DE69727112D1 - Elektronenstrahl-Belichtungsgerät und Belichtungsverfahren - Google Patents
Elektronenstrahl-Belichtungsgerät und BelichtungsverfahrenInfo
- Publication number
- DE69727112D1 DE69727112D1 DE69727112T DE69727112T DE69727112D1 DE 69727112 D1 DE69727112 D1 DE 69727112D1 DE 69727112 T DE69727112 T DE 69727112T DE 69727112 T DE69727112 T DE 69727112T DE 69727112 D1 DE69727112 D1 DE 69727112D1
- Authority
- DE
- Germany
- Prior art keywords
- electron beam
- exposure
- exposure device
- exposure method
- beam exposure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/04—Means for controlling the discharge
- H01J2237/045—Diaphragms
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/317—Processing objects on a microscale
- H01J2237/3175—Lithography
- H01J2237/31761—Patterning strategy
- H01J2237/31767—Step and repeat
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Analytical Chemistry (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electron Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28381496 | 1996-10-25 | ||
JP28381496A JP3728031B2 (ja) | 1996-10-25 | 1996-10-25 | 電子ビーム露光装置及び電子ビーム露光用マスク |
JP32677096A JP3689512B2 (ja) | 1996-12-06 | 1996-12-06 | 電子ビーム露光装置及び該装置を用いたデバイス製造方法 |
JP32677096 | 1996-12-06 | ||
JP1877397 | 1997-01-31 | ||
JP9018773A JPH10214777A (ja) | 1997-01-31 | 1997-01-31 | 電子ビーム照明装置及び該装置を備えた電子ビーム露光装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69727112D1 true DE69727112D1 (de) | 2004-02-12 |
DE69727112T2 DE69727112T2 (de) | 2004-07-08 |
Family
ID=27282355
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69727112T Expired - Lifetime DE69727112T2 (de) | 1996-10-25 | 1997-10-23 | Elektronenstrahl-Belichtungsgerät und Belichtungsverfahren |
Country Status (4)
Country | Link |
---|---|
US (1) | US6225637B1 (de) |
EP (1) | EP0838837B1 (de) |
KR (1) | KR100278045B1 (de) |
DE (1) | DE69727112T2 (de) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6013401A (en) * | 1997-03-31 | 2000-01-11 | Svg Lithography Systems, Inc. | Method of controlling illumination field to reduce line width variation |
JP2000003847A (ja) * | 1998-06-15 | 2000-01-07 | Canon Inc | 荷電粒子線縮小転写装置及びデバイス製造方法 |
US6429440B1 (en) * | 1998-06-16 | 2002-08-06 | Asml Netherlands B.V. | Lithography apparatus having a dynamically variable illumination beam |
EP0965888B1 (de) * | 1998-06-16 | 2008-06-11 | ASML Netherlands B.V. | Lithographischer Apparat |
JP2001068398A (ja) * | 1999-08-27 | 2001-03-16 | Hitachi Ltd | 半導体集積回路装置の製造方法およびマスクの製造方法 |
JP2001085303A (ja) * | 1999-09-10 | 2001-03-30 | Toshiba Corp | 荷電ビーム露光装置及び荷電ビーム露光方法 |
KR100761391B1 (ko) * | 2001-06-30 | 2007-10-04 | 주식회사 하이닉스반도체 | 노광 장치의 플레어 노이즈 제거방법 |
US6903355B2 (en) * | 2002-06-26 | 2005-06-07 | Advantest Corporation | Electron beam exposure apparatus, electron beam method, semiconductor device manufacturing method, mask, and mask manufacturing method |
JP4180854B2 (ja) * | 2002-07-16 | 2008-11-12 | キヤノン株式会社 | 電子ビーム描画装置 |
KR100969056B1 (ko) * | 2002-11-21 | 2010-07-09 | 칼 짜이스 에스엠티 아게 | 마이크로 리도그라피를 위한 투사 렌즈 |
