DE69715993D1 - Cache-Speicher mit Verwendung fehlerhaften Ettikettenspeichers - Google Patents

Cache-Speicher mit Verwendung fehlerhaften Ettikettenspeichers

Info

Publication number
DE69715993D1
DE69715993D1 DE69715993T DE69715993T DE69715993D1 DE 69715993 D1 DE69715993 D1 DE 69715993D1 DE 69715993 T DE69715993 T DE 69715993T DE 69715993 T DE69715993 T DE 69715993T DE 69715993 D1 DE69715993 D1 DE 69715993D1
Authority
DE
Germany
Prior art keywords
cache
cache address
memory
tag memory
address
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69715993T
Other languages
English (en)
Other versions
DE69715993T2 (de
Inventor
Takahiro Fukui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Application granted granted Critical
Publication of DE69715993D1 publication Critical patent/DE69715993D1/de
Publication of DE69715993T2 publication Critical patent/DE69715993T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00—Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02—Addressing or allocation; Relocation
    • G06F12/08—Addressing or allocation; Relocation in hierarchically structured memory systems, e.g. virtual memory systems
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/88—Masking faults in memories by using spares or by reconfiguring with partially good memories
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C15/00—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1064—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in cache or content addressable memories

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Memory System Of A Hierarchy Structure (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Debugging And Monitoring (AREA)
DE69715993T 1996-07-16 1997-07-15 Cache-Speicher mit Verwendung fehlerhaften Ettikettenspeichers Expired - Fee Related DE69715993T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP08185932A JP3116827B2 (ja) 1996-07-16 1996-07-16 キャッシュメモリ制御装置

Publications (2)

Publication Number Publication Date
DE69715993D1 true DE69715993D1 (de) 2002-11-07
DE69715993T2 DE69715993T2 (de) 2003-06-12

Family

ID=16179409

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69715993T Expired - Fee Related DE69715993T2 (de) 1996-07-16 1997-07-15 Cache-Speicher mit Verwendung fehlerhaften Ettikettenspeichers

Country Status (5)

Country Link
US (1) US5825682A (de)
EP (1) EP0823685B1 (de)
JP (1) JP3116827B2 (de)
KR (1) KR100241483B1 (de)
DE (1) DE69715993T2 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10154394A (ja) * 1996-11-21 1998-06-09 Toshiba Corp メモリ装置
US5907511A (en) * 1997-12-23 1999-05-25 Lsi Logic Corporation Electrically selectable redundant components for an embedded DRAM
US6034433A (en) * 1997-12-23 2000-03-07 Intel Corporation Interconnect structure for protecting a transistor gate from charge damage
US5896331A (en) * 1997-12-23 1999-04-20 Lsi Logic Corporation Reprogrammable addressing process for embedded DRAM
US5901095A (en) * 1997-12-23 1999-05-04 Lsi Logic Corporation Reprogrammable address selector for an embedded DRAM
US5999440A (en) * 1998-03-30 1999-12-07 Lsi Logic Corporation Embedded DRAM with noise-protecting substrate isolation well
US6064588A (en) * 1998-03-30 2000-05-16 Lsi Logic Corporation Embedded dram with noise-protected differential capacitor memory cells
US6005824A (en) * 1998-06-30 1999-12-21 Lsi Logic Corporation Inherently compensated clocking circuit for dynamic random access memory
US5978304A (en) * 1998-06-30 1999-11-02 Lsi Logic Corporation Hierarchical, adaptable-configuration dynamic random access memory
US6748562B1 (en) * 2000-10-31 2004-06-08 Agilent Technologies, Inc. Memory tester omits programming of addresses in detected bad columns
JP3701886B2 (ja) * 2001-04-27 2005-10-05 インターナショナル・ビジネス・マシーンズ・コーポレーション 記憶回路ブロック及びアクセス方法
US7240277B2 (en) * 2003-09-26 2007-07-03 Texas Instruments Incorporated Memory error detection reporting
JP2006190402A (ja) * 2005-01-07 2006-07-20 Renesas Technology Corp 半導体装置
US10020037B2 (en) * 2007-12-10 2018-07-10 Intel Corporation Capacity register file
GB2576005B (en) 2018-07-31 2020-10-07 Advanced Risc Mach Ltd Handling guard tag loss

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59207080A (ja) * 1983-05-10 1984-11-24 Nec Corp キヤツシユ記憶制御装置
AU604101B2 (en) * 1987-04-13 1990-12-06 Computervision Corporation High availability cache organization
JPH035851A (ja) * 1989-06-01 1991-01-11 Fujitsu Ltd バッファ記憶装置
US5226150A (en) * 1990-10-01 1993-07-06 Digital Equipment Corporation Apparatus for suppressing an error report from an address for which an error has already been reported
US5497347A (en) * 1994-06-21 1996-03-05 Motorola Inc. BICMOS cache TAG comparator having redundancy and separate read an compare paths
US5617347A (en) * 1995-03-17 1997-04-01 Fujitsu Limited Cache memory system and method thereof for storing a staged memory item and a cache tag within a single cache array structure
US5668766A (en) * 1996-05-16 1997-09-16 Intel Corporation Method and apparatus for increasing memory read access speed using double-sensing

Also Published As

Publication number Publication date
DE69715993T2 (de) 2003-06-12
EP0823685B1 (de) 2002-10-02
KR100241483B1 (ko) 2000-02-01
JP3116827B2 (ja) 2000-12-11
JPH1031619A (ja) 1998-02-03
KR980010790A (ko) 1998-04-30
US5825682A (en) 1998-10-20
EP0823685A1 (de) 1998-02-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee