DE69726378D1 - Gefärbte Photoresists sowie Methoden und Artikel, die diese umfassen - Google Patents
Gefärbte Photoresists sowie Methoden und Artikel, die diese umfassenInfo
- Publication number
- DE69726378D1 DE69726378D1 DE69726378T DE69726378T DE69726378D1 DE 69726378 D1 DE69726378 D1 DE 69726378D1 DE 69726378 T DE69726378 T DE 69726378T DE 69726378 T DE69726378 T DE 69726378T DE 69726378 D1 DE69726378 D1 DE 69726378D1
- Authority
- DE
- Germany
- Prior art keywords
- methods
- articles incorporating
- colored photoresists
- photoresists
- colored
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/106—Binder containing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/106—Binder containing
- Y10S430/111—Polymer of unsaturated acid or ester
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/127—Spectral sensitizer containing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- Materials For Photolithography (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/726,613 US7147983B1 (en) | 1996-10-07 | 1996-10-07 | Dyed photoresists and methods and articles of manufacture comprising same |
US726613 | 1996-10-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69726378D1 true DE69726378D1 (de) | 2004-01-08 |
DE69726378T2 DE69726378T2 (de) | 2004-09-16 |
Family
ID=24919313
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69726378T Expired - Fee Related DE69726378T2 (de) | 1996-10-07 | 1997-09-10 | Gefärbte Photoresists sowie Methoden und Artikel, die diese umfassen |
Country Status (4)
Country | Link |
---|---|
US (3) | US7147983B1 (de) |
EP (1) | EP0834770B1 (de) |
JP (2) | JP4249810B2 (de) |
DE (1) | DE69726378T2 (de) |
Families Citing this family (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5976770A (en) * | 1998-01-15 | 1999-11-02 | Shipley Company, L.L.C. | Dyed photoresists and methods and articles of manufacture comprising same |
KR100395904B1 (ko) * | 1999-04-23 | 2003-08-27 | 주식회사 하이닉스반도체 | 유기 반사방지 중합체 및 그의 제조방법 |
KR100310252B1 (ko) * | 1999-06-22 | 2001-11-14 | 박종섭 | 유기 반사방지 중합체 및 그의 제조방법 |
KR100533379B1 (ko) * | 1999-09-07 | 2005-12-06 | 주식회사 하이닉스반도체 | 유기 난반사 방지막용 조성물과 이의 제조방법 |
KR100549574B1 (ko) | 1999-12-30 | 2006-02-08 | 주식회사 하이닉스반도체 | 유기 반사 방지막용 중합체 및 그의 제조방법 |
KR100734249B1 (ko) * | 2000-09-07 | 2007-07-02 | 삼성전자주식회사 | 축합환의 방향족 환을 포함하는 보호기를 가지는 감광성폴리머 및 이를 포함하는 레지스트 조성물 |
JP3712048B2 (ja) * | 2000-09-27 | 2005-11-02 | 信越化学工業株式会社 | レジスト材料 |
EP1197998A3 (de) * | 2000-10-10 | 2005-12-21 | Shipley Company LLC | Antireflektiver Schaumstoff |
KR20020090584A (ko) * | 2001-05-28 | 2002-12-05 | 주식회사 동진쎄미켐 | 유기 반사 방지막용 고분자 수지, 및 이를 이용하는KrF 포토레지스트용 유기 반사 방지막 조성물 |
GR1004163B (el) * | 2001-11-01 | 2003-02-21 | Πολυκυκλικα παραγωγα τροποποιησης των οπτικων ιδιοτητων και των ιδιοτητων αντοχης στο πλασμα των πολυμερων λιθογραφιας | |
JP4393861B2 (ja) * | 2003-03-14 | 2010-01-06 | 東京応化工業株式会社 | 磁性膜のパターン形成方法 |
JP5002137B2 (ja) * | 2005-07-28 | 2012-08-15 | 富士フイルム株式会社 | 化学増幅型レジスト組成物及びその製造方法 |
JP4762630B2 (ja) * | 2005-08-03 | 2011-08-31 | 東京応化工業株式会社 | レジスト組成物およびレジストパターン形成方法 |
KR100688594B1 (ko) * | 2006-10-26 | 2007-03-02 | 삼성전자주식회사 | 축합환의 방향족 환을 포함하는 보호기를 가지는 감광성폴리머 및 이를 포함하는 레지스트 조성물 |
US7592118B2 (en) | 2007-03-27 | 2009-09-22 | Fujifilm Corporation | Positive resist composition and pattern forming method using the same |
JP4982228B2 (ja) | 2007-03-30 | 2012-07-25 | 富士フイルム株式会社 | ポジ型レジスト組成物及びこれを用いたパターン形成方法 |
JP4905250B2 (ja) * | 2007-05-18 | 2012-03-28 | 住友化学株式会社 | 化学増幅型ポジ型レジスト組成物 |
KR100871770B1 (ko) | 2007-09-12 | 2008-12-05 | 주식회사 효성 | 안트라세닐 벤질기 발색단을 포함하는 공중합체, 상기공중합체의 제조방법, 상기 공중합체를 포함하는유기반사방지막 조성물 및 상기 조성물을 포함하는유기반사방지막 |
KR101111647B1 (ko) * | 2009-08-27 | 2012-02-14 | 영창케미칼 주식회사 | 반도체 패턴 형성을 위한 i-선용 네가티브형 포토레지스트 조성물 |
