EP1225559A2 - Circuit d'attaque pour un dispositif d'affichage - Google Patents

Circuit d'attaque pour un dispositif d'affichage Download PDF

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Publication number
EP1225559A2
EP1225559A2 EP02100001A EP02100001A EP1225559A2 EP 1225559 A2 EP1225559 A2 EP 1225559A2 EP 02100001 A EP02100001 A EP 02100001A EP 02100001 A EP02100001 A EP 02100001A EP 1225559 A2 EP1225559 A2 EP 1225559A2
Authority
EP
European Patent Office
Prior art keywords
lines
switching device
voltage
driver circuit
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP02100001A
Other languages
German (de)
English (en)
Other versions
EP1225559A3 (fr
Inventor
Guido c/o Philips Corp. Int. Prop. GmbH Plangger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
Philips Corporate Intellectual Property GmbH
NXP BV
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Corporate Intellectual Property GmbH, NXP BV, Koninklijke Philips Electronics NV filed Critical Philips Corporate Intellectual Property GmbH
Publication of EP1225559A2 publication Critical patent/EP1225559A2/fr
Publication of EP1225559A3 publication Critical patent/EP1225559A3/fr
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3685—Details of drivers for data electrodes
    • G09G3/3688—Details of drivers for data electrodes suitable for active matrices only
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2310/00—Command of the display device
    • G09G2310/02—Addressing, scanning or driving the display screen or processing steps related thereto
    • G09G2310/0264—Details of driving circuits
    • G09G2310/027—Details of drivers for data electrodes, the drivers handling digital grey scale data, e.g. use of D/A converters
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/2007—Display of intermediate tones
    • G09G3/2011—Display of intermediate tones by amplitude modulation
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3696—Generation of voltages supplied to electrode drivers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S345/00—Computer graphics processing and selective visual display systems
    • Y10S345/904—Display with fail/safe testing feature

Definitions

  • the invention relates to an arrangement for controlling display devices and a Display device with a driver circuit.
  • the invention further relates to a Method for testing driver circuits.
  • the display technology will always play an important role in the next few years Information and communication technology too.
  • the display device As an interface between people and In the digital world, the display device is of central importance for acceptance modern information systems.
  • portable devices such as notebooks, Phones, digital cameras, Personal Digital Assistant (PDA) are without the use of Flat displays cannot be realized.
  • PDA Personal Digital Assistant
  • the active matrix displays are of particular importance because this display device rapid image changes, e.g. the representation of a mouse pointer, are realizable.
  • this active matrix LCD technology the pixels or pixels actively controlled.
  • TFT-LCD Thin film transistors
  • Transistors made of silicon allow the are integrated directly into each pixel, storing the image signals in the pixel.
  • Control voltages over a wide voltage range it is necessary to differentiate the displays or display devices accordingly Control voltages over a wide voltage range. For this control of the Display devices or displays use driver circuits.
  • TFT displays typically consist of a glass with after externally routed connections to which driver circuits are connected.
  • This Driver circuits convert the image signals that are to be shown on a display.
  • the image information is stored in memories as digital signals.
  • This digital Signals must be converted into analog signals, so that by means of an analog Voltage a corresponding light intensity can be displayed.
  • the one for this Conversion required digital-to-analog converters must convert digital signals into voltages convert that go over a range from less than 20 mV to more than 10 V.
  • Display units are sold as modules that result from the active matrix TFT displays and assemble the driver circuit.
  • the quality of the driver ICs comes one special meaning too. Since these driver circuits have several hundred connections to the Need to drive the display device, it is very expensive to this driver circuit testing.
  • the test procedure for these driver circuits has a decisive influence on the quality of the display device and thus also on the price of the end devices. Therefore the test time should be as short as possible.
  • Elaborate precision measuring devices for the Testing also have a negative impact on the price of end products. Only with one very high quality of each driver circuit can produce high yields of Display modules and therefore low costs for the end products.
  • driver circuits mainly consist of a large number of digital-to-analog converters exist, the quality of these devices can only be guaranteed if these digital-to-analog converters be seriously tested. Due to the digital-analog conversion of the digital Image signals can be standard test methods for digital logic for this driver circuit do not apply. Because there are many different voltage values over a wide range must be generated and tested, a test for the driver circuits is very complex.
  • a driver circuit contains 64 lines on which Analog voltages are present and 400 output stages, which means at least 25,600 individual analog voltage values would have to be tested.
  • a test of every single analog voltage value takes a lot of time because Every single value must be programmed and checked directly. Each selectable Analog voltage must be checked at each output of the driver circuit. The height The number of outputs of such a driver circuit requires a simultaneous one parallel measurement of possibly 400 and more analog outputs. The measurement of many analog outputs with an accuracy of 0.2% of the total Voltage range requires very expensive test equipment. Such a functional test leads to very high test costs and is reflected in a very long test time. at Functional tests, such as the one just described, can also occur errors in the Manufacture of the wafers arise that are not detected or only for unreliable detection can.
  • Critical defects such as leakage currents between the lines that the analog Live voltages and the output lines can only be detected if the a digital-to-analog converter for the M line carries a voltage that is very different from that Output line voltage deviates. So-called functional tests are known not as meaningful as test procedures and arrangements where defect-oriented Is tested.
  • the object of the invention is therefore to provide a driver circuit which is within short time and with a very high error coverage.
  • an arrangement for controlling display devices is provided with M lines with at least one multiplexing device and are coupled to a first switching device which interrupts a voltage supply to the M lines and with at least one to the M lines coupled second switching device by means of which at least one of the M lines a definable potential can be switched.
  • a first switching device is inserted into the M lines.
  • This first switching device interrupts the voltage supply, so that a voltage already present there is no longer driven and is held until possible leakage currents or parasitic capacities result in a discharge.
  • the analog voltages on the M lines can be selected via multiplex devices.
  • the multiplexing devices are controlled by digital signals. By means of these digital signals that the contain the image information to be displayed, which acts as an ideal switch Multiplexing device influences such that a selected voltage on the M lines is switched through to an output N.
  • a second switching device is provided, by means of which the voltage selected by the multiplex device can be switched to a selectable test reference potential.
  • This selectable or definable test reference potential is preferably provided as a mass.
  • This second switching device connects the voltage switched through by the multiplexing device with a definable test reference potential.
  • the M lines are coupled to A N output stages.
