DE69616807D1 - Verfahren zum programmieren eines elektrisch programmierbaren speichers und leseverfahren - Google Patents

Verfahren zum programmieren eines elektrisch programmierbaren speichers und leseverfahren

Info

Publication number
DE69616807D1
DE69616807D1 DE69616807T DE69616807T DE69616807D1 DE 69616807 D1 DE69616807 D1 DE 69616807D1 DE 69616807 T DE69616807 T DE 69616807T DE 69616807 T DE69616807 T DE 69616807T DE 69616807 D1 DE69616807 D1 DE 69616807D1
Authority
DE
Germany
Prior art keywords
programming
programmable memory
electrically programmable
reading
reading method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69616807T
Other languages
English (en)
Other versions
DE69616807T2 (de
Inventor
Andrew Birnie
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP USA Inc
Original Assignee
Motorola Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Ltd filed Critical Motorola Ltd
Application granted granted Critical
Publication of DE69616807D1 publication Critical patent/DE69616807D1/de
Publication of DE69616807T2 publication Critical patent/DE69616807T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5642Sensing or reading circuits; Data output circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5628Programming or writing circuits; Data input circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5628Programming or writing circuits; Data input circuits
    • G11C11/5635Erasing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Read Only Memory (AREA)
DE69616807T 1995-08-31 1996-08-30 Verfahren zum programmieren eines elektrisch programmierbaren speichers und leseverfahren Expired - Fee Related DE69616807T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9517759A GB2304947B (en) 1995-08-31 1995-08-31 Electrically programmable memory, method of programming and method of reading
PCT/EP1996/003813 WO1997008706A1 (en) 1995-08-31 1996-08-30 Electrically programmable memory, method of programming and method of reading

Publications (2)

Publication Number Publication Date
DE69616807D1 true DE69616807D1 (de) 2001-12-13
DE69616807T2 DE69616807T2 (de) 2002-04-11

Family

ID=10779984

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69616807T Expired - Fee Related DE69616807T2 (de) 1995-08-31 1996-08-30 Verfahren zum programmieren eines elektrisch programmierbaren speichers und leseverfahren

Country Status (7)

Country Link
US (1) US5949709A (de)
EP (1) EP0847583B1 (de)
JP (1) JP3853844B2 (de)
CN (1) CN1134019C (de)
DE (1) DE69616807T2 (de)
GB (1) GB2304947B (de)
WO (1) WO1997008706A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6081453A (en) * 1997-04-15 2000-06-27 Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device
GB2325546B (en) * 1997-05-21 2001-10-17 Motorola Inc Electrically programmable memory and method of programming
FR2770326B1 (fr) * 1997-10-28 2001-12-28 Sgs Thomson Microelectronics Procede d'ecriture dans une memoire non volatile modifiable electriquement
US6292395B1 (en) * 1999-12-30 2001-09-18 Macronix International Co., Ltd. Source and drain sensing
JP2002133876A (ja) * 2000-10-23 2002-05-10 Hitachi Ltd 半導体記憶装置
US7064978B2 (en) * 2002-07-05 2006-06-20 Aplus Flash Technology, Inc. Monolithic, combo nonvolatile memory allowing byte, page and block write with no disturb and divided-well in the cell array using a unified cell structure and technology with a new scheme of decoder and layout
US6862223B1 (en) * 2002-07-05 2005-03-01 Aplus Flash Technology, Inc. Monolithic, combo nonvolatile memory allowing byte, page and block write with no disturb and divided-well in the cell array using a unified cell structure and technology with a new scheme of decoder and layout
CN101465162B (zh) * 2007-12-20 2013-06-12 世界先进积体电路股份有限公司 存储器的自动循序烧录判别装置与方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0772996B2 (ja) * 1987-01-31 1995-08-02 株式会社東芝 不揮発性半導体メモリ
JP3099887B2 (ja) * 1990-04-12 2000-10-16 株式会社東芝 不揮発性半導体記憶装置
US5218571A (en) * 1990-05-07 1993-06-08 Cypress Semiconductor Corporation EPROM source bias circuit with compensation for processing characteristics
EP0463331A3 (en) * 1990-06-28 1992-12-23 Texas Instruments Incorporated An improved method for programming a non-volatile memory
US5187683A (en) * 1990-08-31 1993-02-16 Texas Instruments Incorporated Method for programming EEPROM memory arrays
US5418743A (en) * 1992-12-07 1995-05-23 Nippon Steel Corporation Method of writing into non-volatile semiconductor memory
EP0649147A1 (de) * 1993-10-11 1995-04-19 Texas Instruments France Speicheranordnung mit erhöhter-Kapazität
US5629890A (en) * 1994-09-14 1997-05-13 Information Storage Devices, Inc. Integrated circuit system for analog signal storing and recovery incorporating read while writing voltage program method

Also Published As

Publication number Publication date
EP0847583B1 (de) 2001-11-07
EP0847583A1 (de) 1998-06-17
DE69616807T2 (de) 2002-04-11
GB2304947A (en) 1997-03-26
US5949709A (en) 1999-09-07
JPH11512208A (ja) 1999-10-19
CN1194716A (zh) 1998-09-30
GB9517759D0 (en) 1995-11-01
JP3853844B2 (ja) 2006-12-06
WO1997008706A1 (en) 1997-03-06
CN1134019C (zh) 2004-01-07
GB2304947B (en) 2000-02-23

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Legal Events

Date Code Title Description
8328 Change in the person/name/address of the agent

Free format text: SCHUMACHER & WILLSAU, PATENTANWALTSSOZIETAET, 80335 MUENCHEN

8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: FREESCALE SEMICONDUCTOR, INC., AUSTIN, TEX., US

8339 Ceased/non-payment of the annual fee