DE69902221D1 - Speicherschaltungen mit eingebautem Selbsttest - Google Patents
Speicherschaltungen mit eingebautem SelbsttestInfo
- Publication number
- DE69902221D1 DE69902221D1 DE69902221T DE69902221T DE69902221D1 DE 69902221 D1 DE69902221 D1 DE 69902221D1 DE 69902221 T DE69902221 T DE 69902221T DE 69902221 T DE69902221 T DE 69902221T DE 69902221 D1 DE69902221 D1 DE 69902221D1
- Authority
- DE
- Germany
- Prior art keywords
- test
- built
- self
- circuit
- bist
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/14—Implementation of control logic, e.g. test mode decoders
- G11C29/16—Implementation of control logic, e.g. test mode decoders using microprogrammed units, e.g. state machines
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP99103478A EP1031994B1 (de) | 1999-02-23 | 1999-02-23 | Speicherschaltungen mit eingebautem Selbsttest |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69902221D1 true DE69902221D1 (de) | 2002-08-29 |
DE69902221T2 DE69902221T2 (de) | 2003-03-06 |
Family
ID=8237618
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69902221T Expired - Lifetime DE69902221T2 (de) | 1999-02-23 | 1999-02-23 | Speicherschaltungen mit eingebautem Selbsttest |
Country Status (3)
Country | Link |
---|---|
US (1) | US6351837B1 (de) |
EP (1) | EP1031994B1 (de) |
DE (1) | DE69902221T2 (de) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7770016B2 (en) * | 1999-07-29 | 2010-08-03 | Intertrust Technologies Corporation | Systems and methods for watermarking software and other media |
US6829728B2 (en) | 2000-11-13 | 2004-12-07 | Wu-Tung Cheng | Full-speed BIST controller for testing embedded synchronous memories |
US6650592B2 (en) * | 2001-11-29 | 2003-11-18 | International Business Machines Corporation | Data processing system, method, and product for automatically performing timing checks on a memory cell using a static timing tool |
US6879530B2 (en) * | 2002-07-18 | 2005-04-12 | Micron Technology, Inc. | Apparatus for dynamically repairing a semiconductor memory |
US7017094B2 (en) | 2002-11-26 | 2006-03-21 | International Business Machines Corporation | Performance built-in self test system for a device and a method of use |
US7734966B1 (en) | 2002-12-26 | 2010-06-08 | Marvell International Ltd. | Method and system for memory testing and test data reporting during memory testing |
JP2006252267A (ja) * | 2005-03-11 | 2006-09-21 | Oki Electric Ind Co Ltd | システム検証用回路 |
US20070050668A1 (en) * | 2005-09-01 | 2007-03-01 | Micron Technology, Inc. | Test mode to force generation of all possible correction codes in an ECC memory |
US20110238400A1 (en) * | 2007-08-07 | 2011-09-29 | Nxp B.V. | Device for a method of modelling a physical structure |
US8726114B1 (en) * | 2012-11-09 | 2014-05-13 | Oracle International Corporation | Testing of SRAMS |
WO2016118216A2 (en) | 2014-11-06 | 2016-07-28 | Intertrust Technologies Corporation | Secure application distribution systems and methods |
KR20210101799A (ko) * | 2020-02-11 | 2021-08-19 | 삼성전자주식회사 | 메모리 테스트 장치 및 테스트 방법 |
CN115389911B (zh) * | 2022-08-25 | 2023-04-14 | 北京物芯科技有限责任公司 | 芯片调度器故障判断方法、装置、电子设备及存储介质 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3831148A (en) * | 1973-01-02 | 1974-08-20 | Honeywell Inf Systems | Nonexecute test apparatus |
IT1047437B (it) | 1975-10-08 | 1980-09-10 | Cselt Centro Studi Lab Telecom | Procedimento e dispositivo per il controllo in linea di memorie logiche sequenziali operanti a divisione di tempo |
US5329471A (en) * | 1987-06-02 | 1994-07-12 | Texas Instruments Incorporated | Emulation devices, systems and methods utilizing state machines |
US5557619A (en) * | 1994-04-04 | 1996-09-17 | International Business Machines Corporation | Integrated circuits with a processor-based array built-in self test circuit |
KR100191143B1 (ko) | 1994-08-19 | 1999-06-15 | 오우라 히로시 | 고속패턴 발생기 |
US5742840A (en) * | 1995-08-16 | 1998-04-21 | Microunity Systems Engineering, Inc. | General purpose, multiple precision parallel operation, programmable media processor |
JPH1069799A (ja) * | 1996-04-30 | 1998-03-10 | Texas Instr Inc <Ti> | 集積回路メモリ・デバイス用組込み自己テスト装置 |
US6061817A (en) * | 1996-06-10 | 2000-05-09 | Cypress Semiconductor Corp. | Method and apparatus for generating test pattern for sequence detection |
US5748640A (en) * | 1996-09-12 | 1998-05-05 | Advanced Micro Devices | Technique for incorporating a built-in self-test (BIST) of a DRAM block with existing functional test vectors for a microprocessor |
US5883905A (en) | 1997-02-18 | 1999-03-16 | Schlumberger Technologies, Inc. | Pattern generator with extended register programming |
US5961653A (en) * | 1997-02-19 | 1999-10-05 | International Business Machines Corporation | Processor based BIST for an embedded memory |
US6122760A (en) * | 1998-08-25 | 2000-09-19 | International Business Machines Corporation | Burn in technique for chips containing different types of IC circuitry |
US6128749A (en) * | 1998-11-03 | 2000-10-03 | Intel Corporation | Cross-clock domain data transfer method and apparatus |
-
1999
- 1999-02-23 DE DE69902221T patent/DE69902221T2/de not_active Expired - Lifetime
- 1999-02-23 EP EP99103478A patent/EP1031994B1/de not_active Expired - Lifetime
- 1999-04-12 US US09/290,384 patent/US6351837B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1031994B1 (de) | 2002-07-24 |
DE69902221T2 (de) | 2003-03-06 |
EP1031994A1 (de) | 2000-08-30 |
US6351837B1 (en) | 2002-02-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |