DE9314259U1 - Sondenadapter für elektonische Bauelemente - Google Patents
Sondenadapter für elektonische BauelementeInfo
- Publication number
- DE9314259U1 DE9314259U1 DE9314259U DE9314259U DE9314259U1 DE 9314259 U1 DE9314259 U1 DE 9314259U1 DE 9314259 U DE9314259 U DE 9314259U DE 9314259 U DE9314259 U DE 9314259U DE 9314259 U1 DE9314259 U1 DE 9314259U1
- Authority
- DE
- Germany
- Prior art keywords
- electronic components
- probe adapter
- adapter
- probe
- electronic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US95461892A | 1992-09-29 | 1992-09-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE9314259U1 true DE9314259U1 (de) | 1994-02-10 |
Family
ID=25495695
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE9314259U Expired - Lifetime DE9314259U1 (de) | 1992-09-29 | 1993-09-21 | Sondenadapter für elektonische Bauelemente |
Country Status (4)
Country | Link |
---|---|
US (2) | US5548223A (de) |
JP (2) | JPH06194385A (de) |
DE (1) | DE9314259U1 (de) |
FR (1) | FR2696283B3 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19603802A1 (de) * | 1995-02-03 | 1996-08-14 | Hewlett Packard Co | Spannungssonde mit Vielfachanschlußleitungen |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5859538A (en) * | 1996-01-31 | 1999-01-12 | Hewlett-Packard Company | Method and apparatus for connecting a ball grid array device to a test instrument to facilitate the monitoring of individual signals or the interruption of individual signals or both |
US5692911A (en) * | 1996-03-27 | 1997-12-02 | Electronic Products, Inc. | Flexible electrical test fixure for integrated circuits on prototype and production printed circuit boards |
US5896037A (en) * | 1996-10-10 | 1999-04-20 | Methode Electronics, Inc. | Interface test adapter for actively testing an integrated circuit chip package |
US6191594B1 (en) * | 1996-10-28 | 2001-02-20 | Tektronix, Inc. | Adapter for a measurement test probe |
JP3100930B2 (ja) * | 1997-09-10 | 2000-10-23 | 株式会社双晶テック | コンタクトプローブ |
US6326797B2 (en) * | 1998-03-04 | 2001-12-04 | International Business Machines Corporation | Apparatus and method for evaluating printed circuit board assembly manufacturing processes |
JP3790041B2 (ja) * | 1998-04-28 | 2006-06-28 | 富士通株式会社 | プローブおよび検査装置 |
US6184576B1 (en) * | 1998-09-21 | 2001-02-06 | Advantest Corp. | Packaging and interconnection of contact structure |
US6106316A (en) * | 1999-02-10 | 2000-08-22 | International Business Machines Corporation | Multistage connector for carriers with combined pin-array and pad-array |
US6222378B1 (en) | 1999-05-28 | 2001-04-24 | Tektronix, Inc. | Probe adapter for a ball-grid-array package |
US6344736B1 (en) * | 1999-07-22 | 2002-02-05 | Tensolite Company | Self-aligning interface apparatus for use in testing electrical |
US6351392B1 (en) | 1999-10-05 | 2002-02-26 | Ironwood Electronics, Inc, | Offset array adapter |
US6428327B1 (en) * | 1999-10-14 | 2002-08-06 | Unisys Corporation | Flexible adapter for use between LGA device and printed circuit board |
US6394820B1 (en) | 1999-10-14 | 2002-05-28 | Ironwood Electronics, Inc. | Packaged device adapter assembly and mounting apparatus |
US6533589B1 (en) | 1999-10-14 | 2003-03-18 | Ironwood Electronics, Inc. | Packaged device adapter assembly |
US20090100295A1 (en) * | 2000-01-06 | 2009-04-16 | Super Talent Electronics, Inc. | Reliable memory module testing and manufacturing method |
US6540527B1 (en) | 2000-04-28 | 2003-04-01 | Unisys Corporation | Method and adapter for reworking a circuit containing an LGA device |
US6603323B1 (en) * | 2000-07-10 | 2003-08-05 | Formfactor, Inc. | Closed-grid bus architecture for wafer interconnect structure |
US6812048B1 (en) * | 2000-07-31 | 2004-11-02 | Eaglestone Partners I, Llc | Method for manufacturing a wafer-interposer assembly |
JP4734706B2 (ja) * | 2000-11-01 | 2011-07-27 | Jsr株式会社 | 電気抵抗測定用コネクター並びに回路基板の電気抵抗測定装置および測定方法 |
US6686657B1 (en) * | 2000-11-07 | 2004-02-03 | Eaglestone Partners I, Llc | Interposer for improved handling of semiconductor wafers and method of use of same |
US6819126B2 (en) * | 2000-12-29 | 2004-11-16 | Storage Technology Corporation | Signal sampling using flex circuits on direct inter-connects |
