DE69901534D1 - Speicherschaltung mit eingebautem Selbsttest - Google Patents

Speicherschaltung mit eingebautem Selbsttest

Info

Publication number
DE69901534D1
DE69901534D1 DE69901534T DE69901534T DE69901534D1 DE 69901534 D1 DE69901534 D1 DE 69901534D1 DE 69901534 T DE69901534 T DE 69901534T DE 69901534 T DE69901534 T DE 69901534T DE 69901534 D1 DE69901534 D1 DE 69901534D1
Authority
DE
Germany
Prior art keywords
test
circuit
built
self
bist
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69901534T
Other languages
English (en)
Other versions
DE69901534T2 (de
Inventor
Shi-Yu Huang
Ding-Ming Kwai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Taiwan Semiconductor Manufacturing Co TSMC Ltd
Original Assignee
Taiwan Semiconductor Manufacturing Co TSMC Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Semiconductor Manufacturing Co TSMC Ltd filed Critical Taiwan Semiconductor Manufacturing Co TSMC Ltd
Application granted granted Critical
Publication of DE69901534D1 publication Critical patent/DE69901534D1/de
Publication of DE69901534T2 publication Critical patent/DE69901534T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
DE69901534T 1999-02-23 1999-02-23 Integrierte Selbsttestschaltung für eine Speichereinrichtung Expired - Lifetime DE69901534T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP19990103479 EP1031995B1 (de) 1999-02-23 1999-02-23 Speicherschaltung mit eingebautem Selbsttest

Publications (2)

Publication Number Publication Date
DE69901534D1 true DE69901534D1 (de) 2002-06-27
DE69901534T2 DE69901534T2 (de) 2003-01-09

Family

ID=8237619

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69901534T Expired - Lifetime DE69901534T2 (de) 1999-02-23 1999-02-23 Integrierte Selbsttestschaltung für eine Speichereinrichtung

Country Status (2)

Country Link
EP (1) EP1031995B1 (de)
DE (1) DE69901534T2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100356481C (zh) * 2004-01-30 2007-12-19 北京中星微电子有限公司 一种嵌入式存储器的测试装置
TWI459008B (zh) * 2012-05-30 2014-11-01 Ind Tech Res Inst 三維記憶體與其內建自我測試電路
US9859019B1 (en) 2017-01-24 2018-01-02 International Business Machines Corporation Programmable counter to control memory built in self-test

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1047437B (it) * 1975-10-08 1980-09-10 Cselt Centro Studi Lab Telecom Procedimento e dispositivo per il controllo in linea di memorie logiche sequenziali operanti a divisione di tempo
KR100191143B1 (ko) * 1994-08-19 1999-06-15 오우라 히로시 고속패턴 발생기
US5883905A (en) * 1997-02-18 1999-03-16 Schlumberger Technologies, Inc. Pattern generator with extended register programming

Also Published As

Publication number Publication date
DE69901534T2 (de) 2003-01-09
EP1031995B1 (de) 2002-05-22
EP1031995A1 (de) 2000-08-30

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Legal Events

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8364 No opposition during term of opposition