DE69708981T2 - Flüssigkristallanzeige - Google Patents
FlüssigkristallanzeigeInfo
- Publication number
- DE69708981T2 DE69708981T2 DE69708981T DE69708981T DE69708981T2 DE 69708981 T2 DE69708981 T2 DE 69708981T2 DE 69708981 T DE69708981 T DE 69708981T DE 69708981 T DE69708981 T DE 69708981T DE 69708981 T2 DE69708981 T2 DE 69708981T2
- Authority
- DE
- Germany
- Prior art keywords
- liquid
- crystal display
- crystal
- display
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004973 liquid crystal related substance Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78696—Thin film transistors, i.e. transistors with a channel being at least partly a thin film characterised by the structure of the channel, e.g. multichannel, transverse or longitudinal shape, length or width, doping structure, or the overlap or alignment between the channel and the gate, the source or the drain, or the contacting structure of the channel
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1345—Conductors connecting electrodes to cell terminals
- G02F1/13454—Drivers integrated on the active matrix substrate
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136227—Through-hole connection of the pixel electrode to the active element through an insulation layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/49—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
- H01L29/4908—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET for thin film semiconductor, e.g. gate of TFT
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/762—Charge transfer devices
- H01L29/765—Charge-coupled devices
- H01L29/768—Charge-coupled devices with field effect produced by an insulated gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
- H01L29/78609—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device for preventing leakage current
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/13624—Active matrix addressed cells having more than one switching element per pixel
- G02F1/136245—Active matrix addressed cells having more than one switching element per pixel having complementary transistors
Landscapes
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mathematical Physics (AREA)
- Thin Film Transistor (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Liquid Crystal (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17318896 | 1996-07-03 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69708981D1 DE69708981D1 (de) | 2002-01-24 |
DE69708981T2 true DE69708981T2 (de) | 2002-04-25 |
Family
ID=15955732
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69708981T Expired - Fee Related DE69708981T2 (de) | 1996-07-03 | 1997-07-03 | Flüssigkristallanzeige |
Country Status (6)
Country | Link |
---|---|
US (2) | US6104040A (de) |
EP (1) | EP0816903B1 (de) |
KR (1) | KR100546905B1 (de) |
DE (1) | DE69708981T2 (de) |
SG (1) | SG73573A1 (de) |
TW (1) | TW324862B (de) |
Families Citing this family (38)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW324862B (en) * | 1996-07-03 | 1998-01-11 | Hitachi Ltd | Liquid display apparatus |
US6005801A (en) * | 1997-08-20 | 1999-12-21 | Micron Technology, Inc. | Reduced leakage DRAM storage unit |
JP2000347159A (ja) * | 1999-06-09 | 2000-12-15 | Hitachi Ltd | 液晶表示装置 |
KR100324871B1 (ko) * | 1999-06-25 | 2002-02-28 | 구본준, 론 위라하디락사 | 박막트랜지스터 제조방법 |