US6717425B2 (en) * | 2001-10-17 | 2004-04-06 | Hewlett-Packard Development Company, L.P. | High-density PCB test jack |
US6655965B2 (en) * | 2001-11-28 | 2003-12-02 | Fci Americas Technology, Inc. | Interconnect device for electrically coupling a test system to a circuit board adapted for use with a ball-grid array connector |
US7173439B1 (en) | 2003-02-14 | 2007-02-06 | Lecroy Corporation | Guide for tip to transmission path contact |
US7317312B1 (en) | 2003-02-14 | 2008-01-08 | Lecroy Corporation | Guide for tip to transmission path contact |
US6877993B2 (en) * | 2003-05-30 | 2005-04-12 | Ironwood Electronics, Inc. | Packaged device adapter assembly with alignment structure and methods regarding same |
US7642791B2 (en) * | 2003-11-07 | 2010-01-05 | Intel Corporation | Electronic component/interface interposer |
US7518238B2 (en) * | 2005-12-02 | 2009-04-14 | Intel Corporation | Mounting flexible circuits onto integrated circuit substrates |
US7294995B1 (en) * | 2006-05-08 | 2007-11-13 | Tektronix, Inc. | Current probing system |
US7503767B2 (en) * | 2006-08-01 | 2009-03-17 | General Dynamics Advanced Information Systems, Inc. | Method and apparatus for compliantly connecting stack of high-density electronic modules in harsh environments |
IT1397222B1 (it) * | 2009-12-30 | 2013-01-04 | St Microelectronics Srl | Metodo per controllare il corretto posizionamento di sonde di test su terminazioni di dispositivi elettronici integrati su semiconduttore e relativo dispositivo elettronico. |
TWI442534B (zh) * | 2010-04-12 | 2014-06-21 | Hon Hai Prec Ind Co Ltd | 晶片轉接板 |
US9263817B2 (en) | 2013-06-12 | 2016-02-16 | Ironwood Electronics, Inc. | Adapter apparatus with suspended conductive elastomer interconnect |
US9048565B2 (en) | 2013-06-12 | 2015-06-02 | Ironwood Electronics, Inc. | Adapter apparatus with deflectable element socket contacts |
US9986165B2 (en) * | 2014-12-31 | 2018-05-29 | Invent.ly LLC | Remote analyte testing system |
US9877404B1 (en) | 2017-01-27 | 2018-01-23 | Ironwood Electronics, Inc. | Adapter apparatus with socket contacts held in openings by holding structures |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2907953A1 (de) * | 1978-03-06 | 1979-10-04 | Tektronix Inc | Flache anschlusschelle |
EP0078339A1 (de) * | 1981-10-30 | 1983-05-11 | Ibm Deutschland Gmbh | Tastkopfanordnung für Leiterzugüberprüfung mit mindestens einem, eine Vielzahl von federnden Kontakten aufweisenden Tastkopf |
US4554505A (en) * | 1983-06-10 | 1985-11-19 | Rockwell International Corporation | Test socket for a leadless chip carrier |
DD263359A1 (de) * | 1987-07-31 | 1988-12-28 | Tech Uni | Pruefadapter |
US5084672A (en) * | 1989-02-21 | 1992-01-28 | Giga Probe, Inc. | Multi-point probe assembly for testing electronic device |
US5166609A (en) * | 1990-05-24 | 1992-11-24 | Tektronix, Inc. | Adapter and test fixture for an integrated circuit device package |
US5202622A (en) * | 1990-05-24 | 1993-04-13 | Tektronix, Inc. | Adapter and test fixture for an integrated circuit device package |
US5221895A (en) * | 1991-12-23 | 1993-06-22 | Tektronix, Inc. | Probe with microstrip transmission lines |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2023947A (en) * | 1933-12-28 | 1935-12-10 | Weston Electrical Instr Corp | Radioanalyzer |
US2578288A (en) * | 1950-03-03 | 1951-12-11 | James W Cook | Test adapter |
US3405361A (en) * | 1964-01-08 | 1968-10-08 | Signetics Corp | Fluid actuable multi-point microprobe for semiconductors |
US3596228A (en) * | 1969-05-29 | 1971-07-27 | Ibm | Fluid actuated contactor |
US4065717A (en) * | 1970-09-15 | 1977-12-27 | Signetics Corporation | Multi-point microprobe for testing integrated circuits |
JPS5830256A (ja) * | 1981-08-17 | 1983-02-22 | Nec Corp | 通信制御装置 |
JPS59155769A (ja) * | 1983-02-25 | 1984-09-04 | Seiko Epson Corp | 電子デイバイスの検査装置 |
US4636722A (en) * | 1984-05-21 | 1987-01-13 | Probe-Rite, Inc. | High density probe-head with isolated and shielded transmission lines |
US4922192A (en) * | 1988-09-06 | 1990-05-01 | Unisys Corporation | Elastic membrane probe |
US4963821A (en) * | 1989-04-14 | 1990-10-16 | Tektronix, Inc. | Probe and method for testing a populated circuit board |
US5087877A (en) * | 1991-02-25 | 1992-02-11 | Motorola Inc. | Test contact fixture using flexible circuit tape |
US5203075A (en) * | 1991-08-12 | 1993-04-20 | Inernational Business Machines | Method of bonding flexible circuit to cicuitized substrate to provide electrical connection therebetween using different solders |
JPH05313936A (ja) * | 1992-05-08 | 1993-11-26 | Nec Corp | インサーキットエミュレータ |
-
1993
- 1993-09-21 DE DE9314259U patent/DE9314259U1/de not_active Expired - Lifetime
- 1993-09-28 JP JP5264387A patent/JPH06194385A/ja active Pending
- 1993-09-29 FR FR939311561A patent/FR2696283B3/fr not_active Expired - Lifetime
-
1995
- 1995-02-16 US US08/390,459 patent/US5548223A/en not_active Expired - Lifetime
-
1997
- 1997-10-14 US US08/949,853 patent/US5903162A/en not_active Expired - Fee Related
- 1997-12-02 JP JP9332042A patent/JPH10185947A/ja active Pending
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2907953A1 (de) * | 1978-03-06 | 1979-10-04 | Tektronix Inc | Flache anschlusschelle |
EP0078339A1 (de) * | 1981-10-30 | 1983-05-11 | Ibm Deutschland Gmbh | Tastkopfanordnung für Leiterzugüberprüfung mit mindestens einem, eine Vielzahl von federnden Kontakten aufweisenden Tastkopf |
EP0078339B1 (de) * | 1981-10-30 | 1986-07-30 | Ibm Deutschland Gmbh | Tastkopfanordnung für Leiterzugüberprüfung mit mindestens einem, eine Vielzahl von federnden Kontakten aufweisenden Tastkopf |
US4554505A (en) * | 1983-06-10 | 1985-11-19 | Rockwell International Corporation | Test socket for a leadless chip carrier |
DD263359A1 (de) * | 1987-07-31 | 1988-12-28 | Tech Uni | Pruefadapter |
US5084672A (en) * | 1989-02-21 | 1992-01-28 | Giga Probe, Inc. | Multi-point probe assembly for testing electronic device |
US5166609A (en) * | 1990-05-24 | 1992-11-24 | Tektronix, Inc. | Adapter and test fixture for an integrated circuit device package |
US5202622A (en) * | 1990-05-24 | 1993-04-13 | Tektronix, Inc. | Adapter and test fixture for an integrated circuit device package |
US5221895A (en) * | 1991-12-23 | 1993-06-22 | Tektronix, Inc. | Probe with microstrip transmission lines |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19603802A1 (de) * | 1995-02-03 | 1996-08-14 | Hewlett Packard Co | Spannungssonde mit Vielfachanschlußleitungen |
Also Published As
Publication number | Publication date |
---|---|
FR2696283A3 (fr) | 1994-04-01 |
JPH06194385A (ja) | 1994-07-15 |
US5903162A (en) | 1999-05-11 |
US5548223A (en) | 1996-08-20 |
FR2696283B3 (fr) | 1994-09-09 |
JPH10185947A (ja) | 1998-07-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE9314259U1 (de) | Sondenadapter für elektonische Bauelemente | |
DE59504639D1 (de) | Verkapselung für elektronische bauelemente | |
DE69427945T2 (de) | Inspektionseinrichtung für Steckverbinder | |
DE69432968D1 (de) | Gehäuse für elektronische Bauelemente | |
DE69032671D1 (de) | Lötanordnung für Komponenten | |
DE69326318D1 (de) | Verpackung für elektronische komponenten | |
DE69531481D1 (de) | Gedichte Gehäusestruktur für elektronisches Gerät | |
DE69229389T2 (de) | Testsystem für Schaltkreise | |
DE69209169T2 (de) | Verbindungstechnik für integrierte Schaltung | |
DE69409056D1 (de) | Kombinationsvorrichtung für Bohrlochmessung | |
DE69306858D1 (de) | Messapparat für Konturen | |
DE59700682D1 (de) | Abschirmgehäuse für elektronische Bauelemente | |
DE69206848T2 (de) | Verbindungsanordnung für Prüfeinrichtung | |
DE69319168T2 (de) | Elektronischer Messapparat | |
DE69319273D1 (de) | Testverfahren für integrierte Halbleiter-Schaltung | |
DE69422968D1 (de) | Montageanordnung für elektronisches Bauteil | |
SE9100906L (sv) | Elektrodsystem foer spaenningsmaetning | |
DE29609183U1 (de) | Halterung für elektronische Bauelemente | |
DE59307235D1 (de) | Tastkopf zur Überprüfung elektrischer Schaltungen | |
DE69429367T2 (de) | Elektronisches gerät für reflexotherapie | |
DE29500678U1 (de) | Prüfvorrichtung für Verkabelungsstecker | |
DE9309909U1 (de) | Zeitmeßeinrichtung für Rechner | |
KR940004345U (ko) | 탐침 평편성 검사장치 | |
DE9218196U1 (de) | Gehäuse für ein elektronisches Gerät | |
DE8916224U1 (de) | Anschlußvorrichtung für ein elektronisches Bauelement |