EP1482593A4 - Connecteur conducteur anisotrope, son procede de fabrication et instrument servant a tester un circuit - Google Patents

Connecteur conducteur anisotrope, son procede de fabrication et instrument servant a tester un circuit

Info

Publication number
EP1482593A4
EP1482593A4 EP03743513A EP03743513A EP1482593A4 EP 1482593 A4 EP1482593 A4 EP 1482593A4 EP 03743513 A EP03743513 A EP 03743513A EP 03743513 A EP03743513 A EP 03743513A EP 1482593 A4 EP1482593 A4 EP 1482593A4
Authority
EP
European Patent Office
Prior art keywords
production method
circuit device
anisotropic conductive
test instrument
conductive connector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP03743513A
Other languages
German (de)
English (en)
Other versions
EP1482593A1 (fr
EP1482593B1 (fr
Inventor
Daisuke Yamada
Kazuaki Mayumi
Kiyoshi Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JSR Corp
Original Assignee
JSR Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by JSR Corp filed Critical JSR Corp
Publication of EP1482593A1 publication Critical patent/EP1482593A1/fr
Publication of EP1482593A4 publication Critical patent/EP1482593A4/fr
Application granted granted Critical
Publication of EP1482593B1 publication Critical patent/EP1482593B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/01—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between the connecting locations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
    • H01R4/04—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation using electrically conductive adhesives
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • H01R43/007—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for elastomeric connecting elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S439/00—Electrical connectors
    • Y10S439/923—Separation or disconnection aid

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Measuring Leads Or Probes (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
  • Non-Insulated Conductors (AREA)
EP03743513.8A 2002-03-07 2003-02-27 Connecteur conducteur anisotrope, son procede de fabrication et instrument servant a tester un circuit Expired - Lifetime EP1482593B1 (fr)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2002062666 2002-03-07
JP2002062666 2002-03-07
JP2002152316 2002-05-27
JP2002152316 2002-05-27
PCT/JP2003/002205 WO2003075408A1 (fr) 2002-03-07 2003-02-27 Connecteur conducteur anisotrope, son procede de fabrication et instrument servant a tester un circuit

Publications (3)

Publication Number Publication Date
EP1482593A1 EP1482593A1 (fr) 2004-12-01
EP1482593A4 true EP1482593A4 (fr) 2010-11-03
EP1482593B1 EP1482593B1 (fr) 2014-01-08

Family

ID=27791004

Family Applications (1)

Application Number Title Priority Date Filing Date
EP03743513.8A Expired - Lifetime EP1482593B1 (fr) 2002-03-07 2003-02-27 Connecteur conducteur anisotrope, son procede de fabrication et instrument servant a tester un circuit

Country Status (7)

Country Link
US (1) US7160123B2 (fr)
EP (1) EP1482593B1 (fr)
KR (1) KR100588029B1 (fr)
CN (1) CN100539304C (fr)
AU (1) AU2003211368A1 (fr)
TW (1) TWI281546B (fr)
WO (1) WO2003075408A1 (fr)

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CN100539304C (zh) 2002-03-07 2009-09-09 Jsr株式会社 各向异性导电连接器及生产工艺和电路器件的检验设备
US7190180B2 (en) * 2003-01-17 2007-03-13 Jsr Corporation Anisotropic conductive connector and production method therefor and inspection unit for circuit device
US7311531B2 (en) * 2003-03-26 2007-12-25 Jsr Corporation Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method
US8518304B1 (en) 2003-03-31 2013-08-27 The Research Foundation Of State University Of New York Nano-structure enhancements for anisotropic conductive material and thermal interposers
TWI239684B (en) * 2003-04-16 2005-09-11 Jsr Corp Anisotropic conductive connector and electric inspection device for circuit device
JP2005019393A (ja) * 2003-06-05 2005-01-20 Sharp Corp 異方性導電物、表示装置、表示装置の製造方法および導電部材
CN1806368B (zh) * 2003-06-12 2010-09-01 Jsr株式会社 各向异性导电连接器装置及其制造方法以及电路装置的检查装置
JP4507644B2 (ja) * 2003-06-12 2010-07-21 Ｊｓｒ株式会社 異方導電性コネクター装置およびその製造方法並びに回路装置の検査装置
JP3675812B1 (ja) * 2003-12-18 2005-07-27 Ｊｓｒ株式会社 異方導電性コネクターおよび回路装置の検査方法
JP3999759B2 (ja) * 2004-04-02 2007-10-31 富士通株式会社 基板及び電子機器
JP2006194620A (ja) * 2005-01-11 2006-07-27 Tokyo Electron Ltd プローブカード及び検査用接触構造体
JP4179620B2 (ja) * 2005-04-28 2008-11-12 日本航空電子工業株式会社 コネクタ
JP2007005246A (ja) * 2005-06-27 2007-01-11 Sumitomo Electric Ind Ltd 多孔質樹脂基材及び多層基板
EP1936387A4 (fr) * 2005-10-11 2011-10-05 Jsr Corp Connecteur conducteur anisotrope et équipement d'inspection de dispositif de circuit
DE102005059375A1 (de) * 2005-12-09 2007-06-14 Biotronik Crm Patent Ag Vorrichtung und Verfahren zur Herstellung von Elektroden für Batterien
TWI403723B (zh) * 2005-12-21 2013-08-01 Jsr Corp Manufacturing method of foreign - shaped conductive connector
CN101449426B (zh) 2006-04-11 2012-05-16 Jsr株式会社 各向异性导电连接器及各向异性导电连接器装置
KR100882735B1 (ko) * 2007-03-19 2009-02-06 도레이새한 주식회사 이방성 전도필름 및 이의 접착방법
JP5081533B2 (ja) * 2007-08-21 2012-11-28 ポリマテック株式会社 異方導電性コネクタおよび異方導電性コネクタの接続構造
EP2325948B1 (fr) * 2008-09-16 2013-04-17 Fuji Polymer Industries Co., Ltd. Composant électroconducteur en caoutchouc, procédé pour son utilisation et téélphone portable comprenant celui-ci
KR101054251B1 (ko) * 2009-05-18 2011-08-08 두성산업 주식회사 기판 표면 실장용 도전성 접촉 단자
JP2011086880A (ja) * 2009-10-19 2011-04-28 Advantest Corp 電子部品実装装置および電子部品の実装方法
WO2011140469A1 (fr) * 2010-05-06 2011-11-10 Zakaryae Fathi Composition de liaison adhésive et procédé d'utilisation
JP2012078222A (ja) * 2010-10-01 2012-04-19 Fujifilm Corp 回路基板接続構造体および回路基板の接続方法
CN103094737A (zh) * 2011-11-05 2013-05-08 宝宸（厦门）光学科技有限公司 引脚结构与引脚连接结构
KR101266124B1 (ko) * 2012-04-03 2013-05-27 주식회사 아이에스시 고밀도 도전부를 가지는 테스트용 소켓 및 그 제조방법
CN103454794B (zh) * 2013-09-06 2016-06-08 深圳市华星光电技术有限公司 点灯测试治具以及液晶面板测试方法
CN104153192A (zh) * 2014-08-06 2014-11-19 江南大学 一种织物磁化学镀铁镍合金的制备方法
JP6506653B2 (ja) * 2015-07-30 2019-04-24 日本メクトロン株式会社 伸縮性配線基板
WO2017143042A2 (fr) 2016-02-16 2017-08-24 Yale University Compositions permettant d'améliorer l'édition ciblée de gènes et leurs procédés d'utilisation
JP6405334B2 (ja) 2016-04-18 2018-10-17 日本メクトロン株式会社 伸縮性配線基板、及び、伸縮性配線基板の製造方法
CN105891558A (zh) * 2016-06-18 2016-08-24 国网辽宁省电力有限公司盘锦供电公司 绝缘杆批量试验接地极
JP2018073577A (ja) * 2016-10-27 2018-05-10 株式会社エンプラス 異方導電性シート及びその製造方法
JP6670276B2 (ja) * 2016-11-30 2020-03-18 富士高分子工業株式会社 積層タイプコネクタ及びその製造方法
CN110140184A (zh) * 2016-12-07 2019-08-16 韦弗有限责任公司 低损耗电传输机构和使用其的天线
US10283476B2 (en) 2017-03-15 2019-05-07 Immunolight, Llc. Adhesive bonding composition and electronic components prepared from the same
CN110582895B (zh) * 2017-05-18 2022-01-14 信越聚合物株式会社 电连接器及其制造方法
CN109341909B (zh) * 2018-11-20 2020-11-10 郑州大学 一种多功能柔性应力传感器
KR102193528B1 (ko) * 2019-04-17 2020-12-23 주식회사 아이에스시 극저온에서 적용 가능한 검사용 커넥터
KR102220172B1 (ko) * 2020-03-03 2021-02-25 (주)티에스이 신호 전송 커넥터
CN112666450B (zh) * 2021-01-13 2022-11-01 深圳市兔拉检测科技有限公司 一种智能芯片检测仪及其检测方法

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US4729809A (en) * 1985-03-14 1988-03-08 Amp Incorporated Anisotropically conductive adhesive composition
EP0641038A2 (fr) * 1993-08-27 1995-03-01 Nitto Denko Corporation Méthode pour connecter des substrats flexibles à des pièces de contacts et leurs structures

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JP3256175B2 (ja) * 1997-12-22 2002-02-12 株式会社ヨコオ Ｉｃパッケージ測定用ソケット
JP3865019B2 (ja) 1998-03-23 2007-01-10 Ｊｓｒ株式会社 異方導電性シートおよびその製造方法
JP2001067942A (ja) 1999-08-31 2001-03-16 Jsr Corp 異方導電性シート
JP4240724B2 (ja) 2000-01-26 2009-03-18 Ｊｓｒ株式会社 異方導電性シートおよびコネクター
JP4522604B2 (ja) 2001-03-19 2010-08-11 日東電工株式会社 異方導電性フィルム
CN100539304C (zh) 2002-03-07 2009-09-09 Jsr株式会社 各向异性导电连接器及生产工艺和电路器件的检验设备
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Publication number Priority date Publication date Assignee Title
US4571542A (en) * 1982-06-30 1986-02-18 Japan Synthetic Rubber Co., Ltd. Method and unit for inspecting printed wiring boards
US4729809A (en) * 1985-03-14 1988-03-08 Amp Incorporated Anisotropically conductive adhesive composition
EP0641038A2 (fr) * 1993-08-27 1995-03-01 Nitto Denko Corporation Méthode pour connecter des substrats flexibles à des pièces de contacts et leurs structures

Non-Patent Citations (1)

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Title
See also references of WO03075408A1 *

Also Published As

Publication number Publication date
KR100588029B1 (ko) 2006-06-12
CN100539304C (zh) 2009-09-09
KR20040087316A (ko) 2004-10-13
TWI281546B (en) 2007-05-21
CN1639919A (zh) 2005-07-13
EP1482593A1 (fr) 2004-12-01
TW200303989A (en) 2003-09-16
US7160123B2 (en) 2007-01-09
EP1482593B1 (fr) 2014-01-08
WO2003075408A1 (fr) 2003-09-12
AU2003211368A1 (en) 2003-09-16
US20050106907A1 (en) 2005-05-19

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