EP1361023A3 - Polierartikel zum elektrochemisch-mechanischen Polieren von Substraten - Google Patents
Polierartikel zum elektrochemisch-mechanischen Polieren von Substraten Download PDFInfo
- Publication number
- EP1361023A3 EP1361023A3 EP03252801A EP03252801A EP1361023A3 EP 1361023 A3 EP1361023 A3 EP 1361023A3 EP 03252801 A EP03252801 A EP 03252801A EP 03252801 A EP03252801 A EP 03252801A EP 1361023 A3 EP1361023 A3 EP 1361023A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- polishing
- conductive
- article
- substrate
- articles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23H—WORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
- B23H5/00—Combined machining
- B23H5/06—Electrochemical machining combined with mechanical working, e.g. grinding or honing
- B23H5/08—Electrolytic grinding
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/046—Lapping machines or devices; Accessories designed for working plane surfaces using electric current
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/12—Lapping plates for working plane surfaces
- B24B37/14—Lapping plates for working plane surfaces characterised by the composition or properties of the plate materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/12—Lapping plates for working plane surfaces
- B24B37/16—Lapping plates for working plane surfaces characterised by the shape of the lapping plate surface, e.g. grooved
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Electroplating Methods And Accessories (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US140010 | 1987-12-31 | ||
US10/140,010 US6979248B2 (en) | 2002-05-07 | 2002-05-07 | Conductive polishing article for electrochemical mechanical polishing |
Publications (3)
Publication Number | Publication Date |
---|---|
EP1361023A2 EP1361023A2 (de) | 2003-11-12 |
EP1361023A3 true EP1361023A3 (de) | 2004-04-07 |
EP1361023B1 EP1361023B1 (de) | 2006-04-12 |
Family
ID=29249779
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP03252801A Expired - Lifetime EP1361023B1 (de) | 2002-05-07 | 2003-05-02 | Polierartikel zum elektrochemisch-mechanischen Polieren von Substraten |
Country Status (9)
Country | Link |
---|---|
US (1) | US6979248B2 (de) |
EP (1) | EP1361023B1 (de) |
JP (2) | JP2004134732A (de) |
KR (3) | KR200321046Y1 (de) |
CN (3) | CN2751972Y (de) |
AT (1) | ATE322959T1 (de) |
DE (1) | DE60304505T2 (de) |
SG (1) | SG117444A1 (de) |
TW (3) | TWI274386B (de) |
Families Citing this family (54)
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US6962524B2 (en) | 2000-02-17 | 2005-11-08 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
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US7077721B2 (en) * | 2000-02-17 | 2006-07-18 | Applied Materials, Inc. | Pad assembly for electrochemical mechanical processing |
US7670468B2 (en) | 2000-02-17 | 2010-03-02 | Applied Materials, Inc. | Contact assembly and method for electrochemical mechanical processing |
US7344432B2 (en) * | 2001-04-24 | 2008-03-18 | Applied Materials, Inc. | Conductive pad with ion exchange membrane for electrochemical mechanical polishing |
US6783657B2 (en) * | 2002-08-29 | 2004-08-31 | Micron Technology, Inc. | Systems and methods for the electrolytic removal of metals from substrates |
US20040040863A1 (en) * | 2002-08-29 | 2004-03-04 | Micron Technology, Inc. | Systems for electrolytic removal of metals from substrates |
JP2004181584A (ja) * | 2002-12-04 | 2004-07-02 | Showa Denko Kk | 研磨用複合材料及び砥石、研削材料、研磨材料並びに電子部品の加工方法及びシリコンの加工方法 |
DE602004008880T2 (de) * | 2003-02-18 | 2008-06-26 | Parker-Hannifin Corp., Cleveland | Polierartikel für elektro-chemisches-mechanisches polieren |
US7842169B2 (en) * | 2003-03-04 | 2010-11-30 | Applied Materials, Inc. | Method and apparatus for local polishing control |
WO2004108358A2 (en) * | 2003-06-06 | 2004-12-16 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