  • This amplifier with adjustable gain factor is designed with high impedance on the input side, which makes it possible to drive the corresponding output with the appropriate strength.
  • the second switching device is preferably arranged in at least one output stage. This ensures that the existing multiplexing devices are used effectively.
  • the first switching device is such executed, which enables a separate interruption of the M lines Another degree of freedom introduced in the test.
  • Leakage currents can be between the driver circuit according to the invention Detect individual lines of the M lines. A wrong selection of the Multiplex devices can be detected, for example if line M1 is selected, although M2 was selected.
  • the M-lines are driven with a voltage that, for example represents digital signal 1.
  • the M lines of the power supply is disconnected and set to a tri-state.
  • the second switching device By arranging the second switching device in at least some of the output stages it is possible to connect all M lines to a test reference potential one after the other turn. After the first switching device has been opened, the M lines remain their voltage value for a period of time until internal parasitic capacities discharge entail. Accordingly, the same voltage value is at the output N for this time measurable, as on line M. By now closing all the second ones Switching devices it is possible to connect at least some of the M lines to that Switch the test reference potential and check which of the M lines on the M lines be switched to zero. If there is a leakage current between one at the test reference potential switched line and a non-driven line M, the non-driven line M also switched to the test reference potential.
  • these driver circuits are in one Test mode
  • the M lines are all interconnected and with a common one same tension. After a voltage builds up on these lines the first switching device is opened and all lines carry the same voltage.
  • the advantage of this arrangement according to the invention is that the driver circuit for one Display device can be tested almost exclusively digitally, which increases the test time significantly decreased. At the same time, you need much simpler for a digital test Test and measurement devices as for analog measurements. Leave on the basis of the digital test signal very many test states are realized, which means that very high error coverage can be achieved is. Due to the digital nature of the test method, the whole test setup is very robust against interference from electromagnetic radiation.
  • the object is also achieved by a display device with a driver circuit, in which the N outputs of the driver circuit with N terminals of the display device are connected.
  • the task is also achieved by a method for testing driver circuits solved, in which the driver circuit at least one voltage on M lines is fed and in which the M lines are coupled to a first switching device and by means of the first switching device the voltage supply to the M lines is interrupted and in which with at least one multiplex device with the M Lines is coupled, one of the M lines is selected, and in which one second switching devices to the supplied voltage on the selected line Test reference potential is switched.
  • Fig. 1 shows the M lines, which can also be understood as a voltage bus.
  • the M lines in a 6 bit D / A converter usually include 64 individual lines.
  • the M lines are coupled to the first switching device 2.
  • This first switching device 2 enables the voltage supply to the M lines to be interrupted.
  • N output stages A N are connected to these M lines, each output stage A N being connected to at least some of the M lines.
  • All M lines are connected to each output stage A N , since each connection of a display device must be supplied with every voltage in order to display image information in the corresponding display area.
  • Multiplexers 4 are present in the output stages A N. These multiplexing devices 4 are provided for the selection of one of the applied voltages which are supplied via the M lines.
  • the multiplexing devices 4 are coupled to an amplifier 5, which forwards the selected voltage to the output N.
  • a second switching device 3 is provided in at least one output stage A N. This second switching device 3 is provided to switch the potential connected through to the output stage A N to a test reference potential.
  • This second switching device 3 can also be arranged in all output stages A N. It is also conceivable for the second switching devices 3 to switch to different test reference potentials in the output stages A N.
  • the second switching devices can also be arranged outside the output stages.
  • the multiplexing devices 4 can also be arranged outside the output stages.
  • the lines M 1 to M i are supplied with one or more voltages by a voltage generator 7. These lines M 1 to M i are supplied to all output stages A 1 to A N. These lines M 1 to M i are each fed to the multiplexing devices 4 in the output stages. Depending on a digital signal E 1 to E N, these multiplexing devices 4 connect a corresponding voltage to the output stage A N.
  • the first switching device 2 is able to interrupt the lines M 1 to M i separately from one another. If necessary, it is also able to connect the lines M 1 to M i with one another and thus to enable all lines M 1 to M i to be supplied with a voltage.
  • FIG. 3 shows an active matrix TFT display, which typically consists of a display glass 10 exists, with leads 13 led out.
  • the source drivers 11 and gate drivers 12 control each of the connections 13.
  • the source drivers 11 typically have several hundred outputs, by means of which on the connections 13 on the display 10 analog voltage value is set.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal Display Device Control (AREA)
EP02100001A 2001-01-09 2002-01-08 Circuit d'attaque pour un dispositif d'affichage Withdrawn EP1225559A3 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10100569 2001-01-09
DE10100569A DE10100569A1 (de) 2001-01-09 2001-01-09 Treiberschaltung für Anzeigevorrichtung

