DE69633930D1 - Automatischer analysator und methode zur graphischen darstellung - Google Patents

Automatischer analysator und methode zur graphischen darstellung

Info

Publication number
DE69633930D1
DE69633930D1 DE69633930T DE69633930T DE69633930D1 DE 69633930 D1 DE69633930 D1 DE 69633930D1 DE 69633930 T DE69633930 T DE 69633930T DE 69633930 T DE69633930 T DE 69633930T DE 69633930 D1 DE69633930 D1 DE 69633930D1
Authority
DE
Germany
Prior art keywords
graphic representation
automatic analyzer
analyzer
automatic
graphic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69633930T
Other languages
English (en)
Other versions
DE69633930T2 (de
Inventor
Mitsuru Ohnuma
Atsushi Katayama
Isamu Takekoshi
Isao Sindo
Kahei Shiraishi
Hiromichi Satoh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of DE69633930D1 publication Critical patent/DE69633930D1/de
Publication of DE69633930T2 publication Critical patent/DE69633930T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00594Quality control, including calibration or testing of components of the analyser
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00594Quality control, including calibration or testing of components of the analyser
    • G01N35/00613Quality control
    • G01N35/00623Quality control of instruments
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00178Special arrangements of analysers
    • G01N2035/00306Housings, cabinets, control panels (details)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N2035/00891Displaying information to the operator
    • G01N2035/009Displaying information to the operator alarms, e.g. audible
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N2035/00891Displaying information to the operator
    • G01N2035/0091GUI [graphical user interfaces]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04Details of the conveyor system
    • G01N2035/0439Rotary sample carriers, i.e. carousels
    • G01N2035/0443Rotary sample carriers, i.e. carousels for reagents
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04Details of the conveyor system
    • G01N2035/0439Rotary sample carriers, i.e. carousels
    • G01N2035/0444Rotary sample carriers, i.e. carousels for cuvettes or reaction vessels
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04Details of the conveyor system
    • G01N2035/0439Rotary sample carriers, i.e. carousels
    • G01N2035/0446Combinations of the above
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04Details of the conveyor system
    • G01N2035/0439Rotary sample carriers, i.e. carousels
    • G01N2035/0453Multiple carousels working in parallel
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00594Quality control, including calibration or testing of components of the analyser
    • G01N35/00712Automatic status testing, e.g. at start-up or periodic
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00Chemistry: analytical and immunological testing
    • Y10T436/11Automated chemical analysis
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00Chemistry: analytical and immunological testing
    • Y10T436/11Automated chemical analysis
    • Y10T436/113332Automated chemical analysis with conveyance of sample along a test line in a container or rack
DE69633930T 1995-09-05 1996-09-03 Automatischer Analysator und Anzeigeverfahren Expired - Lifetime DE69633930T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP22772395 1995-09-05
JP22772395A JP3326054B2 (ja) 1995-09-05 1995-09-05 自動分析装置
PCT/JP1996/002490 WO1997009621A1 (fr) 1995-09-05 1996-09-03 Systeme automatique d'analyse et de visualisation

Publications (2)

Publication Number Publication Date
DE69633930D1 true DE69633930D1 (de) 2004-12-30
DE69633930T2 DE69633930T2 (de) 2005-07-28

Family

ID=16865354

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69633930T Expired - Lifetime DE69633930T2 (de) 1995-09-05 1996-09-03 Automatischer Analysator und Anzeigeverfahren

Country Status (9)

Country Link
US (1) US6440369B1 (de)
EP (1) EP0851232B1 (de)
JP (1) JP3326054B2 (de)
CN (1) CN1113245C (de)
CA (1) CA2230571C (de)
DE (1) DE69633930T2 (de)
ES (1) ES2231823T3 (de)
TW (1) TW351765B (de)
WO (1) WO1997009621A1 (de)

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JP3808651B2 (ja) * 1999-01-13 2006-08-16 東芝メディカルシステムズ株式会社 自動分析装置
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JP3764326B2 (ja) * 2000-08-28 2006-04-05 株式会社日立製作所 自動分析装置
JP4327392B2 (ja) * 2001-12-05 2009-09-09 シスメックス株式会社 生体試料分析装置
JP2003215138A (ja) * 2002-01-29 2003-07-30 Hitachi High-Technologies Corp 自動分析装置
JP2004317269A (ja) * 2003-04-16 2004-11-11 Hitachi High-Technologies Corp 自動分析装置
JP4033060B2 (ja) * 2003-07-17 2008-01-16 株式会社日立ハイテクノロジーズ 自動分析装置
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CN1963527B (zh) * 2005-11-10 2011-12-14 深圳迈瑞生物医疗电子股份有限公司 全自动生化分析仪及其分析方法
JP3808895B2 (ja) * 2005-12-26 2006-08-16 東芝メディカルシステムズ株式会社 自動分析装置
JP2007315871A (ja) * 2006-05-24 2007-12-06 Olympus Corp 自動分析装置
JP4457091B2 (ja) * 2006-07-31 2010-04-28 株式会社日立ハイテクノロジーズ 自動分析装置
JP5089307B2 (ja) * 2007-09-20 2012-12-05 シスメックス株式会社 検体分析装置
JP5170737B2 (ja) * 2007-09-20 2013-03-27 シスメックス株式会社 検体分析装置
US9297820B2 (en) * 2008-02-13 2016-03-29 Hitachi High-Technologies Corporation Automatic analyzer
CN101726616B (zh) * 2008-10-31 2014-07-16 深圳迈瑞生物医疗电子股份有限公司 自动分析装置及其工作方法
JP5500861B2 (ja) * 2009-04-20 2014-05-21 株式会社日立ハイテクノロジーズ 自動分析装置
CN102200536B (zh) * 2010-03-25 2015-05-27 艾博生物医药(杭州)有限公司 测试液体样本中被分析物的检测装置
CN102221603B (zh) * 2010-04-14 2015-03-25 深圳迈瑞生物医疗电子股份有限公司 试剂瓶逻辑组合形成方法、系统及生化分析仪
JP5805136B2 (ja) * 2013-05-16 2015-11-04 株式会社堀場製作所 全血血球免疫測定装置
JP5771236B2 (ja) * 2013-05-17 2015-08-26 株式会社堀場製作所 血液分析装置
JP6145002B2 (ja) * 2013-09-02 2017-06-07 株式会社日立ハイテクノロジーズ 自動分析装置
CN105492908A (zh) * 2013-09-02 2016-04-13 株式会社日立高新技术 自动分析装置
CN105021836A (zh) * 2015-08-04 2015-11-04 北京迪迈医学诊断技术有限公司 旋转式自动取样及进样装置及其方法
EP3404419B1 (de) 2016-01-13 2020-09-09 Hitachi High-Tech Corporation Automatisierter analysator und steuerungsverfahren dafür
JP6900268B2 (ja) * 2017-07-31 2021-07-07 株式会社日立ハイテク 自動分析装置
JP1618169S (de) * 2018-01-26 2018-11-19
JP1630239S (de) * 2018-07-27 2019-05-07
EP4266061A1 (de) * 2020-12-17 2023-10-25 Hitachi High-Tech Corporation Automatische analysevorrichtung

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Also Published As

Publication number Publication date
CN1154476A (zh) 1997-07-16
EP0851232A4 (de) 2000-01-05
CN1113245C (zh) 2003-07-02
JPH0972921A (ja) 1997-03-18
CA2230571C (en) 2002-05-21
DE69633930T2 (de) 2005-07-28
ES2231823T3 (es) 2005-05-16
WO1997009621A1 (fr) 1997-03-13
EP0851232B1 (de) 2004-11-24
CA2230571A1 (en) 1997-03-13
TW351765B (en) 1999-02-01
JP3326054B2 (ja) 2002-09-17
US6440369B1 (en) 2002-08-27
EP0851232A1 (de) 1998-07-01

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