EP1361023A3 - Polierartikel zum elektrochemisch-mechanischen Polieren von Substraten - Google Patents

Polierartikel zum elektrochemisch-mechanischen Polieren von Substraten Download PDF

Info

Publication number
EP1361023A3
EP1361023A3 EP03252801A EP03252801A EP1361023A3 EP 1361023 A3 EP1361023 A3 EP 1361023A3 EP 03252801 A EP03252801 A EP 03252801A EP 03252801 A EP03252801 A EP 03252801A EP 1361023 A3 EP1361023 A3 EP 1361023A3
Authority
EP
European Patent Office
Prior art keywords
polishing
conductive
article
substrate
articles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP03252801A
Other languages
English (en)
French (fr)
Other versions
EP1361023A2 (de
EP1361023B1 (de
Inventor
Yongqi Hu
Yan Wang
Alain Duboust
Feng Q. Liu
Rashid Mavliev
Liang-Yuh Chen
Ratson Morad
Sasson Somekh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of EP1361023A2 publication Critical patent/EP1361023A2/de
Publication of EP1361023A3 publication Critical patent/EP1361023A3/de
Application granted granted Critical
Publication of EP1361023B1 publication Critical patent/EP1361023B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23HWORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
    • B23H5/00Combined machining
    • B23H5/06Electrochemical machining combined with mechanical working, e.g. grinding or honing
    • B23H5/08Electrolytic grinding
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/046Lapping machines or devices; Accessories designed for working plane surfaces using electric current
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/12Lapping plates for working plane surfaces
    • B24B37/14Lapping plates for working plane surfaces characterised by the composition or properties of the plate materials
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/12Lapping plates for working plane surfaces
    • B24B37/16Lapping plates for working plane surfaces characterised by the shape of the lapping plate surface, e.g. grooved
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/902Specified use of nanostructure

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Polishing Bodies And Polishing Tools (AREA)
  • Electroplating Methods And Accessories (AREA)
EP03252801A 2002-05-07 2003-05-02 Polierartikel zum elektrochemisch-mechanischen Polieren von Substraten Expired - Lifetime EP1361023B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US140010 1987-12-31
US10/140,010 US6979248B2 (en) 2002-05-07 2002-05-07 Conductive polishing article for electrochemical mechanical polishing

Publications (3)

Publication Number Publication Date
EP1361023A2 EP1361023A2 (de) 2003-11-12
EP1361023A3 true EP1361023A3 (de) 2004-04-07
EP1361023B1 EP1361023B1 (de) 2006-04-12

Family

ID=29249779

Family Applications (1)

Application Number Title Priority Date Filing Date
EP03252801A Expired - Lifetime EP1361023B1 (de) 2002-05-07 2003-05-02 Polierartikel zum elektrochemisch-mechanischen Polieren von Substraten

Country Status (9)

Country Link
US (1) US6979248B2 (de)
EP (1) EP1361023B1 (de)
JP (2) JP2004134732A (de)
KR (3) KR200321046Y1 (de)
CN (3) CN2751972Y (de)
AT (1) ATE322959T1 (de)
DE (1) DE60304505T2 (de)
SG (1) SG117444A1 (de)
TW (3) TWI274386B (de)

Families Citing this family (54)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2584882B2 (ja) * 1990-03-15 1997-02-26 富士電機株式会社 自動販売機
US6962524B2 (en) 2000-02-17 2005-11-08 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US7678245B2 (en) 2000-02-17 2010-03-16 Applied Materials, Inc. Method and apparatus for electrochemical mechanical processing
US7077721B2 (en) * 2000-02-17 2006-07-18 Applied Materials, Inc. Pad assembly for electrochemical mechanical processing
US7670468B2 (en) 2000-02-17 2010-03-02 Applied Materials, Inc. Contact assembly and method for electrochemical mechanical processing
US7344432B2 (en) * 2001-04-24 2008-03-18 Applied Materials, Inc. Conductive pad with ion exchange membrane for electrochemical mechanical polishing
US6783657B2 (en) * 2002-08-29 2004-08-31 Micron Technology, Inc. Systems and methods for the electrolytic removal of metals from substrates
US20040040863A1 (en) * 2002-08-29 2004-03-04 Micron Technology, Inc. Systems for electrolytic removal of metals from substrates
JP2004181584A (ja) * 2002-12-04 2004-07-02 Showa Denko Kk 研磨用複合材料及び砥石、研削材料、研磨材料並びに電子部品の加工方法及びシリコンの加工方法
DE602004008880T2 (de) * 2003-02-18 2008-06-26 Parker-Hannifin Corp., Cleveland Polierartikel für elektro-chemisches-mechanisches polieren
US7842169B2 (en) * 2003-03-04 2010-11-30 Applied Materials, Inc. Method and apparatus for local polishing control
WO2004108358A2 (en) * 2003-06-06 2004-12-16 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US6848977B1 (en) * 2003-08-29 2005-02-01 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing pad for electrochemical mechanical polishing
US7654885B2 (en) * 2003-10-03 2010-02-02 Applied Materials, Inc. Multi-layer polishing pad
US8066552B2 (en) 2003-10-03 2011-11-29 Applied Materials, Inc. Multi-layer polishing pad for low-pressure polishing
US20050173259A1 (en) * 2004-02-06 2005-08-11 Applied Materials, Inc. Endpoint system for electro-chemical mechanical polishing
US7128821B2 (en) * 2004-01-20 2006-10-31 Taiwan Semiconductor Manufacturing Co., Ltd. Electropolishing method for removing particles from wafer surface
WO2005090648A2 (en) * 2004-03-19 2005-09-29 Ebara Corporation Electrolytic processing apparatus and electrolytic processing method
US7618529B2 (en) * 2004-05-25 2009-11-17 Rohm And Haas Electronic Materials Cmp Holdings, Inc Polishing pad for electrochemical mechanical polishing
DE102004028658A1 (de) * 2004-06-15 2006-01-05 Albert-Ludwigs-Universität Freiburg, vertreten durch den Rektor Komposit-Werkzeugelektrode für die elektrochemische Materialbearbeitung und Verfahren zu deren Herstellung
WO2006093805A2 (en) * 2005-02-25 2006-09-08 Superior Graphite Co. Graphite coating of particulate materials
US20060219663A1 (en) * 2005-03-31 2006-10-05 Applied Materials, Inc. Metal CMP process on one or more polishing stations using slurries with oxidizers
US20060286906A1 (en) * 2005-06-21 2006-12-21 Cabot Microelectronics Corporation Polishing pad comprising magnetically sensitive particles and method for the use thereof
US7407433B2 (en) * 2005-11-03 2008-08-05 Applied Materials, Inc. Pad characterization tool
US20070131562A1 (en) * 2005-12-08 2007-06-14 Applied Materials, Inc. Method and apparatus for planarizing a substrate with low fluid consumption
US8264137B2 (en) 2006-01-03 2012-09-11 Samsung Electronics Co., Ltd. Curing binder material for carbon nanotube electron emission cathodes
US20070153453A1 (en) * 2006-01-05 2007-07-05 Applied Materials, Inc. Fully conductive pad for electrochemical mechanical processing
US20070218587A1 (en) * 2006-03-07 2007-09-20 Applied Materials, Inc. Soft conductive polymer processing pad and method for fabricating the same
US20070235344A1 (en) * 2006-04-06 2007-10-11 Applied Materials, Inc. Process for high copper removal rate with good planarization and surface finish
US20070251832A1 (en) * 2006-04-27 2007-11-01 Applied Materials, Inc. Method and apparatus for electrochemical mechanical polishing of cu with higher liner velocity for better surface finish and higher removal rate during clearance
US7422982B2 (en) 2006-07-07 2008-09-09 Applied Materials, Inc. Method and apparatus for electroprocessing a substrate with edge profile control
US20080014845A1 (en) * 2006-07-11 2008-01-17 Alpay Yilmaz Conditioning disk having uniform structures
US8012000B2 (en) * 2007-04-02 2011-09-06 Applied Materials, Inc. Extended pad life for ECMP and barrier removal
US20080277787A1 (en) * 2007-05-09 2008-11-13 Liu Feng Q Method and pad design for the removal of barrier material by electrochemical mechanical processing
US7828634B2 (en) * 2007-08-16 2010-11-09 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Interconnected-multi-element-lattice polishing pad
US7517277B2 (en) * 2007-08-16 2009-04-14 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Layered-filament lattice for chemical mechanical polishing
US20090088050A1 (en) * 2007-09-28 2009-04-02 Wei-Yung Hsu Conductive polishing article for electrochemical mechanical polishing
WO2009048099A1 (ja) * 2007-10-09 2009-04-16 Roki Techno Co., Ltd. 研磨工具構成体、研磨表層及び研磨方法
US20090278081A1 (en) * 2008-03-28 2009-11-12 Applied Materials, Inc. Pad properties using nanoparticle additives
TWI449597B (zh) * 2008-07-09 2014-08-21 Iv Technologies Co Ltd 研磨墊及其製造方法
JP5038259B2 (ja) * 2008-08-26 2012-10-03 株式会社日立ハイテクノロジーズ クリーニング装置およびクリーニング方法
WO2011090681A2 (en) * 2009-12-29 2011-07-28 Saint-Gobain Abrasives, Inc. Anti-loading abrasive article
KR101329796B1 (ko) * 2011-11-02 2013-11-18 한국과학기술연구원 폴리아크릴로나이트릴계 전기 전도성 복합재료용 조성물, 상기 복합재료의 제조 방법 및 그에 따른 복합재료
TW201417195A (zh) * 2012-10-23 2014-05-01 Wecon Automation Corp 圓形式晶粒置放方法
JP5266415B1 (ja) * 2012-11-08 2013-08-21 日本蚕毛染色株式会社 静電容量式タッチパネル用筆記具
CN104919575B (zh) * 2013-01-11 2018-09-18 应用材料公司 化学机械抛光设备及方法
US9415479B2 (en) * 2013-02-08 2016-08-16 Taiwan Semiconductor Manufacturing Co., Ltd. Conductive chemical mechanical planarization polishing pad
US9914197B2 (en) 2013-12-09 2018-03-13 Saint-Gobain Abrasives, Inc. Abrasive assembly having alignment elements
US9914199B2 (en) * 2013-12-09 2018-03-13 Saint-Gobain Abrasives, Inc. Abrasive disc
CN104894634A (zh) * 2014-03-03 2015-09-09 盛美半导体设备(上海)有限公司 新型电化学抛光装置
CN105619965A (zh) * 2014-11-28 2016-06-01 苏州力合光电薄膜科技有限公司 自润滑薄膜结构及其制造方法和应用
ES2604830B1 (es) * 2016-04-28 2017-12-18 Drylyte, S.L. Proceso para alisado y pulido de metales por transporte iónico mediante cuerpos sólidos libres, y cuerpos sólidos para llevar a cabo dicho proceso.
KR102142197B1 (ko) * 2018-12-28 2020-09-14 임교순 필름 연결형 누설 감지 커넥터
CN116003726A (zh) * 2022-11-09 2023-04-25 合肥宏光研磨科技有限公司 碳纳米管改性聚氨酯抛光衬垫材料及其制备方法

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4713149A (en) * 1985-11-26 1987-12-15 Shigeo Hoshino Method and apparatus for electroplating objects
EP0325753A2 (de) * 1988-01-25 1989-08-02 International Business Machines Corporation System zum Kontrollieren der Leitfähigkeit eines Halbleiterplättchens während des Schleifens
US20010005667A1 (en) * 1999-04-02 2001-06-28 Applied Materials, Inc. CMP platen with patterned surface
WO2001071066A1 (en) * 2000-03-17 2001-09-27 Nu Tool Inc. Device providing electrical contact to the surface of a semiconductor workpiece during metal plating
US20010036746A1 (en) * 2000-03-09 2001-11-01 Shuzo Sato Methods of producing and polishing semiconductor device and polishing apparatus
US20020020621A1 (en) * 2000-01-14 2002-02-21 Uzoh Cyprian Emeka Semiconductor workpiece proximity plating apparatus
US6368184B1 (en) * 2000-01-06 2002-04-09 Advanced Micro Devices, Inc. Apparatus for determining metal CMP endpoint using integrated polishing pad electrodes
US20020119286A1 (en) * 2000-02-17 2002-08-29 Liang-Yuh Chen Conductive polishing article for electrochemical mechanical polishing
EP1368826A2 (de) * 2001-03-14 2003-12-10 Applied Materials, Inc. Planarisierung von substraten mittels elektrochemisch-mechanischem polieren

Family Cites Families (153)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US88715A (en) * 1869-04-06 Improved material for paint
BE333311A (de) 1925-05-23
US1927162A (en) 1931-02-27 1933-09-19 Research Corp Electroplating
US2112691A (en) 1936-01-30 1938-03-29 Pyrene Mfg Co Electroplating anode unit
US2240265A (en) 1937-03-30 1941-04-29 John S Nachtman Method of continuously tin plating ferrous metal stock
US2431065A (en) 1938-12-12 1947-11-18 Meaker Company Continuous wire and strip electro-processing machine
US2392687A (en) 1943-02-15 1946-01-08 John S Nachtman Apparatus for electroplating wire
US2461556A (en) 1943-04-01 1949-02-15 Carnegie Illinois Steel Corp Method and apparatus for the electrolytic coating of metal strip
US2544510A (en) 1943-10-23 1951-03-06 Nat Steel Corp Apparatus and method for plating strips
US2503863A (en) 1943-11-18 1950-04-11 Siegfried G Bart Apparatus for electroplating the inside of pipes
US2509304A (en) 1944-02-24 1950-05-30 Nat Steel Corp Method and apparatus for electrolytic coating of strip material
US2453481A (en) 1944-03-14 1948-11-09 Nat Steel Corp Anode for electrolytic coating
US2490055A (en) 1944-03-30 1949-12-06 Nat Steel Corp Metal strip electroplating apparatus
US2495695A (en) 1944-05-08 1950-01-31 Kenmore Metals Corp Electroplating apparatus
US2536912A (en) 1944-07-12 1951-01-02 Ibm Electrolysis etching device
US2569578A (en) 1944-08-07 1951-10-02 Nat Steel Corp Apparatus for electrocoating striplike material
US2480022A (en) 1944-10-07 1949-08-23 George B Hogaboom Rotary barrel
US2473290A (en) 1944-10-21 1949-06-14 George E Millard Apparatus for plating journals of crankshafts
US2456185A (en) 1944-11-23 1948-12-14 Gen Motors Corp Electroplating apparatus
US2517907A (en) 1945-01-05 1950-08-08 Conmar Prod Corp Apparatus for electrotreating metal slide fasteners
US2500205A (en) 1945-04-12 1950-03-14 Cleveland Graphite Bronze Co Method of plating
US2454935A (en) 1945-06-27 1948-11-30 Meaker Company Continuous wire and strip electroprocessing machine
NL69965C (de) 1945-08-10
US2619454A (en) 1945-08-30 1952-11-25 Brush Dev Co Method of manufacturing a magnetic recording medium by electrodeposition
US2554943A (en) 1945-10-25 1951-05-29 Bethlehem Steel Corp Electroplating apparatus
US2506794A (en) 1945-11-23 1950-05-09 Revere Copper & Brass Inc Apparatus for electroplating
US2530677A (en) 1946-01-17 1950-11-21 Edward L Berkenkotter Apparatus for plating crankshafts
US2457510A (en) 1946-01-23 1948-12-28 Delbert G Van Ornum Electroplating apparatus
US2519945A (en) 1946-01-25 1950-08-22 Gen Electric Electroplating apparatus
US2477808A (en) 1946-05-08 1949-08-02 Carl G Jones Electrolytic apparatus for treatment of moving strip
US2576074A (en) 1946-06-11 1951-11-20 John S Nachtman Method and apparatus for continuous strip metal treatment
US2479323A (en) 1946-06-13 1949-08-16 Udylite Corp Plating machine
US2512328A (en) 1946-06-28 1950-06-20 Armco Steel Corp Continuous electroplating device
US2500206A (en) 1946-06-29 1950-03-14 Cleveland Graphite Bronze Co Apparatus for plating
US2560534A (en) 1946-07-12 1951-07-17 Nat Standard Co Method of operating a continuous electroplating system
US2539898A (en) 1946-08-16 1951-01-30 Udylite Corp Electrical contact mechanism for plating machines
US2549678A (en) 1946-08-23 1951-04-17 Conn Ltd C G Method of and apparatus for electroforming metal articles
US2556017A (en) 1947-01-29 1951-06-05 Edwin E Vonada Electrolytic method and apparatus for cleaning strip
US2535966A (en) 1947-02-07 1950-12-26 Teplitz Alfred Electrolytic apparatus for cleaning strip
US2540175A (en) 1947-02-11 1951-02-06 Rosenqvist Gunnar Manufacture by electrodeposition
US2569577A (en) 1947-05-09 1951-10-02 Nat Steel Corp Method of and apparatus for electroplating
US2458676A (en) 1947-07-22 1949-01-11 Brenner Abner Apparatus for electroplating
US2560966A (en) 1947-07-31 1951-07-17 Revere Copper & Brass Inc Method of electroplating copper clad stainless steel cooking vessels
US2571709A (en) 1947-08-26 1951-10-16 Western Electric Co Apparatus for electroplating articles
US2646398A (en) 1948-10-08 1953-07-21 Gen Motors Corp Electroprocessing apparatus
BE494578A (de) 1949-03-18
US2689215A (en) 1949-07-13 1954-09-14 Siegfried G Bart Method and apparatus for plating pipe
US2587630A (en) 1949-07-28 1952-03-04 Sulphide Ore Process Company I Method for electrodeposition of iron in the form of continuous strips
US2656283A (en) 1949-08-31 1953-10-20 Ohio Commw Eng Co Method of plating wire
US2656284A (en) 1949-09-07 1953-10-20 Ohio Commw Eng Co Method of plating rolled sheet metal
US2657457A (en) 1949-09-10 1953-11-03 Ohio Commw Eng Co Continuous metal production and continuous gas plating
US2684939A (en) 1949-12-17 1954-07-27 Time Inc Apparatus for plating chromium
US2633452A (en) 1950-05-03 1953-03-31 Jr George B Hogaboom Strainer bags for enclosing electroplating anodes
US2657177A (en) 1950-07-10 1953-10-27 United States Steel Corp Plating thickness regulator
US2674550A (en) 1950-09-05 1954-04-06 Kolene Corp Apparatus and method for processing of steel strip continuously
US2680710A (en) 1950-09-14 1954-06-08 Kenmore Metal Corp Method and apparatus for continuously electroplating heavy wire and similar strip material
US2675348A (en) 1950-09-16 1954-04-13 Greenspan Lawrence Apparatus for metal plating
US2706173A (en) 1950-10-12 1955-04-12 Harold R Wells Apparatus for electro-plating crankshaft journals
US2673836A (en) 1950-11-22 1954-03-30 United States Steel Corp Continuous electrolytic pickling and tin plating of steel strip
US2696859A (en) 1950-12-16 1954-12-14 Gildo J Somma Screw driver attachment
US2695269A (en) 1951-03-02 1954-11-23 United States Steel Corp Apparatus for electroplating wire
US2698832A (en) 1951-03-20 1955-01-04 Standard Process Corp Plating apparatus
US2711993A (en) 1951-05-01 1955-06-28 Lyon George Albert Apparatus for conveying cylindrical articles through a bath
US2710834A (en) 1951-10-27 1955-06-14 Vrilakas Marcus Apparatus for selective plating
US2708445A (en) 1952-07-11 1955-05-17 Nat Standard Co Wire processing apparatus
US3162588A (en) 1961-04-17 1964-12-22 Hammond Machinery Builders Inc Belt type electrolytic grinding machine
US3334041A (en) 1964-08-28 1967-08-01 Norton Co Coated abrasives
US3476677A (en) 1965-02-15 1969-11-04 Carbond Corp Electrolytic grinding tools
US3433730A (en) 1965-04-28 1969-03-18 Gen Electric Electrically conductive tool and method for making
US3448023A (en) 1966-01-20 1969-06-03 Hammond Machinery Builders Inc Belt type electro-chemical (or electrolytic) grinding machine
US3942959A (en) * 1967-12-22 1976-03-09 Fabriksaktiebolaget Eka Multilayered flexible abrasive containing a layer of electroconductive material
AU3308268A (en) 1968-02-05 1970-03-12 Raynors Pty. Limited Plating and anodising bath racks
US3992178A (en) * 1973-04-17 1976-11-16 Fabrika Ab Eka Flexible coated abrasive with graphite outer layer
US3873512A (en) 1973-04-30 1975-03-25 Martin Marietta Corp Machining method
US4001094A (en) 1974-09-19 1977-01-04 Jumer John F Method for incremental electro-processing of large areas
US4047902A (en) 1975-04-01 1977-09-13 Wiand Richard K Metal-plated abrasive product and method of manufacturing the product
GB1539309A (en) 1976-12-14 1979-01-31 Inoue Japax Res Electrochemical polishing
US4119515A (en) 1977-03-28 1978-10-10 National Steel Corporation Apparatus for electroplating sheet metals
US4312716A (en) 1980-11-21 1982-01-26 Western Electric Co., Inc. Supporting an array of elongate articles
JP2501781B2 (ja) * 1982-03-30 1996-05-29 日立マクセル株式会社 導電性研磨用部材
US4523411A (en) 1982-12-20 1985-06-18 Minnesota Mining And Manufacturing Company Wet surface treating device and element therefor
JPS61265279A (ja) * 1985-05-17 1986-11-25 Tohoku Metal Ind Ltd フレキシブル磁気デイスク用研摩テ−プ
US4704511A (en) 1985-10-17 1987-11-03 Inoue-Japax Research Incorporated Traveling-wire electroerosion machine with swiveling nozzle assembly
US4839993A (en) 1986-01-28 1989-06-20 Fujisu Limited Polishing machine for ferrule of optical fiber connector
EP0239736B2 (de) 1986-02-28 1995-10-25 Schering Aktiengesellschaft Langgestreckte Gestelle und zugehörige Teile zum lösbaren Befestigen von zu galvanisierenden Leiterplatten, sowie zugehörige Leiterplatten
US4772361A (en) 1987-12-04 1988-09-20 Dorsett Terry E Application of electroplate to moving metal by belt plating
JPH01193166A (ja) 1988-01-28 1989-08-03 Showa Denko Kk 半導体ウェハ鏡面研磨用パッド
US4934102A (en) 1988-10-04 1990-06-19 International Business Machines Corporation System for mechanical planarization
JP2601333B2 (ja) * 1988-10-05 1997-04-16 三井金属鉱業株式会社 複合砥石およびその製造方法
CH678156A5 (de) 1989-03-20 1991-08-15 Exnii Metallorezh Stankov
US5061294A (en) * 1989-05-15 1991-10-29 Minnesota Mining And Manufacturing Company Abrasive article with conductive, doped, conjugated, polymer coat and method of making same
US5108463B1 (en) 1989-08-21 1996-08-13 Minnesota Mining & Mfg Conductive coated abrasives
US5136817A (en) 1990-02-28 1992-08-11 Nihon Dempa Kogyo Co., Ltd. Automatic lapping apparatus for piezoelectric materials
US5257478A (en) 1990-03-22 1993-11-02 Rodel, Inc. Apparatus for interlayer planarization of semiconductor material
US5137542A (en) 1990-08-08 1992-08-11 Minnesota Mining And Manufacturing Company Abrasive printed with an electrically conductive ink
US5066370A (en) 1990-09-07 1991-11-19 International Business Machines Corporation Apparatus, electrochemical process, and electrolyte for microfinishing stainless steel print bands
US5096550A (en) 1990-10-15 1992-03-17 The United States Of America As Represented By The United States Department Of Energy Method and apparatus for spatially uniform electropolishing and electrolytic etching
US5217586A (en) 1992-01-09 1993-06-08 International Business Machines Corporation Electrochemical tool for uniform metal removal during electropolishing
JPH08502695A (ja) * 1992-02-12 1996-03-26 ミネソタ・マイニング・アンド・マニュファクチュアリング・カンパニー 電気伝導性支持体を含有する被覆研磨材物品
US5203884A (en) 1992-06-04 1993-04-20 Minnesota Mining And Manufacturing Company Abrasive article having vanadium oxide incorporated therein
US5225034A (en) 1992-06-04 1993-07-06 Micron Technology, Inc. Method of chemical mechanical polishing predominantly copper containing metal layers in semiconductor processing
US5328716A (en) * 1992-08-11 1994-07-12 Minnesota Mining And Manufacturing Company Method of making a coated abrasive article containing a conductive backing
MY114512A (en) * 1992-08-19 2002-11-30 Rodel Inc Polymeric substrate with polymeric microelements
US5562529A (en) 1992-10-08 1996-10-08 Fujitsu Limited Apparatus and method for uniformly polishing a wafer
US5534106A (en) 1994-07-26 1996-07-09 Kabushiki Kaisha Toshiba Apparatus for processing semiconductor wafers
JPH08112769A (ja) * 1994-10-14 1996-05-07 Fuji Photo Film Co Ltd 研磨テープ
US6017265A (en) * 1995-06-07 2000-01-25 Rodel, Inc. Methods for using polishing pads
US5486282A (en) 1994-11-30 1996-01-23 Ibm Corporation Electroetching process for seed layer removal in electrochemical fabrication of wafers
US5478435A (en) 1994-12-16 1995-12-26 National Semiconductor Corp. Point of use slurry dispensing system
US5893796A (en) * 1995-03-28 1999-04-13 Applied Materials, Inc. Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus
US6024630A (en) * 1995-06-09 2000-02-15 Applied Materials, Inc. Fluid-pressure regulated wafer polishing head
US5702811A (en) * 1995-10-20 1997-12-30 Ho; Kwok-Lun High performance abrasive articles containing abrasive grains and nonabrasive composite grains
US5738574A (en) * 1995-10-27 1998-04-14 Applied Materials, Inc. Continuous processing system for chemical mechanical polishing
US5882491A (en) * 1996-01-02 1999-03-16 Skf Industrial Trading & Development Company B.V. Electrode for electrochemical machining, method of electrochemical machining with said electrode, a bearing and a method of determining a profile using said electrode
NL1003233C2 (nl) * 1996-05-30 1997-12-03 Skf Ind Trading & Dev Werkwijze voor het vervaardigen van een lagerring en een lager dat een dergelijke lagerring omvat.
US5871392A (en) * 1996-06-13 1999-02-16 Micron Technology, Inc. Under-pad for chemical-mechanical planarization of semiconductor wafers
US6056851A (en) * 1996-06-24 2000-05-02 Taiwan Semiconductor Manufacturing Company Slurry supply system for chemical mechanical polishing
US6183354B1 (en) * 1996-11-08 2001-02-06 Applied Materials, Inc. Carrier head with a flexible membrane for a chemical mechanical polishing system
US6020264A (en) * 1997-01-31 2000-02-01 International Business Machines Corporation Method and apparatus for in-line oxide thickness determination in chemical-mechanical polishing
US5911619A (en) * 1997-03-26 1999-06-15 International Business Machines Corporation Apparatus for electrochemical mechanical planarization
US6537140B1 (en) * 1997-05-14 2003-03-25 Saint-Gobain Abrasives Technology Company Patterned abrasive tools
JPH1158205A (ja) * 1997-08-25 1999-03-02 Unique Technol Internatl Pte Ltd 電解研磨併用ポリシング・テクスチャー加工装置および加工方法ならびにそれに使用する電解研磨併用ポリシング・テクスチャーテープ
US6033293A (en) * 1997-10-08 2000-03-07 Lucent Technologies Inc. Apparatus for performing chemical-mechanical polishing
US6372001B1 (en) * 1997-10-09 2002-04-16 3M Innovative Properties Company Abrasive articles and their preparations
US6171467B1 (en) * 1997-11-25 2001-01-09 The John Hopkins University Electrochemical-control of abrasive polishing and machining rates
WO1999041434A2 (en) * 1998-02-12 1999-08-19 Acm Research, Inc. Plating apparatus and method
US6210257B1 (en) * 1998-05-29 2001-04-03 Micron Technology, Inc. Web-format polishing pads and methods for manufacturing and using web-format polishing pads in mechanical and chemical-mechanical planarization of microelectronic substrates
US6395152B1 (en) * 1998-07-09 2002-05-28 Acm Research, Inc. Methods and apparatus for electropolishing metal interconnections on semiconductor devices
US6190494B1 (en) * 1998-07-29 2001-02-20 Micron Technology, Inc. Method and apparatus for electrically endpointing a chemical-mechanical planarization process
US6176992B1 (en) * 1998-11-03 2001-01-23 Nutool, Inc. Method and apparatus for electro-chemical mechanical deposition
JP2000141215A (ja) * 1998-11-05 2000-05-23 Sony Corp 平坦化研磨装置及び平坦化研磨方法
US6077337A (en) * 1998-12-01 2000-06-20 Intel Corporation Chemical-mechanical polishing slurry
US6238592B1 (en) * 1999-03-10 2001-05-29 3M Innovative Properties Company Working liquids and methods for modifying structured wafers suited for semiconductor fabrication
US6238271B1 (en) * 1999-04-30 2001-05-29 Speed Fam-Ipec Corp. Methods and apparatus for improved polishing of workpieces
US6381169B1 (en) * 1999-07-01 2002-04-30 The Regents Of The University Of California High density non-volatile memory device
US6234870B1 (en) * 1999-08-24 2001-05-22 International Business Machines Corporation Serial intelligent electro-chemical-mechanical wafer processor
US6368872B1 (en) * 1999-10-22 2002-04-09 Tecan Trading Ag Apparatus and method for chemical processing
US6520843B1 (en) * 1999-10-27 2003-02-18 Strasbaugh High planarity chemical mechanical planarization
US6551179B1 (en) * 1999-11-05 2003-04-22 Strasbaugh Hard polishing pad for chemical mechanical planarization
US6379223B1 (en) * 1999-11-29 2002-04-30 Applied Materials, Inc. Method and apparatus for electrochemical-mechanical planarization
US6569004B1 (en) * 1999-12-30 2003-05-27 Lam Research Polishing pad and method of manufacture
US6368190B1 (en) * 2000-01-26 2002-04-09 Agere Systems Guardian Corp. Electrochemical mechanical planarization apparatus and method
US6537144B1 (en) * 2000-02-17 2003-03-25 Applied Materials, Inc. Method and apparatus for enhanced CMP using metals having reductive properties
US6383066B1 (en) * 2000-06-23 2002-05-07 International Business Machines Corporation Multilayered polishing pad, method for fabricating, and use thereof
US6656019B1 (en) * 2000-06-29 2003-12-02 International Business Machines Corporation Grooved polishing pads and methods of use
US7160176B2 (en) * 2000-08-30 2007-01-09 Micron Technology, Inc. Methods and apparatus for electrically and/or chemically-mechanically removing conductive material from a microelectronic substrate
US7112121B2 (en) * 2000-08-30 2006-09-26 Micron Technology, Inc. Methods and apparatus for electrical, mechanical and/or chemical removal of conductive material from a microelectronic substrate
US6561889B1 (en) * 2000-12-27 2003-05-13 Lam Research Corporation Methods for making reinforced wafer polishing pads and apparatuses implementing the same
US6517426B2 (en) * 2001-04-05 2003-02-11 Lam Research Corporation Composite polishing pad for chemical-mechanical polishing
US20030013397A1 (en) * 2001-06-27 2003-01-16 Rhoades Robert L. Polishing pad of polymer coating
KR20030015567A (ko) * 2001-08-16 2003-02-25 에스케이에버텍 주식회사 웨이브 형태의 그루브가 형성된 화학적 기계적 연마패드
US6884724B2 (en) * 2001-08-24 2005-04-26 Applied Materials, Inc. Method for dishing reduction and feature passivation in polishing processes
US6848977B1 (en) * 2003-08-29 2005-02-01 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing pad for electrochemical mechanical polishing

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4713149A (en) * 1985-11-26 1987-12-15 Shigeo Hoshino Method and apparatus for electroplating objects
EP0325753A2 (de) * 1988-01-25 1989-08-02 International Business Machines Corporation System zum Kontrollieren der Leitfähigkeit eines Halbleiterplättchens während des Schleifens
US20010005667A1 (en) * 1999-04-02 2001-06-28 Applied Materials, Inc. CMP platen with patterned surface
US6368184B1 (en) * 2000-01-06 2002-04-09 Advanced Micro Devices, Inc. Apparatus for determining metal CMP endpoint using integrated polishing pad electrodes
US20020020621A1 (en) * 2000-01-14 2002-02-21 Uzoh Cyprian Emeka Semiconductor workpiece proximity plating apparatus
US20020119286A1 (en) * 2000-02-17 2002-08-29 Liang-Yuh Chen Conductive polishing article for electrochemical mechanical polishing
US20010036746A1 (en) * 2000-03-09 2001-11-01 Shuzo Sato Methods of producing and polishing semiconductor device and polishing apparatus
WO2001071066A1 (en) * 2000-03-17 2001-09-27 Nu Tool Inc. Device providing electrical contact to the surface of a semiconductor workpiece during metal plating
EP1368826A2 (de) * 2001-03-14 2003-12-10 Applied Materials, Inc. Planarisierung von substraten mittels elektrochemisch-mechanischem polieren

Also Published As

Publication number Publication date
TW578641U (en) 2004-03-01
ATE322959T1 (de) 2006-04-15
TW592164U (en) 2004-06-11
TWI274386B (en) 2007-02-21
DE60304505D1 (de) 2006-05-24
US20030209448A1 (en) 2003-11-13
EP1361023A2 (de) 2003-11-12
JP2004134732A (ja) 2004-04-30
KR200331228Y1 (ko) 2003-10-23
DE60304505T2 (de) 2006-09-07
EP1361023B1 (de) 2006-04-12
CN100413032C (zh) 2008-08-20
CN2751972Y (zh) 2006-01-18
KR20030087569A (ko) 2003-11-14
JP3100987U (ja) 2004-06-03
SG117444A1 (en) 2005-12-29
CN1458671A (zh) 2003-11-26
KR200321046Y1 (ko) 2003-07-25
CN2737501Y (zh) 2005-11-02
US6979248B2 (en) 2005-12-27
TW200402100A (en) 2004-02-01

Similar Documents

Publication Publication Date Title
EP1361023A3 (de) Polierartikel zum elektrochemisch-mechanischen Polieren von Substraten
WO2002085570A3 (en) Conductive polishing article for electrochemical mechanical polishing
WO2005120164A3 (en) Three dimensional antennas formed using wet conductive materials and methods for production thereof
EP1102355A3 (de) Elektrisches Verbindungselement und dessen Herstellungsverfahren
WO2002089178A3 (en) Embedded metal nanocrystals
EP1066928A3 (de) Polierkissen mit Rillenmuster zur Verwendung in einer chemisch-mechanischen Poliervorrichtung
EP1046917A3 (de) Verfahren zur Herstellung eines Kraftaufnehmers für äussere Kräfte
EP1176641A3 (de) Vor- und rückseitig elektrisch leitendes Substrat und seine Herstellung
EP1843383A3 (de) Strukturen leitfähiger Objekte auf einem Substrat und Herstellungsverfahren dafür
EP1364702A3 (de) Verfahren zum herstellen einer Arrayplatte von Biomoleküle mit hydrophilen und hydrophoben Bereiche
EP1734580A3 (de) Leiterplatte mit Kernplatte, die einen Teilkern aus Keramik aufweist und Herstellungsverfahren desselben
CA2287404A1 (en) Method of planarizing the upper surface of a semiconductor wafer
AR016922A1 (es) Proceso para la produccion de un abrasivo estructurado revestido y abrasivo estructurado revestido que se obtiene
WO2002084714A3 (en) Method and apparatus for electrochemically depositing a material onto a workpiece surface
MY131030A (en) Polishing pad with oriented pore structure
WO2007040958A3 (en) Electrostatic chuck assembly with dielectric material and/or cavity having varying thickness, profile and/or shape, method of use and apparatus incorporating same
PT1459332E (pt) Processo para produção de uma camada de resistência condutora eléctrica, bem como dispositivo de aquecimento e/ou arrefecimento
EP2421341A3 (de) Elektronische Komponente und Herstellungsverfahren dafür
EP1553613A3 (de) Verfahren zur Herstellung eines Emitters aus Kohlenstoffnanoröhre
EP1245409A4 (de) Geschirrteil sowie verfahren zur behandlung seiner oberfläche, substrat mit harter deckfolie und verfahren zu seiner herstellung, und bestecke
TWI346303B (en) Sicherheitselement zur rf-identifikation
FR2782821B1 (fr) Procede de fabrication de carte a puce sans contact
WO2006058076A3 (en) Method and structure for implanting bonded substrates for electrical conductivity
WO2009120967A3 (en) Method of manufacturing a substrate for a microelectronic device, and substrate formed thereby
EP1351292A3 (de) Halbleitervorrichtung mit flexiblem Bereich und Herstellungsverfahren

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR

AX Request for extension of the european patent

Extension state: AL LT LV MK

RIN1 Information on inventor provided before grant (corrected)

Inventor name: MORAD, RATSON

Inventor name: MAVLIEV, RASHID

Inventor name: HU, YONGQI

Inventor name: SOMEKH, SASSON

Inventor name: LIU, FENG Q.

Inventor name: DUBOUST, ALAIN

Inventor name: CHEN, LIANG-YUH

Inventor name: WANG, YAN

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR

AX Request for extension of the european patent

Extension state: AL LT LV MK

RIC1 Information provided on ipc code assigned before grant

Ipc: 7B 24D 13/14 A

Ipc: 7B 24B 37/04 B

Ipc: 7H 01L 21/321 B

17P Request for examination filed

Effective date: 20040827

AKX Designation fees paid

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR

17Q First examination report despatched

Effective date: 20041202

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

RIN1 Information on inventor provided before grant (corrected)

Inventor name: SOMEKH, SASSON

Inventor name: CHEN, LIANG-YUH

Inventor name: MORAD, RATSON

Inventor name: MAVLIEV, RASHID

Inventor name: HU, YONGQI

Inventor name: WANG, YAN

Inventor name: LIU, FENG Q.

Inventor name: DUBOUST, ALAIN

GRAS Grant fee paid

Free format text: ORIGINAL CODE: EPIDOSNIGR3

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: CH

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060412

Ref country code: SK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060412

Ref country code: SI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060412

Ref country code: AT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060412

Ref country code: LI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060412

Ref country code: BE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060412

Ref country code: RO

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060412

Ref country code: CZ

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060412

Ref country code: FI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060412

Ref country code: NL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060412

REG Reference to a national code

Ref country code: GB

Ref legal event code: FG4D

REG Reference to a national code

Ref country code: CH

Ref legal event code: EP

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20060502

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20060522

Year of fee payment: 4

REF Corresponds to:

Ref document number: 60304505

Country of ref document: DE

Date of ref document: 20060524

Kind code of ref document: P

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: MC

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20060531

REG Reference to a national code

Ref country code: IE

Ref legal event code: FG4D

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060712

Ref country code: SE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060712

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: ES

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060723

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: PT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060912

NLV1 Nl: lapsed or annulled due to failure to fulfill the requirements of art. 29p and 29m of the patents act
REG Reference to a national code

Ref country code: CH

Ref legal event code: PL

ET Fr: translation filed
PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

26N No opposition filed

Effective date: 20070115

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: IT

Payment date: 20070515

Year of fee payment: 5

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20070502

REG Reference to a national code

Ref country code: FR

Ref legal event code: ST

Effective date: 20080131

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060713

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20070502

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: EE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060412

Ref country code: BG

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060712

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: HU

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20061013

Ref country code: LU

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20060502

Ref country code: TR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060412

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20070531

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: CY

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20060412

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IT

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20080502

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20100531

Year of fee payment: 8

REG Reference to a national code

Ref country code: DE

Ref legal event code: R119

Ref document number: 60304505

Country of ref document: DE

Effective date: 20111201

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20111201