US6848977B1 (en) * | 2003-08-29 | 2005-02-01 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad for electrochemical mechanical polishing |
US7654885B2 (en) * | 2003-10-03 | 2010-02-02 | Applied Materials, Inc. | Multi-layer polishing pad |
US8066552B2 (en) | 2003-10-03 | 2011-11-29 | Applied Materials, Inc. | Multi-layer polishing pad for low-pressure polishing |
US20050173259A1 (en) * | 2004-02-06 | 2005-08-11 | Applied Materials, Inc. | Endpoint system for electro-chemical mechanical polishing |
US7128821B2 (en) * | 2004-01-20 | 2006-10-31 | Taiwan Semiconductor Manufacturing Co., Ltd. | Electropolishing method for removing particles from wafer surface |
WO2005090648A2 (en) * | 2004-03-19 | 2005-09-29 | Ebara Corporation | Electrolytic processing apparatus and electrolytic processing method |
US7618529B2 (en) * | 2004-05-25 | 2009-11-17 | Rohm And Haas Electronic Materials Cmp Holdings, Inc | Polishing pad for electrochemical mechanical polishing |
DE102004028658A1 (de) * | 2004-06-15 | 2006-01-05 | Albert-Ludwigs-Universität Freiburg, vertreten durch den Rektor | Komposit-Werkzeugelektrode für die elektrochemische Materialbearbeitung und Verfahren zu deren Herstellung |
WO2006093805A2 (en) * | 2005-02-25 | 2006-09-08 | Superior Graphite Co. | Graphite coating of particulate materials |
US20060219663A1 (en) * | 2005-03-31 | 2006-10-05 | Applied Materials, Inc. | Metal CMP process on one or more polishing stations using slurries with oxidizers |
US20060286906A1 (en) * | 2005-06-21 | 2006-12-21 | Cabot Microelectronics Corporation | Polishing pad comprising magnetically sensitive particles and method for the use thereof |
US7407433B2 (en) * | 2005-11-03 | 2008-08-05 | Applied Materials, Inc. | Pad characterization tool |
US20070131562A1 (en) * | 2005-12-08 | 2007-06-14 | Applied Materials, Inc. | Method and apparatus for planarizing a substrate with low fluid consumption |
US8264137B2 (en) | 2006-01-03 | 2012-09-11 | Samsung Electronics Co., Ltd. | Curing binder material for carbon nanotube electron emission cathodes |
US20070153453A1 (en) * | 2006-01-05 | 2007-07-05 | Applied Materials, Inc. | Fully conductive pad for electrochemical mechanical processing |
US20070218587A1 (en) * | 2006-03-07 | 2007-09-20 | Applied Materials, Inc. | Soft conductive polymer processing pad and method for fabricating the same |
US20070235344A1 (en) * | 2006-04-06 | 2007-10-11 | Applied Materials, Inc. | Process for high copper removal rate with good planarization and surface finish |
US20070251832A1 (en) * | 2006-04-27 | 2007-11-01 | Applied Materials, Inc. | Method and apparatus for electrochemical mechanical polishing of cu with higher liner velocity for better surface finish and higher removal rate during clearance |
US7422982B2 (en) | 2006-07-07 | 2008-09-09 | Applied Materials, Inc. | Method and apparatus for electroprocessing a substrate with edge profile control |
US20080014845A1 (en) * | 2006-07-11 | 2008-01-17 | Alpay Yilmaz | Conditioning disk having uniform structures |
US8012000B2 (en) * | 2007-04-02 | 2011-09-06 | Applied Materials, Inc. | Extended pad life for ECMP and barrier removal |
US20080277787A1 (en) * | 2007-05-09 | 2008-11-13 | Liu Feng Q | Method and pad design for the removal of barrier material by electrochemical mechanical processing |
US7828634B2 (en) * | 2007-08-16 | 2010-11-09 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Interconnected-multi-element-lattice polishing pad |
US7517277B2 (en) * | 2007-08-16 | 2009-04-14 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Layered-filament lattice for chemical mechanical polishing |
US20090088050A1 (en) * | 2007-09-28 | 2009-04-02 | Wei-Yung Hsu | Conductive polishing article for electrochemical mechanical polishing |
WO2009048099A1 (ja) * | 2007-10-09 | 2009-04-16 | Roki Techno Co., Ltd. | 研磨工具構成体、研磨表層及び研磨方法 |
