DE69527642T2 - Polykristalline ferroelektrische kondensatorheterostruktur mit hybridelektroden - Google Patents
Polykristalline ferroelektrische kondensatorheterostruktur mit hybridelektrodenInfo
- Publication number
- DE69527642T2 DE69527642T2 DE69527642T DE69527642T DE69527642T2 DE 69527642 T2 DE69527642 T2 DE 69527642T2 DE 69527642 T DE69527642 T DE 69527642T DE 69527642 T DE69527642 T DE 69527642T DE 69527642 T2 DE69527642 T2 DE 69527642T2
- Authority
- DE
- Germany
- Prior art keywords
- ferroelectric capacitor
- hybrid electrodes
- polycrystalline ferroelectric
- heterostructure
- capacitor heterostructure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000003990 capacitor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
- H01L28/60—Electrodes
- H01L28/75—Electrodes comprising two or more layers, e.g. comprising a barrier layer and a metal layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
- H01L28/55—Capacitors with a dielectric comprising a perovskite structure material
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/341,728 US5519235A (en) | 1994-11-18 | 1994-11-18 | Polycrystalline ferroelectric capacitor heterostructure employing hybrid electrodes |
PCT/US1995/014740 WO1996016447A1 (en) | 1994-11-18 | 1995-11-03 | Polycrystalline ferroelectric capacitor heterostructure employing hybrid electrodes |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69527642D1 DE69527642D1 (de) | 2002-09-05 |
DE69527642T2 true DE69527642T2 (de) | 2003-04-03 |
Family
ID=23338770
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69527642T Expired - Fee Related DE69527642T2 (de) | 1994-11-18 | 1995-11-03 | Polykristalline ferroelektrische kondensatorheterostruktur mit hybridelektroden |
Country Status (12)
Country | Link |
---|---|
US (1) | US5519235A (de) |
EP (1) | EP0792524B1 (de) |
JP (1) | JP3040483B2 (de) |
KR (1) | KR100296236B1 (de) |
AU (1) | AU684407B2 (de) |
DE (1) | DE69527642T2 (de) |
IL (1) | IL115893A (de) |
MX (1) | MX9703547A (de) |
MY (1) | MY117284A (de) |
NZ (1) | NZ296461A (de) |
TW (1) | TW283234B (de) |
WO (1) | WO1996016447A1 (de) |
Families Citing this family (59)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2703206B2 (ja) * | 1994-09-30 | 1998-01-26 | 三星電子株式会社 | 強誘電体キャパシタ及びその製造方法 |
US5572060A (en) * | 1995-02-01 | 1996-11-05 | Southern Methodist University | Uncooled YBaCuO thin film infrared detector |
US5821598A (en) * | 1995-02-01 | 1998-10-13 | Research Corporation Technologies, Inc. | Uncooled amorphous YBaCuO thin film infrared detector |
WO1997001854A1 (en) * | 1995-06-28 | 1997-01-16 | Bell Communication Research, Inc. | Barrier layer for ferroelectric capacitor integrated on silicon |
US5798903A (en) * | 1995-12-26 | 1998-08-25 | Bell Communications Research, Inc. | Electrode structure for ferroelectric capacitor integrated on silicon |
KR100199095B1 (ko) | 1995-12-27 | 1999-06-15 | 구본준 | 반도체 메모리 셀의 캐패시터 구조 및 그 제조방법 |
US5593914A (en) * | 1996-03-19 | 1997-01-14 | Radiant Technologies, Inc. | Method for constructing ferroelectric capacitor-like structures on silicon dioxide surfaces |
TW322635B (de) | 1996-04-19 | 1997-12-11 | Matsushita Electron Co Ltd | |
JP3594061B2 (ja) * | 1996-07-24 | 2004-11-24 | ソニー株式会社 | 層状結晶構造酸化物およびその製造方法 |
KR19980014897A (ko) * | 1996-08-17 | 1998-05-25 | 구자홍 | 커패시터 및 그 제조방법 |
KR20010013595A (ko) | 1997-06-09 | 2001-02-26 | 엔, 마이클 그로브 | 개선된 장벽 특성을 나타내는 결정 퍼로브스카이트강유전체 셀을 어닐링하는 방법 |
JP3169866B2 (ja) | 1997-11-04 | 2001-05-28 | 日本電気株式会社 | 薄膜キャパシタ及びその製造方法 |
WO1999025014A1 (fr) * | 1997-11-10 | 1999-05-20 | Hitachi, Ltd. | Element dielectrique et mode de fabrication |
KR100252854B1 (ko) * | 1997-12-26 | 2000-04-15 | 김영환 | 반도체 메모리 장치 및 그 제조방법 |
KR100458084B1 (ko) * | 1997-12-27 | 2005-06-07 | 주식회사 하이닉스반도체 | 누설전류가 감소된 하부전극을 갖는 강유전체 커패시터 형성 방법 |
KR100289389B1 (ko) * | 1998-03-05 | 2001-06-01 | 김영환 | 반도체소자의캐패시터제조방법 |
US6128178A (en) * | 1998-07-20 | 2000-10-03 | International Business Machines Corporation | Very thin film capacitor for dynamic random access memory (DRAM) |
US6194754B1 (en) * | 1999-03-05 | 2001-02-27 | Telcordia Technologies, Inc. | Amorphous barrier layer in a ferroelectric memory cell |
US6312819B1 (en) | 1999-05-26 | 2001-11-06 | The Regents Of The University Of California | Oriented conductive oxide electrodes on SiO2/Si and glass |
US6693033B2 (en) | 2000-02-10 | 2004-02-17 | Motorola, Inc. | Method of removing an amorphous oxide from a monocrystalline surface |
US6501973B1 (en) | 2000-06-30 | 2002-12-31 | Motorola, Inc. | Apparatus and method for measuring selected physical condition of an animate subject |
US6590236B1 (en) | 2000-07-24 | 2003-07-08 | Motorola, Inc. | Semiconductor structure for use with high-frequency signals |
US6555946B1 (en) | 2000-07-24 | 2003-04-29 | Motorola, Inc. | Acoustic wave device and process for forming the same |
JP2004519864A (ja) * | 2000-08-24 | 2004-07-02 | コバ・テクノロジーズ・インコーポレイテッド | シングルトランジスタ希土類亜マンガン酸塩強誘電体不揮発性メモリセル |
US6638838B1 (en) | 2000-10-02 | 2003-10-28 | Motorola, Inc. | Semiconductor structure including a partially annealed layer and method of forming the same |
US6673646B2 (en) | 2001-02-28 | 2004-01-06 | Motorola, Inc. | Growth of compound semiconductor structures on patterned oxide films and process for fabricating same |
WO2002071477A1 (en) | 2001-03-02 | 2002-09-12 | Cova Technologies Incorporated | Single transistor rare earth manganite ferroelectric nonvolatile memory cell |
US6709989B2 (en) | 2001-06-21 | 2004-03-23 | Motorola, Inc. | Method for fabricating a semiconductor structure including a metal oxide interface with silicon |
US6531740B2 (en) | 2001-07-17 | 2003-03-11 | Motorola, Inc. | Integrated impedance matching and stability network |
US6646293B2 (en) | 2001-07-18 | 2003-11-11 | Motorola, Inc. | Structure for fabricating high electron mobility transistors utilizing the formation of complaint substrates |
US6693298B2 (en) | 2001-07-20 | 2004-02-17 | Motorola, Inc. | Structure and method for fabricating epitaxial semiconductor on insulator (SOI) structures and devices utilizing the formation of a compliant substrate for materials used to form same |
US20030015712A1 (en) * | 2001-07-23 | 2003-01-23 | Motorola, Inc. | Fabrication of an optical communication device within a semiconductor structure |
US6667196B2 (en) | 2001-07-25 | 2003-12-23 | Motorola, Inc. | Method for real-time monitoring and controlling perovskite oxide film growth and semiconductor structure formed using the method |
US6589856B2 (en) | 2001-08-06 | 2003-07-08 | Motorola, Inc. | Method and apparatus for controlling anti-phase domains in semiconductor structures and devices |
US6639249B2 (en) | 2001-08-06 | 2003-10-28 | Motorola, Inc. | Structure and method for fabrication for a solid-state lighting device |
US6673667B2 (en) | 2001-08-15 | 2004-01-06 | Motorola, Inc. | Method for manufacturing a substantially integral monolithic apparatus including a plurality of semiconductor materials |
JP4708667B2 (ja) * | 2002-08-08 | 2011-06-22 | キヤノン株式会社 | アクチュエータおよび液体噴射ヘッド |
US6825517B2 (en) * | 2002-08-28 | 2004-11-30 | Cova Technologies, Inc. | Ferroelectric transistor with enhanced data retention |
US6714435B1 (en) | 2002-09-19 | 2004-03-30 | Cova Technologies, Inc. | Ferroelectric transistor for storing two data bits |
US6888736B2 (en) | 2002-09-19 | 2005-05-03 | Cova Technologies, Inc. | Ferroelectric transistor for storing two data bits |
US6762481B2 (en) * | 2002-10-08 | 2004-07-13 | The University Of Houston System | Electrically programmable nonvolatile variable capacitor |
EP1589059B1 (de) * | 2002-11-05 | 2012-06-06 | Eamex Corporation | Leitfähiges polymer enthaltende verbundstruktur |
US7754353B2 (en) * | 2003-10-31 | 2010-07-13 | Newns Dennis M | Method and structure for ultra-high density, high data rate ferroelectric storage disk technology using stabilization by a surface conducting layer |
TWI244205B (en) * | 2004-06-11 | 2005-11-21 | Univ Tsinghua | A lead barium zirconate-based fatigue resistance ferroelectric and ferroelectric memory device made from the same |
JP4559425B2 (ja) * | 2004-07-22 | 2010-10-06 | 日本電信電話株式会社 | 2安定抵抗値取得装置及びその製造方法 |
US8603573B2 (en) * | 2006-12-01 | 2013-12-10 | The Trustees Of The University Of Pennsylvania | Ferroelectric ultrathin perovskite films |
WO2011053199A1 (en) * | 2009-10-30 | 2011-05-05 | St. Jude Medical Ab | A medical implantable lead |
WO2012166562A1 (en) * | 2011-05-27 | 2012-12-06 | University Of North Texas | Graphene magnetic tunnel junction spin filters and methods of making |
US10601074B2 (en) | 2011-06-29 | 2020-03-24 | Space Charge, LLC | Rugged, gel-free, lithium-free, high energy density solid-state electrochemical energy storage devices |
US9853325B2 (en) | 2011-06-29 | 2017-12-26 | Space Charge, LLC | Rugged, gel-free, lithium-free, high energy density solid-state electrochemical energy storage devices |
US11527774B2 (en) | 2011-06-29 | 2022-12-13 | Space Charge, LLC | Electrochemical energy storage devices |
US11179682B2 (en) * | 2015-03-30 | 2021-11-23 | Massachusetts Institute Of Technology | Segregation resistant perovskite oxides with surface modification |
WO2019173626A1 (en) | 2018-03-07 | 2019-09-12 | Space Charge, LLC | Thin-film solid-state energy-storage devices |
JP2022527654A (ja) | 2019-04-08 | 2022-06-02 | ケプラー コンピューティング インコーポレイテッド | ドープされた極性層及びそれを組み込んだ半導体デバイス |
US11289497B2 (en) | 2019-12-27 | 2022-03-29 | Kepler Computing Inc. | Integration method of ferroelectric memory array |
US11482528B2 (en) | 2019-12-27 | 2022-10-25 | Kepler Computing Inc. | Pillar capacitor and method of fabricating such |
US11430861B2 (en) | 2019-12-27 | 2022-08-30 | Kepler Computing Inc. | Ferroelectric capacitor and method of patterning such |
US11501905B2 (en) * | 2020-08-31 | 2022-11-15 | Boston Applied Technologies, Inc. | Composition and method of making a monolithic heterostructure of multiferroic thin films |
US11765909B1 (en) | 2021-06-11 | 2023-09-19 | Kepler Computing Inc. | Process integration flow for embedded memory enabled by decoupling processing of a memory area from a non-memory area |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL9000602A (nl) * | 1990-03-16 | 1991-10-16 | Philips Nv | Werkwijze voor het vervaardigen van een halfgeleiderinrichting met geheugenelementen vormende condensatoren met een ferroelectrisch dielectricum. |
JP3006053B2 (ja) * | 1990-08-07 | 2000-02-07 | セイコーエプソン株式会社 | 半導体装置 |
TW200600B (de) * | 1991-10-01 | 1993-02-21 | Philips Nv | |
US5155658A (en) * | 1992-03-05 | 1992-10-13 | Bell Communications Research, Inc. | Crystallographically aligned ferroelectric films usable in memories and method of crystallographically aligning perovskite films |
US5270298A (en) * | 1992-03-05 | 1993-12-14 | Bell Communications Research, Inc. | Cubic metal oxide thin film epitaxially grown on silicon |
US5248564A (en) * | 1992-12-09 | 1993-09-28 | Bell Communications Research, Inc. | C-axis perovskite thin films grown on silicon dioxide |
US5387459A (en) * | 1992-12-17 | 1995-02-07 | Eastman Kodak Company | Multilayer structure having an epitaxial metal electrode |
-
1994
- 1994-11-18 US US08/341,728 patent/US5519235A/en not_active Expired - Fee Related
-
1995
- 1995-11-03 WO PCT/US1995/014740 patent/WO1996016447A1/en active IP Right Grant
- 1995-11-03 EP EP95939139A patent/EP0792524B1/de not_active Expired - Lifetime
- 1995-11-03 DE DE69527642T patent/DE69527642T2/de not_active Expired - Fee Related
- 1995-11-03 NZ NZ296461A patent/NZ296461A/xx unknown
- 1995-11-03 KR KR1019970703288A patent/KR100296236B1/ko not_active IP Right Cessation
- 1995-11-03 JP JP8516946A patent/JP3040483B2/ja not_active Expired - Lifetime
- 1995-11-03 MX MX9703547A patent/MX9703547A/es not_active IP Right Cessation
- 1995-11-03 AU AU41083/96A patent/AU684407B2/en not_active Ceased
- 1995-11-06 IL IL11589395A patent/IL115893A/en active IP Right Grant
- 1995-11-18 MY MYPI95003518A patent/MY117284A/en unknown
- 1995-11-20 TW TW084112387A patent/TW283234B/zh active
Also Published As
Publication number | Publication date |
---|---|
TW283234B (de) | 1996-08-11 |
IL115893A (en) | 1998-08-16 |
IL115893A0 (en) | 1996-01-31 |
AU684407B2 (en) | 1997-12-11 |
JP3040483B2 (ja) | 2000-05-15 |
EP0792524B1 (de) | 2002-07-31 |
JPH09512963A (ja) | 1997-12-22 |
MY117284A (en) | 2004-06-30 |
US5519235A (en) | 1996-05-21 |
EP0792524A4 (de) | 1999-03-17 |
WO1996016447A1 (en) | 1996-05-30 |
AU4108396A (en) | 1996-06-17 |
MX9703547A (es) | 1997-08-30 |
DE69527642D1 (de) | 2002-09-05 |
NZ296461A (en) | 1999-03-29 |
KR970707588A (ko) | 1997-12-01 |
EP0792524A1 (de) | 1997-09-03 |
KR100296236B1 (ko) | 2001-08-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |