EP1441386A1 - Procede et patin de polissage de plaquette - Google Patents
Procede et patin de polissage de plaquette Download PDFInfo
- Publication number
- EP1441386A1 EP1441386A1 EP20020773017 EP02773017A EP1441386A1 EP 1441386 A1 EP1441386 A1 EP 1441386A1 EP 20020773017 EP20020773017 EP 20020773017 EP 02773017 A EP02773017 A EP 02773017A EP 1441386 A1 EP1441386 A1 EP 1441386A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- polishing
- wafer
- polishing pad
- compressibility
- surface roughness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02024—Mirror polishing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/249921—Web or sheet containing structurally defined element or component
- Y10T428/249953—Composite having voids in a component [e.g., porous, cellular, etc.]
- Y10T428/249955—Void-containing component partially impregnated with adjacent component
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001333233A JP3664676B2 (ja) | 2001-10-30 | 2001-10-30 | ウェーハの研磨方法及びウェーハ研磨用研磨パッド |
JP2001333233 | 2001-10-30 | ||
PCT/JP2002/011094 WO2003038882A1 (fr) | 2001-10-30 | 2002-10-25 | Procede et patin de polissage de plaquette |
Publications (1)
Publication Number | Publication Date |
---|---|
EP1441386A1 true EP1441386A1 (fr) | 2004-07-28 |
Family
ID=19148535
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP20020773017 Withdrawn EP1441386A1 (fr) | 2001-10-30 | 2002-10-25 | Procede et patin de polissage de plaquette |
Country Status (7)
Country | Link |
---|---|
US (1) | US7695347B2 (fr) |
EP (1) | EP1441386A1 (fr) |
JP (1) | JP3664676B2 (fr) |
KR (1) | KR20040097982A (fr) |
CN (1) | CN1299335C (fr) |
TW (1) | TWI289889B (fr) |
WO (1) | WO2003038882A1 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011106144A1 (fr) * | 2010-02-25 | 2011-09-01 | Memc Electronic Materials, Inc. | Procédés pour réduire la largeur de la région non liée dans des structures silicium sur isolant (soi) et des tranches, et structures soi produites par ces procédés |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7927209B2 (en) * | 2005-02-07 | 2011-04-19 | Wms Gaming Inc. | Wagering games with pooling of awards |
EP1710045B1 (fr) * | 2005-04-08 | 2008-12-17 | Ohara Inc. | Substrat et méthode de polissage d'un substrat |
JP4895530B2 (ja) * | 2005-05-16 | 2012-03-14 | 京セラミタ株式会社 | 画像形成装置 |
JP4881590B2 (ja) * | 2005-07-27 | 2012-02-22 | ニッタ・ハース株式会社 | 研磨布 |
US8883034B2 (en) * | 2009-09-16 | 2014-11-11 | Brian Reiss | Composition and method for polishing bulk silicon |
US8815110B2 (en) * | 2009-09-16 | 2014-08-26 | Cabot Microelectronics Corporation | Composition and method for polishing bulk silicon |
US8697576B2 (en) * | 2009-09-16 | 2014-04-15 | Cabot Microelectronics Corporation | Composition and method for polishing polysilicon |
US9283648B2 (en) | 2012-08-24 | 2016-03-15 | Ecolab Usa Inc. | Methods of polishing sapphire surfaces |
JP6291026B2 (ja) * | 2013-03-15 | 2018-03-14 | エコラボ ユーエスエー インコーポレイティド | サファイアの表面を研磨する方法 |
JP6332041B2 (ja) * | 2014-01-20 | 2018-05-30 | 信越化学工業株式会社 | 合成石英ガラス基板の製造方法 |
CN106002498B (zh) * | 2016-08-01 | 2018-04-06 | 中国电子科技集团公司第四十六研究所 | 一种有机dast晶体的表面研磨工艺方法 |
JP2018074019A (ja) * | 2016-10-31 | 2018-05-10 | 株式会社Sumco | ウェーハの製造方法およびウェーハ |
CN106891211B (zh) * | 2017-02-20 | 2019-02-12 | 大连理工大学 | 一种粘弹性垫的制作方法及薄板类工件平面磨削方法 |
US10377014B2 (en) | 2017-02-28 | 2019-08-13 | Ecolab Usa Inc. | Increased wetting of colloidal silica as a polishing slurry |
JP6951895B2 (ja) * | 2017-07-25 | 2021-10-20 | ニッタ・デュポン株式会社 | 研磨布 |
JP7306234B2 (ja) * | 2019-11-19 | 2023-07-11 | 株式会社Sumco | ウェーハの研磨方法及びシリコンウェーハ |
JP7388324B2 (ja) | 2019-12-05 | 2023-11-29 | 株式会社Sumco | ウェーハの片面研磨方法、ウェーハの製造方法、およびウェーハの片面研磨装置 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4841680A (en) * | 1987-08-25 | 1989-06-27 | Rodel, Inc. | Inverted cell pad material for grinding, lapping, shaping and polishing |
JPH10128674A (ja) | 1996-10-28 | 1998-05-19 | Rooder Nitta Kk | 研磨用パッド |
US6126532A (en) * | 1997-04-18 | 2000-10-03 | Cabot Corporation | Polishing pads for a semiconductor substrate |
DE69809265T2 (de) * | 1997-04-18 | 2003-03-27 | Cabot Microelectronics Corp | Polierkissen fur einen halbleitersubstrat |
US5797076A (en) * | 1997-05-12 | 1998-08-18 | Lexmark International, Inc. | Abrasive shim compliant doctor blade |
JPH11277408A (ja) * | 1998-01-29 | 1999-10-12 | Shin Etsu Handotai Co Ltd | 半導体ウエーハの鏡面研磨用研磨布、鏡面研磨方法ならびに鏡面研磨装置 |
US6117000A (en) * | 1998-07-10 | 2000-09-12 | Cabot Corporation | Polishing pad for a semiconductor substrate |
JP4533476B2 (ja) * | 1999-07-07 | 2010-09-01 | 株式会社シミズ | フッ素樹脂含有カチオン電着塗料および製造方法 |
DE60024559T2 (de) * | 1999-10-15 | 2006-08-24 | Ebara Corp. | Verfahren und Gerät zum Polieren eines Werkstückes |
JP3649385B2 (ja) * | 2000-01-12 | 2005-05-18 | 東洋ゴム工業株式会社 | 熱可塑性エラストマー微孔質発泡体、その製造方法および研磨シート |
JP3652572B2 (ja) | 2000-01-20 | 2005-05-25 | ニッタ・ハース株式会社 | 研磨布 |
US6383065B1 (en) * | 2001-01-22 | 2002-05-07 | Cabot Microelectronics Corporation | Catalytic reactive pad for metal CMP |
-
2001
- 2001-10-30 JP JP2001333233A patent/JP3664676B2/ja not_active Expired - Lifetime
-
2002
- 2002-10-25 WO PCT/JP2002/011094 patent/WO2003038882A1/fr not_active Application Discontinuation
- 2002-10-25 KR KR10-2004-7004745A patent/KR20040097982A/ko not_active Application Discontinuation
- 2002-10-25 US US10/493,494 patent/US7695347B2/en not_active Expired - Lifetime
- 2002-10-25 CN CNB028214021A patent/CN1299335C/zh not_active Expired - Lifetime
- 2002-10-25 EP EP20020773017 patent/EP1441386A1/fr not_active Withdrawn
- 2002-10-29 TW TW91132083A patent/TWI289889B/zh not_active IP Right Cessation
Non-Patent Citations (1)
Title |
---|
See references of WO03038882A1 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011106144A1 (fr) * | 2010-02-25 | 2011-09-01 | Memc Electronic Materials, Inc. | Procédés pour réduire la largeur de la région non liée dans des structures silicium sur isolant (soi) et des tranches, et structures soi produites par ces procédés |
Also Published As
Publication number | Publication date |
---|---|
US20050014455A1 (en) | 2005-01-20 |
KR20040097982A (ko) | 2004-11-18 |
TW200300053A (en) | 2003-05-01 |
TWI289889B (en) | 2007-11-11 |
CN1299335C (zh) | 2007-02-07 |
WO2003038882A1 (fr) | 2003-05-08 |
US7695347B2 (en) | 2010-04-13 |
JP2003142437A (ja) | 2003-05-16 |
JP3664676B2 (ja) | 2005-06-29 |
CN1579014A (zh) | 2005-02-09 |
WO2003038882A8 (fr) | 2004-10-14 |
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Legal Events
Date | Code | Title | Description |
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PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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17P | Request for examination filed |
Effective date: 20040422 |
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AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR IE IT LI LU MC NL PT SE SK TR |
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STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN |
|
18W | Application withdrawn |
Effective date: 20060808 |