JP4564929B2 (ja) * | 2006-02-21 | 2010-10-20 | キヤノン株式会社 | 3次元フォトニック結晶の形成方法 |
JP2011199279A (ja) * | 2010-03-18 | 2011-10-06 | Ims Nanofabrication Ag | ターゲット上へのマルチビーム露光のための方法 |
JP5554620B2 (ja) * | 2010-04-14 | 2014-07-23 | 株式会社ニューフレアテクノロジー | 描画装置、描画方法および描画装置の異常診断方法 |
EP2757571B1 (de) * | 2013-01-17 | 2017-09-20 | IMS Nanofabrication AG | Hochspannungsisolationsvorrichtung für eine optische Vorrichtung mit geladenen Partikeln |
JP2015023286A (ja) | 2013-07-17 | 2015-02-02 | アイエムエス ナノファブリケーション アーゲー | 複数のブランキングアレイを有するパターン画定装置 |
EP2830083B1 (de) | 2013-07-25 | 2016-05-04 | IMS Nanofabrication AG | Verfahren zur Ladungsteilchen-Mehrstrahlbelichtung |
EP2913838B1 (de) | 2014-02-28 | 2018-09-19 | IMS Nanofabrication GmbH | Kompensation defekter Beamlets in einem Ladungsträger-Mehrstrahlbelichtungswerkzeug |
EP2937889B1 (de) | 2014-04-25 | 2017-02-15 | IMS Nanofabrication AG | Mehrstrahliges werkzeug zum schneiden von mustern |
EP2950325B1 (de) | 2014-05-30 | 2018-11-28 | IMS Nanofabrication GmbH | Kompensation von dosisinhomogenität mittels überlappender belichtungsorte |
JP6892214B2 (ja) | 2014-07-10 | 2021-06-23 | アイエムエス ナノファブリケーション ゲーエムベーハー | 畳み込みカーネルを使用する粒子ビーム描画機のカスタマイズ化 |
US9568907B2 (en) | 2014-09-05 | 2017-02-14 | Ims Nanofabrication Ag | Correction of short-range dislocations in a multi-beam writer |
US9653263B2 (en) | 2015-03-17 | 2017-05-16 | Ims Nanofabrication Ag | Multi-beam writing of pattern areas of relaxed critical dimension |
EP3096342B1 (de) | 2015-03-18 | 2017-09-20 | IMS Nanofabrication AG | Bidirektionales mehrstrahliges schreiben mit doppeldurchgang |
US10410831B2 (en) | 2015-05-12 | 2019-09-10 | Ims Nanofabrication Gmbh | Multi-beam writing using inclined exposure stripes |
US10295911B2 (en) * | 2016-05-19 | 2019-05-21 | Nikon Corporation | Extreme ultraviolet lithography system that utilizes pattern stitching |
US10325756B2 (en) | 2016-06-13 | 2019-06-18 | Ims Nanofabrication Gmbh | Method for compensating pattern placement errors caused by variation of pattern exposure density in a multi-beam writer |
US10325757B2 (en) | 2017-01-27 | 2019-06-18 | Ims Nanofabrication Gmbh | Advanced dose-level quantization of multibeam-writers |
US10522329B2 (en) | 2017-08-25 | 2019-12-31 | Ims Nanofabrication Gmbh | Dose-related feature reshaping in an exposure pattern to be exposed in a multi beam writing apparatus |
US11569064B2 (en) | 2017-09-18 | 2023-01-31 | Ims Nanofabrication Gmbh | Method for irradiating a target using restricted placement grids |
US10651010B2 (en) | 2018-01-09 | 2020-05-12 | Ims Nanofabrication Gmbh | Non-linear dose- and blur-dependent edge placement correction |
US10840054B2 (en) | 2018-01-30 | 2020-11-17 | Ims Nanofabrication Gmbh | Charged-particle source and method for cleaning a charged-particle source using back-sputtering |
US11099482B2 (en) | 2019-05-03 | 2021-08-24 | Ims Nanofabrication Gmbh | Adapting the duration of exposure slots in multi-beam writers |
KR20210132599A (ko) | 2020-04-24 | 2021-11-04 | 아이엠에스 나노패브릭케이션 게엠베하 | 대전 입자 소스 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4393312A (en) | 1976-02-05 | 1983-07-12 | Bell Telephone Laboratories, Incorporated | Variable-spot scanning in an electron beam exposure system |
NL8602196A (nl) | 1986-08-29 | 1988-03-16 | Philips Nv | Geladen deeltjes bestralingsapparaat met optisch vervormbaar bundel begrenzend diafragma. |
JPH0793253B2 (ja) | 1986-10-31 | 1995-10-09 | 株式会社東芝 | 荷電ビ−ム露光装置 |
GB2197751A (en) | 1986-11-24 | 1988-05-25 | Philips Electronic Associated | Variable shaped spot electron beam pattern generator |
AT393925B (de) | 1987-06-02 | 1992-01-10 | Ims Ionen Mikrofab Syst | Anordnung zur durchfuehrung eines verfahrens zum positionieren der abbildung der auf einer maske befindlichen struktur auf ein substrat, und verfahren zum ausrichten von auf einer maske angeordneten markierungen auf markierungen, die auf einem traeger angeordnet sind |
ATE171812T1 (de) | 1988-06-01 | 1998-10-15 | Ims Ionen Mikrofab Syst | Ionenstrahllithographie |
JP2680074B2 (ja) | 1988-10-24 | 1997-11-19 | 富士通株式会社 | 荷電粒子ビーム露光を用いた半導体装置の製造方法 |
US5079112A (en) | 1989-08-07 | 1992-01-07 | At&T Bell Laboratories | Device manufacture involving lithographic processing |
JPH0399419A (ja) | 1989-09-12 | 1991-04-24 | Mitsubishi Electric Corp | 電子ビーム描画装置 |
JPH03185400A (ja) * | 1989-12-15 | 1991-08-13 | Seiko Epson Corp | X線源 |
US5227269A (en) | 1990-06-22 | 1993-07-13 | Texas Instruments Incorporated | Method for fabricating high density DRAM reticles |
US5250812A (en) * | 1991-03-29 | 1993-10-05 | Hitachi, Ltd. | Electron beam lithography using an aperture having an array of repeated unit patterns |
JP2706192B2 (ja) | 1991-11-06 | 1998-01-28 | 富士通株式会社 | 電子ビーム露光装置 |
US5528048A (en) | 1994-03-15 | 1996-06-18 | Fujitsu Limited | Charged particle beam exposure system and method |
US5624774A (en) | 1994-06-16 | 1997-04-29 | Nikon Corporation | Method for transferring patterns with charged particle beam |
JP3378413B2 (ja) | 1994-09-16 | 2003-02-17 | 株式会社東芝 | 電子線描画装置及び電子線描画方法 |
US5854490A (en) * | 1995-10-03 | 1998-12-29 | Fujitsu Limited | Charged-particle-beam exposure device and charged-particle-beam exposure method |
JP2785788B2 (ja) * | 1996-01-19 | 1998-08-13 | 日本電気株式会社 | 一括マスク搭載ホルダ構造 |
US5751004A (en) * | 1997-01-24 | 1998-05-12 | International Business Machines Corporation | Projection reticle transmission control for coulomb interaction analysis |
-
1997
- 1997-10-20 US US08/954,520 patent/US6225637B1/en not_active Expired - Lifetime
- 1997-10-23 DE DE69727112T patent/DE69727112T2/de not_active Expired - Lifetime
- 1997-10-23 EP EP97118465A patent/EP0838837B1/de not_active Expired - Lifetime
- 1997-10-25 KR KR1019970055139A patent/KR100278045B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP0838837B1 (de) | 2004-01-07 |
EP0838837A2 (de) | 1998-04-29 |
US6225637B1 (en) | 2001-05-01 |
KR19980033184A (ko) | 1998-07-25 |
KR100278045B1 (ko) | 2001-01-15 |
EP0838837A3 (de) | 2000-03-08 |
DE69727112T2 (de) | 2004-07-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |