Classifications

• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
  • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
  • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
  • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
  • H01L21/67005—Apparatus not specifically provided for elsewhere
  • H01L21/67011—Apparatus for manufacture or treatment
  • H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
  • H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
  • H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
  • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
  • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
  • H01L21/67005—Apparatus not specifically provided for elsewhere
  • H01L21/67011—Apparatus for manufacture or treatment
  • H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
  • H01L21/6719—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers

Definitions

• the invention relates to a device for treating substrates, in particular semiconductor wafers, with a first treatment unit and a substrate holder which can be moved vertically above the first treatment unit, and to a method for treating substrates, in particular semiconductor wafers, in which a substrate holder carrying a substrate moves into a treatment position a first treatment unit is moved, a first substrate treatment is carried out, and the substrate holder is lifted vertically after the first substrate treatment.
• the space available for the treatment centers is in usually limited.
• the provision of two independent treatment units requires a large amount of space.
• the substrate often has to be transported in a moist state, which can lead to increased contamination problems.
• a device for treating substrates is also known.
• a substrate to be treated is placed on an underlying substrate holder, which can be moved vertically via an underneath shaft.
• the shaft extends through the bottom of a first treatment device and positions the substrate holder in a first step in the first treatment device.
• the substrate holder with the substrate is then lifted vertically out of the first treatment device and a second, two-part treatment device is moved from the side around the substrate holder, so that a second treatment device is formed above the first treatment device.
• the second treatment device must be sealed in the area of the shaft and in the area of the interface of the two parts of the treatment device, which considerably increases the movement control of these parts and the costs required for this.
• DE 196 526 A discloses an apparatus and a method for treating substrates in a fluid container, a hood for receiving the substrates being able to be positioned above the fluid container.
• the hood has a substrate guiding and holding device, which ensures safe transport of the substrates within the hood.
• a semiconductor substrate cleaning device is known from JP 6-163 505 A, in which a plurality of fixed chambers are arranged one above the other in the vertical direction and can be sequentially fitted with substrates.
• JP 10-242 106 A shows a device in which a basin that receives substrates is moved along a rail and can be connected to different treatment fluid connections in order to carry out different treatments within the same basin.
• the invention is therefore based on the object of providing a device which, in a simple and inexpensive manner, reduces the handling steps between different substrate treatments and eliminates sealing problems between divided treatment devices.
• the object is achieved in that the substrate holder is guided outside the first and second treatment units and the second treatment unit is in one piece. This simplifies the construction of the treatment units, since the guide does not extend through the treatment basin and a seal on the shaft of the substrate holder is therefore not required.
• the one-piece treatment device also eliminates the sealing problems in the area of the interface between different parts of a treatment unit.
• the device is thus in the Setup easier and cheaper.
• media carryover is prevented from occurring due to media adhering to the shaft.
• the second treatment unit can be moved in a straight line, while in another embodiment it can be pivoted.
• the second treatment unit advantageously has a rinsing device.
• Substrates, in particular semiconductor wafers often have to be rinsed during a manufacturing process comprising several steps, and in particular after certain treatment steps, so that a rinsing device is available as a second treatment unit above a first treatment unit.
• the second treatment unit has a drying device.
• the second treatment unit comprises a combined rinsing and drying device.
• part of the substrate holder can be placed on the second treatment unit.
• At least one further, third treatment unit and a second substrate holder that can be moved vertically above the third treatment unit are provided, the second treatment unit being movable between the second substrate holder and the third treatment unit in a raised position of the second substrate holder.
• the movable second treatment unit can be used alternately for the first and third treatment units, so that additional space can be saved since the second treatment unit is assigned to two other treatment units. In addition, this also results in cost savings since one treatment unit can be saved.
• the first and third treatment units are essentially the same.
• the first and third treatment units can also be different.
• the second treatment unit can advantageously be moved into a rest position located between the first and the third treatment unit, in which the second treatment unit does not carry out any treatment and also does not impair or overlap any of the first and third treatment units.
• the rest position need not necessarily be between the first and third treatment units. It is also possible to move the second treatment unit into any position in which it does not impair or overlap any of the first and third treatment units.
• the first treatment unit is a metal plating unit.
• a handling device for loading and unloading the substrate holder is advantageously provided.
• the object of the invention is achieved in a method for treating substrates, in particular semiconductor wafers, which has the following method steps: moving a substrate holder carrying a substrate into a treatment position above a first treatment unit; Performing a first substrate treatment; Lifting the substrate holder after the first substrate treatment; Moving a second treatment unit between the raised substrate holder and the first treatment unit; and performing a second substrate treatment in that the substrate holder is guided outside the first and second treatment units and the second treatment unit is in one piece.
• This method gives the same advantages that were previously explained with reference to the device.
• Preferred embodiments of the method according to the invention result from the subclaims, which in turn yield the advantages explained above with reference to the device.
• the invention is based on a preferred
• 1 shows a schematic plan view of a wafer treatment station with a plurality of treatment devices
• 2 shows a schematic side view of a treatment device in a first treatment position
• 3 shows a schematic side view of the treatment device in a second treatment position
• 4 shows a cross-sectional view through a first treatment station with a substrate holder located above it
• 5 shows a schematic cross-sectional view through a second treatment unit with a substrate holder located above it.
• FIG. 1 shows a top view of a treatment station 1 with differently configured treatment devices 3, 4 and 5.
• the representation of differently configured treatment devices in a treatment station serves only as an example to illustrate the preferred configuration options for the treatment device according to the invention. As a rule, only one configuration type of the treatment device is used in a treatment station 1.
• the treatment devices 3, 4 and 5 are arranged in two rows with a space 7 in between, in which a wafer handling robot 10 is movably arranged.
• a wafer handling robot 10 For each of the two rows of wafer treatment devices 3, 4, 5, one wafer cassette 11, 13 is provided on one end of the wafer treatment station 1, from which the wafer handling robot 10 removes wafers 15 and in the substrate holder of the treatment device 3, 4, 5 or, conversely, removes wafer 15 from the substrate holder and inserts it into the cassette 11 or 13.
• a wafer pre-alignment unit 17 is provided between the wafer cassettes 11 and 13, on which a wafer 15 removed from a cassette 11 or 13 is initially placed in order to obtain an exact pre-alignment.
• the wafer treatment apparatus 5 which shows the simplest construction of the treatment apparatus according to the invention is schematically shown in side view in the ⁇ Figures 2 and 3.
• the wafer treatment device 5 has a metal plating device 20, a substrate holder 22 which can be moved vertically by means of a lifting device 23, and a horizontally movable washing and drying device 25.
• the metal plating device 20, the substrate holder 22 and the rinsing and drying device 25 are described in more detail below with reference to FIGS. 4 and 5.
• the substrate holder 22 can be lowered into a position (see also FIG. 4) located above the metal plating device 20, in which a metal plating is carried out.
• the substrate holder 22 is raised and the rinsing and drying device 25 is inserted between the substrate holder 22 and the metal plating device.
• the substrate holder 22 is then lowered into a position in which a substrate in the substrate holder is rinsed and dried (see FIG. 5).
• the lower part 41 of the substrate holder 22 is then placed on the rinsing and drying device 25, so that the wafer can be removed with the wafer handling robot 10.
• the removed wafer is replaced by a new wafer, the substrate holder is closed and raised.
• the rinsing and drying device is moved out of the area of the substrate holder 22 and the substrate holder then lowers the new wafer again for treatment in the metal plating device 20.
• the metal plating device 20 is shown schematically in cross section in FIG. 4, a housing of the device not being shown to simplify the illustration.
• a treatment fluid containing a corresponding metal, such as copper, is introduced into a first chamber 31 of the treatment device via a connection 30.
• a perforated plate 33 is arranged above the funnel, which homogenizes the upward flow of the treatment fluid.
• An anode arrangement 34 is provided above the perforated plate 33 and at a distance from it.
• a substrate holder 22 above the metal plating device 20 which consists of an upper part 40 and an annular lower part 41 which is adapted to the shape of the substrate, between which a wafer 15 is inserted.
• the Upper part 40 and lower part 41 are held together by means of a vacuum applied between them.
• FIG. 5 schematically shows a cross-sectional view of the rinsing and drying device 25, certain parts, for example an outer basin of the device, having been omitted to simplify the illustration.
• the rinsing and drying device comprises a nozzle body 50 with a raised nozzle plate 51, in which a plurality of nozzles 52 are arranged. An opening is provided in the center of the nozzle plate 51, into which an insert 53 is inserted with a nozzle, not shown in detail, which is separate from the nozzles 52 of the nozzle plate.
• a fluid is introduced via fluid inlets 54 and 55 via a chamber 56 located below the nozzle plate 51, which emerges via the nozzles 52 and is directed onto a substrate 15 located above it.
• a flushing liquid for flushing the substrate 15 is applied to the nozzle in the insert 53 via an inlet 57.
• the fluid introduced via the inlets 54, 55 generally differs from the rinsing liquid which is introduced via the inlet 57.
• the rinsing and drying device 25 has a surface 58 which is lower than the nozzle plate 51 and surrounds the nozzle plate 51 in a ring shape and which has a plurality of webs 59, one of which can be seen in FIG. 5.
• the raised webs 59 serve as a deposit for the lower part 41 of the substrate holder 22 during loading and unloading of the substrate holder 22.
• the loading and unloading of the substrate holder 22 takes place by placing the lower part 41 of the substrate holder 22 on the webs 59, releasing the vacuum acting between the upper part 40 and the lower part 41, and lifting the upper part 40 so that the wafer 15 is now free on the Lower part 41 lies and is gripped by the wafer handling robot 10, or can be inserted through it into the opening thus created.
• Rinsing and drying device 25 refers to the patent application filed on the same day by the applicant of the present application with the application number 198 59 466 and the title “Device and method for treating substrates”, which is thus made the subject of the present application .
• the treatment device 3 shown in FIG. 1 differs from the treatment device 5 described above in that the rinsing and drying device 25 is between two metal plating devices. lines 20 is longitudinally displaceable, so that the rinsing and drying device 25 can be used for both metal plating devices. This also saves a rinsing and drying device 25, with additional space savings.
• the rinsing and drying device 25 can be placed between two metal plating devices 20.
• the rinsing and drying device 25 is arranged to be pivotable about an axis 60.
• the rinsing and drying device can each be pivoted via one of the two metal plating devices 20.
• the rinsing and drying device can also be pivoted out of the area of the metal plating devices 20, so that it does not overlap either of the two devices 20, as is shown, for example, in FIG.
• the treatment devices be of different types and serve for other processes.
• a rinsing unit instead of the metal plating device, a rinsing unit, a chemical treatment device or the like can be provided.
• the second horizontally movable treatment device is also not limited to a rinsing and drying device.
• a pure drying unit or, for example, a polishing unit could be provided instead.
• the treatment devices can also be used to treat other substrates, such as, for example, glass substrates, CD 'or DVD' s, instead of the semiconductor wafers described.