US20090278081A1 (en) * | 2008-03-28 | 2009-11-12 | Applied Materials, Inc. | Pad properties using nanoparticle additives |
TWI449597B (zh) * | 2008-07-09 | 2014-08-21 | Iv Technologies Co Ltd | 研磨墊及其製造方法 |
JP5038259B2 (ja) * | 2008-08-26 | 2012-10-03 | 株式会社日立ハイテクノロジーズ | クリーニング装置およびクリーニング方法 |
WO2011090681A2 (en) * | 2009-12-29 | 2011-07-28 | Saint-Gobain Abrasives, Inc. | Anti-loading abrasive article |
KR101329796B1 (ko) * | 2011-11-02 | 2013-11-18 | 한국과학기술연구원 | 폴리아크릴로나이트릴계 전기 전도성 복합재료용 조성물, 상기 복합재료의 제조 방법 및 그에 따른 복합재료 |
TW201417195A (zh) * | 2012-10-23 | 2014-05-01 | Wecon Automation Corp | 圓形式晶粒置放方法 |
JP5266415B1 (ja) * | 2012-11-08 | 2013-08-21 | 日本蚕毛染色株式会社 | 静電容量式タッチパネル用筆記具 |
CN104919575B (zh) * | 2013-01-11 | 2018-09-18 | 应用材料公司 | 化学机械抛光设备及方法 |
US9415479B2 (en) * | 2013-02-08 | 2016-08-16 | Taiwan Semiconductor Manufacturing Co., Ltd. | Conductive chemical mechanical planarization polishing pad |
US9914197B2 (en) | 2013-12-09 | 2018-03-13 | Saint-Gobain Abrasives, Inc. | Abrasive assembly having alignment elements |
US9914199B2 (en) * | 2013-12-09 | 2018-03-13 | Saint-Gobain Abrasives, Inc. | Abrasive disc |
CN104894634A (zh) * | 2014-03-03 | 2015-09-09 | 盛美半导体设备(上海)有限公司 | 新型电化学抛光装置 |
CN105619965A (zh) * | 2014-11-28 | 2016-06-01 | 苏州力合光电薄膜科技有限公司 | 自润滑薄膜结构及其制造方法和应用 |
ES2604830B1 (es) * | 2016-04-28 | 2017-12-18 | Drylyte, S.L. | Proceso para alisado y pulido de metales por transporte iónico mediante cuerpos sólidos libres, y cuerpos sólidos para llevar a cabo dicho proceso. |
KR102142197B1 (ko) * | 2018-12-28 | 2020-09-14 | 임교순 | 필름 연결형 누설 감지 커넥터 |
CN116003726A (zh) * | 2022-11-09 | 2023-04-25 | 合肥宏光研磨科技有限公司 | 碳纳米管改性聚氨酯抛光衬垫材料及其制备方法 |
Citations (9)
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2002
- 2002-05-07 US US10/140,010 patent/US6979248B2/en not_active Expired - Fee Related
-
2003
- 2003-05-02 EP EP03252801A patent/EP1361023B1/de not_active Expired - Lifetime
- 2003-05-02 AT AT03252801T patent/ATE322959T1/de not_active IP Right Cessation
- 2003-05-02 DE DE60304505T patent/DE60304505T2/de not_active Expired - Lifetime
- 2003-05-06 SG SG200302562A patent/SG117444A1/en unknown
- 2003-05-07 CN CNU032575270U patent/CN2751972Y/zh not_active Expired - Fee Related
- 2003-05-07 TW TW092112489A patent/TWI274386B/zh not_active IP Right Cessation
- 2003-05-07 CN CNU032575262U patent/CN2737501Y/zh not_active Expired - Fee Related
- 2003-05-07 KR KR20-2003-0014154U patent/KR200321046Y1/ko not_active IP Right Cessation
- 2003-05-07 TW TW092208363U patent/TW592164U/zh not_active IP Right Cessation
- 2003-05-07 CN CNB031234178A patent/CN100413032C/zh not_active Expired - Fee Related
- 2003-05-07 JP JP2003129443A patent/JP2004134732A/ja not_active Withdrawn
- 2003-05-07 TW TW092208365U patent/TW578641U/zh not_active IP Right Cessation
- 2003-05-07 KR KR20-2003-0014153U patent/KR200331228Y1/ko not_active IP Right Cessation
- 2003-05-07 KR KR10-2003-0028979A patent/KR20030087569A/ko not_active Application Discontinuation
- 2003-10-10 JP JP2003271742U patent/JP3100987U/ja not_active Expired - Lifetime
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Also Published As
Publication number | Publication date |
---|---|
TW578641U (en) | 2004-03-01 |
ATE322959T1 (de) | 2006-04-15 |
TW592164U (en) | 2004-06-11 |
TWI274386B (en) | 2007-02-21 |
DE60304505D1 (de) | 2006-05-24 |
US20030209448A1 (en) | 2003-11-13 |
EP1361023A2 (de) | 2003-11-12 |
JP2004134732A (ja) | 2004-04-30 |
KR200331228Y1 (ko) | 2003-10-23 |
DE60304505T2 (de) | 2006-09-07 |
EP1361023B1 (de) | 2006-04-12 |
CN100413032C (zh) | 2008-08-20 |
CN2751972Y (zh) | 2006-01-18 |
KR20030087569A (ko) | 2003-11-14 |
JP3100987U (ja) | 2004-06-03 |
SG117444A1 (en) | 2005-12-29 |
CN1458671A (zh) | 2003-11-26 |
KR200321046Y1 (ko) | 2003-07-25 |
CN2737501Y (zh) | 2005-11-02 |
US6979248B2 (en) | 2005-12-27 |
TW200402100A (en) | 2004-02-01 |
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