Publications (2)

Publication Number Publication Date
EP1225559A2 true EP1225559A2 (fr) 2002-07-24
EP1225559A3 EP1225559A3 (fr) 2009-07-08

Family

ID=7669979

Family Applications (1)

Application Number Title Priority Date Filing Date
EP02100001A Withdrawn EP1225559A3 (fr) 2001-01-09 2002-01-08 Circuit d'attaque pour un dispositif d'affichage

Country Status (5)

Country Link
US (1) US6972755B2 (fr)
EP (1) EP1225559A3 (fr)
JP (1) JP4290370B2 (fr)
CN (1) CN100504974C (fr)
DE (1) DE10100569A1 (fr)

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AUPQ113799A0 (en) 1999-06-22 1999-07-15 University Of Queensland, The A method and device for measuring lymphoedema
CA2451059C (fr) * 2002-11-27 2013-05-21 Z-Tech (Canada) Inc. Elimination des artefacts au niveau de l'interface lors de mesures de la bioimpedance
CN1314202C (zh) * 2004-05-12 2007-05-02 凌阳科技股份有限公司 共享运算放大器及应用其的增益电路与模拟/数字转换电路
WO2005122888A1 (fr) 2004-06-18 2005-12-29 The University Of Queensland Detection d'oedeme
TWI285358B (en) * 2004-07-30 2007-08-11 Sunplus Technology Co Ltd TFT LCD source driver with built in test circuit and method for testing the same
CN100359556C (zh) * 2004-09-13 2008-01-02 凌阳科技股份有限公司 内建测试电路的源极驱动器及其测试方法
WO2006056074A1 (fr) 2004-11-26 2006-06-01 Z-Tech (Canada) Inc. Procede des gradients ponderes et systeme de diagnostic de maladie
JP5607300B2 (ja) 2005-07-01 2014-10-15 インぺディメッド リミテッド 対象上でインピーダンス測定を実行するための装置および方法
CA2609111C (fr) 2005-07-01 2016-10-18 Scott Chetham Procede et appareil d'execution de mesures d'impedance en fonction de ladetermination d'une disposition d'electrode au moyen d'une representation affichee
JP5161772B2 (ja) * 2005-08-02 2013-03-13 インぺディメッド リミテッド インピーダンスパラメータ値
JP4949659B2 (ja) 2005-09-02 2012-06-13 ルネサスエレクトロニクス株式会社 駆動回路のテスト方法及び表示装置の駆動回路
US9724012B2 (en) 2005-10-11 2017-08-08 Impedimed Limited Hydration status monitoring
US8761870B2 (en) 2006-05-30 2014-06-24 Impedimed Limited Impedance measurements
JP2008009170A (ja) * 2006-06-29 2008-01-17 Toshiba Matsushita Display Technology Co Ltd 液晶表示装置および液晶表示装置の駆動方法
JP5372768B2 (ja) 2006-11-30 2013-12-18 インぺディメッド リミテッド 測定装置
CA2675438A1 (fr) 2007-01-15 2008-07-24 Impedimed Limited Systeme de surveillance
EP2137589B1 (fr) 2007-03-30 2015-02-25 Impedimed Limited Dispositif de protection actif pour la réduction d'une charge de signal résistive et capacitive avec contrôle ajustable du niveau de compensation
AU2008241356B2 (en) 2007-04-20 2013-10-03 Impedimed Limited Monitoring system and probe
AU2008324750B2 (en) 2007-11-05 2014-01-16 Impedimed Limited Impedance determination
AU2008207672B2 (en) * 2008-02-15 2013-10-31 Impedimed Limited Impedance Analysis
US9615766B2 (en) 2008-11-28 2017-04-11 Impedimed Limited Impedance measurement process
CN101847378B (zh) * 2009-03-27 2012-07-04 北京京东方光电科技有限公司 源极驱动芯片
CA2777797A1 (fr) 2009-10-26 2011-05-05 Impedimed Limited Determination d'indicateur de niveau de fluide
US9585593B2 (en) 2009-11-18 2017-03-07 Chung Shing Fan Signal distribution for patient-electrode measurements
US9603213B1 (en) 2016-02-05 2017-03-21 Abl Ip Holding Llc Controlling multiple groups of LEDs
US10874006B1 (en) 2019-03-08 2020-12-22 Abl Ip Holding Llc Lighting fixture controller for controlling color temperature and intensity

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Also Published As

Publication number Publication date
CN100504974C (zh) 2009-06-24
JP4290370B2 (ja) 2009-07-01
DE10100569A1 (de) 2002-07-11
JP2002304164A (ja) 2002-10-18
EP1225559A3 (fr) 2009-07-08
US6972755B2 (en) 2005-12-06
CN1365092A (zh) 2002-08-21
US20020093992A1 (en) 2002-07-18

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