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• Engineering & Computer Science (AREA)
• Physics & Mathematics (AREA)
• Condensed Matter Physics & Semiconductors (AREA)
• General Physics & Mathematics (AREA)
• Manufacturing & Machinery (AREA)
• Computer Hardware Design (AREA)
• Microelectronics & Electronic Packaging (AREA)
• Power Engineering (AREA)
• Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
• Cleaning Or Drying Semiconductors (AREA)
• Electroplating Methods And Accessories (AREA)

Applications Claiming Priority (3)

Publications (1)

Family

ID=7892265

Family Applications (1)

Country Status (6)

Families Citing this family (1)

Family Cites Families (11)

• 1998
  • 1998-12-22 DE DE19859469A patent/DE19859469C2/de not_active Expired - Fee Related
• 1999
  • 1999-11-18 US US09/869,214 patent/US6488987B1/en not_active Expired - Fee Related
  • 1999-11-18 JP JP2000590198A patent/JP2002533919A/ja active Pending
  • 1999-11-18 EP EP99956014A patent/EP1145289A1/de not_active Withdrawn
  • 1999-11-18 WO PCT/EP1999/008861 patent/WO2000038219A1/de not_active Application Discontinuation
  • 1999-11-18 KR KR1020017007998A patent/KR20010089682A/ko not_active Application Discontinuation

Non-Patent Citations (1)

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