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- JP6243518B2 JP6243518B2 JP2016513473A JP2016513473A JP6243518B2 JP 6243518 B2 JP6243518 B2 JP 6243518B2 JP 2016513473 A JP2016513473 A JP 2016513473A JP 2016513473 A JP2016513473 A JP 2016513473A JP 6243518 B2 JP6243518 B2 JP 6243518B2
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- 238000003384 imaging method Methods 0.000 title claims description 25
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 53
- 229910052710 silicon Inorganic materials 0.000 claims description 53
- 239000010703 silicon Substances 0.000 claims description 53
- 230000005855 radiation Effects 0.000 claims description 31
- 239000004065 semiconductor Substances 0.000 claims description 20
- 230000010354 integration Effects 0.000 claims description 13
- 238000000034 method Methods 0.000 claims description 10
- 239000010410 layer Substances 0.000 description 24
- 238000012545 processing Methods 0.000 description 21
- 239000000463 material Substances 0.000 description 9
- 238000002591 computed tomography Methods 0.000 description 8
- 238000004891 communication Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- 230000001186 cumulative effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000002059 diagnostic imaging Methods 0.000 description 2
- 238000013507 mapping Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000002730 additional effect Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006335 response to radiation Effects 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computed tomography [CT]
- A61B6/032—Transmission computed tomography [CT]
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computed tomography [CT]
- A61B6/032—Transmission computed tomography [CT]
- A61B6/035—Mechanical aspects of CT
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
- A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
- A61B6/4233—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using matrix detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/50—Constructional details
- H04N23/54—Mounting of pick-up tubes, electronic image sensors, deviation or focusing coils
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
- A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
- A61B6/4241—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using energy resolving detectors, e.g. photon counting
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- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Medical Informatics (AREA)
- Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- General Health & Medical Sciences (AREA)
- Animal Behavior & Ethology (AREA)
- Veterinary Medicine (AREA)
- Radiology & Medical Imaging (AREA)
- Biomedical Technology (AREA)
- Heart & Thoracic Surgery (AREA)
- Optics & Photonics (AREA)
- Surgery (AREA)
- Public Health (AREA)
- Biophysics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pathology (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Pulmonology (AREA)
- Mathematical Physics (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Light Receiving Elements (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Measurement Of Radiation (AREA)
Description
Claims (13)
- 各々がフォトトランジスタを備える、複数の検出器ピクセルを含む、シリコンフォトセンサ層と、
前記複数のフォトトランジスタの各々のためのバイアス制御部及び電流・周波数コンバータを含む、前記シリコンフォトセンサ層に結合される、シリコン電子部層と
を有し、
前記複数のフォトトランジスタの各々は暗電流を生成し、対応するバイアス制御部が、対応する電流・周波数コンバータに送られる前記暗電流の量を調整し、
前記シリコンフォトセンサ層は、タイルに蓄積される放射線を検出する放射線センサを更に有し、前記バイアス制御部は、前記検出された放射線に基づいて、前記対応する電流・周波数コンバータに送られる前記暗電流の量を調整する、
シリコンイメージング検出器タイル。 - 対応する電流・周波数コンバータに送られる前記暗電流の量により、前記電流・周波数コンバータは、周波数が前記電流・周波数コンバータによって決定され得るように、各積分期間内に少なくとも一つのパルスを生成するように、前記バイアス制御部は、前記対応する電流・周波数コンバータに送られる前記暗電流の量を調整する、請求項1に記載のシリコンイメージング検出器タイル。
- 前記電流・周波数コンバータに、各積分期間内に少なくとも一つのパルスを生成させるために必要とされる電流レベルの値を記憶するレジスタを更に有し、前記バイアス制御部は、前記暗電流を調整するために前記値を使用する、請求項1乃至2の何れか一項に記載のシリコンイメージング検出器タイル。
- 前記タイルの温度を検出する前記シリコンフォトセンサ層における温度センサを更に有し、前記バイアス制御部は、前記検出された温度に基づいて、前記対応する電流・周波数コンバータに送られる前記暗電流の量を調整する、請求項1乃至3の何れか一項に記載のシリコンイメージング検出器タイル。
- 前記バイアス制御部は、前記フォトトランジスタのベース電流を制御する、請求項1乃至4の何れか一項に記載のシリコンイメージング検出器タイル。
- 前記検出器ピクセルの少なくとも一つは、フォトダイオードを更に含み、前記バイアス制御部は、前記フォトダイオード又は前記フォトトランジスタを前記電流・周波数コンバータに択一的に電気的に接続する、請求項1乃至5の何れか一項に記載のシリコンイメージング検出器タイル。
- 前記フォトトランジスタは、単一半導体又は共に接続される少なくとも二つの半導体を有する、請求項1乃至6の何れか一項に記載のシリコンイメージング検出器タイル。
- X線放射がない場合、イメージング検出器のシリコンフォトセンサ層の検出器ピクセルのフォトトランジスタにより、暗電流を検出すると共に生成するステップと、
バイアス制御部により、前記シリコンフォトセンサ層に結合されるシリコン電子層の電流・周波数コンバータに送られる前記暗電流の量を調整するステップと、
前記電流・周波数コンバータにより、前記電流・周波数コンバータに送られる前記暗電流の量を変換するステップと、
シリコン検出器タイルに蓄積される放射線を検出するステップと、
前記検出された放射線に基づいて前記暗電流を更に調整するステップと
を含む、方法。 - 対応する電流・周波数コンバータに送られる前記暗電流の量により、前記電流・周波数コンバータは、周波数が前記電流・周波数コンバータによって決定され得るように、各積分期間内に少なくとも一つのパルスを生成する、請求項8に記載の方法。
- 前記電流・周波数コンバータに、各積分期間内に少なくとも一つのパルスを生成させるために必要とされる電流レベルを記憶するレジスタのレジスタ値を読み出すステップと、
前記レジスタ値に基づいて前記暗電流を調整するステップと
を更に有する、請求項9に記載の方法。 - 前記シリコン検出器タイルの温度を検出するステップと、
前記検出された温度に基づいて前記暗電流を更に調整するステップと
を更に有する、請求項8乃至10の何れか一項に記載の方法。 - 前記電流・周波数コンバータに送られる前記暗電流の量を調整するために前記フォトトランジスタのベース電流を制御するステップ
を更に有する、請求項8乃至11の何れか一項に記載の方法。 - 前記検出器ピクセルは、フォトダイオードを更に有し、
前記フォトトランジスタ又は前記フォトダイオードの一つを前記電流・周波数コンバータに選択的に接続するステップ
を更に有する、請求項8乃至12の何れか一項に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201361824020P | 2013-05-16 | 2013-05-16 | |
US61/824,020 | 2013-05-16 | ||
PCT/IB2014/061263 WO2014184714A1 (en) | 2013-05-16 | 2014-05-07 | Imaging detector |
Publications (3)
Publication Number | Publication Date |
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JP2016528749A JP2016528749A (ja) | 2016-09-15 |
JP2016528749A5 JP2016528749A5 (ja) | 2017-08-03 |
JP6243518B2 true JP6243518B2 (ja) | 2017-12-06 |
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Application Number | Title | Priority Date | Filing Date |
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JP2016513473A Active JP6243518B2 (ja) | 2013-05-16 | 2014-05-07 | イメージング検出器 |
Country Status (8)
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US (1) | US9538107B2 (ja) |
EP (1) | EP2997397B1 (ja) |
JP (1) | JP6243518B2 (ja) |
KR (1) | KR20160010552A (ja) |
CN (1) | CN105209932B (ja) |
BR (1) | BR112015028336A2 (ja) |
RU (1) | RU2015153566A (ja) |
WO (1) | WO2014184714A1 (ja) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2014104306A1 (ja) * | 2012-12-27 | 2014-07-03 | 株式会社東芝 | X線ct装置及び制御方法 |
JP6257916B2 (ja) * | 2013-04-26 | 2018-01-10 | 東芝メディカルシステムズ株式会社 | 光検出装置、放射線検出装置、放射線分析装置及び光検出方法 |
JP2014230600A (ja) * | 2013-05-28 | 2014-12-11 | 株式会社東芝 | X線ct装置およびx線ct装置用x線検出器 |
EP2871496B1 (en) | 2013-11-12 | 2020-01-01 | Samsung Electronics Co., Ltd | Radiation detector and computed tomography apparatus using the same |
CN106662661B (zh) * | 2014-10-31 | 2019-06-25 | 皇家飞利浦有限公司 | 用于探测辐射信号的传感器设备和成像系统 |
KR101725099B1 (ko) * | 2014-12-05 | 2017-04-26 | 삼성전자주식회사 | 컴퓨터 단층 촬영장치 및 그 제어방법 |
US10098595B2 (en) * | 2015-08-06 | 2018-10-16 | Texas Instruments Incorporated | Low power photon counting system |
EP3482231B1 (en) * | 2016-07-05 | 2022-09-07 | Shenzhen Xpectvision Technology Co., Ltd. | Bonding of materials with dissimilar coefficients of thermal expansion |
RU2683961C1 (ru) * | 2016-09-08 | 2019-04-03 | Конинклейке Филипс Н.В. | Детектор излучения и система рентгеновской визуализации |
CN109716165B (zh) * | 2016-10-27 | 2022-09-30 | 深圳帧观德芯科技有限公司 | 辐射检测器中的暗噪音补偿 |
EP3542187B1 (en) * | 2016-11-15 | 2021-06-09 | Shenzhen Xpectvision Technology Co., Ltd. | An image sensor |
CN109031393B (zh) | 2017-06-09 | 2020-07-28 | 京东方科技集团股份有限公司 | 光电探测电路以及光电探测器 |
US10151845B1 (en) | 2017-08-02 | 2018-12-11 | Texas Instruments Incorporated | Configurable analog-to-digital converter and processing for photon counting |
US10024979B1 (en) | 2017-11-01 | 2018-07-17 | Texas Instruments Incorporated | Photon counting with coincidence detection |
US20190154852A1 (en) * | 2017-11-16 | 2019-05-23 | NueVue Solutions, Inc. | Analog Direct Digital X-Ray Photon Counting Detector For Resolving Photon Energy In Spectral X-Ray CT |
CN108120729B (zh) * | 2017-12-28 | 2024-04-02 | 清华大学 | Ct检查系统和ct成像方法 |
JP6776295B2 (ja) * | 2018-04-26 | 2020-10-28 | シャープ株式会社 | 放射線画像撮像装置 |
US10890674B2 (en) | 2019-01-15 | 2021-01-12 | Texas Instruments Incorporated | Dynamic noise shaping in a photon counting system |
EP4254017A1 (en) * | 2022-03-28 | 2023-10-04 | Koninklijke Philips N.V. | Photon counting detector and photon counting method |
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- 2014-05-07 EP EP14727068.0A patent/EP2997397B1/en active Active
- 2014-05-07 JP JP2016513473A patent/JP6243518B2/ja active Active
- 2014-05-07 KR KR1020157035556A patent/KR20160010552A/ko not_active Application Discontinuation
- 2014-05-07 BR BR112015028336A patent/BR112015028336A2/pt not_active IP Right Cessation
- 2014-05-07 US US14/890,598 patent/US9538107B2/en active Active
- 2014-05-07 CN CN201480028193.XA patent/CN105209932B/zh active Active
- 2014-05-07 WO PCT/IB2014/061263 patent/WO2014184714A1/en active Application Filing
- 2014-05-07 RU RU2015153566A patent/RU2015153566A/ru not_active Application Discontinuation
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KR20160010552A (ko) | 2016-01-27 |
RU2015153566A (ru) | 2017-06-19 |
WO2014184714A1 (en) | 2014-11-20 |
US20160094798A1 (en) | 2016-03-31 |
US9538107B2 (en) | 2017-01-03 |
CN105209932B (zh) | 2018-12-18 |
BR112015028336A2 (pt) | 2017-07-25 |
EP2997397B1 (en) | 2017-10-04 |
EP2997397A1 (en) | 2016-03-23 |
CN105209932A (zh) | 2015-12-30 |
JP2016528749A (ja) | 2016-09-15 |
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