TWI605310B (zh) * | 2009-12-15 | 2017-11-11 | 羅門哈斯電子材料有限公司 | 光阻劑及其使用方法 |
CN101768373A (zh) * | 2010-01-08 | 2010-07-07 | 武汉科技学院 | 一种重氮偶合法制备水溶性乙烯砜型聚氨酯类高分子活性染料的方法 |
JP6049250B2 (ja) | 2010-11-30 | 2016-12-21 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | 光酸発生剤 |
US8480815B2 (en) * | 2011-01-14 | 2013-07-09 | GM Global Technology Operations LLC | Method of making Nd-Fe-B sintered magnets with Dy or Tb |
CN102492309B (zh) * | 2011-11-11 | 2013-06-19 | 大连理工大学 | 悬挂型光热转换有机相变染料 |
WO2013074622A1 (en) | 2011-11-14 | 2013-05-23 | Orthogonal, Inc. | Method for patterning an organic material using a non-fluorinated photoresist |
US20140356789A1 (en) * | 2013-05-31 | 2014-12-04 | Orthogonal, Inc. | Fluorinated photopolymer with integrated anthracene sensitizer |
US9500948B2 (en) | 2013-05-31 | 2016-11-22 | Orthogonal, Inc. | Fluorinated photoresist with integrated sensitizer |
US8962779B2 (en) | 2013-07-16 | 2015-02-24 | Dow Global Technologies Llc | Method of forming polyaryl polymers |
US9410016B2 (en) | 2013-07-16 | 2016-08-09 | Dow Global Technologies Llc | Aromatic polyacetals and articles comprising them |
US9063420B2 (en) | 2013-07-16 | 2015-06-23 | Rohm And Haas Electronic Materials Llc | Photoresist composition, coated substrate, and method of forming electronic device |
US8933239B1 (en) | 2013-07-16 | 2015-01-13 | Dow Global Technologies Llc | Bis(aryl)acetal compounds |
US9298088B2 (en) | 2013-07-24 | 2016-03-29 | Orthogonal, Inc. | Fluorinated photopolymer with fluorinated sensitizer |
US9541829B2 (en) | 2013-07-24 | 2017-01-10 | Orthogonal, Inc. | Cross-linkable fluorinated photopolymer |
KR102028483B1 (ko) * | 2013-09-17 | 2019-10-07 | 동우 화인켐 주식회사 | 착색 감광성 수지 조성물, 컬러필터 및 이를 구비한 액정표시장치 |
US9772558B2 (en) | 2013-09-24 | 2017-09-26 | International Business Machines Corporation | Sulfonic acid ester containing polymers for organic solvent based dual-tone photoresists |
US9958778B2 (en) | 2014-02-07 | 2018-05-01 | Orthogonal, Inc. | Cross-linkable fluorinated photopolymer |
JP2016018075A (ja) | 2014-07-08 | 2016-02-01 | 東京応化工業株式会社 | レジストパターン形成方法及びレジスト組成物 |
KR102480950B1 (ko) | 2014-12-24 | 2022-12-23 | 올싸거널 인코포레이티드 | 전자 장치의 포토리소그래피 패터닝 |
JP7243180B2 (ja) * | 2017-12-25 | 2023-03-22 | 東ソー株式会社 | 光架橋性重合体、絶縁層及びこれを含む有機トランジスタデバイス |
GB201903420D0 (en) * | 2019-03-13 | 2019-04-24 | Nanotronix Inc | Photoresist |
US11940730B2 (en) | 2020-12-31 | 2024-03-26 | Rohm And Haas Electronic Materials Llc | Photoresist compositions and pattern formation methods |
WO2023085414A1 (ja) * | 2021-11-15 | 2023-05-19 | 日産化学株式会社 | 多環芳香族炭化水素系光硬化性樹脂組成物 |
Family Cites Families (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1359472A (en) * | 1970-09-01 | 1974-07-10 | Agfa Gevaert | Photographic recording and reproduction of information |
BE786973A (nl) * | 1971-08-27 | 1973-01-31 | Agfa Gevaert Nv | Fotografisch registreren en reproduceren van informatie |
BE787339A (nl) * | 1971-09-14 | 1973-02-09 | Agfa Gevaert Nv | Fotografische registratie en reproductie van informatie |
US4442197A (en) | 1982-01-11 | 1984-04-10 | General Electric Company | Photocurable compositions |
DE3565013D1 (en) | 1984-02-10 | 1988-10-20 | Ciba Geigy Ag | Process for the preparation of a protection layer or a relief pattern |
US4618566A (en) * | 1984-10-31 | 1986-10-21 | Ecoplastics Limited | Fluorene containing compounds and negative photoresist compositions therefrom |
US4603101A (en) | 1985-09-27 | 1986-07-29 | General Electric Company | Photoresist compositions containing t-substituted organomethyl vinylaryl ether materials |
EP0305545B1 (de) * | 1987-03-17 | 1993-02-10 | Hitachi Chemical Co., Ltd. | Substituierte acridin-derivate und deren verwendung |
EP0380667A4 (en) * | 1987-10-07 | 1991-04-24 | Terumo Kabushiki Kaisha | Ultraviolet-absorbing polymer material and photoetching process |