US6227723B1 (en) * | 1999-06-30 | 2001-05-08 | Kyocera Corporation | Substrate for mounting an optical component and optical module provided with the same |
US6952020B1 (en) * | 1999-07-06 | 2005-10-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
JP4104800B2 (ja) * | 1999-12-08 | 2008-06-18 | 三菱電機株式会社 | 液晶表示装置およびtftパネル |
US6998656B2 (en) * | 2003-02-07 | 2006-02-14 | Hewlett-Packard Development Company, L.P. | Transparent double-injection field-effect transistor |
TW490649B (en) * | 2000-12-29 | 2002-06-11 | Ind Tech Res Inst | Drive circuit of a single matrix-type organic electrically triggered light emission pixel |
JP4202012B2 (ja) * | 2001-11-09 | 2008-12-24 | 株式会社半導体エネルギー研究所 | 発光装置及び電流記憶回路 |
JP2004296665A (ja) * | 2003-03-26 | 2004-10-21 | Seiko Epson Corp | 半導体装置、電気光学装置、および電子機器 |
KR100542986B1 (ko) * | 2003-04-29 | 2006-01-20 | 삼성에스디아이 주식회사 | 박막 트랜지스터, 상기 박막 트랜지스터 제조 방법 및 이를 이용한 표시장치 |
TW200500979A (en) * | 2003-05-20 | 2005-01-01 | Adv Lcd Tech Dev Ct Co Ltd | Light emission type display apparatus |
KR100515357B1 (ko) * | 2003-08-14 | 2005-09-15 | 삼성에스디아이 주식회사 | 게이트와 바디가 전기적으로 연결된 박막 트랜지스터와 그제조방법 |
KR100543004B1 (ko) | 2003-09-18 | 2006-01-20 | 삼성에스디아이 주식회사 | 평판표시장치 |
KR100501706B1 (ko) | 2003-10-16 | 2005-07-18 | 삼성에스디아이 주식회사 | 게이트-바디콘택 박막 트랜지스터 |
KR100626007B1 (ko) * | 2004-06-30 | 2006-09-20 | 삼성에스디아이 주식회사 | 박막 트랜지스터, 상기 박막 트랜지스터의 제조방법, 이박막 트랜지스터를 구비한 평판표시장치, 및 이평판표시장치의 제조방법 |
KR100688979B1 (ko) * | 2005-06-14 | 2007-03-08 | 삼성전자주식회사 | 백라이트유닛 |
JP4967264B2 (ja) * | 2005-07-11 | 2012-07-04 | 株式会社日立製作所 | 半導体装置 |
KR100741976B1 (ko) | 2005-08-25 | 2007-07-23 | 삼성에스디아이 주식회사 | 박막트랜지스터 및 그 제조 방법 |
US7754509B2 (en) * | 2006-03-29 | 2010-07-13 | Chunghua Picture Tubes, Ltd. | Manufacturing method for thin film transistor |
KR101261609B1 (ko) * | 2006-07-06 | 2013-05-06 | 삼성디스플레이 주식회사 | 박막 트랜지스터, 표시판 및 그 제조 방법 |
KR101319076B1 (ko) | 2006-12-22 | 2013-10-17 | 엘지디스플레이 주식회사 | 문턱 전압 복원 기능을 가진 트랜지스터와 그의 구동 및제조 방법 |
KR100878284B1 (ko) * | 2007-03-09 | 2009-01-12 | 삼성모바일디스플레이주식회사 | 박막트랜지스터와 그 제조 방법 및 이를 구비한유기전계발광표시장치 |
KR100875432B1 (ko) | 2007-05-31 | 2008-12-22 | 삼성모바일디스플레이주식회사 | 다결정 실리콘층의 제조 방법, 이를 이용하여 형성된박막트랜지스터, 그의 제조방법 및 이를 포함하는유기전계발광표시장치 |
KR100889626B1 (ko) | 2007-08-22 | 2009-03-20 | 삼성모바일디스플레이주식회사 | 박막트랜지스터, 그의 제조방법, 이를 구비한유기전계발광표시장치, 및 그의 제조방법 |
KR100889627B1 (ko) | 2007-08-23 | 2009-03-20 | 삼성모바일디스플레이주식회사 | 박막트랜지스터, 그의 제조방법, 및 이를 구비한유기전계발광표시장치 |
KR100982310B1 (ko) | 2008-03-27 | 2010-09-15 | 삼성모바일디스플레이주식회사 | 박막트랜지스터, 그의 제조방법, 및 이를 포함하는유기전계발광표시장치 |
KR100989136B1 (ko) * | 2008-04-11 | 2010-10-20 | 삼성모바일디스플레이주식회사 | 박막트랜지스터, 그의 제조방법, 및 이를 포함하는유기전계발광표시장치 |
KR101002666B1 (ko) | 2008-07-14 | 2010-12-21 | 삼성모바일디스플레이주식회사 | 박막트랜지스터, 그의 제조방법, 및 이를 포함하는유기전계발광표시장치 |
KR101272892B1 (ko) * | 2009-11-11 | 2013-06-11 | 엘지디스플레이 주식회사 | 어레이 기판 |
WO2011099342A1 (en) * | 2010-02-10 | 2011-08-18 | Semiconductor Energy Laboratory Co., Ltd. | Field effect transistor |
JP5521993B2 (ja) * | 2010-11-17 | 2014-06-18 | 富士通セミコンダクター株式会社 | 半導体装置の製造方法及び半導体装置 |
KR102319478B1 (ko) * | 2014-03-18 | 2021-10-29 | 삼성디스플레이 주식회사 | 박막 트랜지스터 및 그 제조 방법 |
CN105810749B (zh) * | 2014-12-31 | 2018-12-21 | 清华大学 | N型薄膜晶体管 |
KR102283919B1 (ko) | 2015-01-06 | 2021-07-30 | 삼성디스플레이 주식회사 | 액정 표시 장치 |
CN105390510B (zh) * | 2015-12-14 | 2018-06-01 | 武汉华星光电技术有限公司 | 低温多晶硅tft基板及其制作方法 |
US20220310732A1 (en) * | 2020-10-27 | 2022-09-29 | Chengdu Boe Optoelectronics Technology Co., Ltd. | Array substrate, fabrication method thereof and display device |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2653099B2 (ja) * | 1988-05-17 | 1997-09-10 | セイコーエプソン株式会社 | アクティブマトリクスパネル,投写型表示装置及びビューファインダー |
US5493129A (en) | 1988-06-29 | 1996-02-20 | Hitachi, Ltd. | Thin film transistor structure having increased on-current |
US5017983A (en) | 1989-08-03 | 1991-05-21 | Industrial Technology Research Institute | Amorphous silicon thin film transistor with a depletion gate |
US5196911A (en) * | 1990-07-26 | 1993-03-23 | Industrial Technology Research Institute | High photosensitive depletion-gate thin film transistor |
JP3255942B2 (ja) | 1991-06-19 | 2002-02-12 | 株式会社半導体エネルギー研究所 | 逆スタガ薄膜トランジスタの作製方法 |
JPH05299436A (ja) | 1992-04-24 | 1993-11-12 | Hitachi Ltd | 薄膜トランジスタ及びそれを用いた液晶表示装置 |
JP3437863B2 (ja) | 1993-01-18 | 2003-08-18 | 株式会社半導体エネルギー研究所 | Mis型半導体装置の作製方法 |
JPH07175084A (ja) | 1993-12-21 | 1995-07-14 | Hitachi Ltd | 液晶表示装置及びその製造方法 |
GB9311129D0 (en) * | 1993-05-28 | 1993-07-14 | Philips Electronics Uk Ltd | Electronic devices with-film circuit elements forming a sampling circuit |
KR100294026B1 (ko) | 1993-06-24 | 2001-09-17 | 야마자끼 순페이 | 전기광학장치 |
JP3030368B2 (ja) | 1993-10-01 | 2000-04-10 | 株式会社半導体エネルギー研究所 | 半導体装置およびその作製方法 |
WO1995034916A1 (fr) | 1994-06-15 | 1995-12-21 | Seiko Epson Corporation | Fabrication d'un equipement a semi-conducteurs a couches minces, equipement a semi-conducteurs a couches minces, afficheur a cristaux liquides et equipement electronique |
JP3253808B2 (ja) * | 1994-07-07 | 2002-02-04 | 株式会社半導体エネルギー研究所 | 半導体装置およびその作製方法 |
US6124911A (en) * | 1994-07-29 | 2000-09-26 | Kabushiki Kaisha Toshiba | Reflection LCD with a counter substrate having a plurality of curved areas |
US5789762A (en) | 1994-09-14 | 1998-08-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor active matrix circuit |
US5985703A (en) | 1994-10-24 | 1999-11-16 | Banerjee; Sanjay | Method of making thin film transistors |
KR0169385B1 (ko) | 1995-03-10 | 1999-03-20 | 김광호 | 블랙 매트릭스 구조가 가능한 액정용 박막 트랜지스터 기판 및 그 제조방법 |
JPH09266179A (ja) | 1996-03-29 | 1997-10-07 | Nec Corp | タングステン合金電極および配線 |
TW324862B (en) * | 1996-07-03 | 1998-01-11 | Hitachi Ltd | Liquid display apparatus |
JP3323889B2 (ja) | 1996-10-28 | 2002-09-09 | 三菱電機株式会社 | 薄膜トランジスタの製造方法 |
-
1997
- 1997-06-03 TW TW086107640A patent/TW324862B/zh not_active IP Right Cessation
- 1997-06-23 SG SG1998004419A patent/SG73573A1/en unknown
- 1997-06-30 US US08/885,182 patent/US6104040A/en not_active Expired - Lifetime
- 1997-07-03 DE DE69708981T patent/DE69708981T2/de not_active Expired - Fee Related
- 1997-07-03 EP EP97111177A patent/EP0816903B1/de not_active Expired - Lifetime
- 1997-07-03 KR KR1019970030838A patent/KR100546905B1/ko not_active IP Right Cessation
-
2003
- 2003-02-13 US US10/365,525 patent/US6812489B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US6104040A (en) | 2000-08-15 |
TW324862B (en) | 1998-01-11 |
SG73573A1 (en) | 2000-06-20 |
EP0816903A1 (de) | 1998-01-07 |
DE69708981D1 (de) | 2002-01-24 |
US6812489B2 (en) | 2004-11-02 |
KR100546905B1 (ko) | 2006-08-22 |
US20030160237A1 (en) | 2003-08-28 |
EP0816903B1 (de) | 2001-12-12 |
KR980010572A (ko) | 1998-04-30 |
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