EP3364194B1 - Kelvin test probe, kelvin test probe module, and manufacturing method therefor - Google Patents

Kelvin test probe, kelvin test probe module, and manufacturing method therefor Download PDF

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Publication number
EP3364194B1
EP3364194B1 EP15794805.0A EP15794805A EP3364194B1 EP 3364194 B1 EP3364194 B1 EP 3364194B1 EP 15794805 A EP15794805 A EP 15794805A EP 3364194 B1 EP3364194 B1 EP 3364194B1
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EP
European Patent Office
Prior art keywords
conductive
insulation sheet
pads
pad
insulation
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EP15794805.0A
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German (de)
English (en)
French (fr)
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EP3364194A1 (en
EP3364194A4 (en
Inventor
Eun Jou Lee
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Inno Inc
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Inno Inc
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Publication of EP3364194A4 publication Critical patent/EP3364194A4/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00ย -ย G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06744—Microprobes, i.e. having dimensions as IC details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00ย -ย G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
    • G01R1/06761—Material aspects related to layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00ย -ย G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00ย -ย G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film

Definitions

  • the present invention relates to a probe for Kelvin Test, a probe module for Kelvin Test and a manufacturing method thereof and in particular, to a probe for Kelvin Test, a probe module for Kelvin Test and a manufacturing method thereof which can achieve an easy manufacturing method and save the manufacturing cost.
  • Kevin Test is intended to measure resistance of an integrated circuit element precisely and in general, resistance of integrated circuit is determined by the measurement of electric current and voltage by contacting two contact terminals to an integrated-circuit lead or a ball grid.
  • Fig. 1 represents a general concept of Kelvin Test. Referring to Fig. 1 , in order to measure resistance of a test element, electric current and voltage are measured by contacting two contact terminals to different points of each of pads (Pad A, Pad B) of a test element.
  • Such probe for Kelvin Test (or a probe for Kelvin Test) is generally a Pogo-pin type probe and Fig. 2 shows an example of a probe for Kelvin Test disclosed in Korean laid-open patent publication No. 10-2009-0118319 .
  • a probe for Kelvin Test of prior arts has a pair of probes 100a, 100b which are in parallel and each probe has a plunger 10 which contacts with a contact portion of semiconductor lead, a cylindrical barrel 30 having the plunger 10 on the top, an elastic spring 20 arranged inside the barrel 30 to provide elastic force, and a contact pin 40 attached to the bottom of the barrel 30. That is, a probe for Kelvin Test of a Pogo-pin type is being used which has an elastic force by means of the spring 20.
  • the Pogo-pin type probe for Kelvin Test has the structure of a barrel which accommodates the elastic spring and has the structural characteristics of the spring itself, there is limitation to reduce a pitch between the two terminals.
  • the present invention is invented to solve the above problems and to provide a probe for Kelvin Test, a probe module for Kelvin Test and a manufacturing method thereof which can achieve an easy manufacturing method and save the manufacturing cost.
  • a probe for Kelvin Test comprising: an upper insulation sheet made of flexible material; a lower insulation sheet which is spaced apart from the upper insulation sheet in the vertical direction and which is made of flexible material; an insulation elastic member which connects the upper insulation sheet and the lower insulation sheet and which is made of elastic material; a first upper conductive pad which is formed on one surface of the upper insulation sheet; a second upper conductive pad which is formed on the other surface of the upper insulation sheet; a first upper conductive pin which is attached to the first upper conductive pad such that one portion of the first upper conductive pin protrudes above the upper insulation sheet; a second upper conductive pin which is attached to the second upper conductive pad such that one portion of the second upper conductive pin protrudes above the upper insulation sheet; a first lower conductive pad which is formed on one surface of the lower insulation sheet; a second lower conductive pad which is formed on the other surface of the lower insulation sheet; a first lower conductive pin which is attached to the first lower conductive pad such that one portion
  • the upper insulation sheet and the lower insulation sheet may be provided in the form of a PI film; and the first upper conductive pad, the second upper conductive pad, the first lower conductive pad and the second lower conductive pad may be formed by patterning conductive layers of a flexible circuit substrate having the conductive layers respectively on both surfaces of the PI film.
  • first upper conductive pad, the second upper conductive pad, the first lower conductive pad and the second lower conductive pad may be formed by plating base conductive layers which are formed after the conductive layers are patterned.
  • the insulation elastic member may be made of silicone material.
  • the probe for Kelvin Test may further comprises an insulation body made of elastic material which surrounds the upper insulation sheet, the lower insulation sheet, the insulation elastic member, the first upper conductive pad, the second upper conductive pad, the first lower conductive pad, the second lower conductive pad, the first conductive wire and the second conductive wire in such a manner that the first upper conductive pin and the second upper conductive pin protrude upwardly and the first lower conductive pin and the second lower conductive pin protrude downwardly.
  • a probe module for Kelvin Test comprising: an upper insulation sheet made of flexible material; a lower insulation sheet which is spaced apart from the upper insulation sheet in the vertical direction and which is made of flexible material; an insulation elastic member which connects the upper insulation sheet and the lower insulation sheet and which is made of elastic material; a plurality of first upper conductive pads which are spaced apart from each other on one surface of the upper insulation sheet along the surface direction of the sheet; a plurality of second upper conductive pads which are spaced apart from each other on the other surface of the upper insulation sheet along the surface direction of the sheet; first upper conductive pins which are attached respectively to each of the first upper conductive pads such that one portion of each of the first upper conductive pins protrudes above the upper insulation sheet; second upper conductive pins which are attached respectively to each of the second upper conductive pads such that one portion of each of the second upper conductive pins protrudes above the upper insulation sheet; a plurality of first lower conductive pads which are spaced apart from
  • the upper insulation sheet and the lower insulation sheet may be provided in the form of a PI film; and the first upper conductive pads, the second upper conductive pads, the first lower conductive pads and the second lower conductive pads may be formed by patterning conductive layers of a flexible circuit substrate having the conductive layers respectively on both surfaces of the PI film.
  • first upper conductive pads, the second upper conductive pads, the first lower conductive pads and the second lower conductive pads may be formed by plating base conductive layers which are formed after the conductive layers are patterned.
  • the insulation elastic member may be made of silicone material.
  • the probe module may further comprise an insulation body made of elastic material which surrounds the upper insulation sheet, the lower insulation sheet, the insulation elastic member, the first upper conductive pads, the second upper conductive pads, the first lower conductive pads, the second lower conductive pads, the first conductive wires and the second conductive wires in such a manner that the first upper conductive pins and the second upper conductive pins protrude upwardly and the first lower conductive pins and the second lower conductive pins protrude downwardly.
  • an insulation body made of elastic material which surrounds the upper insulation sheet, the lower insulation sheet, the insulation elastic member, the first upper conductive pads, the second upper conductive pads, the first lower conductive pads, the second lower conductive pads, the first conductive wires and the second conductive wires in such a manner that the first upper conductive pins and the second upper conductive pins protrude upwardly and the first lower conductive pins and the second lower conductive pins protrude downwardly.
  • the object of the invention may be accomplished by a method of manufacturing a probe module for Kelvin Test according to another embodiment comprising following steps: (a) forming a plurality of first base conductive pads which are spaced apart from each other on one surface of an insulation sheet made of flexible material along a surface of the sheet and each of which extends from an upper edge to a lower edge; (b) forming a plurality of second base conductive pads which are spaced apart from each other on the other surface of the insulation sheet along a surface of the sheet and each of which extends from an upper edge to a lower edge; (c) attaching first upper conductive pins respectively to an upper edge of each of the first base conductive pads such that one portion of each of the first upper conductive pins protrudes above the insulation sheet; (d) attaching second upper conductive pins respectively to an upper edge of each of the second base conductive pads such that one portion of each of the second upper conductive pins protrudes above the insulation sheet; (e) attaching first lower conductive pins respectively to a lower edge
  • the insulation sheet may be provided in the form of a PI film; and the first base conductive pad and the second base conductive pad may be formed by patterning conductive layers of a flexible circuit substrate having conductive layers respectively on both surfaces of the PI film.
  • first base conductive pad and the second base conductive pad may be formed by plating base conductive layers which are formed after the conductive layers are patterned.
  • the object of the invention may be accomplished by a method of manufacturing a probe module for Kelvin Test according to another embodiment comprising following steps: (a) forming a plurality of first upper conductive pads which are spaced apart from each other on an upper edge of one surface of an insulation sheet made of flexible material along a surface of the sheet; (b) forming a plurality of second upper conductive pads which are spaced apart from each other on an upper edge of the other surface of the insulation sheet along a surface of the sheet; (c) forming a plurality of first lower conductive pads which are spaced apart from each other on a lower edge of one surface of the insulation sheet along a surface of the sheet; (d) forming a plurality of second lower conductive pads which are spaced apart from each other on a lower edge of the other surface of the insulation sheet along a surface of the sheet; (e) attaching first upper conductive pins respectively to each of the first upper conductive pads such that one portion of each of the first upper conductive pins protrudes above the insulation sheet; (f)
  • the insulation sheet may be provided in the form of a PI film; and the first upper conductive pads, the second upper conductive pads, the first lower conductive pads and the second lower conductive pads may be formed by patterning conductive layers of a flexible circuit substrate having conductive layers on both surfaces of the PI film.
  • first upper conductive pads, the second upper conductive pads, the first lower conductive pads and the second lower conductive pads may be formed by plating base conductive layers which are formed after the conductive layers are patterned.
  • the insulation elastic member may be made of silicone material.
  • the method may further comprise a step of forming an insulation body made of elastic material which surrounds the upper insulation sheet, the lower insulation sheet, the insulation elastic member, the first upper conductive pads, the second upper conductive pads, the first lower conductive pads, the second lower conductive pads, the first conductive wires and the second conductive wires in such a manner that the first upper conductive pins and the second upper conductive pins protrude upwardly and the first lower conductive pins and the second lower conductive pins protrude downwardly.
  • a probe for Kelvin Test a probe module for Kelvin Test and a manufacturing method thereof which can achieve an easy manufacturing method and save the manufacturing cost is provided.
  • the invention relates to a probe for Kelvin Test and comprises: an upper insulation sheet made of flexible material; a lower insulation sheet which is spaced apart from the upper insulation sheet in the vertical direction and which is made of flexible material; an insulation elastic member which connects the upper insulation sheet and the lower insulation sheet and which is made of elastic material; a first upper conductive pad which is formed on one surface of the upper insulation sheet; a second upper conductive pad which is formed on the other surface of the upper insulation sheet; a first upper conductive pin which is attached to the first upper conductive pad such that one portion of the first upper conductive pin protrudes above the upper insulation sheet; a second upper conductive pin which is attached to the second upper conductive pad such that one portion of the second upper conductive pin protrudes above the upper insulation sheet; a first lower conductive pad which is formed on one surface of the lower insulation sheet; a second lower conductive pad which is formed on the other surface of the lower insulation sheet; a first lower conductive pin which is attached to the first lower conductive pad such that one portion of the first lower conductive
  • Fig. 4 is a perspective view of a probe 10 of Kelvin Test according to the present invention
  • Fig. 5 is a cross-sectional view taken from line V-V of Fig. 5 .
  • the probe 10 of Kelvin Test according to the present invention comprises an upper insulation sheet 11, a lower insulation sheet 12, an insulation elastic member 60, a first upper conductive pad 21, a second upper conductive pad 31, a first upper conductive pin 41, a second upper conductive pin 51, a first lower conductive pad 22, a second lower conductive pad 32, a first lower conductive pin 42, a second lower conductive pin 52, a first conductive wire 71 and a second conductive wire 72.
  • the upper insulation sheet 11 is made of flexible material.
  • the upper insulation sheet 11 is made of PI film material and will be explained in detail hereinafter.
  • the lower insulation sheet 12 is made of flexible material.
  • the lower insulation sheet 12 is made in the form of PI film in the same manner as the upper insulation sheet 11.
  • the lower insulation sheet 12 is spaced apart from the upper insulation sheet 11 in the vertical direction H as shown in Figs. 4 and 5 .
  • the insulation elastic member 60 is made of elastic material, e.g., silicone material to connect the upper insulation sheet 11 and the lower insulation sheet 12 which are spaced apart in the vertical direction H.
  • the upper insulation sheet 11, the insulation elastic member 60 and the lower insulation sheet 12 electrically separate a first conductive line and a second conductive line which are formed respectively on both sheet surfaces which will be explained hereinafter.
  • the first upper conductive pad 21 is formed on one surface of the upper insulation sheet 11.
  • the second upper conductive pad 31 is formed on the other surface of the upper insulation sheet 11. That is, the first upper conductive pad 21 and the second upper conductive pad 31 have the upper insulation sheet 11 therebetween and are arranged on both sides of the upper insulation sheet 11 such that they are electrically separated from each other by the upper insulation sheet 11.
  • the upper insulation sheet 11 is provided in the form of PI film and the first upper conductive pad 21 and the second upper conductive pad 31 are formed by patterning conductive layers 321, 322 of a flexible circuit substrate 300 (see Fig. 7 ) which have the conductive layers 321, 322 on the both sides of the PI film, which will be explained in detail hereinafter.
  • the first lower conductive pad 22 is formed on one side of the lower insulation sheet 12.
  • the second lower conductive pad 32 is formed on the other surface of the lower insulation sheet 12. That is, the first lower conductive pad 22 and the second lower conductive pad 32 have the lower insulation sheet 12 therebetween and are arranged on both sides of the lower insulation sheet 12 and are electrically separated from each other by the lower insulation sheet 12.
  • the lower insulation sheet 12 is provided in the form of PI film and the first lower conductive pad 22 and the second lower conductive pad 32 are formed by patterning conductive layers 321, 322 of a flexible circuit substrate 300 (see Fig. 7 ) which have the conductive layers 321, 322 on the both sides of the PI film, which will be explained in detail hereinafter.
  • the first upper conductive pin 41 is attached on the first upper conductive pad 21 such that one portion of the first upper conductive pin, i.e., the top portion of the first upper conductive pin protrudes above the upper insulation sheet 11.
  • the second upper conductive pin 51 is attached on the second upper conductive pad 31 such that one portion of the second upper conductive pin, i.e., the top portion of the second upper conductive pin protrudes above the upper insulation sheet 11.
  • the first upper conductive pin 41 and the second upper conductive pin 51 are spaced apart from each other by the thickness of the upper insulation sheet 11, the first upper conductive pad 21 and the second upper conductive pad 31.
  • the first lower conductive pin 42 is attached on the first lower conductive pad 22 such that one portion of the first lower conductive pin, i.e., the bottom portion of the first lower conductive pin protrudes below the lower insulation sheet 12.
  • the second lower conductive pin 52 is attached on the second lower conductive pad 32 such that one portion of the second lower conductive pin, i.e., the bottom portion of the second lower conductive pin protrudes below the lower insulation sheet 12.
  • the first lower conductive pin 42 and the second lower conductive pin 52 are spaced apart from each other by the thickness of the lower insulation sheet 12, the first lower conductive pad 22 and the second lower conductive pad 32.
  • the first conductive wire 71 electrically connects the first upper conductive pad 21 to the first lower conductive pad 22. Therefore, the first upper conductive pin 41, the first upper conductive pad 21, the first conductive wire 71, the first lower conductive pad 22 and the first lower conductive pin 42 are electrically interconnected to form a first conductive line in the vertical direction H.
  • the second conductive wire 72 electrically connects the second upper conductive pad 31 to the second lower conductive pad 32 such that the second upper conductive pin 51, the second upper conductive pad 31, the second conductive wire 72, the second lower conductive pad 32 and the second lower conductive pin 52 are electrically interconnected to form a second conductive line in the vertical direction H.
  • a probe 10 for Kelvin Test which has the first conductive line and the second conductive line which have the upper insulation sheet 11, the lower insulation sheet 12 and the insulation elastic member 62 therebetween.
  • the gap between the two conductive lines can be reduced to the sum of the thickness of the insulation sheet 310, the first upper conductive pad 21 (or the first lower conductive pad 22) and the second upper conductive pad 31 (or the second lower conductive pad 32), so that it is possible to perform a Kelvin Test for a high-integrated semiconductor element.
  • first upper conductive pad 21, the second upper conductive pad 31, the first lower conductive pad 22 and the second lower conductive pad 32 can be manufactured by the patterning process of the flexible circuit substrate 300, the more effective manufacturing method and in turn the reduction of the manufacturing cost can be obtained.
  • Fig. 4 is a perspective view of a probe 10 of Kelvin Test according to the present invention
  • Fig. 5 is a cross-sectional view taken from line V-V of Fig. 5 .
  • the probe 10 of Kelvin Test according to the present invention comprises an upper insulation sheet 11, a lower insulation sheet 12, an insulation elastic member 60, a first upper conductive pad 21, a second upper conductive pad 31, a first upper conductive pin 41, a second upper conductive pin 51, a first lower conductive pad 22, a second lower conductive pad 32, a first lower conductive pin 42, a second lower conductive pin 52, a first conductive wire 71 and a second conductive wire 72.
  • the upper insulation sheet 11 is made of flexible material.
  • the upper insulation sheet 11 is made of PI film material and will be explained in detail hereinafter.
  • the lower insulation sheet 12 is made of flexible material.
  • the lower insulation sheet 12 is made in the form of PI film in the same manner as the upper insulation sheet 11.
  • the lower insulation sheet 12 is spaced apart from the upper insulation sheet 11 in the vertical direction H as shown in Figs. 4 and 5 .
  • the insulation elastic member 60 is made of elastic material, e.g., silicone material to connect the upper insulation sheet 11 and the lower insulation sheet 12 which are spaced apart in the vertical direction H.
  • the upper insulation sheet 11, the insulation elastic member 60 and the lower insulation sheet 12 electrically separate a first conductive line and a second conductive line which are formed respectively on both sheet surfaces which will be explained hereinafter.
  • the first upper conductive pad 21 is formed on one surface of the upper insulation sheet 11.
  • the second upper conductive pad 31 is formed on the other surface of the upper insulation sheet 11. That is, the first upper conductive pad 21 and the second upper conductive pad 31 have the upper insulation sheet 11 therebetween and are arranged on both sides of the upper insulation sheet 11 such that they are electrically separated from each other by the upper insulation sheet 11.
  • the upper insulation sheet 11 is provided in the form of PI film and the first upper conductive pad 21 and the second upper conductive pad 31 are formed by patterning conductive layers 321, 322 of a flexible circuit substrate 300 (see Fig. 7 ) which have the conductive layers 321, 322 on the both sides of the PI film, which will be explained in detail hereinafter.
  • the first lower conductive pad 22 is formed on one side of the lower insulation sheet 12.
  • the second lower conductive pad 32 is formed on the other surface of the lower insulation sheet 12. That is, the first lower conductive pad 22 and the second lower conductive pad 32 have the lower insulation sheet 12 therebetween and are arranged on both sides of the lower insulation sheet 12 and are electrically separated from each other by the lower insulation sheet 12.
  • the lower insulation sheet 12 is provided in the form of PI film and the first lower conductive pad 22 and the second lower conductive pad 32 are formed by patterning conductive layers 321, 322 of a flexible circuit substrate 300 (see Fig. 7 ) which have the conductive layers 321, 322 on the both sides of the PI film, which will be explained in detail hereinafter.
  • the first upper conductive pin 41 is attached on the first upper conductive pad 21 such that one portion of the first upper conductive pin, i.e., the top portion of the first upper conductive pin protrudes above the upper insulation sheet 11.
  • the second upper conductive pin 51 is attached on the second upper conductive pad 31 such that one portion of the second upper conductive pin, i.e., the top portion of the second upper conductive pin protrudes above the upper insulation sheet 11.
  • the first upper conductive pin 41 and the second upper conductive pin 51 are spaced apart from each other by the thickness of the upper insulation sheet 11, the first upper conductive pad 21 and the second upper conductive pad 31.
  • the first lower conductive pin 42 is attached on the first lower conductive pad 22 such that one portion of the first lower conductive pin, i.e., the bottom portion of the first lower conductive pin protrudes below the lower insulation sheet 12.
  • the second lower conductive pin 52 is attached on the second lower conductive pad 32 such that one portion of the second lower conductive pin, i.e., the bottom portion of the second lower conductive pin protrudes below the lower insulation sheet 12.
  • the first lower conductive pin 42 and the second lower conductive pin 52 are spaced apart from each other by the thickness of the lower insulation sheet 12, the first lower conductive pad 22 and the second lower conductive pad 32.
  • the first conductive wire 71 electrically connects the first upper conductive pad 21 to the first lower conductive pad 22. Therefore, the first upper conductive pin 41, the first upper conductive pad 21, the first conductive wire 71, the first lower conductive pad 22 and the first lower conductive pin 42 are electrically interconnected to form a first conductive line in the vertical direction H.
  • the second conductive wire 72 electrically connects the second upper conductive pad 31 to the second lower conductive pad 32 such that the second upper conductive pin 51, the second upper conductive pad 31, the second conductive wire 72, the second lower conductive pad 32 and the second lower conductive pin 52 are electrically interconnected to form a second conductive line in the vertical direction H.
  • a probe 10 for Kelvin Test which has the first conductive line and the second conductive line which have the upper insulation sheet 11, the lower insulation sheet 12 and the insulation elastic member 62 therebetween.
  • the gap between the two conductive lines can be reduced to the sum of the thickness of the insulation sheet 310, the first upper conductive pad 21 (or the first lower conductive pad 22) and the second upper conductive pad 31 (or the second lower conductive pad 32), so that it is possible to perform a Kelvin Test for a high-integrated semiconductor element.
  • first upper conductive pad 21, the second upper conductive pad 31, the first lower conductive pad 22 and the second lower conductive pad 32 can be manufactured by the patterning process of the flexible circuit substrate 300, the more effective manufacturing method and in turn the reduction of the manufacturing cost can be obtained.
  • Fig. 6 is a perspective view of a probe module 100 for Kelvin Test according to the present invention.
  • the probe module 100 for Kelvin Test according to the present invention has a plurality of probes 10 along the direction D of the surface of the upper insulation sheet 11 (or the lower insulation sheet 12).
  • the cross-section of Fig. 6 taken from V-V line is the same as the cross-sectional view of Fig. 5 and thus, the cross-sectional shape as to the probe module 100 for Kelvin Test according to the present invention will be explained referring to Fig. 5 .
  • the probe module 100 for Kelvin Test comprises an upper insulation sheet 11, a lower insulation sheet 12, an insulation elastic member 60, a plurality of first upper conductive pads 21, a plurality of second upper conductive pads 31, a plurality of first upper conductive pins 41, a plurality of second upper conductive pins 51, a plurality of first lower conductive pads 22, a plurality of second lower conductive pads 32, a plurality of first lower conductive pins 42, a plurality of second lower conductive pins 52, a plurality of first conductive wires 71 and a plurality of second conductive wires 72.
  • the upper insulation sheet 11 of the probe 10 for Kelvin Test is made of flexible material and in one example, it can be made of PI film material.
  • the lower insulation sheet 12 is made of flexible material.
  • the lower insulation sheet 12 is made in the form of PI film, like the upper insulation sheet 11.
  • the lower insulation sheet 12 is spaced apart from the upper insulation sheet 11 in the vertical direction H as shown in Fig. 6 .
  • the insulation elastic member 60 is made of elastic material, e.g., silicone material to connect the upper insulation sheet 11 and the lower insulation sheet 12 which are spaced apart in the vertical direction H.
  • the upper insulation sheet 11, the insulation elastic member 60 and the lower insulation sheet 12 electrically separate a plurality of first conductive lines and a plurality of second conductive lines which are formed respectively on both sheet surfaces which will be explained hereinafter.
  • the plurality of first upper conductive pads 21 are formed on one surface of the upper insulation sheet 11 and as shown in Fig. 6 , the first upper pads are spaced apart from each other on the surface of the upper insulation sheet along the sheet surface direction D.
  • the plurality of second upper conductive pads 31 are formed on the other surface of the upper insulation sheet 11 and are spaced apart from each other along the sheet surface direction D.
  • the first upper conductive pad 21 and the second upper conductive pad 31 which correspond to each other face each other across the upper insulation sheet 11.
  • the plurality of first upper conductive pads 21 and the plurality of second upper conductive pads 31 have the upper insulation sheet 11 therebetween and are arranged on both sides of the upper insulation sheet 11 such that they are electrically separated from each other by the upper insulation sheet 11.
  • the upper insulation sheet 11 is provided in the form of PI film and the upper conductive pad 21 and the second upper conductive pad 31 are formed by patterning conductive layers 321, 322 of a flexible circuit substrate 300 (see Fig. 7 ) which have the conductive layers 321, 322 on the both sides of the PI film, which will be explained in detail hereinafter.
  • the plurality of first lower conductive pads 22 are formed on one side of the lower insulation sheet 12 and are spaced apart from each other along the surface direction D of the lower insulation sheet 12.
  • the plurality of second lower conductive pads 32 are formed on the other side of the lower insulation sheet 12 and are spaced apart from each other along the surface direction D of the lower insulation sheet 12.
  • the first lower conductive pad 22 and the second lower conductive pad 32 which correspond to each other face each other across the lower insulation sheet 12.
  • first upper conductive pad 21 and the first lower conductive pad 22 which correspond to each other are arranged to face each other in the vertical direction H and the second upper conductive pad 31 and the second lower conductive pad 32 which correspond to each other are arranged to face each other in the vertical direction H.
  • the lower insulation sheet 12 is provided in the form of PI film and the lower conductive pad 22 and the second lower conductive pad 32 are formed by patterning conductive layers 321, 322 of a flexible circuit substrate 300 (see Fig. 7 ) which have the conductive layers 321, 322 on the both sides of the PI film.
  • a first upper conductive pin 41 is attached on each of the first upper conductive pads 21 such that one portion of the first upper conductive pin 41 protrudes above the upper insulation sheet 11.
  • a second upper conductive pin 51 is attached on each of the second upper conductive pads 31 such that one portion of the second upper conductive pin 51 protrudes above the upper insulation sheet 11.
  • a first lower conductive pin 42 is attached on each of the first lower conductive pads 22 such that one portion of the first lower conductive pin 42 protrudes below the lower insulation sheet 12.
  • a second lower conductive pin 52 is attached on each of the second lower conductive pads 32 such that one portion of the second lower conductive pin 52 protrudes below the lower insulation sheet 12.
  • the first upper conductive pad 21 and the first lower conductive pad 22 which face each other in the vertical direction H are electrically connected to each other by a first conductive wire 71.
  • the second upper conductive pad 31 and the second lower conductive pad 32 which face each other in the vertical direction H are electrically connected to each other by a second conductive wire 72.
  • the plurality of first conductive lines each of which is formed in the vertical direction D are arranged along the surface direction D in such a manner that the upper insulation sheet 11, the insulation elastic member 60 and the lower insulation sheet 12 are arranged between the first conductive lines and the second conductive lines and that the first upper conductive pin 41, the first upper conductive pad 21, the first conductive wire 71, the first lower conductive pad 22 and the first lower conductive pin 42 are interconnected on one side.
  • the plurality of second conductive lines each of which is formed in the vertical direction D are arranged along the surface direction D in such a manner that the upper insulation sheet 11, the insulation elastic member 60 and the lower insulation sheet 12 are arranged between the first conductive lines and the second conductive lines and that the second upper conductive pin 51, the second upper conductive pad 31, the second conductive wire 72, the second lower conductive pad 32 and the second lower conductive pin 52 are interconnected on the other side.
  • the first conductive line and the second conductive line which have the upper insulation sheet 11, the insulation elastic member 60 and the lower insulation sheet 12 therebetween are configured to form one probe 10 for Kelvin Test and thus the plurality of probes 10 for Kelvin Test can be arranged along the direction D of the sheet surface.
  • a plurality of first base conductive pad 321a is formed on one side of the insulation sheet 310 and a plurality of second base conductive pad 331a is formed on the other side of the insulation sheet.
  • a flexible circuit substrate 300 is used having conductive layers 321, 322 on both surfaces of PI film as shown in Fig. 7(a) .
  • a flexible circuit substrate 300 is prepared having conductive layers 321, 322 on both surfaces of the insulation sheet 310 which is PI film-type. Then, using a mask having a pattern which corresponds to the first base conductive pad 321a, a plurality of first base conductive pads 321a are formed on one side of the insulation sheet 310 as shown in Fig. 7(b) by a process of etching or photolithography. Similarly, using a mask having a pattern which corresponds to the second base conductive pad 331a, a plurality of second base conductive pads 331a are formed on the other side of the insulation sheet 310.
  • a first upper conductive pin 41 is attached to the upper edge of each of the first base conductive pad 321a and a second upper conductive pin 51 is attached to the upper edge of each of the second base conductive pad 331a.
  • the first upper conductive pin 41 and the second upper conductive pin 51 are attached such that one portion of the pin protrudes above the insulation sheet 310.
  • first lower conductive pin 42 is attached to the lower edge of each of the first base conductive pad 321a and a second lower conductive pin 52 is attached to the lower edge of each of the second base conductive pad 331a.
  • first lower conductive pin 42 and the second lower conductive pin 52 are attached such that one portion of the pin protrudes below the insulation sheet 310.
  • a predetermined portion between the first upper conductive pin 41 and the first lower conductive pin 42 (or between the second upper conductive pin 51 and the second lower conductive pin 52) is cut off.
  • the insulation sheet 310 is divided into the upper insulation sheet 11 and the lower insulation sheet 12
  • the first base conductive pad 321a is divided into the first upper conductive pad 21 and the first lower conductive pad 22
  • the second base conductive pad 331a is divided into the second upper conductive pad 31 and the second lower conductive pad 32.
  • a process is proceeded to form an insulation elastic member 60 on the cut-off area between the upper insulation sheet 11 and the lower insulation sheet 12.
  • a liquid silicone is applied to an area between the upper insulation sheet 11 and the lower insulation sheet 12, and then is cured to form the insulation elastic member 60.
  • the insulation elastic member 60 corresponds to the boundary line of the bottom of the upper insulation sheet 11 and the boundary line of the top of the lower insulation sheet 12.
  • silicone can be applied to cover the bottom of the upper insulation sheet 11 and the top of the lower insulation sheet 12 and then be cured.
  • the first upper conductive pad 21 and the first lower conductive pad 22 which face each other in the vertical direction H are connected to each other by the first conductive wire 71 and the second upper conductive pad 31 and the second lower conductive pad 32 which face each other in the vertical direction H are connected to each other by the second conductive wire 72 as shown in Fig. 9(b) .
  • the first conductive wire 71 and the second conductive wire 72 can be connected to the first upper conductive pad 21, the first lower conductive pad 22, the second upper conductive pad 31 and the second lower conductive pad 32, respectively by soldering.
  • Figs. 10 and 11 describe a probe module 100a for Kelvin Test according to another embodiment of the present invention.
  • Fig. 10 is a perspective view of a probe module for Kelvin Test according to another embodiment and
  • Fig. 11 is a cross-sectional view taken from line XI- XI of Fig. 10 .
  • the probe module 100a for Kelvin Test shown in Figs. 10 and 11 is a modified embodiment of the probe module 100 explained in the above.
  • the outer part of the probe module 100 for Kelvin Test is surrounded by an elastic insulation body 180. That is, the first upper conductive pin 41 and the second upper conductive pin 51 protrude upwardly and the first lower conductive pin 42 and the second lower conductive pin 52 protrude downwardly such that the upper insulation sheet 11, the lower insulation sheet 12, the insulation elastic member 60, the first upper conductive pad 21, the second upper conductive pad 31, the first lower conductive pad 22, the second lower conductive pad 32, the first conductive wire 71 and the second conductive wire 72 are surrounded by the insulation body 180.
  • the probe module 100a for Kelvin Test when the probe module 100a for Kelvin Test is attached in the depth direction W depending on the shape of the terminal formed on the semiconductor element, it is possible to attach the probe module to the terminal without any further housing for electrical insulation.
  • the probe module 100 for Kelvin Test as shown in Fig. 6 can be used.
  • the first upper conductive pad 21, the second upper conductive pad 31, the first lower conductive pad 22 and the second lower conductive pad 32 are formed by the cut-off.
  • Fig. 12 represents another embodiment in which during patterning a flexible circuit substrate 300, the first upper conductive pad 21, the second upper conductive pad 31, the first lower conductive pad 22 and the second lower conductive pad 32 are formed on the insulation sheet 310 in the form of a PI film as shown in Fig. 12 , and the first upper conductive pin 41, the second upper conductive pin 51, the first lower conductive pin 42 and the second lower conductive pin 52 are attached, respectively. Then, as shown in Fig. 12(b) , the upper insulation sheet 11 and the lower insulation sheet 12 can be also separated by the cut-off of the insulation sheet 310.
  • the first base conductive pad 321a, the second base conductive pad 331a, the first upper conductive pad 21, the second upper conductive pad 31, the first lower conductive pad 22 and the second lower conductive pad 32 can be formed by the plating, e.g., by nickel plating and then gold plating, of the base conductive layers 321, 322 formed by the patterning of PI film.
  • the present invention can be used for the test of integrated circuit such as semiconductor, in particular Kelvin Test, to measure resistance of integrated circuit precisely.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
EP15794805.0A 2015-10-08 2015-11-02 Kelvin test probe, kelvin test probe module, and manufacturing method therefor Active EP3364194B1 (en)

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KR1020150141415A KR101728399B1 (ko) 2015-10-08 2015-10-08 ์ผˆ๋นˆ ํ…Œ์ŠคํŠธ์šฉ ํ”„๋กœ๋ธŒ, ์ผˆ๋นˆ ํ…Œ์ŠคํŠธ์šฉ ํ”„๋กœ๋ธŒ ๋ชจ๋“ˆ ๋ฐ ๊ทธ ์ œ์กฐ๋ฐฉ๋ฒ•
PCT/KR2015/011634 WO2017061656A1 (ko) 2015-10-08 2015-11-02 ์ผˆ๋นˆ ํ…Œ์ŠคํŠธ์šฉ ํ”„๋กœ๋ธŒ, ์ผˆ๋นˆ ํ…Œ์ŠคํŠธ์šฉ ํ”„๋กœ๋ธŒ ๋ชจ๋“ˆ ๋ฐ ๊ทธ ์ œ์กฐ๋ฐฉ๋ฒ•

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KR102213594B1 (ko) * 2020-05-18 2021-02-08 ์ฃผ์‹ํšŒ์‚ฌ ์˜คํ‚จ์Šค์ „์ž ๏ผญ๏ฝ…๏ฝ๏ฝ“ ์ผˆ๋นˆ ํ…Œ์ŠคํŠธ ์†Œ์ผ“
KR102265359B1 (ko) * 2021-01-26 2021-06-15 ์ฃผ์‹ํšŒ์‚ฌ ๋ฉ”๋””์…˜ ๋„์ „์„ฑ ๋ฐ•๋ง‰์„ ์ด์šฉํ•œ ํ”„๋กœ๋ธŒ ํ•€ ๋ฐ ์ด๋ฅผ ํฌํ•จํ•˜๋Š” ํ…Œ์ŠคํŠธ ์†Œ์ผ“

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US8558554B2 (en) 2009-04-21 2013-10-15 Johnstech International Corporation Electrically conductive Kelvin contacts for microcircuit tester
KR101190174B1 (ko) * 2011-10-06 2012-10-12 ์—์ด์ผ€์ด์ด๋…ธํ…์ฃผ์‹ํšŒ์‚ฌ ๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ ์†Œ์ผ“
KR101162175B1 (ko) * 2011-05-06 2012-07-04 ์—์ด์ผ€์ด์ด๋…ธํ…์ฃผ์‹ํšŒ์‚ฌ ๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ ์†Œ์ผ“
KR101183167B1 (ko) 2011-10-27 2012-09-14 ๋ฆฌ๋…ธ๊ณต์—…์ฃผ์‹ํšŒ์‚ฌ ์ผˆ๋นˆ ํ…Œ์ŠคํŠธ์šฉ ์†Œ์ผ“
KR101489186B1 (ko) 2013-11-27 2015-02-11 ์ฃผ์‹ํšŒ์‚ฌ ์ด๋…ธ ๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ ์†Œ์ผ“ ๋ฐ ๊ทธ ์ œ์กฐ๋ฐฉ๋ฒ•
KR101582956B1 (ko) * 2013-12-30 2016-01-06 ์ฃผ์‹ํšŒ์‚ฌ ์ด๋…ธ๊ธ€๋กœ๋ฒŒ ๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ ์†Œ์ผ“ ๋ฐ ๊ทธ ์ œ์กฐ๋ฐฉ๋ฒ•
KR101517409B1 (ko) 2014-03-05 2015-05-19 ์ฃผ์‹ํšŒ์‚ฌ ์ด๋…ธ ๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ ์†Œ์ผ“ ๋ฐ ๊ทธ ์ œ์กฐ ๋ฐฉ๋ฒ•

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EP3364194A1 (en) 2018-08-22
EP3364194A4 (en) 2019-10-23
WO2017061656A1 (ko) 2017-04-13

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