DE69717237T2 - Evakuierbare Verpackung und Verfahren zu deren Herstellung - Google Patents

Evakuierbare Verpackung und Verfahren zu deren Herstellung

Info

Publication number
DE69717237T2
DE69717237T2 DE69717237T DE69717237T DE69717237T2 DE 69717237 T2 DE69717237 T2 DE 69717237T2 DE 69717237 T DE69717237 T DE 69717237T DE 69717237 T DE69717237 T DE 69717237T DE 69717237 T2 DE69717237 T2 DE 69717237T2
Authority
DE
Germany
Prior art keywords
evacuable
packaging
manufacture
evacuable packaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69717237T
Other languages
English (en)
Other versions
DE69717237D1 (de
Inventor
Tetsuzo Hara
Yasuhiro Negoro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Publication of DE69717237D1 publication Critical patent/DE69717237D1/de
Application granted granted Critical
Publication of DE69717237T2 publication Critical patent/DE69717237T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
    • B81B7/0032—Packages or encapsulation
    • B81B7/0077—Other packages not provided for in groups B81B7/0035 - B81B7/0074
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/0001—Transmitting or indicating the displacement of elastically deformable gauges by electric, electro-mechanical, magnetic or electro-magnetic means
    • G01L9/0008—Transmitting or indicating the displacement of elastically deformable gauges by electric, electro-mechanical, magnetic or electro-magnetic means using vibrations
    • G01L9/0019—Transmitting or indicating the displacement of elastically deformable gauges by electric, electro-mechanical, magnetic or electro-magnetic means using vibrations of a semiconductive element
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/0041—Transmitting or indicating the displacement of flexible diaphragms
    • G01L9/0042—Constructional details associated with semiconductive diaphragm sensors, e.g. etching, or constructional details of non-semiconductive diaphragms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P1/00—Details of instruments
    • G01P1/02—Housings
    • G01P1/023—Housings for acceleration measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P5/00—Measuring speed of fluids, e.g. of air stream; Measuring speed of bodies relative to fluids, e.g. of ship, of aircraft
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/02—Containers; Seals
    • H01L23/10—Containers; Seals characterised by the material or arrangement of seals between parts, e.g. between cap and base of the container or between leads and walls of the container
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C2203/00—Forming microstructural systems
    • B81C2203/01—Packaging MEMS
    • B81C2203/0145—Hermetically sealing an opening in the lid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
    • G01P2015/0822—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass
    • G01P2015/0825—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass
    • G01P2015/0828—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass the mass being of the paddle type being suspended at one of its longitudinal ends
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01079—Gold [Au]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00—Stock material or miscellaneous articles
    • Y10T428/13—Hollow or container type article [e.g., tube, vase, etc.]
    • Y10T428/131—Glass, ceramic, or sintered, fused, fired, or calcined metal oxide or metal carbide containing [e.g., porcelain, brick, cement, etc.]
    • Y10T428/1317—Multilayer [continuous layer]
DE69717237T 1996-12-19 1997-12-16 Evakuierbare Verpackung und Verfahren zu deren Herstellung Expired - Lifetime DE69717237T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8354588A JP3045089B2 (ja) 1996-12-19 1996-12-19 素子のパッケージ構造およびその製造方法

Publications (2)

Publication Number Publication Date
DE69717237D1 DE69717237D1 (de) 2003-01-02
DE69717237T2 true DE69717237T2 (de) 2003-08-28

Family

ID=18438573

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69717237T Expired - Lifetime DE69717237T2 (de) 1996-12-19 1997-12-16 Evakuierbare Verpackung und Verfahren zu deren Herstellung

Country Status (4)

Country Link
US (1) US6416831B1 (de)
EP (1) EP0849578B1 (de)
JP (1) JP3045089B2 (de)
DE (1) DE69717237T2 (de)

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TW379346B (en) * 1996-08-27 2000-01-11 Omron Tateisi Electronics Co Micro-relay and the method of manufacturing thereof
EP0951069A1 (de) * 1998-04-17 1999-10-20 Interuniversitair Microelektronica Centrum Vzw Herstellungsverfahren für eine Mikrostruktur mit Innenraum
EP0951068A1 (de) * 1998-04-17 1999-10-20 Interuniversitair Micro-Elektronica Centrum Vzw Herstellungsverfahren für eine Mikrostruktur mit Innenraum
US6871544B1 (en) 1999-03-17 2005-03-29 Input/Output, Inc. Sensor design and process
AU3517600A (en) * 1999-03-17 2000-10-04 Input/Output, Inc. Calibration of sensors
JP2001038699A (ja) * 1999-07-26 2001-02-13 Sony Corp 接合基板素子および接合基板素子製造方法
JP3435665B2 (ja) * 2000-06-23 2003-08-11 株式会社村田製作所 複合センサ素子およびその製造方法
JP2003060472A (ja) * 2001-08-08 2003-02-28 Seiko Instruments Inc 圧電振動子
US20040031912A1 (en) * 2001-10-31 2004-02-19 Wong Marvin Glenn Method of eliminating brownian noise in micromachined varactors
FR2841380A1 (fr) * 2002-06-25 2003-12-26 Commissariat Energie Atomique Procede d'encapsulation d'un objet sous atmosphere controlee
US6962514B2 (en) * 2002-08-08 2005-11-08 Applied Materials, Inc. Method and apparatus used in fabrication of MEMS stacks
AU2003286572A1 (en) * 2002-10-23 2004-05-13 Rutgers, The State University Of New Jersey Processes for hermetically packaging wafer level microscopic structures
US20050189621A1 (en) * 2002-12-02 2005-09-01 Cheung Kin P. Processes for hermetically packaging wafer level microscopic structures
US7514283B2 (en) 2003-03-20 2009-04-07 Robert Bosch Gmbh Method of fabricating electromechanical device having a controlled atmosphere
US7075160B2 (en) 2003-06-04 2006-07-11 Robert Bosch Gmbh Microelectromechanical systems and devices having thin film encapsulated mechanical structures
US7621412B2 (en) * 2003-06-26 2009-11-24 Stokely-Van Camp, Inc. Hot fill container and closure and associated method
US7109580B2 (en) * 2004-03-03 2006-09-19 Hymite A/S Hermetically sealed package for optical, electronic, opto-electronic and other devices
FR2870227B1 (fr) * 2004-05-12 2006-08-11 Commissariat Energie Atomique Procede d'obturation d'un event et machine mettant en oeuvre un tel procede
JP2006023115A (ja) * 2004-07-06 2006-01-26 Surpass Kogyo Kk 絶対圧形圧力センサの製造方法および製造装置
US7204737B2 (en) * 2004-09-23 2007-04-17 Temic Automotive Of North America, Inc. Hermetically sealed microdevice with getter shield
US7368803B2 (en) * 2004-09-27 2008-05-06 Idc, Llc System and method for protecting microelectromechanical systems array using back-plate with non-flat portion
JP4816049B2 (ja) * 2005-12-13 2011-11-16 大日本印刷株式会社 センサーパッケージおよびその製造方法
JP4816051B2 (ja) * 2005-12-13 2011-11-16 大日本印刷株式会社 センサーパッケージおよびその製造方法
US20070170528A1 (en) 2006-01-20 2007-07-26 Aaron Partridge Wafer encapsulated microelectromechanical structure and method of manufacturing same
JP5262136B2 (ja) * 2008-01-28 2013-08-14 株式会社村田製作所 電子部品の製造方法
US8545973B2 (en) * 2008-03-15 2013-10-01 Daniel D. Smolko Sealable containers
CN101582363A (zh) * 2008-05-14 2009-11-18 清华大学 真空器件的封接方法
CN101587807B (zh) * 2008-05-23 2011-05-04 清华大学 真空器件的封接装置以及封接方法
CN101587808B (zh) * 2008-05-23 2011-06-08 清华大学 真空器件的封接装置以及封接方法
CN101609773B (zh) * 2008-06-18 2012-05-16 清华大学 真空器件的封接方法
JP2010217170A (ja) * 2009-02-17 2010-09-30 Seiko Epson Corp 複合センサー、電子機器
JP5213887B2 (ja) * 2010-02-22 2013-06-19 京セラ株式会社 弾性表面波素子
SE537584C2 (sv) 2011-12-15 2015-06-30 Silex Microsystems Ab Tunnfilmskapsling
JP2014036081A (ja) * 2012-08-08 2014-02-24 Seiko Epson Corp 電子デバイスの製造方法、電子デバイス、電子機器、および移動体
JP2016048176A (ja) * 2014-08-27 2016-04-07 セイコーエプソン株式会社 物理量センサー、電子機器および移動体
EP3045909B1 (de) * 2015-01-14 2020-11-04 Sensirion AG Sensorpaket
CN115394573B (zh) * 2022-08-25 2023-09-15 成都宏明电子股份有限公司 一种大功率高储能密度电容器的灌注方法及灌注工装

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JP2729005B2 (ja) * 1992-04-01 1998-03-18 三菱電機株式会社 半導体圧力センサ及びその製造方法
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Also Published As

Publication number Publication date
US6416831B1 (en) 2002-07-09
DE69717237D1 (de) 2003-01-02
EP0849578A1 (de) 1998-06-24
EP0849578B1 (de) 2002-11-20
JPH10189795A (ja) 1998-07-21
JP3045089B2 (ja) 2000-05-22

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Legal Events

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8364 No opposition during term of opposition