US4985564A (en) * | 1988-09-03 | 1991-01-15 | Hitachi Chemical Co., Ltd. | Acridine compound and photopolymerizable composition using the same |
WO1990003598A1 (en) | 1988-09-28 | 1990-04-05 | Brewer Science, Inc. | Multifunctional photolithographic compositions |
JPH02269353A (ja) | 1988-10-28 | 1990-11-02 | Hewlett Packard Co <Hp> | フォトリソグラフィーによる半導体の製造方法 |
EP0388343B1 (de) * | 1989-03-14 | 1996-07-17 | International Business Machines Corporation | Chemisch amplifizierter Photolack |
US5128232A (en) | 1989-05-22 | 1992-07-07 | Shiply Company Inc. | Photoresist composition with copolymer binder having a major proportion of phenolic units and a minor proportion of non-aromatic cyclic alcoholic units |
US5391465A (en) * | 1989-06-20 | 1995-02-21 | Rohm And Haas Company | Method of using selected photoactive compounds in high resolution, acid hardening photoresists with near ultraviolet radiation wherein the photoresist comprise conventional deep UV photoacid generators |
US5212046A (en) * | 1989-10-17 | 1993-05-18 | Shipley Company Inc. | Near UV photoresist |
JP2505637B2 (ja) * | 1990-09-28 | 1996-06-12 | 日立化成工業株式会社 | 光重合性組成物および光重合性エレメント |
JPH04170546A (ja) * | 1990-11-01 | 1992-06-18 | Fuji Photo Film Co Ltd | 光重合性組成物 |
US5250395A (en) | 1991-07-25 | 1993-10-05 | International Business Machines Corporation | Process for imaging of photoresist including treatment of the photoresist with an organometallic compound |
US6165697A (en) | 1991-11-15 | 2000-12-26 | Shipley Company, L.L.C. | Antihalation compositions |
US5296332A (en) * | 1991-11-22 | 1994-03-22 | International Business Machines Corporation | Crosslinkable aqueous developable photoresist compositions and method for use thereof |
US5322765A (en) | 1991-11-22 | 1994-06-21 | International Business Machines Corporation | Dry developable photoresist compositions and method for use thereof |
KR960015081A (ko) * | 1993-07-15 | 1996-05-22 | 마쯔모또 에이이찌 | 화학증폭형 레지스트 조성물 |
US5576359A (en) | 1993-07-20 | 1996-11-19 | Wako Pure Chemical Industries, Ltd. | Deep ultraviolet absorbent composition |
US5731385A (en) * | 1993-12-16 | 1998-03-24 | International Business Machines Corporation | Polymeric dyes for antireflective coatings |
EP0675410B1 (de) | 1994-03-28 | 1999-08-04 | Wako Pure Chemical Industries Ltd | Resistzusammensetzung für tiefe Ultraviolettbelichtung |
US5607824A (en) | 1994-07-27 | 1997-03-04 | International Business Machines Corporation | Antireflective coating for microlithography |
US6136498A (en) * | 1996-06-28 | 2000-10-24 | International Business Machines Corporation | Polymer-bound sensitizer |
-
1996
- 1996-10-07 US US08/726,613 patent/US7147983B1/en not_active Expired - Fee Related
-
1997
- 1997-09-10 DE DE69726378T patent/DE69726378T2/de not_active Expired - Fee Related
- 1997-09-10 EP EP97115715A patent/EP0834770B1/de not_active Expired - Lifetime
- 1997-10-06 JP JP30776297A patent/JP4249810B2/ja not_active Expired - Lifetime
-
2006
- 2006-05-03 US US11/418,520 patent/US7632630B2/en not_active Expired - Fee Related
- 2006-10-25 JP JP2006290286A patent/JP4250182B2/ja not_active Expired - Lifetime
-
2008
- 2008-12-12 US US12/316,578 patent/US20090220888A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
EP0834770A3 (de) | 1999-07-21 |
US7147983B1 (en) | 2006-12-12 |
US20060204892A1 (en) | 2006-09-14 |
EP0834770A2 (de) | 1998-04-08 |
EP0834770B1 (de) | 2003-11-26 |
US20090220888A1 (en) | 2009-09-03 |
JP4250182B2 (ja) | 2009-04-08 |
JPH10186647A (ja) | 1998-07-14 |
JP4249810B2 (ja) | 2009-04-08 |
JP2007058236A (ja) | 2007-03-08 |
DE69726378T2 (de) | 2004-09-16 |
US7632630B2 (en) | 2009-12-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |