EP1415519A1 - Geschweisster anschlusskamm - Google Patents

Geschweisster anschlusskamm

Info

Publication number
EP1415519A1
EP1415519A1 EP02756051A EP02756051A EP1415519A1 EP 1415519 A1 EP1415519 A1 EP 1415519A1 EP 02756051 A EP02756051 A EP 02756051A EP 02756051 A EP02756051 A EP 02756051A EP 1415519 A1 EP1415519 A1 EP 1415519A1
Authority
EP
European Patent Office
Prior art keywords
lead
leadframe
holes
hole
welding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP02756051A
Other languages
English (en)
French (fr)
Inventor
Lars Gustafsson
Jan ÖHRN
Per LUNDSTRÖM
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Telefonaktiebolaget LM Ericsson AB
Original Assignee
Telefonaktiebolaget LM Ericsson AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Telefonaktiebolaget LM Ericsson AB filed Critical Telefonaktiebolaget LM Ericsson AB
Publication of EP1415519A1 publication Critical patent/EP1415519A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49811Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/328Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by welding
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01006Carbon [C]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01033Arsenic [As]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01082Lead [Pb]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/013Alloys
    • H01L2924/014Solder alloys
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/156Material
    • H01L2924/15786Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
    • H01L2924/15787Ceramics, e.g. crystalline carbides, nitrides or oxides

Definitions

  • the invention is related to a method of joining leads to substrates, e.g. in the manufacture of subassemblies mounted on a larger circuit board.
  • a subassembly here taken as comprising a carrier having a conductive pattern, various components mounted thereto and a leadframe. If the subassembly has the carrier, e.g. a ceramic substrate, located under the leadframe, the weight of the carrier and the components may cause the assembly to collapse and the substrate to fall down. This case is illustrated in Fig. 1.
  • the carrier e.g. a ceramic substrate
  • Solder is herein taken to mean an alloy having a melting point below 450°C, intended for joining two parts at a temperature below the melting points of these parts.
  • a braze is an alloy having a melting point higher than 450 °C and intended for the same use.
  • solders in the desired temperature range have disqualifying properties such as brittleness, high cost or that they can contain hazardous substances. Also, many components cannot withstand the elevated temperature needed when using high temperature solders. - The components cannot withstand the high temperature needed for the reflow process of brazing materials.
  • holes are made in the leads of the frame and then the leads are welded to the pads.
  • the holes reduce the energy required for the welding.
  • the holes can preferably cover about 50% of the area heated in the welding process.
  • Fig. 1 is a cross-sectional view of a leadframe joined to a substrate
  • FIG. 2 is fragmentary plan view of a lead joined to a contact pad.
  • a subassembly comprising an e.g. ceramic substrate 1 joined to a leadframe 3 at joining positions 5.
  • connection leads or legs 7 of the leadframe are made to be electrically connected to pads 9 of the substrate, see the fragmentary, plan view of Fig. 2.
  • the leads 7 have a thickness considerably larger than then thin contact pads 9.
  • the leads are welded to the pads using e.g. a laser beam, plasma welding, a microflame, as indicated at 10.
  • the pads will hence be more easily heated than the leads due to the difference in heat capacity resulting from the different thicknesses.
  • the leads 7 are provided with at least one and preferably two holes 11 covering e.g. about 50% of the area heated in the welding. These holes can have any shape, e.g. being circular as illustrated in the figure.
  • a meltdown of the material in the walls of the holes 11 or in the edge regions of the lead at the holes is obtained, the melted material flowing down to be joined with the material of the underlying pad 9.
  • the leadframe is heated at regions around the holes and also the substrate, i.e. the pads 9 thereof, the latter heating occurring through the holes 11.
  • the holes 11 can have a diameter in the range of about 0.1 - 0.8 mm made in the leadframe material which can have a thickness in the range 0.1 - 1 mm.
  • the incoming, heating energy indicated by the arrows 10, has a direction that is approximately perpendicular to the large surface of the components to be welded to each other.

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Connections Effected By Soldering, Adhesion, Or Permanent Deformation (AREA)
  • Lead Frames For Integrated Circuits (AREA)
EP02756051A 2001-08-07 2002-08-07 Geschweisster anschlusskamm Withdrawn EP1415519A1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
SE0102668A SE521528C3 (sv) 2001-08-07 2001-08-07 Svetsad benram
SE0102668 2001-08-07
PCT/SE2002/001434 WO2003015485A1 (en) 2001-08-07 2002-08-07 Welded leadframe

Publications (1)

Publication Number Publication Date
EP1415519A1 true EP1415519A1 (de) 2004-05-06

Family

ID=20284987

Family Applications (1)

Application Number Title Priority Date Filing Date
EP02756051A Withdrawn EP1415519A1 (de) 2001-08-07 2002-08-07 Geschweisster anschlusskamm

Country Status (6)

Country Link
EP (1) EP1415519A1 (de)
JP (1) JP2004538656A (de)
CN (1) CN1270376C (de)
SE (1) SE521528C3 (de)
TW (1) TW531462B (de)
WO (1) WO2003015485A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4842118B2 (ja) 2006-01-24 2011-12-21 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
CN102054658B (zh) * 2009-10-30 2013-03-27 日月光封装测试(上海)有限公司 封装打线工艺的加热治具及其方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4889275A (en) * 1988-11-02 1989-12-26 Motorola, Inc. Method for effecting solder interconnects
US4972989A (en) * 1989-10-30 1990-11-27 Motorola, Inc. Through the lead soldering
DE19840306A1 (de) * 1998-09-04 2000-03-09 Bosch Gmbh Robert Ausrichtleiste

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO03015485A1 *

Also Published As

Publication number Publication date
SE521528C2 (sv) 2003-11-11
SE0102668D0 (sv) 2001-08-07
WO2003015485A1 (en) 2003-02-20
SE0102668L (sv) 2003-02-08
SE521528C3 (sv) 2003-12-10
JP2004538656A (ja) 2004-12-24
CN1539256A (zh) 2004-10-20
TW531462B (en) 2003-05-11
CN1270376C (zh) 2006-08-16

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